A3LML-1610Laser Beam Printer

1. External Pictures 1) Front View 2) Rear View 3) Side View 1 4) Side View 2

2. Print Board Assembled(PBA) Pictures 1) Top View of Main Controller 2) Bottom View of Main Controller 3) Top View of SMPS 4) Bottom View of SMPS 5) Top View of HVPS 6) Bottom View of HVPS

1 of 21 Samsung EMC Testing and Certification Laboratory Project No: LBE050067 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. EMC Test Report According to FCC Part 15 Subpart B Project No. LBE050067 Equipment under Test Applicant Samsung Electronics Co., Ltd 416 Maetan 3-dong, Yeongtong-gu, Suwon-si, Gyeonggi-do, Korea, 443-742 FCC ID A3LML-1610 Product Name LBP Model Name ML-1610 Variant Model Phaser 3117, Dell Laser Printer 1100 Manufacturer 1) Samsung Electronics Co., Ltd 259, Gongdan-Dong, Gumi-City, Kyung-Buk, 730-030, Korea 2) Shandong Samsung Telecommunications Co., Ltd Sanxing Road, Weihai Hi-Tech, IDZ shandong Province, 264209, China 3) Samsung Electronics Slovakia s.r.o. Hviezdoslavova 807, 924 27 Galanta, Slovakia Date of Test January 13, 2005~ January 14, 2005 Issued Date January 25, 2005 Name/Position Signature Tested by Min Gon, Kim Test Engineer Reviewed by No Cheon, Park Manager of EMC Lab. Authorized by Seung Kyu, Cha Chief of EMC Lab. 1. This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. 2. This test report is to certify that the tested device properly complies with the requirements of FCC Rules and Regulations Part 15 Subpart B Unintentional Radiators. All tests necessary to show compliance to the requirements were and these results met the specifications requirement. This laboratory is registered by the NIST/NVLAP, U.S.A. The test reported herein have been performed in accordance with its terms of registration. 3. Fcc filing Registration Number : 873282 NVLAP LAB CODE 200623-0 2 of 21 Samsung EMC Testing and Certification Laboratory Project No: LBE050067 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Table of Contents 1. General Information 1.1 Basic Information related Product 1.2 Detail Information related Product 1.3 Operating mode and condition 1.4 Test System Details 1.5 Equipment Modifications 1.6 Test Procedure 1.7 Test Configuration 1.8 Applied Standard 1.9 Test Facility 2. Summary of Test Results 3. Description of individual tests 3.1 Conducted Emission 3.2 Radiated Emission 4. Appendix 4.1 Test Photography 4.2 EUT Photography 3 of 21 Samsung EMC Testing and Certification Laboratory Project No: LBE050067 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1. General Information 1.1 Basic Information related Product Applicant Samsung Electronics Co., Ltd Model name ML-1610 Applicant Address 416 Maetan3- Dong, Yeoung tong-gu, Suwon-si, Gyeonggi-do, 443-742, Korea Contact Person Min Gon, Kim Kind of product LBP Variant list Phaser 3117 Dell Laser Printer 1100 Manufacturer 1) Samsung Electronics Co., Ltd 259, Gongdan-Dong, Gumi-City, Kyung-Buk, 730-030, Korea 2) Shandong Samsung Telecommunications Co., Ltd Sanxing Road, Weihai Hi-Tech, IDZ shandong Province, 264209, China 3) Samsung Electronics Slovakia s.r.o. Hviezdoslavova 807, 924 27 Galanta, Slovakia New / Alternative / Permissive change Information New 1.2 Detail Information related Product Specification Item Specification Remark Print Speed Up to 16 ppm in A4 (17 ppm in Letter). - Resolution 600 x 600 dpi - Power Rating AC 110 ~ 127, 50 / 60 Hz - Power Consumption 300 W average during operation / Less than 10 W in sleep mode - First Printing Time 10 seconds - Warmup Time 30 seconds - External Dimensions 358mm X 275mm X 215mm (W x D x H) - Interface USB 1.1 (Compatible with USB 2.0) - Weight 5.7 Kg (including Toner Cartridge) 4 of 21 Samsung EMC Testing and Certification Laboratory Project No: LBE050067 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Operating Frequency - System clock (75MHz) - Oscillator clock (12MHz) - USB clock ( 48MHz ) 1.3 Operating Mode and Condition The system was configured for testing in typical fashion use. Cable were attached to each of the available I/O port. Where applicable, peripherals were attached to the I/O cables through USB port. The EUT was tested USB Printing mode as maximum emission. 1.4 Test System Details N/A 1.5 Equipment Modifications No equipment modifications were required. 5 of 21 Samsung EMC Testing and Certification Laboratory Project No: LBE050067 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.6 Test Procedure 1.6.1 Conducted Emission EUT was placed on a platform nominal size, 1m by 1.5m, raised 80cm above the conducti ng ground plane. The rear of tabletop was located 40cm to the vertical conducting ground plane. The rear of EUT, including peripherals was aligned and flush with rear of tabletop. All other surfaces of tabletop was at least 80cm from any other grounded conducting surface. I/O cables and AC cables that were connected to the peripherals were bundled in center. They were folded back and forth forming a bindle 30cm to 40cm long and were handed at a 40cm height to the ground plane. Each EUT current-carrying power lead, except the ground(safety)lead, were individually connected through a LISN to the input power source. All unused 50 ohm connectors of the LISN were resistively terminated in 50 ohm when not connected to the measuring equipment. Frequency Band [MHz] Instrument Detector Resolution Bandwidth Video Bandwidth Quasi-Peak 9kHz - 0.15 to 30 EMI Receiver Average 9kHz - 1.6.2 Radiated Emission EUT was placed on a platform of nominal size, 1m by 1.5m, raised 80cm above the conducting ground plane. The rear of EUT, including peripherals was aligned and flush with rear of tabletop. I/O cables that were connected to the peripherals were bundle in center. They were folded back and forth forming a bundle 30cm to 40cm long and were hanged 40cm height to the ground plane. Test was made with the antenna positioned in both the horizontal and vertical planes of polarization. The measurement antenna was vari…

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16 of 21 Samsung EMC Testing and Certification Laboratory Project No: LBE050067 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 4. Appendix 4.1 Test Photography Pic. 1 Conducted Emission (Front) Pic. 2 Conducted Emission (Rear) 17 of 21 Samsung EMC Testing and Certification Laboratory Project No: LBE050067 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Pic. 3 Radiated Emission (Front) Pic. 4 Radiated Emission (Rear)