A3LML1430Laser Printer

User's Guide SAMSUNG LASER PRINTER A.1 APPENDIX Item Specifications and Description Print Speed 14 PPM Resolution 600 dpi First Printing Time WarmUp Time Less than 12.5 seconds Power Consumption 250 W average during operation / Less than 10 W in sleep mode Power Rating AC 100 ~ 127 V (USA, Canada) / 220 ~ 240 V (Others), 50 / 60 Hz Acoustic Noise Stand by: Less than 35 dB; Operating: Less than 47 dB Toner Supply Single cartridge Toner Cartridge Life 2,500 pages (for starter, 1,000 pages), 5% area coverage Emulation SPL Random Access Memory (RAM) 8 MB (nonexpandable) 30 seconds Interface • IEEE 1284 Bidirectional Parallel - Modes supported: Compatible, Nibble, Byte, ECP • USB Interface Standard - USB 1.1 compliant - 12 Mbps 1 port Weight 6.5 Kg / 13.4 lb. External Dimensions (W x D x H) 329 x 355 x 231 mm / 12.95 x 13.98 x 9.09 in. Temperature:10 ~ 32 °C / 50 ~ 90 °F; Humidity: 20 ~ 80 % RH Package Weight Paper: 1.83 Kg Plastic: 0.33 Kg Duty Cycle Monthly: 12,000 pages maximum Operating Environment Printer Specifications

Block Diagram 6-1 Samsung Electronics 6. Block Diagram 6-1. Block Diagram(GDI) MAIN S3C46M0X SDRAM (8MB) SMP S Eng i ne PANEL B' D FLASH MEMORY (0.5MB) POWER CORD +24V MOTOR FAN EX I T SE N SOR HV PS B' D MHV OPC G N D SUPPL Y DEV TH V BUFFER MHVP W M BI ASPW M THVPWM POWER SWITCH IN-LET LED 4 3 KEY IEEE 12 84 CABLE VOL TAGE DET ECT OR Crysta l 10MHz Mai n Cl ock Oscillator 44 MHz Vi deo Clock Po we r On Re s e t CPU Jup iter3 US B 74LVX161284 Line Tr a n s c e i v e r PC +5V FS781BZ B SOLENOIDE DEV_FUSE LSU

                                                                               

Page 14 of 15 JOB NO. : E2-02-0009 5. FCC Label Configuration and Location 5.1 Label Configulation 5.2 Location of Label This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government.

              



                       



                                                      



               



                          



      



              



                               



              



            



                           



          



                                                                      



                                                             

Page 2 of 15 JOB NO. : E2-02-0009 Table of Contents 1. General Information 1.1 Product Description 1.2 Configuration of EUT and peripherals 1.3 Used Cable Description 1.4 System Block Diagram of Test Configuration 1.5 Test Facility 2. System Test Configuration 2.1 Configuration of Radiated and Conducted Interference Measurement 2.2 Operation Enviroment 2.3 Test Procedure 3. Conducted Emission Test Data 4. Radiated Emission Test Data 5. Label Configuration and Location 6. Test Equipment Used Distribution This test report has been made available as follows: CS Management Center, EMC Laboratory1 original Printer Division1 copy This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. Page 3 of 15 JOB NO. : E2-02-0009 1. General Information Applicant :Samsung Electronics Co., Ltd. CS Management Center EMC Test Laboratory Tel.: +81-(0)31-200-2135 Fax.: +81-(0)31-200-2189 Full Address :416 Maetan 3 Dong, Paldal-Ku, Suwon City, Kyungki Do, Korea, 442-742 Kind of Product :Leaser Beam Printer FCC ID:A3LML1430 Project Name :- Model & Variant Names :ML-1430(Brand Name: SAMSUNG) Test Report Produced by :Tae Young, Jang/ Test Eng. 1.1 Product Description 1) Justification The system was configured for testing in typical fashion use. Cable were attached to each of the available I/O Ports. Where applicable, peripherals were attached to the I/O cables. The mode of operation utilized for testing was selected to best simulate typical EUT use. The Test mode is standby,USB printing,and Parallel Printing. the test results of standby mode was the worst case emissions. Further details of cabling and configuration are shown in the test system configuration. This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. Page 4 of 15 JOB NO. : E2-02-0009 2) Operating Frequency : 66MHz(CPU Speed), 51.040MHz(Video Clock),10.000 MHz(Main Clock) 3) Description of Testing operating mode LPT1 USB - 4) Tested Resolution : This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. STAND BY PRINTING Operating Mode Operating section of EUT ColorsTested Video modeResolutionsRefresh rates Page 5 of 15 JOB NO. : E2-02-0009 5) Assemble Parts ItemSpecificationRemark CPUSAMSUNG,IC ASIC-JUPITER3,S3C46M0X01 66MHz RISC Processor Including USB Main ControllerSAMSUNG,8MB LSUSAMSUNG,600DPI,14PPMLASER SCAN UNIT KIHWA PRECISION,600DPI,14PPM SMPSSUN KOREA, 3.5A , AC100~127,50/60Hz DONGYANG, 3.5A , AC100~127,50/60Hz HVPSSUN KOREA, DC24V+15%/-10%, 1AHIGH VOLAGE POWER SUPPLY DOGNYANG, DC24V+15%/-10%, 1A Ports 1 USB, 1 Parallel Port This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. Page 6 of 15 JOB NO. : E2-02-0009 2.5.2 Configuration of EUT and peripherals MarkItemModel No.Serial No.ManufacturerRemark ADesktop computerTD260-DTC92DK409981SAMSUNG BSerial MouseM-CU15LTC45000091- CMonitorCPG17NFP106H2JN401141SAMSUNG DLaser PrinterML-1430-SAMSUNGEUT EPS/2 MouseP8011028781KYE SYSTEMS FKeyboard SEM-DT353V088510 SAMSUNG 2.5.3 Used Cable Description No.ItemLength[m]Shielded(Y/N) 1AC Power cable1.7N 2Video cable1.5Y 3Serial cable1.5Y 4Mouse cable2.0Y 5Printer cable1.8Y 6Keyboard Cable1.7Y 7USB1.8Y 8AC Power cable1.7N 9AC Power cable1.7N This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. Remark Page 7 of 15 JOB NO. : E2-02-0009 1.4 System Block Diagram of Test Configuration 1.5 Test Facility All test described in this report were performed by : SAMSUNG ELECTRONICS CO., LTD. EMC TESTING LABORATORY 416 Maetan 3 Dong, Paldal-Ku, Suwon City, Kyungki Do, Korea, 442-742 Semi Anechoic Chamber #1(Registration Number:98856) and Shielded Room. This test facility has been filed in FCC under the criteria in ANSI C63.4-1992. This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 6 D 5 4 2 1 3 9 F B A C E 8 7 Page 8 of 15 JOB NO. : E2-02-0009 2. System Test Configuration 2.1 Configuration of Radiated and Conducted Interference Measurement * Cabling was taken into consideration and test data was taken under worse case conditions. 1)Conduction(Front View) 2)Conduction(Rear View) This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. Page 9 of 15 JOB NO. : E2-02-0009 3) Radiation(Front View) 4) Radiation(Rear View) This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. Page 10 of 15 JOB NO. : E2-02-0009 2.2 Operation Enviroment ConductionRadiation Temperature [ C ] :23C23C Humidity [ % ] :63C63C Power supply :AC120V/60HzAC120V/60Hz 2.3 Test Procedure 2.3.1 Conducted Emissions Eut was placed on a platform of nominal size, 1m by 1.5m, raised 80cm above the conducting ground plane. The rear of tabletop was located 40cm to the vertical conducting ground plane. The rear of EUT,including peripherals was aligned and flush with rear of tabletop. All other surfaces of tabletop was at least 80cm from any other grounded conducting surface. I/O cables and AC cables that were connected to the peripherals were bundled in center. They were folded back and forth forming a bundle 30cm to 40cm long and were hanged at a 40cm height to the ground plane. Each EUT current-carrying power lead,except the ground(safety) lead, were individually connected through a LISN to the input power source. All unused 50 ohm connectors of the LISN were resistively terminated in 50 ohm when not connected to the measuring equipment. The EUT was switched on and allowed to warm up to its normal operating condition. A quick scan, from 450kHz to 30MHz, was made on the L1 & L2 line by LISN. High peaks, relative to the limit line, over the frequency range were then selected. The EMI TEST RECEIVER was then tuned to the selected frequencies. CISPR quasi-peak measurements with a receiver bandwidth setting of 10kHz, were taken. This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. Page 11 of 15 JOB NO. : E2-02-0009 2.3.2 Ra…

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Page 8 of 15 JOB NO. : E2-02-0009 2. System Test Configuration 2.1 Configuration of Radiated and Conducted Interference Measurement * Cabling was taken into consideration and test data was taken under worse case conditions. 1)Conduction(Front View) 2)Conduction(Rear View) This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. Page 9 of 15 JOB NO. : E2-02-0009 3) Radiation(Front View) 4) Radiation(Rear View) This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government.

Page 8 of 15 JOB NO. : E2-02-0009 2. System Test Configuration 2.1 Configuration of Radiated and Conducted Interference Measurement * Cabling was taken into consideration and test data was taken under worse case conditions. 1)Conduction(Front View) 2)Conduction(Rear View) This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. Page 9 of 15 JOB NO. : E2-02-0009 3) Radiation(Front View) 4) Radiation(Rear View) This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government.