A3LML1520Laser Beam Printer

SAMSUNG CONFIDENTIAL Humming VE Block Diagram SDRAM (8MB) FLASH MEMORY ( 0.5MB) POWER CORD +24V MHVPWM THVPWM VOLTAGE DETECTOR Crystal 12MHz Main Clock VideoClock PowerOnReset CPUJupiter4 +5V F.G LSU LD PANEL B'D 2LED 1KEY SOLENOIDE MAIN MOTOR USB HEATER-THERMISTOR HEATER-AC MHV OPC GND SUPPLY DEV THV SMPS PART'S MOTOR DR PART'S FUSER ASSY ARM9 80Mhz EXIT- SENSOR FEED-SENSOR P/EMPTY-SENSOR MP - SENSOR PC FAN IN-LET -+ GND +24V +5V SSCG COVER OPEN SW CN? HVPS PART'S PTL THV-RD BIASPWM THV_EA SOLENOIDE

FrontViewofEUT Rear View of EUT Side View of EUT Side View of EUT

TopViewofMainController Bottom View of Main Controller TopViewofSMPS+HVPS Bottom View of SMPS + HVPS

1 of 20 Samsung EMC Testing and Certification Laboratory Project No: LBE040869 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. EMC Test Report According to FCC Part 15 Subpart B Project No. LBE040869 Equipment under Test Laser Beam Printer Applicant Samsung Electronics Co. Ltd; 416 Maetan-3 Dong, YeoungTong-Ku, Suwon City, Kyungki-Do, Korea, 442-742 FCC ID A3LML1520 Product Name LBP Model Name ML-1520 Manufacturer Samsung Electronics Co. Ltd 259, Gongdan-Dong, Gumi-City, Kyung-Buk, 730-030, Korea Date of Test April 29, 2004 Issued Date May 3, 2004 Name/Position Signature Tested by CK KIM Test Engineer Reviewed by No Cheon, Park Manager of EMC Lab. Authorized by Kyu Baek, Chung Chief of EMC Lab. 1. This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. 2. This test report is to certify that the tested device properly complies with the requirements of FCC Rules and Regulations Part 15 Subpart B Unintentional Radiators. All tests necessary to show compliance to the requirements were and these results met the specifications requirement. This laboratory is registered by the NIST/NVLAP, U.S.A. The test reported herein have been performed in accordance with its terms of registration. 2 of 20 Samsung EMC Testing and Certification Laboratory Project No: LBE040869 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Table of Contents 1. General Information 1.1 Basic Information related Product 1.2 Detail Information related Product 1.3 Operating Mode and Test Configuration 1.4 Test System Details 1.5 Equipment Modifications 1.6 Test Procedure 1.7 Test Configurations 1.8 Applied Standards 1.9 Test Facility 2. Summary of Test Results 3. Description of individual tests 3.1 Conducted Emission 3.2 Radiated Emission 4. Appendix 4.1 Test Photography 4.2 EUT Photography 3 of 20 Samsung EMC Testing and Certification Laboratory Project No: LBE040869 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1. General Information 1.1 Basic Information related Product Applicant Samsung Electronics Co. Ltd; Model name ML-1520 Applicant Address Samsung Electronics Co. Ltd; 416 Maetan3- Dong, Yeoung tong-Ku, Suwon City, Gyeonggi-Do, Korea, 443-742 Contact Person CK KIM Kind of product LBP Valiant list Manufacturer Samsung Electronics Co. Ltd 259, Gongdan-Dong, Gumi-City, Kyung-Buk, 730-030, Korea New / Alternative / Permissive change Information This report is original report # 1.2 Detail Information related Product Specification Item Specification Remark Print speed Up to 14 ppm in A4 (15 ppm in Letter) Resolution Up to 600 x 600 dpi effective output First Printing Time Less than 12 seconds Warm-up Time Less than 30 seconds Power Rating AC 110~127V 50/60Hz Toner Cartridge Life 3000 pages (for starter, 1000 pages) @ IDC 5% coverage Weight 7 Kg External Dimensions 352 x 372 x 196 mm (13.8" x 14.6" x 7.7") Emulation SPL Random 2 MB (Nonexpendable) 4 of 20 Samsung EMC Testing and Certification Laboratory Project No: LBE040869 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Access Memory Interface USB Interface Standard - USB 1.1 compliant - 12 Mbps 1 port Operating Frequency - CPU Clock : 12 MHz - SD-Ram Clock : 75 MHz 5 of 20 Samsung EMC Testing and Certification Laboratory Project No: LBE040869 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.3 Operating Mode and Condition The system was configured for testing in typical fashion use. Cable were attached to each of the available I/O port. Where applicable, peripherals were attached to the I/O cables. This EUT have Wireless Printing server function so Host PC link to EUT and transfer print file formation "H" character document continuously. 1.4 Test System Details 1.5 Equipment Modifications No equipment modifications were required. 6 of 20 Samsung EMC Testing and Certification Laboratory Project No: LBE040869 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.6 Test Procedure 1.6.1 Disturbance Voltage at Mains EUT was placed on a platform nominal size, 1m by 1.5m, raised 80cm above the conducting ground plane. The rear of tabletop was located 40cm to the vertical conducting grounding plane. The rear of EUT, including peripherals was aligned and flush with rear of tabletop. All other surfaces of tabletop was at least 80cm from any other grounded conducing surface. I/O cables and AC cables that were connected to the peripherals were bundled in center. They were folded back and forth forming a bindle 30cm to 40cm long and were handed at a 40cm height to the ground plane. Each EUT current-carrying power lead, except the ground(safety)lead, were individually connected through a LISN to the input power source. All unused 50 ohm connectors of the LISN were resistively terminated in 50 ohm when not connected to the measuring equipment. 1.6.2 Radiated disturbance EUT was placed on a platform of nominal size, 1m by 1.5m, raised 80cm above the conducting ground plane. The rear of EUT, including peripherals was aligned and flush with rear of tabletop. I/O cables that were connected to the peripherals were bundle in center. They were folded back and forth forming a bundle 30cm to 40cm long and were hanged 40cm height to the ground plane. Test was made with the antenna positioned in both the horizontal and vertical planes of polarization. The measurement antenna was varied in height above the conducting ground plane and the run table azimuth was varied to obtain the maximum signal strength The system configuration, clock speed, mode of operation or video resolution, turntable azimuth with respect to the antenna were noted for each frequency found. The spectrum was scanned from 30 to 10…

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17 of 20 Samsung EMC Testing and Certification Laboratory Project No: LBE040869 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 4. Appendix 4.1 Test Photography Pic. 1 Conducted Emission (Front) Pic. 2 Conducted Emission (Rear) 18 of 20 Samsung EMC Testing and Certification Laboratory Project No: LBE040869 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Pic. 3 Radiated Emission (Front) Pic. 4 Conducted Emission(Rear)