A3LSCH570Single-Mode Cellular CDMA Phone

July 23, 1999 Federal Communications Commission Authorization and Evaluation Division Equipment Authorization Branch 7435 Oakland Mills Road Columbia, MD 21046 To whom it may concern: We, the undersigned, hereby authorize PCTEST Engineering Laboratory inc., to act as on our agent in behalf of all matters relating to applications for equipment authorization, including the signing of all documents relating to these matters. Any and all acts carried out by PCTEST Engineering Laboratory, inc. on our behalf shall have the same effect as acts of our own. We also hereby certify that no party to this application is subject to a denial of benefits, including FCC benefits, pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988,21 U.S.C.853(a) Sincerely, Ben Kim Ben Kim Engineering Manager

July 23, 1999 Federal Communications Commission Authorization and Evaluation Div. Equipment Authorization Branch 7435 Oakland Mills Road Columbia, MD 21046 In re: Samsung Electronics Co., Ltd. FCC ID: A3LSCH570 CDMA Phone - Certification Request for Confidentiality To whom it may concern: In accordance with 0.459 of CFR 47, Samsung Electronics Co., Ltd. Requests confidentiality for the Appendix C (Block Diagram/Schematics/Circuit Description) of the attached test report. These documents contains detailed system and equipment description and related information about the product which Samsung Electronics Co., Ltd. considers to be proprietary, confidential, and a custom design and otherwise, would not release to the general public. Since this design is a basis from which future technological products will evolve, Samsung feels that this information would be of benefit to its competitors, and that the disclosure of the information in these documents would give our competitors an unfair advantage in the market. Sincerely, Ben Kim Ben Kim Engineering Manager Samsung Electronics America

AFFIDAVIT FOR ESN PROTECTION OF CELLULAR MOBILE TELEPHONES We hereby certify that the Portable Cellular Telephone (FCC ID: A3LSCH570) is so designed that it complies with all the requirements for ESN protection specified in Sec.22.919 of the FCC Rules. a) The transmitter in service has a unique ESN. b) The ESN host component is permanently attached to a main circuit board of the mobile transmitter and the integrity of the unit operating software cannot be altered. The ESN is plated from fraudulent contact and tampering. The ESN is encoded using multiplication by a polynomial and the ESN data programmed in the memory with other information. c) The ESN is factory set and cannot be altered, transferred, removed or otherwise able to be manipulated. Cellular mobile equipment is specifically designed such that any attempt to remove, tamper with, or change the ESN chip, its logic system, or firmware originally programmed by the manufacturer will render the mobile transmitter inoperative. Sincerely, Ben Kim Ben Kim Engineering Manager Samsung Electronics America

July 28, 1999 Federal Communications Commission Equipment Approval Services 7435 Oakland Mills Road Columbia, MD 21046 SUBJECT:SAMSUNG ELECTRONICS CO., LTD. FCC ID: A3LSCH570 Part 22 Certification Gentlemen: Attached herewith, on behalf of SAMSUNG ELECTRONICS CO., LTD. is an application for Part 22 Certification of the following Single Mode Cellular CDMA phone: FCC ID:A3LSCH570 TRADE / MODEL(s):SAMSUNG SCH-570 EUT TYPE:Non-Broadcast Transmitter Held to Ear (TNE) Tx Freq. Range:824.64 – 849.37 MHz Rx Freq. Range:869.64 – 893.37 MHz Max. Output Power:0.43 Watts (ERP) Attached is the applicant’s Letter of Authorization, Confidentiality Request, ESN Affidavit, measurement report data and plots, RF Exposure measurement report, FCC ID label and location, test setup photographs, internal and external photographs, block diagrams (confidential), schematic diagrams & circuit description (confidential), operational description, parts list & tune-up procedure, and the user's manual. Should you have any questions or comments concerning the above, please contact the undersigned. cc:Mr. Ben Kim Engineering Manager SAMSUNG Electronics America

November 01, 1999 Federal Communications Commission Equipment Approval Services 7435 Oakland Mills Road Columbia, MD 21046 Attn: Frank Coperich / Kwok Chan SUBJECT:Samsung Electronics Co., Ltd. FCC ID: A3LSCH570 731 Confirmation Number: EA94955 Correspondence Reference No.: 10074 Request for Additional Info.: 10/12/99 Dear Frank / Kwok: Submitted herewith, on behalf of Samsung Electronics Co., Ltd., is an amendment in response to your e-mail dated October 12, 1999 requesting additional information for the subject application. 1. Attached is the SAR measurement data and photographs for hands-free body-worn configuration, using the ear-microphone accessory, and the phone placed in the optional holster. Also attached is a letter from the applicant stating the minimum separation distance, which will be placed as a warning statement to the user in the operators manual. 2. The 24dBm output indicated on the SAR plots (both brain & body SAR) does not include the 1.2dB cable loss also shown on the plots. The actual conducted output level is 25.2dBm. We trust this information is sufficient to issue the grant. Should you have any further questions, please do not hesitate to contact us. Thank you. Sincerely, cc:Ben Kim Engineering Manager Samsung American QA Lab

December 07, 1999 Federal Communications Commission Equipment Approval Services 7435 Oakland Mills Road Columbia, MD 21046 Attn: Frank Coperich / Kwok Chan SUBJECT:Samsung Electronics Co., Ltd. FCC ID: A3LSCH570 731 Confirmation Number: EA94955 Correspondence Reference No.: 10894 Request for Additional Info.: 12/02/99 Dear Frank / Kwok: Submitted herewith, on behalf of Samsung Electronics Co., Ltd., is an amendment for verification of the Body- worn configuration of the Samsung Electronics Co., Ltd. Single-Mode Cellular phone. The SAR tests were done with the IDX measurement system with a torso phantom. Please note the location of the hot-spot was identical in both systems. Attached are the SAR Test Data Summary Pages, SAR data from the IDX measurement system, and SAR Test Setup Photos. In addition, listed below is the information we received from SPEAG on 12/3/99 stating the conversion factor for the muscle material at 835 MHz, and the appropriate conductivity and permittivity parameters used during the body SAR measurement using the SPEAG probe S/N: 1368. Based on this information, the data derived from the SPEAG system is comparable to the data derived using the IDX system for Body SAR. SN:1368 – brain 900MHz – eps=42.5, sig=0.85, ConvF=5.76 SN:1368 – muscle 900MHz – eps=55.96, sig=0.97, ConvF=5.59 (3% lower than 5.76) SN:1368 – muscle 835MHz – eps=56.2, sig=0.95, ConvF=5.7 (1% lower than 5.76) We trust this information is sufficient to issue the grant. Should you have any further questions, please do not hesitate to contact us. Thank you. Sincerely, cc:Ben Kim, Engineering Manager Samsung American QA Lab

Test Report S/N: 22.990708415.A3LFCC Part 22 Test Date(s): July 12-16, 1999Certification © 1999 PCTEST Lab FCC ID: A3LSCH570 (Tx 824-849MHz) NVLAP Lab Code: 100431-0 SAMSUNG Cellular CDMA Phone (Model: SCH-570) Test Report S/N: 22.990708415.A3LFCC Part 22 Test Date(s): July 12-16, 1999Certification © 1999 PCTEST Lab FCC ID: A3LSCH570 (Tx 824-849MHz) NVLAP Lab Code: 100431-0 SAMSUNG Cellular CDMA Phone (Model: SCH-570) Test Report S/N: 22.990708415.A3LFCC Part 22 Test Date(s): July 12-16, 1999Certification © 1999 PCTEST Lab FCC ID: A3LSCH570 (Tx 824-849MHz) NVLAP Lab Code: 100431-0 SAMSUNG Cellular CDMA Phone (Model: SCH-570) Test Report S/N: 22.990708415.A3LFCC Part 22 Test Date(s): July 12-16, 1999Certification © 1999 PCTEST Lab FCC ID: A3LSCH570 (Tx 824-849MHz) NVLAP Lab Code: 100431-0 SAMSUNG Cellular CDMA Phone (Model: SCH-570) Test Report S/N: 22.990708415.A3LFCC Part 22 Test Date(s): July 12-16, 1999Certification © 1999 PCTEST Lab FCC ID: A3LSCH570 (Tx 824-849MHz) NVLAP Lab Code: 100431-0 SAMSUNG Cellular CDMA Phone (Model: SCH-570) Test Report S/N: 22.990708415.A3LFCC Part 22 Test Date(s): July 12-16, 1999Certification © 1999 PCTEST Lab FCC ID: A3LSCH570 (Tx 824-849MHz) NVLAP Lab Code: 100431-0 SAMSUNG Cellular CDMA Phone (Model: SCH-570)

© 1999 PCTEST Lab FCC ID SAMPLE LABEL & LOCATION LABELLING REQUIREMENTS PER §§ 2.925 The Label shown shall be permanently affixed at a conspicuous location on the device and be readily visible to the user at the time of purchase. Fig 12. Sample label (SEE NEXT PAGE) PORTABLE CDMA PHONE MODEL NO: SCH-570 SERIAL NO.: FCC ID: A3LSCH570 I I MADE IN KOREA 1

Test Report S/N: 22.990708415.A3LFCC Part 22 Test Date(s): July 12-16, 1999Certification © 1999 PCTEST Lab FCC ID: A3LSCH570 (Tx 824-849MHz) NVLAP Lab Code: 100431-0 SAMSUNG Cellular CDMA Phone (Model: SCH-570) Test Report S/N: 22.990708415.A3LFCC Part 22 Test Date(s): July 12-16, 1999Certification © 1999 PCTEST Lab FCC ID: A3LSCH570 (Tx 824-849MHz) NVLAP Lab Code: 100431-0 SAMSUNG Cellular CDMA Phone (Model: SCH-570) Test Report S/N: 22.990708415.A3LFCC Part 22 Test Date(s): July 12-16, 1999Certification © 1999 PCTEST Lab FCC ID: A3LSCH570 (Tx 824-849MHz) NVLAP Lab Code: 100431-0 SAMSUNG Cellular CDMA Phone (Model: SCH-570) Test Report S/N: 22.990708415.A3LFCC Part 22 Test Date(s): July 12-16, 1999Certification © 1999 PCTEST Lab FCC ID: A3LSCH570 (Tx 824-849MHz) NVLAP Lab Code: 100431-0 SAMSUNG Cellular CDMA Phone (Model: SCH-570) Test Report S/N: 22.990708415.A3LFCC Part 22 Test Date(s): July 12-16, 1999Certification © 1999 PCTEST Lab FCC ID: A3LSCH570 (Tx 824-849MHz) NVLAP Lab Code: 100431-0 SAMSUNG Cellular CDMA Phone (Model: SCH-570) Test Report S/N: 22.990708415.A3LFCC Part 22 Test Date(s): July 12-16, 1999Certification © 1999 PCTEST Lab FCC ID: A3LSCH570 (Tx 824-849MHz) NVLAP Lab Code: 100431-0 SAMSUNG Cellular CDMA Phone (Model: SCH-570) Test Report S/N: 22.990708415.A3LFCC Part 22 Test Date(s): July 12-16, 1999Certification © 1999 PCTEST Lab FCC ID: A3LSCH570 (Tx 824-849MHz) NVLAP Lab Code: 100431-0 SAMSUNG Cellular CDMA Phone (Model: SCH-570) Test Report S/N: 22.990708415.A3LFCC Part 22 Test Date(s): July 12-16, 1999Certification © 1999 PCTEST Lab FCC ID: A3LSCH570 (Tx 824-849MHz) NVLAP Lab Code: 100431-0 SAMSUNG Cellular CDMA Phone (Model: SCH-570)

1.SPECIFICATION 1.GENERAL FreqencyRange Transmitter Receiver 824.64~848.37MHz 869.64~893.37MHz ChannelSpacing1.23MHz NumberofChannels20FA DuplexSpacing45MHz Frequ encyStabilit y ¡¾ 300Hz OperatingTemperature-20 ¡É ~+50 ¡É (-4~+122 ¢μ ) OperatingVolt age HHP 3.6VDC( ¡¾ 10%) SizeandWeight Includ ingstandardbattery Includ ingextend ed-lifebattery 108x46x25mm(standard), 108x46x29mm(extend ed) 128g 143g OperatingTime StandbyTime (Slotmode2) TalkTime 50~70hours (withstandardbattery) 60~90hours (withextend ed-lifebattery) 120min (withstandardbattery) 150min (withextend ed-lifebattery) WaveformQualityabove0.944 TimeReferencewithin ¡¾ 1us RxSensitivityand DynamicRange -104dBm, FER=within0.5% -104dBm~-25dBm,FER=within0.5% TxOutputPowerMaximum430mW TxFrequencyDeviationwithin ¡¾ 300Hz OccupiedBandWidth1.32MHz TxConductedSpuriousEmission900KHz:below-42dBc/30KHz 1.98MHz:below-54dBc/30KHz MinimumTxPowerControlbelow-50dBm OpenLoopPowerControl-25dBm: -57.0dBm~-38.5dBm -65dBm: -17.5dBm~+1.5dBm -104dBm:+18.0dBm~+30.0dBm StandbyOutputPowerbelow-61dBm ColsedLoopTxPowerControlRangeTest1:above ¡¾ 24dB Test2:0ms~2.5ms Test3:above ¡¾ 24dB Test4:above ¡¾ 24dB Test5:above ¡¾ 24dB 2.FREQENCYRANGE TransmitterFrequency FANO.CHNO.CenterFrequency 11011824.64MHz 229825.87MHz 370827.10MHz 4111828.33MHz 5152829.56MHz 6193830.79MHz 7234832.02MHz 8275833.25MHz 9316834.48MHz 10363835.89MHz 11404837.12MHz 12445838.35MHz 13486839.58MHz 14527840.81MHz 15568842.04MHz 16609843.27MHz 17650844.27MHz 18697845.91MHz 19738847.14MHz 20779848.37MHz ReceiverFrequency FANO.CHNO.CenterFrequency 11011869.64MHz 229870.87MHz 370872.10MHz 4111873.33MHz 5152874.56MHz 6193875.79MHz 7234877.02MHz 8275878.25MHz 9316879.58MHz 10363880.89MHz 11404882.12MHz 12445883.35MHz 13486884.58MHz 14527885.81MHz 15568887.04MHz 16609888.27MHz 17650889.27MHz 18697890.91MHz 19738892.14MHz 20779893.37MHz 6.Descr iptionofFre quencyStabili zation Circ uit,Suppre ssionofSpuriousRadiation Fre quencySynthesizerCirc uit TheFrequencysynthesizerisanindirectfrequencysynthesizerPLL(PhasedLockedLoop).Itconsistsofa VCTCXO(U343),PLLIC(U342,U402), VCO(U341),andloopfilter. VCTCXO TheVCTCXOisareferencesourceofthefrequencysynthesizer.Itprovides19.68MHzreferencefrequencyto PLL.TheVCTCXOisaVoltageControlledTemperatureCompensatedCrystalOscillatorhaving19.68MHz 2.5 ppmfrequencystabilityoverallusefultemperaturerange. Acorrectfrequencytuningismadebythecontrol voltage. VCO TheVCO(U341)generatesthesignalhaving966 12.5MHzcenterfrequencywiththevoltagecontrol. PLLIC controlsthissignal. PLLIC ThePLLIC(U342,U402)includesprescalersandchargepump.ThereferencedividerinPLLICdividesthe frequencyofVCTCXOby19.68MHzandmakesreferencefrequency10KHz.Thisreferencefrequencyissupplied tooneoftheinputofphasedetector.ThesignalgeneratedatVCOgoesintoanotherinputstageofthephase detectorthroughaprescalerandthemaindivider.Atthispoint,theerrorproportionaltothephasedifferenceof twoinputsisoccurred.ThiserrorsignalissuppliedtothefrequencycontrolinputstageofVCOthroughtheloop filterconsistedRC. SpuriousRadiationSuppre ssionCirc uit Thespurioussignalfromantennaissuppressedattheduplexer.Theduplexerhasaflatcharacteristicstothe receivesignalandahighattenuationcharacteristicstotheharmonicsignaloftransmission.Soitsuppressthe spuriousradiation Table:Thecharacteristicofduplexerfilter(F301) ParameterValue TX CenterFrequency836.5MHz(FT) BandwidthFT 12.5MHz InsertionLossatBW+10 ~+35 2.6dBMax -30 ~+85 2.8dBMax VSWRatBW1.7Max Inputpower2WMax Attenuation absolutevalue relativevalue 869~894MHz 43dBMin 1648~1698MHz27dBMin 2472~2547MHz30dBMin RippleatBW1.9dBMax RX CenterFrequency881.5MHz(FR) BandwidthFR 12.5MHz InsertionLossatBW3.7dBMax VSWRatBW1.8Max Inputpower1WMax Attenuation absolutevalue relativevalue 824~849MHz50dBMin 914~939MHz10dBMin 959~984MHz30dBMin RippleatBW1.3dBMax

9.PARTSLIST SEC-CODEB'DPARTNO.DESCRIPTION 0401-001052D101DIODE-SWITCHING 0401-001052D109DIODE-SWITCHING 0405-000107D401,D402,D403,D404DIODE-VARACTOR 0407-000102D481,D107,D108DIODE-ARRAY 0407-000115D103,D105,D106DIODE-ARRAY 0407-000122D102,D104DIODE-ARRAY 0409-000108D301DIODE-PIN 0501-000162Q116,Q452,Q450TR-SMALLSIGNAL 0501-000218Q108,Q114,Q102TR-SMALLSIGNAL 0501-000218Q301TR-SMALLSIGNAL 0501-000218Q451TR-SMALLSIGNAL 0501-000457Q113,Q115TR-SMALLSIGNAL 0501-000689Q304TR-SMALLSIGNAL 0501-002063Q303TR-SMALLSIGNAL 0501-002208Q109TR-SMALLSIGNAL 0504-000167Q482,Q481,Q119TR-DIGITAL 0504-000168Q103,Q121TR-DIGITAL 0504-000172Q111,Q120TR-DIGITAL 0504-001016Q485TR-DIGITAL 0505-001062U301FET-GAAS 0505-001095U106FET-SILICON 0505-001119Q302FET-SILICON 0505-001165U104FET-SILICON 0505-001170U484FET-SILICON 0601-000355D116LED 0801-002192U105IC-CMOSLOGIC 0803-003010U114IC-TTL 1001-001019U481IC-ANALOGMULTIPLEX 1103-001062U102IC-EEPROM 1106-001126U702IC-SRAM 1107-001062U701IC-FLASHMEMORY 1201-000103U111IC-AUDIOAMP 1201-001006U463,U462IC-OPAMP 1201-001090U385IC-PREAMP 1201-001175U464IC-PREAMP 1201-001176U461IC-PREAMP 1201-001257U302IC-AGCAMP 1201-001259U467IC-POWERAMP SEC-CODEB'DPARTNO.DESCRIPTION 1202-000192U118IC-VOLFAGECOMP. 1203-000392UX101IC-RESET 1203-001107U482IC-VOLTAGEREGULATOR 1203-001256U382IC-VOLTAGEREGULATOR 1203-001268U124IC-VOLTAGEREGULATOR 1203-001285U483IC-SWITCHVOL.REG. 1203-001390U122IC-VOLTAGEREGULATOR 1203-001396U123IC-PWMCONTROLLER 1204-001106U117IC-ASP 1205-001253U460IC-MIXER 1205-001383U101IC-DATACOMM./GEN. 1205-001451U401IC-DATACOMM./GEN. 1209-000142U342IC-SYNTHESIZER 1209-001078U402IC-PLL/SYNTHESISER 1404-001040R498THERMISTOR-NTC10Kohm,5% 2007-000070L450R-CHIP0ohm,5% 2007-000137R417,R130R-CHIP2Kohm,5% 2007-000138R154R-CHIP100ohm,5% 2007-000140R109R-CHIP1Kohm,5% 2007-000140R205,R188,R132,R147R-CHIP1Kohm,5% 2007-000140R209,R156,R158,R192R-CHIP1Kohm,5% 2007-000140R345,R451,R416,R346R-CHIP1Kohm,5% 2007-000141R128,R303R-CHIP2.2Kohm,5% 2007-000142R456R-CHIP2.7Kohm,5% 2007-000142R486,R141R-CHIP2.7Kohm,5% 2007-000143R140R-CHIP4.7Kohm,5% 2007-000143R145,R129,R466R-CHIP4.7Kohm,5% 2007-000143R173,R176,R152R-CHIP4.7Kohm,5% 2007-000143R411R-CHIP4.7Kohm,5% 2007-000146R455R-CHIP6.8Kohm,5% 2007-000148R143,R174,R157,R159R-CHIP10Kohm,5% 2007-000148R180,R182,R137R-CHIP10Kohm,5% 2007-000148R184,R185,R178,R144R-CHIP10Kohm,5% 2007-000148R305,R406,R407R-CHIP10Kohm,5% 2007-000148R413,R415,R485,R460R-CHIP10Kohm,5% 2007-000148R414,R337R-CHIP10Kohm,5% 2007-000148R496,R462,R464,R473R-CHIP10Kohm,5% 2007-000148R701,R702R-CHIP10Kohm,5% 2007-000148U485R-CHIP10Kohm,5% SEC-CODEB'DPARTNO.DESCRIPTION 2007-000149R103,U704R-CHIP12Kohm,5% 2007-000149R104R-CHIP12Kohm,5% 2007-000151R208,R307R-CHIP15Kohm,5% 2007-000152R133,R134R-CHIP20Kohm,5% 2007-000153R106,R474R-CHIP22Kohm,5% 2007-000153R181,R131,R119,R189R-CHIP22Kohm,5% 2007-000155R170,R136,R149R-CHIP27Kohm,5% 2007-000155R463,R251,R252R-CHIP27Kohm,5% 2007-000157R139R-CHIP47Kohm,5% 2007-000157R349R-CHIP47Kohm,5% 2007-000157R483,R484,R481,R482R-CHIP47Kohm,5% 2007-000159R148R-CHIP56Kohm,5% 2007-000161R166R-CHIP82Kohm,5% 2007-000162R110,R108,R105R-CHIP100Kohm,5% 2007-000162R112,R123,R118R-CHIP100Kohm,5% 2007-000162R120,R107,R111R-CHIP100Kohm,5% 2007-000162R151,R171R-CHIP100Kohm,5% 2007-000162R153,R116,R122R-CHIP100Kohm,5% 2007-000164R114R-CHIP150Kohm,5% 2007-000171R165,C155R-CHIP0ohm,5% 2007-000171R183R-CHIP0ohm,5% 2007-000171R215,R216R-CHIP0ohm,5% 2007-000171R364,R204R-CHIP0ohm,5% 2007-000171R408,R409,C318R-CHIP0ohm,5% 2007-000171R418,R316R-CHIP0ohm,5% 2007-000171R422,R423,C444,C445R-CHIP0ohm,5% 2007-000171R425,LX101,RX201R-CHIP0ohm,5% 2007-000172R306,R356,R350R-CHIP10ohm,5% 2007-000172R344R-CHIP10ohm,5% 2007-000172R348,R401,R341R-CHIP10ohm,5% 2007-000172R419,R339,R347R-CHIP10ohm,5% 2007-000173R468R-CHIP22ohm,5% 2007-000772R121R-CHIP33Kohm,1% 2007-000831R177,R135R-CHIP39Kohm,5% 2007-000932R127,R155R-CHIP470ohm,5% 2007-000932R301R-CHIP470ohm,5% 2007-000982R453,R454,R476,R362R-CHIP5.6Kohm,5% 2007-001119R355R-CHIP680ohm,5% 2007-001217R186,R187R-CHIP82ohm,5% SEC-CODEB'DPARTNO.DESCRIPTION 2007-001244R102R-CHIP91Kohm,5% 2007-001244R175R-CHIP91Kohm,5% 2007-001288R360R-CHIP18ohm,5% 2007-001294R191,R193,R194,R336R-CHIP36ohm,5% 2007-001295R304R-CHIP39ohm,5% 2007-001305R467,R469R-CHIP120ohm,5% 2007-001306R361,R358,R309,R310R-CHIP150ohm,5% 2007-001307R217R-CHIP180ohm,5% 2007-001311R308R-CHIP270ohm,5% 2007-001311R357R-CHIP270ohm,5% 2007-001313RX501,RX504R-CHIP330ohm,5% 2007-001313RX502,RX503,RX102R-CHIP330ohm,5% 2007-001319R490,RX101R-CHIP1.2Kohm,5% 2007-001319RX103R-CHIP1.2Kohm,5% 2007-001320R410R-CHIP1.8Kohm,5% 2007-001323R475R-CHIP3Kohm,5% 2007-001325R190R-CHIP3.3Kohm,5% 2007-001333R335R-CHIP18Kohm,5% 2007-002797R452R-CHIP560ohm,5% 2007-002965R313R-CHIP15ohm,5% 2007-007001R160,R161,R179R-CHIP3.9Kohm,5% 2007-007131R488R-CHIP13Kohm,1% 2007-007132R489R-CHIP15Kohm,1% 2007-007133R404R-CHIP300ohm,1% 2007-007480R101R-CHIP130Kohm,1% 2203-000138R363C-CERAMIC,CHIP1.5nF,10% 2203-000233C185,C145,C345,C370C-CERAMIC,CHIP100pF,5% 2203-000233C347,C359,C306,C307C-CERAMIC,CHIP100pF,5% 2203-000233C348,CX102,C309,C501C-CERAMIC,CHIP100pF,5% 2203-000233C360-C362,C331,C334C-CERAMIC,CHIP100pF,5% 2203-000233C411,C451,C417C-CERAMIC,CHIP100pF,5% 2203-000233C491,C493,CX501,CX502C-CERAMIC,CHIP100pF,5% 2203-000233CX503,CX504,C4X1C-CERAMIC,CHIP100pF,5% 2203-000254C100,C179,C177,C169C-CERAMIC,CHIP10nF,10% 2203-000254C121C-CERAMIC,CHIP10nF,10% 2203-000254C126,C461C-CERAMIC,CHIP10nF,10% 2203-000254C152,CX101,C102C-CERAMIC,CHIP10nF,10% 2203-000254C171,C175,C112C-CERAMIC,CHIP10nF,10% 2203-000254C308,C388C-CERAMIC,CHIP10nF,10% SEC-CODEB'DPARTNO.DESCRIPTION 2203-000254C326,C110,C403C-CERAMIC,CHIP10nF,10% 2203-000254C343,C481,C487,C486C-CERAMIC,CHIP10nF,10% 2203-000254C354,C355,C356,C358C-CERAMIC,CHIP10nF,10% 2203-000254C371,C429C-CERAMIC,CHIP10nF,10% 2203-000254C381,C386,C333,C394C-CERAMIC,CHIP10nF,10% 2203-000254C435,C433,C431,C452C-CERAMIC,CHIP10nF,10% 2203-000254C441,C425,C423,C437C-CERAMIC,CHIP10nF,10% 2203-000254C443…

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3.NAMPROGRAMMING NAMfeaturescanbeprogrammedasfollows: Notes: -IfyouentertheNAMprogrammode,eachitemshowsthecurrenlystoreddata.Gotothenextitemby pressingSTO. -Youcanmodifythedatabyenteringanewdata. -Ifyouenterawrongdigit,pressCLRtodeletethelastdigit.PressandholdCLRtodeletealldigits. -Toscrollitemsbackwardsorforwards,presstheVOLUMEbuttonontheleftsideofthephone. Gener alSetup LCDDisplay Keyin Function 47*869#08#9 47*869#08#9 -selectNAMprogramming NAMprogram 1 -choose'GENERAL' 1:General 2:SetupNAM1 ESN Volume -ElectronicSerialNumberofthephone B0000000 CAIversion Volume ¡ã -TheversionofCommonAirInterfacesupported 2 bythemobile SCM Volume ¡ã -StationClassMarkdisplaysthepowerclass(bit0~1), 00101010 transmission(bit2),slottedclass(bit5),dualmode(bit6). LockCode (0000) -Lockcode,currentstatusisdisplayed 0000 4-digitcode tochange,enternewcode. STO -storesit SlotMode -Slotmode. 'Yes'indicatestheslotmode. Yes *or# changesthestatus. STO -storesit. SlotIndex -Slotmodeindex.Thehigher,thelongersleepingtime 2 0-7 tochange,enternewone. STO -storesit. PrefNAM1... -PreferredsystemselectionforNAM1 Digitalonly STO changesthesystem. -storesit. PrefNAM2... -PreferredsystemselectionforNAM2 Digitalonly STO changesthesystem. -storesit. LCDDisplay Keyin Function PrefNAM3...-PreferredsystemselectionforNAM3 DigitalonlySTOchangesthesystem. -storesit. PrefNAM4...-PreferredsystemselectionforNAM4 DigitalonlySTOchangesthesystem. -storesit. SettingUpNAM1 LCDDisplayKeyinFunction NAMProgram2-Choose'SetupNAM1.' 1:General 2:SetupNAM1 IMSI_MCC-IMSIMobleCountryCode,currentcodeisdisplayed. 454numbertochange,enternewone. STO-storesit. IMSI_MNC-IMSIMobileNetworkCode,currentcodeisdisplayed. 05numbertochange,enternewone. STO-storesit. CDMATELNO.-CDMAcurrentnumberisdisplayed. 85200000000phonenumbertochange,enternewone. STO-storesit. CDMApref..-Preferredsystemselection,currentsystemisdisplayed. Apref*or#changesthesystem. STO-storesit. CDMAACCOLC-CDMAAccessOverloadClass,currentstatusisdisplayed. 0classnumbertochange,enternewone. STO-storesit. PchnSysA-PreferredchannelcurrentlyusedundersystemA 283channelnumbertochange,enternewone. STO-storesit. PchnSysB-PreferredchannelcurrentlyusedundersystemB 384channelnumbertochange,enternewone. STO-storesit. SchnSysA-SecondchannelcurrentlyusedundersystemA 691channelnumbertochange,enternewone. STO-storesit. SchnSysB-SecondchannelcurrentlyusedundersystemB 777channelnumbertochange,enternewone. STO-storesit. CDAcqSID1-1stAcquisitionsystemID,currentstatusisdisplayed. 0IDnumber1~6tochange,enternewone. STO-storesit. CDlockSID1-1stlocksystemID,currentstatusisdisplayed. 10640IDnumbertochange,enternewone. STO-storesit. CDMAHomeSID-CDMAHomesystemID,currentstatusisdisplayed Yes*or#changesthestatus. STO-storesit. LCDDisplayKeyinFunction CDMAfSID-CDMAforeignSID,currentstatusisdisplayed. Yes*or#changesthesystem. STO-storesit. CDMAfNID-CDMAforeignNID,currentstatusisdisplayed. Yes*or#changesthesystem. STO-storesit. SID#1-firstSIDwritteninthelist,currentstatusisdisplayed. 10641numbertochange,enternewone. STO-storesit. NID#1-firstNIDwritteninthelist,currentstatusisdisplayed. 65835numbertochange,enternewone. STO-storesit. SID#2-2ndSIDwritteninthelist,currentstatusisdisplayed. 13numbertochange,enternewone. STO-storesit. NID#2-2ndNIDwritteninthelist,currentstatusisdisplayed 0numbertochange,enternewone. STO-storesit. SID#3-3rdSIDwritteninthelist,currentstatusisdisplayed. 0numbertochange,enternewone. STO-storesit. NID#3-3rdSIDwritteninthelist,currentstatusisdisplayed. 0numbertochange,enternewone. STO-storesit. SID#4-4thSIDwritteninthelist,currentstatusisdisplayed. 0numbertochange,enternewone. STO-storesit. NID#4-4thNIDwritteninthelist,currentstatusisdisplayed. 0numbertochange,enternewone. STO-storesit. SettingUpNAM2 LCDDisplayKeyinFunction NAMProgram3-Choose'SetupNAM2' 1:General 2:SetupNAM1 TheNAM2setupprogramisthesameas'NAM1'. SettingUpNAM3 LCDDisplayKeyinFunction NAMProgram4-Choose'SetupNAM3'. 3:SetupNAM2 4:SetupNAM3 TheNAM3setupprogramisthesameas'NAM1'. SettingUpNAM4 LCDDisplayKeyinFunction NAMProgram5-Choose'SetupNAM4' 5:SetupNAM4 TheNAM4setupprogramisthesameas'NAM1'. 4.Troubleshooting LogicSection NoPower PressPWRbutton U124pin3input=4V? END U123pin2=3.6V? U124pin5output=3.3V? U122pin4output=3.3V? Checkthesignalpathfromthebattery terminaltoU123pin2. CheckU123anditsneighboringcircuits CheckU124anditsneighboringcircuits CheckU122anditsneighboringcircuits Y Y Y Y N N N N Abnormalinitialoperation (Normal+3.3Vvoltagesource) CHIPX8CLKsignalouput fromU401pin52? PressPWRbutton. TCXOCLK appliedtoU401pin26? TCXO/4CLKsignaloutput fromU401pin29? RAM-CSsignalouput fromU101pin92? LEDon? Normalinitial displayonLCD? END CheckU101pins93-96,98-105,107-117, 119-126and128-132.Replaceifrequired. CheckTCXOoutput,R401,andC403. Replaceifrequired. CheckU401anditsneighboring circuits.Replaceifrequired Check'H'levelinputfrom U101pin59andU401pin79. ChecktheLEDanditsneighboring circuits.Replaceifrequired. ChecktheLCDpinsanditsneighboring circuits.Replaceifrequired. Y Y Y Y Y Y N N N N N N AbnormalBacklightOperation 'H'level fromU101pin60driveQ114 throughR189? Pressanybuttononthephone BacklightLEDon 'H'levelouputfrom U101pin60? NormalQ115operation? Thevoltage appliedtoLCD(M101) pins28,29? CheckR188,R189,andQ114. Replaceifrequired CheckU101pin60.Replaceifrequired. CheckR190,R191,R193,R194and Q115.Replaceifrequired ResolderR186andR187. Y Y Y Y N N N N AbnormalKeyDataInput Checkinitialstatus Scanningsignals ouputfromU101pins159, 160,163-167? ResolderU101 pins170,172,and173 NormalKeydatainput? END ResolderCON100. ResolderU101pins159,160, and163-167. ReplacetheKeypadassembly. Y Y Y N N AbnormalKeytone Abnormalkeytone END CLKwaveformoutput fromU101pin49? Normalkeytone? CLKwaveformapplied toJ101pins11, and14? CheckU111,C132,andC133. Replaceifrequired. CheckU101pin49.Replaceifrequired. ReplacetheKeypadassembly. Y Y Y N N N CLKwaveform appliedtoU111pin2? ResolderC141,C142,C146. Y N AbnormalAlertTone AbnormalKeytone CLKwaveformapplied toCON100pin24? Checktheb…

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© 1999 PCTEST Engineering Lab., Inc. PCTEST Engineering Laboratory, Inc. 6660-B 6660-B DobbinDobbin Road Road •• Columbia, MD 21045 Columbia, MD 21045 •• U.S.A. U.S.A. TEL (410) 290-6652 TEL (410) 290-6652 •• FAX (410) 290-6654 FAX (410) 290-6654 http://www.pctestlab.comhttp://www.pctestlab.com CERTIFICATE OF COMPLIANCE (SAR EVALUATION) Samsung Electronics Co., Ltd.Dates of Tests: July 12-16, 1999 146 Maetun-3 Dong, Paldal-Ku,Test Report S/N: 22.990708416.A3L Suwon City, Kyungki-Do, KOREA 441-742Test Site: PCTEST Lab, Columbia MD Attention: Ben Kim, Engineering Manager Samsung Electronics America (QA Lab) FCC ID A3LSCH570 APPLICANT SAMSUNG ELECTRONICS CO., LTD. EUT Type:Single-Mode Cellular CDMA Phone Tx Frequency:824.64 – 848.37 MHz Rx. Frequency:869.64 – 893.37 MHz Max Output Power:0.43 W ERP Trade Name/Model(s):SAMSUNG SCH-570 FCC Classification:Non-Broadcast Transmitter Held to Ear (TNE) Application Type:Certification Serial Number:n/a (pre production) FCC Rule Part(s):2.1093; ET Docket 96.326; 22(H) This wireless portable device has been shown to be capable of compliance for localized specific absorption rate (SAR) for uncontrolled environment/general population exposure limits specified in ANSI/IEEE Std. C95.1-1992 and had been tested in accordance with the measurement procedures specified in ANSI/IEEE Std. C95.3-1992. (See Test Report). I attest to the accuracy of data. All measurements reported herein were performed by me or were made under my supervision and are correct to the best of my knowledge and belief. I assume full responsibility for the completeness of these measurements and vouch for the qualifications of all persons taking them. NVLAP accreditation does not constitute any product endorsement by NVLAP or any agency of the United States Government. PCTEST certifies that no party to this application has been denied the FCC benefits pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C. 853(a) 990708416.A3L SAR Measurement ReportFCC Part 22 Certification © 1999 PCTEST Labi Table of Contents SCOPE 1 INTRODUCTION / SAR DEFINITION 2 SAR MEASUREMENT SET-UP 3 E-FIELD PROBE SYSTEM 4 E-FIELD PROBE CALIBRATION PROCESS 5 DATA EXTRAPOLATION 6 PHANTOM, HOLDER & BRAIN EQUIVALENT TISSUE 7 SYSTEM SPECIFICATIONS 8 MEASUREMENT PROCESS 9 TEST POSITION OF THE PHONE 10 ANSI/IEEE C95.1 RF EXPOSURE LIMITS 11 MEASUREMENT UNCERTAINTIES 12 TEST DATA SUMMARY 13 SAR TEST EQUIPMENT LIST 14 CONCLUSION 15 REFERENCES 16 APPENDIX A – PROBE CALIBRATION DATA17 APPENDIX B – DIPOLE VALIDATION DATA18 Test Report S/N: SAR.990708416.A3LSAR Measurement Report Test Dates: July 12-16, 1999FCC Part 22 Certification FCC ID: A3LSCH570 (Tx 824-849 MHz) © 1999 PCTEST LabSAMSUNG Single-Mode Cellular CDMA Phone1 SAR MEASUREMENT REPORT Scope - Environmental evaluation measurements of specific absorption rate 1 (SAR) distributions in simulated human head tissues exposed to radiofrequency (RF) radiation from wireless portable devices for compliance with the rules and regulations of the U.S. Federal Communications Commission (FCC). 2 Applicant Name:SAMSUNG ELECTRONICS CO., LTD. Address:146 Maetun-3 Dong, Paldal-Ku, Suwon City, Kyungki-Do, KOREA 441-742 Attention:Ben Kim, Engineering Manager Samsung Electronics America (QA Lab) • EUT Type:Single-Mode Cellular CDMA Phone • Trade Name:SAMSUNG • Model(s):SCH-570 • FCC IDENTIFIER:A3LSCH570 • S/N:Pre-production • Tx Frequency:824.64 – 848.37 MHz • Rx Frequency:869.64 – 893.37 MHz • Application Type: Certification • FCC Classification:Non-Broadcast Transmitter Held to Ear (TNE) • FCC Rule Part(s):§ 2.1093, Docket 96-326; § 22(H) • Modulation(s):CDMA • Max. RF Output Power:0.43 W ERP • Antenna:Helical (λ/2) • Antenna Dimensions:11.1 cm. (Length) • Date(s) of Tests:July 12-16, 1999 • Place of Tests:PCTEST Engineering Lab. Columbia, MD, U.S.A. • Report Serial No.:SAR.990708416.A3L 1 Specific Abso…

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