A3LSCWR5000PCS CDMA WLL Terminal (Wireless Local Loop)

Nov.02, 1998 Federal Communications Commission Authorization and Evaluation Division Equipment Authorization Branch 7435 Oakland Mills Road Columbia, MD 21046 In re: Samsung Electronics Co., Ltd. FCC ID.: A3LSCWR5000 Wireless Local Loop Terminal (CDMA) Request for Confidentiality To whom it may concern: In accordance with 0.459 of CFR 47, Samsung Electronics Co., Ltd. Requests confidentiality of the Block Diagram/Schematics/Circuit Description Attachments in the attached test report. These documents contains detailed system and equipment description and related information about the product which Samsung Electronics Co., Ltd. considers to be proprietary, confidential, and a custom design and otherwise, would not release to the general public. Since this design is a basis from which future technological products will evolve, Samsung feels that this information would be of benefit to its competitors, and that the disclosure of the information in these documents would give our competitors an unfair advantage in the market. Sincerely, Ben Kim Engineering Manager

November 03, 1998 Federal Communications Commission Equipment Approval Services 7435 Oakland Mills Road Columbia, MD 21046 SUBJECT:SAMSUNG Electronics Co., Ltd. FCC ID: A3LSCWR5000 Part 24 Certification Gentlemen: Attached herewith, on behalf of SAMSUNG Electronics Co., Ltd., is an application for Part 24 Certification of the following PCS CDMA WLL Terminal (Wireless Local Loop): FCC ID:A3LSCWR5000 TRADE / MODEL(s):SAMSUNG SCW-R5000 EUT TYPE:PCS CDMA WLL Terminal (Wireless Local Loop) Tx Freq. Range:1851.25 – 1908.75 MHz Max. Output Power:0.2 Watts Attached is the Letter of Authorization, Confidentiality Request, measurement report data and plots, FCC ID label and location, test setup photographs, internal and external photographs, block diagram (confidential), schematic diagrams & circuit description (confidential), operational description, parts list & tune-up procedure, and the user's manual. Should you have any questions or comments concerning the above, please contact the undersigned. cc:Mr. Ben Kim, Engineering Manager American QA Lab SAMSUNG Electronics America

Test Report S/N: 24.980930677.A3L FCC Part 24 Test Date(s): October 19-23, 1998Certification © 1998 PCTEST LabFCC ID: A3LSCWR5000 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 24.980930677.A3L FCC Part 24 Test Date(s): October 19-23, 1998Certification © 1998 PCTEST LabFCC ID: A3LSCWR5000 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 24.980930677.A3L FCC Part 24 Test Date(s): October 19-23, 1998Certification © 1998 PCTEST LabFCC ID: A3LSCWR5000 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 24.980930677.A3L FCC Part 24 Test Date(s): October 19-23, 1998Certification © 1998 PCTEST LabFCC ID: A3LSCWR5000 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 24.980930677.A3L FCC Part 24 Test Date(s): October 19-23, 1998Certification © 1998 PCTEST LabFCC ID: A3LSCWR5000 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 24.980930677.A3L FCC Part 24 Test Date(s): October 19-23, 1998Certification © 1998 PCTEST LabFCC ID: A3LSCWR5000 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 24.980930677.A3L FCC Part 24 Test Date(s): October 19-23, 1998Certification © 1998 PCTEST LabFCC ID: A3LSCWR5000 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 24.980930677.A3L FCC Part 24 Test Date(s): October 19-23, 1998Certification © 1998 PCTEST LabFCC ID: A3LSCWR5000 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd.

© 1998 PCTEST Engineering Lab., Inc. PCTEST Engineering Laboratory, Inc. 6660-B 6660-B DobbinDobbin Road Road •• Columbia, MD 21045 Columbia, MD 21045 •• U.S.A. U.S.A. TEL (410) 290-6652 TEL (410) 290-6652 •• FAX (410) 290-6654 FAX (410) 290-6654 http://www.pctestlab.comhttp://www.pctestlab.com CERTIFICATE OF COMPLIANCE (Part 24 Certification) SAMSUNG ELECTRONICS CO., LTD.Dates of Tests: October 19-23, 1998 416 Maetan-3 Dong, Paldal-KuTest Report S/N: 24.980930677.A3L Suwon City Kyungki-Do 441-742, KOREATest Site: PCTEST Lab, Columbia MD U.S.A. Attn: D. H. KIM, General Manager FCC ID A3LSCWR5000 APPLICANT SAMSUNG ELECTRONICS CO., LTD. Classification:Licensed Base Station for Part 24 (PCB) FCC Rule Part(s):§§§§24(E), 2.983, 2.987 EUT Type:PCS CDMA WLL Terminal (Wireless Local Loop) Trade Name/Model(s):SAMSUNG SCW-R5000 Frequency Range:Tx: 1851.25 – 1908.75MHz Rx: 1931.25 – 1988.75MHz Max Output Power:0.2 Watts Frequency Tolerance:0.00025% (2.5 ppm) This equipment has been shown to be capable of compliance with the applicable technical standards as indicated in the measurement report and was tested in accordance with the measurement procedures specified in §2.947 with the following remarks (Note Codes): * (BC) The output power is continuously variable from the value listed in this entry to 5%-10% of the value listed. I attest to the accuracy of data. All measurements reported herein were performed by me or were made under my supervision and are correct to the best of my knowledge and belief. I assume full responsibility for the completeness of these measurements and vouch for the qualifications of all persons taking them. PCTEST certifies that no party to this application has been denied the FCC benefits pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C. 853(a) 980930677.A3L Certification © 1998PCTEST Engineering Laboratory, Inc.FCC Part 24 TABLE OF CONTENTS ATTACHMENT A: COVER LETTER(S) ATTACHMENT B: ATTESTATION STATEMENT(S) ATTACHMENT C: TEST REPORT SCOPE 1 INTRODUCTION (SITE DESCRIPTION) 2 INSERTS PER §2.983 3 DESCRIPTION OF TESTS 4-6 TEST DATA (RADIATED) 7-9 TEST DATA (FREQUENCY STABILITY) 10-11 PLOTS OF EMISSIONS 12 LIST OF TEST EQUIPMENT 13 SAMPLE CALCULATIONS 14 RECOMMENDATION / CONCLUSION 15 ATTACHMENT D: TEST PLOTS ATTACHMENT E: FCC ID LABEL / LOCATION ATTACHMENT F: TEST SETUP PHOTOGRAPHS ATTACHMENT G: EXTERNAL PHOTOGRAPHS ATTACHMENT H: INTERNAL PHOTOGRAPHS ATTACHMENT I: BLOCK DIAGRAM(S) ATTACHMENT J: SCHEMATIC DIAGRAM(S) ATTACHMENT K: PARTS LIST/TUNE UP PROCEDURE ATTACHMENT L:OPERATIONAL DESCRIPTION ATTACHMENT M:USER’S MANUAL Test Report S/N: 24.980930677.A3LFCC Part 24 Dates of Tests: October 19-23, 1998Certification © 1998 PCTEST LabFCC ID: A3LSCWR5000 (Part 24 – Licensed PCS)1 SAMSUNG PCS CDMA WLL Terminal (Model: SCW-R5000) MEASUREMENT REPORT Scope - Measurement and determination of electromagnetic emissions (EME) of radio frequency devices including intentional and/or unintentional radiators for compliance with the technical rules and regulations of the Federal Communications Commission. §2983(a) General Information Applicant Name:SAMSUNG ELECTRONICS CO., LTD. Address:416 Maetun-3 Dong, Paldal-Ku Suwon City, Kyungki-Do 441-742, KOREA Attention:D. H. KIM, General Manager • §2983(b) FCC ID:A3LSCWR5000 • §2983(c) Quantity:Quantity production is planned • §2.983(d) Emission Designator:1M25F9W • §2.983(d) Maximum Power Rating:0.2 W • Power Supply Charger:85VAC – 265VAC 60Hz Model WBR-1850 • Battery Pack:9.6 VDC 1800mAh Ni-MH Battery Pack • AC Power Adapter:SAMSUNG Model: F5000ADP • FCC Classification:Licensed Base Station for Part 24 (PCB) • Equipment (EUT) Type:PCS CDMA WLL Terminal (Wireless Local Loop) • Modulation:CDMA • Tx Frequency Range: 1851.25 – 1908.75 MHz • Rx Frequency Range:1931.25 – 1988.75 MHz • Frequency Tolerance:± 2.5 ppm • FCC Rule Part(s):§§§ 24, 2.983, 2.987 • Dates of Tests:October 19-23, 1998 • Place of Tests:PCTEST Lab, Columbia, MD U.S.A. 980615425.CKL Test Report S/N: 24.980930677.A3LFCC Part 24 Dates of Tests: October 19-23, 1998Certification © 1998 PCTEST LabFCC ID: A3LSCWR5000 (Part 24 – Licensed PCS)2 SAMSUNG PCS CDMA WLL Terminal (Model: SCW-R5000) 1.1 INTRODUCTION These measurement tests were conducted at PCTEST Engineering Laboratory, Inc. facility in New Concept Business Park, Guilford Industrial Park, Columbia, Maryland. The site address is 6660-B Dobbin Road, Columbia, MD 21045. The test site is one of the highest points in the Columbia area with an elevation of 390 feet above mean sea level. The site coordinates are 39° 11'15" N latitude and 76° 49'38" W longitude. The facility is 1.5 miles North of the FCC laboratory, and the ambient signal and ambient signal strength are approximately equal to those of the FCC laboratory. There are no FM or TV transmitters within 15 miles of the site. The detailed description of the measurement facility was found to be in compliance with the requirements of § 2.948 according to ANSI C63.4 on October 19, 1992. PCTEST Lab is recognized under the National Voluntary Laboratory Accreditation Program for satisfactory compliance with criteria established in Title 15, Part 285 Code of Federal Regulations. These criteria encompass the requirements of ISO/IEC Guide 25 and the relevant requirements of ISO 9002 (ANSI/ASQC Q92-1987) as suppliers of calibration or test results. The Scope of PCTEST Accreditation are for Electromagnetic Compatibility and Telecommunications and FCC. 1.2 PCTEST Location The map at right shows the location of the PCTEST Lab, its proximity to the FCC Lab, the Columbia vicinity area, the Baltimore- Washington International (BWI) airport, and the city of Baltimore, and the Washington, D.C. area. (see Figure1). Figure 1. Map of the Greater Baltimore and Metropolitan Washington, D.C. area. Test Report S/N: 24.980930677.A3LFCC Part 24 Dates of Tests: October 19-23, 1998Certification © 1998 PCTEST LabFCC ID: A3LSCWR5000 (Part 24 – Licensed PCS)3 SAMSUNG PCS CDMA WLL Terminal (Mode…

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Test Report S/N: 24.980930677.A3LFCC Part 24 Test Date(s): October 19-23, 1998Certification © 1998 PCTEST LabFCC ID: A3LSCWR5000 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 24.980930677.A3LFCC Part 24 Test Date(s): October 19-23, 1998Certification © 1998 PCTEST LabFCC ID: A3LSCWR5000 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 24.980930677.A3LFCC Part 24 Test Date(s): October 19-23, 1998Certification © 1998 PCTEST LabFCC ID: A3LSCWR5000 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 24.980930677.A3LFCC Part 24 Test Date(s): October 19-23, 1998Certification © 1998 PCTEST LabFCC ID: A3LSCWR5000 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd.