A3LSECFRPCUSB Flash Drive

This device complies with Part 15 of the FCC Rules. Operation is subject to th e following two conditions: (1)this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. Fcc information to the user This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to Part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates, uses and can radiate radio freq uency energy and, if not installed and used in accordance with the instructions, may cause harmfu l interference to radio communications. However, there is no guarantee that interference will not occu r in a particular installation. If this equipment does cause harmful interference to radio or television reception, whic h can be determined by turning the equipment off and on, the user is encouraged to try to correct the inte rference by one or more of the following measures : - Reorient or relocate the receiving antenna.- Increase the separation betwee n the equipment and receiver. - Connect the equipment into an outlet on a circuit diffe rent from that to which the receiver is connected. - Consult the dealer or experienced radio TV technician for help. CAUTION! Change or modifications not expressly approved by the manufacturer responsible for compliance could void the user's authority to operate the equipment.

20 of 20 Samsung EMC Laboratory Project No: LBE050199 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Picture 7. EUT (Label) SECFRPC_2G D6OVHFIUSF#

1 of 20 Samsung EMC Laboratory Project No: LBE050199 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. EMI Test Report According to FCC Part 15 Subpart B Project No. LBE050199 Equipment under Test Applicant Samsung Electronics Co., Ltd. 416 Maetan 3-Dong, Yeong tong-Gu, Suwon-Si, Gyeonggi-Do, Korea, 443-742 FCC ID A3LSECFRPC Product Name USB Flash Drive Model Name SECFRPC_2G Manufacturer Samsung Electronics Co., Ltd. Date of Test January 28, 2005 ~ February 07, 2005 Issued Date February 17, 2005 Name/Position Signature Tested by Young Hun, Cheong Test Engineer Reviewed by No Cheon, Park Manager of EMC Lab. Authorized by Seung Kyu, Cha Chief of EMC Lab. 1. This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. 2. This test report is to certify that the tested device properly complies with the requirements of FCC Rules and Regulations Part 15 Subpart B Unintentional Radiators. All tests necessary to show compliance to the requirements were and these results met the specifications requirement. This laboratory is registered by the NIST/NVLAP, U.S.A. The test reported herein have been performed in accordance with its terms of registration. 3. Fcc filing Registration Number : 873282 NVLAP LAB CODE 200623-0 2 of 20 Samsung EMC Laboratory Project No: LBE050199 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Table of Contents 1. General Information 1.1 Basic Information related Product 1.2 Detail Information related Product 1.3 Operating mode and condition 1.4 Test System Details 1.5 Equipment Modifications 1.6 Test Procedure 1.7 Test Configuration 1.8 Applied Standard 1.9 Test Facility 2. Summary of Test Results 3. Description of individual tests 3.1 Conducted Emission 3.2 Radiated Emission 4. Appendix 4.1 Test Photography 4.2 EUT Photography 3 of 20 Samsung EMC Laboratory Project No: LBE050199 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1. General Information 1.1 Basic Information related Product Applicant Samsung Electronics Co., Ltd. Model name SECFRPC_2G Applicant Address 416 Maetan 3-Dong, Yeong tong-Gu, Suwon-Si, Gyeonggi-Do, Korea, 443-742 Contact Person Young Hun, Cheong Kind of product USB Flash Drive Variant list 1GB : SECFRPC_1G 512MB : SECFRPC_512 256MB : SECFRPC_256 128MB : SECFRPC_128 64MB : SECFRPC_64 32MB : SECFRPC_32 Manufacturer Samsung Electronics Co., Ltd. New / Alternative / Permissive change Information New 1.2 Detail Information related Product Specification Item Specification Remark USB Flash Drive - Fully compatible with the USB 2.0 High speed Specification , USB-IF certified - USB Specification V1.1 Mass Storage Compliance - USB Bulk Only Mass Storage Support - USB Class Definition for Bootability Support - Interface Speed : up to - High Speed : 480M bps - Full Speed : 12M bps - High Performance : Sequential Read/Write : 15MB/s (Max.) - Storage Capacities : Up to 2GB - Software support : - Password lock - Secure zoning - Auto Sleep Mode - USB Bus Powered (4.75 volt – 5.25 volt) - Suspend ≤ 500uA 4 of 20 Samsung EMC Laboratory Project No: LBE050199 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Operating Frequency Crystal : 12MHz(Ceramic SMD-type) 1.3 Operating Mode and Condition The EUT exercise program used during radiated and conducted testing was designed to exercise the various system components in a manner similar to typical use. So we used windows media player program, It operated read continuously on EUT. Further details of cabling and configuration are shown in the test system configuration. 1.4 Test System Details Refer to 1.2 1.5 Equipment Modifications No equipment modifications were required. 5 of 20 Samsung EMC Laboratory Project No: LBE050199 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.6 Test Procedure 1.6.1 Conducted Emission EUT was placed on a platform nominal size, 1m by 1.5m, raised 80cm above the conducti ng ground plane. The rear of tabletop was located 40cm to the vertical conducting ground plane. The rear of EUT, including peripherals was aligned and flush with rear of tabletop. All other surfaces of tabletop was at least 80cm from any other grounded conducting surface. I/O cables and AC cables that were connected to the peripherals were bundled in center. They were folded back and forth forming a bindle 30cm to 40cm long and were handed at a 40cm height to the ground plane. Each EUT current-carrying power lead, except the ground(safety)lead, were individually connected through a LISN to the input power source. All unused 50 ohm connectors of the LISN were resistively terminated in 50 ohm when not connected to the measuring equipment. Frequency Band [MHz] Instrument Detector Resolution Bandwidth Video Bandwidth Quasi-Peak 9kHz - 0.15 to 30 EMI Receiver Average 9kHz - 1.6.2 Radiated Emission EUT was placed on a platform of nominal size, 1m by 1.5m, raised 80cm above the conducting ground plane. The rear of EUT, including peripherals was aligned and flush with rear of tabletop. I/O cables that were connected to the peripherals were bundle in center. They were folded back and forth forming a bundle 30cm to 40cm long and were hanged 40cm height to the ground plane. Test was made with the antenna positioned in both the horizontal and vertical planes of polarization. The measurement antenna was varied in height above the conducting ground plane and the run table azimuth was varied to obtain the maximum signal strength 6 of 20 Samsung EMC Laboratory Project No: LBE050199 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. The system configuration, clock speed, mode of operation or video resolution, turntable azimuth with respect to the antenn…

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17 of 20 Samsung EMC Laboratory Project No: LBE050199 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 4. Appendix 4.1 Test Photography Picture 1. Conducted Emission (Front) Picture 2. Conducted Emission (Rear) 18 of 20 Samsung EMC Laboratory Project No: LBE050199 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Picture 3. Radiated Emission (Front) Picture 4. Radiated Emission (Rear)