A3LSECSMUSB Flash Drive

This device complies with Part 15 of the FCC Rules. Operation is subject to th e following two conditions: (1)this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. Fcc information to the user This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to Part 15 of the FCC Rules. These limits are designed to provide reasonable protection agai nst harmful interference in a residential installation. This equipment generates, uses and can radiate radio freque ncy energy and, if not installed and used in accordance with the instructions, may cause harmfu l interference to radio communications. However, there is no guarantee that interference will not occu r in a particular installation. If this equipment does cause harmful interference to radio or television reception, whic h can be determined by turning the equipment off and on, the user is encouraged to try to correct the inte rference by one or more of the following measures : - Reorient or relocate the receiving antenna.- Increase the separation betwee n the equipment and receiver. - Connect the equipment into an outlet on a circuit diffe rent from that to which the receiver is connected. - Consult the dealer or experienced radio TV technician for help. CAUTION! Change or modifications not expressly approved by the manufacturer responsible for compliance could void the user's authority to operate the equipment.

Page 15 of 16 Project NO. : LBE040051 5. FCC Label Configuration and Location 5.1 Label Configulation 5.2 Location of FCC Mark This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Model No.: SECSM_1G FCC tested comply with FCC Standards For HOME OR OFFICE USE FCC Trade Mark FCC ID : A3LSECSM Made in Korea

Page 1 of 16 Project NO. : LBE040051 Product :USB Flash Drive Model No. : SECSM_1G FCC ID : A3LSECSM 1. This test reports shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 2. This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. 3. This test report is to certify that the tested device properly complies with the requirements of FCC Rules and Regulations Part 15 Subpart B Unintentional Radiators. All tests necessary to show compliance to the requirements were and these results met the specifications requirement. Date of test :January 12. 2004-January 13.2004 Issued Date :January 14, 2004 Tested by: Jin Hwan, Jung/ Test Engineer Reviewed by: No Cheon, PARK / Manager of EMC Lab. Authorised by: Kyu Baek, CHUNG / Chief of EMC Lab. This laboratory is registered by the NIST/NVLAP, U.S.A. The test reported herein have been performed in accordance with its terms of registration. EMI TEST REPORT According to FCC Part 15 Subpart B/Class B NVLAP Code: 200623- Page 2 of 16 Project NO. : LBE040051 Table of Contents 1. General Information 1.1 Product Description 1.2 Configuration of EUT and peripherals 1.3 Used Cable Description 1.4 System Block Diagram of Test Configuration 1.5 Test Facility 2. System Test Configuration 2.1 Configuration of Radiated and Conducted Interference Measurement 2.2 Operation Environment 2.3 Test Procedure 3. Conducted Emission Test Data 4. Radiated Emission Test Data 5. Label Configuration and Location 6. Test Equipment Used Distribution This test report has been made available as follows: CS Management Center, EMC Laboratory1 original Memory Division1 copy This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Page 3 of 16 Project NO. : LBE040051 1. General Information Applicant :Samsung Electronics Co., Ltd. Device Solution Network, Memory Division Full Address :San #16 Banwol-Ri, Taean-Eup, Hwasung-City Kyungki-Do, Korea, 442-742 Kind of Product :USB Flash Drive FCC ID:A3LSECSM Project Name :- Model & Variant Names : SECSM_1G (Brand Name: Samsung) SECSM_512, SECSM_256, SECSM_128 SECSM_64, SECSM_32, SECSM_16 Product Description : - Compatible with the USB 2.0 Specification - Auto Sleep Mode - USB Specification V1.1 Mass Storage Compliance - Low Vcc Program Inhibit Function - Interface Speed : High Speed : 480Mbps - USB Bus Powered (4.75 V~5.25V) Full Speed : 12 Mbps - Suspend : ≤500uA - Sequential Read/Write : 5MB/s (Max.) - Storage Capacities : 1GB Test Report Produced by :Jin Hwan, Jung/ Test Engineer This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Page 4 of 16 Project NO. : LBE040051 1.1 Product Description 1) Justification The system was configured for testing in typical fashion use. Cable were attached to each of the available I/O Ports. Where applicable, peripherals were attached to the I/O cables. The mode of operation utilized for testing was selected to best simulate typical EUT use. The system was tested with the configuration of clause 1.4. In each test mode, Finally we found worst case emission that is above configuration with the Worst case components(in the above table). So, the DATA of the maximum EUT operation was reported. Further details of cabling and configuration are shown in the test system configuration. 2) Operating Frequency : Crystal : 12MHz(Ceramic SMD-type) 3) Description of Testing operating mode 4) Manufacturer : SAMSUNG Electronics Co., Ltd. This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Operating Mode Operating section of EUT Read MODERead and Execute MODE Write MODE Read and Execute continuously data on EUT Execute MODE Page 5 of 16 Project NO. : LBE040051 1.2 Configuration of EUT and peripherals MarkItemModel No.Serial No.Manufacturer Remark A USB Flash Drive SECSM_1GNoneSamsungEUT B Notebook PC Latitude X200 KR-00P177-36521-22P-0013 DELL- CPrinterLQ-580H C29303002L132806094 EPSON- D PS/2 Keyboard SEM-DT353V015783SAMSUNG- E Serial MouseC3KMS11020758Microsoft- F USB MouseM-U48aLNA 14618599Logitech- G AC Adapter PA-1500-05D CN-00R334-48010-286-00E0 1.3 Used Cable Description No.ItemLength[m]Shielded(Y/N) 1AC Power Cable1.7N 2AC Power Cable1.7N 3Printer Cable1.7Y 4Serial Cable1.8N 5PS/2 Cable1.7N 6USB Cable1.7N This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. - - - Remark - - - Page 6 of 16 Project NO. : LBE040051 1.4 System Block Diagram of Test Configuration 1.5 Test Facility All test described in this report were performed by : SAMSUNG ELECTRONICS CO., LTD. EMC TESTING LABORATORY 416 Maetan 3-Dong, Yeoungtong-Ku, Suwon City, Gyeongki-Do, Korea, 443-742 Semi Anechoic Chamber and Shielded Room. This test facility has been filed in FCC under the criteria in ANSI C63.4-1992. This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. F B A AC POWER AC POWER 1 3 4 6 D C 2 E 5 Page 7 of 16 Project NO. : LBE040051 2. System Test Configuration 2.1 Configuration of Radiated and Conducted Interference Measurement * Cabling was taken into consideration and test data was taken under worse case conditions. 1)Conduction(Front View) 2)Conduction(Rear View) This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Page 8 of 16 Project NO. : LBE040051 3) Radiation(Front View) 4) Radiation(Rear View) This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Page 9 of 16 Project NO. : LBE040051 2.2 Operation Environment ConductionRadiation Temperature [ C ] : 24.523.5 Humidity [ % ] 3435 Power supply :AC120V/60HzAC120V/60Hz 2.3 Test Procedure 2.3.1 Conducted Emissions EUT was placed on a platform of nominal size, 1m by 1.5m, raised 80cm above the conducting ground plane. The re…

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Page 7 of 16 Project NO. : LBE040051 2. System Test Configuration 2.1 Configuration of Radiated and Conducted Interference Measurement * Cabling was taken into consideration and test data was taken under worse case conditions. 1)Conduction(Front View) 2)Conduction(Rear View) This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Page 8 of 16 Project NO. : LBE040051 3) Radiation(Front View) 4) Radiation(Rear View) This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory.