A3LSECUSBUSB Flash Drive

This device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions: (1)this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. Fccinformation to the user This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to Part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates, uses and can radiate radio frequency energy and, if not installed and used in accordance with the instructions, may cause harmful interference to radio communications. However, there is no guarantee that interference will not occur in a particular installation. If this equipment does cause harmful interference to radio or television reception, which canbe determined by turning the equipment off and on, the user is encouraged to try to correct the interference by one or more of the following measures: -Reorient or relocate the receiving antenna. -Increase the separation between the equipment and receiver. -Connect the equipment into an outlet on a circuit different from that to which the receiver is connected. -Consult the dealer or experienced radio TV technician for help. CAUTION! Change or modifications not expressly approved by the manufacturer responsible for compliance could void the user's authority to operate the equipment.

Page 16 of 17 Project NO. : LBE020732 5. FCC Label Configuration and Location 5.1 Label Configulation 5.2 Location of Label This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Model No.: SECUSB FCC tested comply with FCC Standards For HOME OR OFFICE USE FCC Trade Mark FCC ID : A3LSECUSB Made in Korea

Page 1 of 17 Project NO. : LBE020732 Product :USB Flash Drive Model No. :SECUSB FCC ID : A3LSECUSB 1. This test reports shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 2. This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. 3. This test report is to certify that the tested device properly complies with the requirements of FCC Rules and Regulations Part 15 Subpart B Unintentional Radiators. All tests necessary to show compliance to the requirements were and these results met the specifications requirement. Date of test :September 4, 2002 ~ September 5, 2002 Issued Date :September 6, 2002 Tested by: Choon Kil, Kim / Test Engineer Reviewed by: Yang Soo, KIM / Manager of EMC Lab. Authorised by: Kyu Baek, CHUNG / Chief of EMC Lab. This laboratory is registered by the NIST/NVLAP, U.S.A. The test reported herein have been performed in accordance with its terms of registration. EMI TEST REPORT According to FCC Part 15 Subpart B/Class B NVLAP Code: 200447 Page 2 of 17 Project NO. : LBE020732 Table of Contents 1. General Information 1.1 Product Description 1.2 Configuration of EUT and peripherals 1.3 Used Cable Description 1.4 System Block Diagram of Test Configuration 1.5 Test Facility 2. System Test Configuration 2.1 Configuration of Radiated and Conducted Interference Measurement 2.2 Operation Environment 2.3 Test Procedure 3. Conducted Emission Test Data 4. Radiated Emission Test Data 5. Label Configuration and Location 6. Test Equipment Used Distribution This test report has been made available as follows: CS Management Center, EMC Laboratory1 original Computer Division1 copy This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Page 3 of 17 Project NO. : LBE020732 1. General Information Applicant :Samsung Electronics Co., Ltd. Full Address :416 Maetan 3 Dong, Paldal-Ku, Suwon City, Kyungki Do, Korea, 442-742 Kind of Product :USB Flash Drive FCC ID:A3LSECUSB Project Name :- Model & Variant Names :SECUSB(Brand Name: Samsung) Test Report Produced by :Choon Kil, Kim / Test Engineer This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Page 4 of 17 Project NO. : LBE020732 1.1 Product Description 1) Justification The system was configured for testing in typical fashion use. Cable were attached to each of the available I/O Ports. Where applicable, peripherals were attached to the I/O cables. The mode of operation utilized for testing was selected to best simulate typical EUT use. The system was pre-tested using the below additional components, and we found worst emission level for the components, were selected as the final components for the test. S820 M17D-AN SMB-600 BA44-00014A C011108523 And then the system was tested with the configuration of clause 1.4 In each test mode, Finally we found worst case emission that is above configuration with the Worst case components(in the above table). So, the DATA of the maximum EUT operation was reported. Further details of cabling and configuration are shown in the test system configuration. This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Samsung Samsung Samsung Samsung AC/DC AdaptorSamsung ComponentBrand and Model NameRemark AC/DC Adaptor Note PC Monitor Mouse Page 5 of 17 Project NO. : LBE020732 2) Operating Frequency : 4MHz (Metal-SMD Clock) 3) Description of Testing operating mode USB Flash Drive 4) Tested Resolution : 5) Manufacturer :SAMSUNG Electronics Co., Ltd. This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Read & Write & Delete Tested Video mode LCD(17") Resolutions Operating Mode Operating section of EUT (Using 'CP Device' Program) Refresh ratesColors 1600 X 120060Hz32bits Page 6 of 17 Project NO. : LBE020732 6) Assemble Parts ItemSpecificationRemark Flash Memory256MB Controller100TQFPLexar X-talMetal-SMD,4MHz LED1608,green SwitchSlide-switch InterfaceUSB This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Page 7 of 17 Project NO. : LBE020732 1.2 Configuration of EUT and peripherals MarkItemModel No.Serial No.ManufacturerFCC ID AUSB Flash DriveSECUSB-SamsungEUT BNote PCS820463691EN400009Samsung- CMonitorM17D-ANN106H4JT100839Samsung- DMouseSMB-600 8BCE018009 Samsung- EAC/DC AdaptorAD-6019BA44-00014ASamsungPC FAC/DC AdaptorAD-4214NC011108523SamsungMonitor This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Page 8 of 17 Project NO. : LBE020732 1.3 Used Cable Description No.ItemLength[m]Shielded (Y/N)Remark 1AC Power Cable1.7N- 2Mouse Cable1.2N- 3Monitor Cable1.2Y- This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Page 9 of 17 Project NO. : LBE020732 1.4 System Block Diagram of Test Configuration 1.5 Test Facility All test described in this report were performed by : SAMSUNG ELECTRONICS CO., LTD. EMC TESTING LABORATORY 416 Maetan 3 Dong, Paldal-Ku, Suwon City, Kyungki Do, Korea, 442-742 Semi Anechoic Chamber #1(Registration Number:98856) and Shielded Room. This test facility has been filed in FCC under the criteria in ANSI C63.4-1992. This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. D B E A B C F Page 10 of 17 Project NO. : LBE020732 2. System Test Configuration 2.1 Configuration of Radiated and Conducted Interference Measurement * Cabling was taken into consideration and test data was taken under worse case conditions. 1)Conduction(Front View) 2)Conduction(Rear View) This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Page 11 of 17 Project NO. : LBE020732 3) Radiation(Front View) 4) Radiation(Rear View) This report shall not be…

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Page 10 of 17 Project NO. : LBE020732 2. System Test Configuration 2.1 Configuration of Radiated and Conducted Interference Measurement * Cabling was taken into consideration and test data was taken under worse case conditions. 1)Conduction(Front View) 2)Conduction(Rear View) This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Page 11 of 17 Project NO. : LBE020732 3) Radiation(Front View) 4) Radiation(Rear View) This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory.