A3LSF755PMulti Function Printer

Block Diagram SCAN UPPER MAIN SPGPm ARM946ES CACHE(16K*2) SDRAM Control ROM ControlDMA Control PVC GEU/HCT/gCODEC I/O I/F Engine Control IEEE1284/USB2.0 FAST SRAM (128 KByte) Backup logic FlashROM (1MB) X 2EA SDRAM,32MB MOTOR DRIVER A3977SLR CIP4e Image Processer AFE I/F I/O PORT Motor Control DMA Control RTC JBIG Codec CIP4 AFE Reset MOTOR DRIVER TEA3718 X 2EA THERM. FUSER AC PWR 2P FAN 2P 26P MHV SUPPLY DEVTHV COVER S/W INLET & POWER S/W HVPS SMPS EXIT SENSOR MP EMPTY SENSOR FEED SENSOR PAPER EMPTY SENSOR OPC GND +5V +24V+24VS AC 110V / 220V 2P MODEM FM336 33.6KBPS AUDIO PART 2P CIS DRIVING PART 600/300 DPI, COLOR CIS 12P,FFC OPE ● MICOM● LCD/LED Drive● Key Scan DOCUMENT SENSOR PAPER EXIT SENSOR LCD, 16*2 LINES 14P MAIN MOTOR ADF MOTOR 4P USB 2.0 IEEE1284 PTL LSU DEV_FUSE MAIN CLUTCH 2P 11P 2P 3P MP CLUTCH 4P UART 6P 4P +12V 11P 8P SCF Paper EmptySensor B'd 3P SCFMotorSCFClutch 2P 4P Net2270 LINE MODEM & EXT.PHONE SEPERATING PART LINE INTERFACE TRANSFORMER 600 : 600 TX:RX Ext. PHONE EXT. PHONE INTERFACE PART MODEM AFE LIU SCF Micom S3P8469 EEPROM M27W256 Motor A3977

ٛ. External Pictures 1) Front View 2) Rear View 3) Side View 1 4) Side View 2

Page 17 of 18 Project NO. : LBE040254 5. FCC Label Configuration and Location 5.1 Label Configulation 5.2 Location of Label This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory.

2. Print Board Assembled(PBA) Pictures 1) Top View of Main Controller 2) Bottom View of Main Controller 3) Top View of Discrete LIU 4) Bottom View of Discrete LIU 5) Top View of V1(SMPS + HVPS) 6) Bottom View of V1 (SMPS + HVPS)

Page 1 of 18 Project NO. : LBE040254 Product :Multi Function Printer Model No. : Msys 755P FCC ID : A3LSF755P 1. This test reports shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 2. This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. 3. This test report is to certify that the tested device properly complies with the requirements of FCC Rules and Regulations Part 15 Subpart B Unintentional Radiators. All tests necessary to show compliance to the requirements were and these results met the specifications requirement. 4. That data in this report are traceable to National or International Standards. Date of test :February 6, 2004 Issued Date :February 13, 2004 Tested by: Sang Kyu, Seo / Test Engineer of EMC Lab. Reviewed by: No Cheon, PARK / Manager of EMC Lab. Authorized by: Kyu Baek, CHUNG / Chief of EMC Lab. This laboratory is registered by the NIST/NVLAP, U.S.A. The test reported herein have been performed in accordance with its terms of registration. EMI TEST REPORT According to FCC Part 15 Subpart B/Class B NVLAP Code: 200623- Page 2 of 18 Project NO. : LBE040254 Table of Contents 1. General Information 1.1 Product Description 1.2 Configuration of EUT and peripherals 1.3 Used Cable Description 1.4 System Block Diagram of Test Configuration 1.5 Test Facility 2. System Test Configuration 2.1 Configuration of Radiated and Conducted Interference Measurement 2.2 Operation Environment 2.3 Test Procedure 2.4 Measurement Uncertainty 3. Conducted Emission Test Data 4. Radiated Emission Test Data 5. Label Configuration and Location 6. Test Equipment Used Distribution This test report has been made available as follows: CS Management Center, EMC Laboratory1 original Printer Division1 copy This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Page 3 of 18 Project NO. : LBE040254 1. General Information Applicant :Samsung Electronics Co., Ltd. Full Address :416 Maetan 3 Dong, YeoungTon-Ku, Suwon City, Kyungki Do, Korea, 442-742 Kind of Product :Multi function Printer FCC ID:A3LSF755P Project Name :- Model & Variant Names : Basic Model : Msys 755P Variant Model : Msys 750 Variant Model : 3820/F270/LF215m/2210L Test Report Produced by : Sang Kyu, Seo / Test Engineer of EMC Lab. This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Remark) Variant Model Msys 750 is identical to the Basic Model Msys 755P except for the USB printer port. (Speed : Letter Size 17 PPM, A4 Size 16PPM) (Brand : Samsung) (Brand : Samsung) (Brand : Ricoh) Page 4 of 18 Project NO. : LBE040254 1.1 Product Description 1) Justification The system was configured for testing in typical fashion use. Cable were attached to each of the available I/O Ports. Where applicable, peripherals were attached to the I/O cables. The mode of operation utilized for testing was selected to best simulate typical EUT use. In each test mode, Finally we found worst case emission that is above configuration with the Worst case components(in the above table). So, the DATA of the maximum EUT operation was reported. Further details of cabling and configuration are shown in the test system configuration. 2) Operating Frequency : This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Video clock : 14.7456 MHz CPU clock : 60 MHz SDRAM Clock : 60 MHz Main Clock : 12 MHz CIP4_Main : 20 MHz UART clock : 12 MHz CIS Clock(copy) : 5MHz Modem Clock : 28.224MHz Page 5 of 18 Project NO. : LBE040254 3) Description of Testing operating mode USB PrintingContinously H pattern printing by Computer ADF CopyingContinously H pattern ADF Copying EUT was tested all operating mode as above. Finally EUT was tested USB Printing mode as maximum emission. 4) Tested Resolution : N/A 5) Manufacturer :Samsung Electronics Co., Ltd. Shandong Samsung Telecommunications Co. Ltd. Sanxing Road, Weihai Hi-Tech. IDZ Shandong Province, 264209 China This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 259, Gongdan-Dong, Gumi-City, Kyung-Buk, 730-030, Korea Operating Mode Operating section of EUT ColorsTested Video modeResolutionsRefresh rates Page 6 of 18 Project NO. : LBE040254 1.2 Configuration of EUT and peripherals MarkItemModel No.Serial No.ManufacturerRemark A Laser Beam Printer Msys 755PNoneSamsungEUT BComputerPP03L26429045536DELLDoC CAdapterADP-90FB06G356C/0DELL- DPhoneSP-F008-Samsung- This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Page 7 of 18 Project NO. : LBE040254 1.3 Used Cable Description No.ItemLength[m]Shielded (Y/N)Remark 1AC Power Cable1.7NFor EUT 2USB Cable1.5Y- 3Parallel Cable1.5Y- 4AC Power Cable1.5NFor PC 5Tel Line1.5NFor Phone This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Page 8 of 18 Project NO. : LBE040254 1.4 System Block Diagram of Test Configuration 1.5 Test Facility All test described in this report were performed by : SAMSUNG ELECTRONICS CO., LTD. EMC TESTING LABORATORY 416 Maetan 3-Dong, Youngtong Ku, Suwon City, Kyungki Do, Korea, 443-742 Semi Anechoic Chamber #2(Registration Number:873282) and Shielded Room. This test facility has been filed in FCC under the criteria in ANSI C63.4-1995. This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. B AC POWER A 4 AC POWER 3 1 2 C 5 Page 9 of 18 Project NO. : LBE040254 2. System Test Configuration 2.1 Configuration of Radiated and Conducted Interference Measurement * Cabling was taken into consideration and test data was taken under worse case conditions. 1)Conduction(Front View) 2)Conduction(Rear View) This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Page 10 of 18 …

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Page 9 of 18 Project NO. : LBE040254 2. System Test Configuration 2.1 Configuration of Radiated and Conducted Interference Measurement * Cabling was taken into consideration and test data was taken under worse case conditions. 1)Conduction(Front View) 2)Conduction(Rear View) This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Page 10 of 18 Project NO. : LBE040254 3) Radiation(Front View) 4) Radiation(Rear View) This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory.