A3LSMF966UPortable Handset

YW 10/11/2024 Object: Date Issued: Page 1 of 3 D2600V2 – SN: 1069 09/12/2024 Certification of Calibration Object D2600V2 – SN: 1069 Calibration procedure(s) Procedure for Calibration Extension for SAR Dipoles. Extension Calibration date: September 12, 2024 Description: SAR Validation Dipole at 2600 MHz. Calibration Equipment used: Measurement Uncertainty = ±23% (k=2) Name Function Signature Calibrated By: Arturo Oliveros Compliance Engineer Approved By: Greg Snyder Executive VP of Operations Manufacturer Model Description Cal Date Cal Interval Cal Due Serial Number Hewlett Packard 8753E RF Vector Network Analyzer 5/21/2024 Annual 5/21/2025 US38161081 Agilent E4438C ESG Vector Signal Generator 5/19/2024 Annual 5/19/2025 US41460739 Amplifier Research 15S1G6 Amplifier CBT N/A CBT 343972 Anritsu ML2496A Power Meter 7/15/2024 Annual 7/15/2025 1138001 Anritsu MA2411B Pulse Power Sensor 7/10/2024 Annual 7/10/2025 1126066 Anritsu MA2411B Pulse Power Sensor 7/1/2024 Annual 7/1/2025 1911105 Traceable 4040 90080-06 Therm./ Clock/ Humidity Monitor 1/15/2024 Annual 1/15/2025 160574418 Control Company 4352 Ultra Long Stem Thermometer 1/15/2024 Annual 1/15/2025 160508097 Agilent 85033E 3.5mm Standard Calibration Kit 7/31/2024 Annual 7/31/2025 MY53402352 Mini-Circuits VLF-6000+ Low Pass Filter DC to 6000 MHz CBT N/A CBT N/A Narda 4772-3 Attenuator (3dB) CBT N/A CBT 9406 Mini-Circuits ZHDC-16-63-S+ 50-6000MHz Bidirectional Coupler CBT N/A CBT N/A Pasternack NC-100 Torque Wrench 12/5/2022 Biennial 12/5/2024 N/A SPEAG DAK-3.5 Dielectric Assessment Kit 5/14/2024 Annual 5/14/2025 1070 SPEAG EX3DV4 SAR Probe 5/13/2024 Annual 5/13/2025 7552 SPEAG DAE4 Dasy Data Acquisition Electronics 5/8/2024 Annual 5/8/2025 1676 ELEMENT MATERIALS TECHNOLOGY (formerly PCTEST) 18855 Adams Ct, Morgan Hill, CA 95037 USA Tel. +1.408.538.5600 http://www.element.com Object: Date Issued: Page 2 of 3 D2600V2 – SN: 1069 09/12/2024 DIPOLE CALIBRATION EXTENSION Per KDB 865664 D01, calibration intervals of up to three years may be considered for reference dipoles when it is demonstrated that the SAR target, impedance and return loss of a dipole have remained stable according to the following requirements: 1. The measured SAR does not deviate more than 10% from the target on the calibration certificate. 2. The return-loss does not deviate more than 20% from the previous measurement and meets the required 20dB minimum return-loss requirement. 3. The measurement of real or imaginary parts of impedance does not deviate more than 5Ω from the previous measurement. The following dipole was checked to pass the above 3 requirements to have 2-year calibration period from the calibration date: Calibration Date Extension Date Certificate Electrical Delay (ns) Certificate SAR Target Head (1g) W/kg @ 20.0 dBm Measured Head SAR (1g) W/kg @ 20.0 dBm Deviation 1g (%) Certificate SAR Target Head (10g) W/kg @ 20.0 dBm Measured Head SAR (10g) W/kg @ 20.0 dBm Deviation 10g (%) Certificate Impedance Head (Ohm) Real Measured Impedance Head (Ohm) Real Difference (Ohm) Real Certificate Impedance Head (Ohm) Imaginary Measured Impedance Head (Ohm) Imaginary Difference (Ohm) Imaginary Certificate Return Loss Head (dB) Measured Return Loss Head (dB) Deviation (%) 9/12/2023 9/12/2024 1.152 5.62 5.56 -1.07% 2.55 2.42 -5.10% 48.5 53.2 4.7 -5 -2.2 2.8 -25.6 -23.9 6.50% Object: Date Issued: Page 3 of 3 D2600V2 – SN: 1069 09/12/2024 Impedance & Return-Loss Measurement Plot for Head TSL SRS 07/03/24 Object: Date Issued: Page 1 of 3 D2600V2 – SN: 1064 06/12/2023 Certification of Calibration Object D2600V2 – SN: 1064 Calibration procedure(s) Procedure for Calibration Extension for SAR Dipoles. Extension Calibration date: 06/12/2023 Description: SAR Validation Dipole at 2600 MHz. Calibration Equipment used: Measurement Uncertainty = ±23% (k=2) Name Function Signature Calibrated By: Tho Tong Test Engineer Approved By: Greg Snyder Executive VP of Operations, Regulatory Manufacturer Model Description Cal Date Cal Interval Ca l Due Serial Number Agilent N5182A MXG Vector Signal Generator 11/30/2022Annual 11/30/2023MY47420603 Amplifier Research 15S1G6 Amplifier CBTN/A CBT343971 Anritsu MA2411B Pulse Power Sensor 10/21/2022Annual 10/21/20231207364 Anritsu ML2496A Power Meter 8/16/2022Annual 8/16/20231351001 Control Company 4040Therm./ Clock/ Humidity Monitor 1/17/2023Biennial 1/17/2024160574418 Control Company 4352Long Stem Thermometer 9/10/2021Biennial 9/10/2023210774678 Mini-Circuits BW-N20W5+ DC to 18 GHz Precision Fixed 20 dB Attenuator CBTN/A CBTN/A Mini-Circuits NLP-2950+ Low Pass Fi l te r DC to 2700 MHz CBTN/A CBTN/A Narda 4772-3 Attenuator (3dB) CBTN/A CBT9406 Pasternack PE5011-1Torque Wrench 12/21/2021Biennial 12/21/202382475 Mini-CircuitsZHDC-16-63-S+Coupler CBTN/A CBTN/A Rohde & Schwarz ZNLE6Vector Network Analyzer 10/21/2022Annual 10/21/2023101307 SPEAG DAK-3.5 Dielectric Assessment Kit 11/14/2022Annual 11/14/20231277 Keysight Technologies85033EStandard Mechanical Calibration Kit (DC to 9GHz, 3.5mm)6/21/2022Annua l6/21/2023MY53402352 SPEAGEX3DV 4SAR Probe7/18/2022Annual7/18/20237406 SPEAG DAE4 Dasy Data Acquisition Electronics 7/18/2022Annual7/18/20231677 ELEMENT MATERIALS TECHNOLOGY (formerly PCTEST) 7185 Oakland Mills Road, Columbia, MD 21046 USA Tel. +1.410.290.6652 / Fax +1.410.290.6654 http://www.element.com Object: Date Issued: Page 2 of 3 D2600V2 – SN: 1064 06/12/2023 DIPOLE CALIBRATION EXTENSION Per KDB 865664 D01, calibration intervals of up to three years may be considered for reference dipoles when it is demonstrated that the SAR target, impedance and return loss of a dipole have remained stable according to the following requirements: 1. The measured SAR does not deviate more than 10% from the target on the calibration certificate. 2. The return-loss does not deviate more than 20% from the previous measurement and meets the required 20dB minimum return-loss requirement. 3. The measurement of real or imaginary parts of impedance does not deviate more than 5Ω…

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FCC ID: A3LSMF966U PART 2 RF EXPOSURE EVALUATION REPORT Approved by: Technical Manager DUT Type: APPENDIX D: Page 1 of 2 Portable Handset © 2025 Element REV 1.0 04/06/2020 AP PENDI X D: TE ST P ROCEDURE S FO R SUB6 NR + NR RADI O Appendix D provides the test procedures for validating Qualcomm Smart Transmit feature for Sub6 NR standalone (SA) and LTE + Sub6 NR non-standalone (NSA) mode transmission scenario, where sub-6GHz LTE link acts as an anchor. SAR exposure switch validation with one simultaneous transmission scenario (i.e., either FR1 NSA or LTE interband ULCA) is sufficient as Smart Transmit operation is the same. NOTE: If multi_Tx_factor is set to > 1.0 with EFS version 19 (or higher), then in single Tx transmission scenarios, Smart Transmit ensures time-averaged RF exposure is ≤ (SAR_design_target * 10(+ sub6 device uncertainty/10)) < regulatory RF exposure limit for sub6 radio managed by Smart Transmit. In simultaneous Tx transmission scenarios, Smart Transmit ensures time-averaged RF exposure is ≤ (SAR_design_target * multi_Tx_factor * 10(+ sub6 device uncertainty/10)) < regulatory RF exposure limit for sub6 radios managed by Smart Transmit. These simultaneous transmission scenarios are listed below: 2- or-more radio scenarios within WWAN like EN-DC, LTE ULCA, etc. 2- or-more-radio across technologies such as WWAN+WLAN, WWAN+BT, WLAN+BT and WWAN+WLAN+BT transmission scenarios (if WLAN/BT radios are also managed by Smart Transmit). D.1 Time-varying Tx power test for sub6 NR in SA mode Follows Section 4.2.1 to select test configurations for time-varying test. This t est is performed with two pre -defined test sequences (described in Section 4.1) applied to Sub6 NR. Follow the test procedures described in Section 4.3.1 to demonstrate the effectiveness of power limiting enforcement and that the time averaged Tx power of Sub6 NR when converted into 1gSAR values does not e xceed the regulatory limit at all t imes (see Eq. (1a) and (1b)). Sub6 NR response to test sequence1 and test sequence2 will be similar to other technologies (say, LTE), and are shown in Sections 9.1.4. D.2 Switch in SAR exposure between LTE vs. Sub6 NR during transmission This t est is to demonstrate that Smart Transmit feature accurately accounts fo r switching in exposures among SAR for LTE radio only, SAR from both LTE radio and sub6 NR, and SAR from sub6 NR only scenarios, and ensures total time-averaged RF exposure compliance with FCC limit. Test procedure: 1.Measure conducted Tx power corresponding to P limit for LTE and sub6 NR in selected band. Test condition to measure conducted P limit is: □Establish device in call with the callbox for LTE in desired band. Measure conducted Tx power corresponding to LTE P limit with Smart Transmit peak exposure mode enabled, and callbox set to request maximum power. □Repeat above step to measure conducted Tx power corresponding to Sub6 NR P limit . If testing LTE+Sub6 NR in non-standalone mode, then establish LTE+Sub6 NR call with FCC ID: A3LSMF966U PART 2 RF EXPOSURE EVALUATION REPORT Approved by: Technical Manager DUT Type: APPENDIX D: Page 2 of 2 Portable Handset © 2025 Element REV 1.0 04/06/2020 callbox and request all down bits for radio1 LTE. In this scenario, with callbox requesting maximum power from Sub6 NR, measured conducted Tx power corresponds to radio2 P limit (as radio1 LTE is at all-down bits) 2.Set DUT to the intended Smart Transmit exposure mode with EUT setup for LTE + Sub6 NR call. First, establish LTE connection in all-up bits with the callbox, and then Sub6 NR connection is added with callbox requesting UE to transmit at maximum power in Sub6 NR. As soon as the Sub6 NR connection is established, request all-down bits on LTE link (otherwise, Sub6 NR will not have sufficient RF exposure margin to sustain the call with LTE in all-up bits). Continue LTE (all-down bits)+Sub6 NR transmission for more than one time- window duration to test predominantly Sub6 NR SAR exposure scenario (as SAR exposure is negligible from all-down bits in LTE). After at least one time-window, request LTE to go all- up bits to test LTE SAR and Sub6 NR SAR exposure scenario. After at least one more time- window, drop (or request all-down bits) Sub6 NR transmission to test predominantly LTE SAR exposure scenario. Continue the test for at least one more time-window. Record the conducted Tx powers for both LTE and Sub6 NR for the entire duration of this test. 3.Once the measurement is done, extract instantaneous Tx power versus time for both LTE and Sub6 NR links. Similar to technology/band switch test in Section 4.3.3, convert the conducted Tx power for both these radios into 1gSAR value (see Eq. (6a) and (6b)) using corresponding technology/band P limit measured in Step 1, and then perform 100s running average to determine time-averaged 1gSAR versus time as illustrated in Figure 4-1. Note that here it is assumed both radios have Tx frequencies < 3GHz, otherwise, 60s running average should be performed for radios having Tx frequency between 3GHz and 6GHz. 4.Make one plot containing: (a) instantaneous Tx power versus time measured in Step 2. 5.Make another plot containing: (a) instantaneous 1gSAR versus time determined in Step 3, (b) computed time-averaged 1gSAR versus time determined in Step 3, and (c) corresponding regulatory 1gSAR limit of 1.6W/kg. The validation criteria is, at all times, the time-averaged 1gSAR versus time shall not exceed the regulatory 1gSAR limit of 1.6W/kg.

FCC ID: A3LSMF966U PART 2 RF EXPOSURE EVALUATION REPORT Approved by: Technical Manager DUT Type: APPENDIX C: Page 1 of 3 Portable Handset © 2025 Element REV 1.0 04/06/2020 APPENDIX C: TEST SEQUENCES 1.Test sequence is generated based on below parameters of the DUT: a.Measured maximum power (P max ) b.Measured Tx_power_at_SAR_design_target (P limit ) c.Reserve_power_margin (dB) ●P reserve (dBm) = measured P limit (dBm) – Reserve_power_margin (dB) d.SAR_time_window (100s for FCC) 2.Test Sequence 1 Waveform: Based on the parameters above, the Test Sequence 1 is generated with one transiti on bet ween high and low Tx powers. Here, high power = P max ; low power = P max /2, and the transition occurs after 80 seconds at high power P max . As long as the power enforcement is taking into effective during one 100s/60s time window, the validation test with this defined test sequence 1 is valid, otherwise, select other radio configuration (band/DSI within the same technology group) having lower P limit for this test. The Test sequence 1 waveform is shown below: Figure C-1 Test sequence 1 waveform FCC ID: A3LSMF966U PART 2 RF EXPOSURE EVALUATION REPORT Approved by: Technical Manager DUT Type: APPENDIX C: Page 2 of 3 Portable Handset © 2025 Element REV 1.0 04/06/2020 3.Test Sequence 2 Waveform: Based on the parameters described above, the Test Sequence 2 is generated as described in Table C- 1, which contains two 170 second-long sequences (yellow and green highlighted rows) that are mirrored around the center row of 20s, resulting in a total duration of 360 seconds: Table C-1 Test Sequence 2 Time duration (seconds) dB relative to P limit or P reserve 15 P reserve – 2 20 P limit 20 (P limit + P max )/2 averaged in mW and rounded to nearest 0.1 dB step 10 P reserve – 6 20 P max 15 P limit 15 P reserve – 5 20 P max 10 P reserve – 3 15 P limit 10 P reserve – 4 20 (P limit + P max )/2 averaged in mW and rounded to nearest 0.1 dB step 10 P reserve – 4 15 P limit 10 P reserve – 3 20 P max 15 P reserve – 5 15 P limit 20 P max 10 P reserve – 6 20 (P limit + P max )/2 averaged in mW and rounded to nearest 0.1 dB step 20 P limit 15 P reserve – 2 FCC ID: A3LSMF966U PART 2 RF EXPOSURE EVALUATION REPORT Approved by: Technical Manager DUT Type: APPENDIX C: Page 3 of 3 Portable Handset © 2025 Element REV 1.0 04/06/2020 The Test Sequence 2 waveform is shown in Figure C- 2. Figure C-2 Test sequence 2 waveform 4.Test sequence for WLAN Radios: Since WLAN radios do not have closed loop power control, average Tx power level of WLAN radios is indirectly varied by transmitting at varying duty cycles (i.e., varying UL data rates). Test sequence #1 described previously can be converted into duty cycle at Pmax, i.e., duty cycle for an arbitrary Tx power level = (Tx power level / Pmax). Table C-2 T est Sequence 1 for WLAN radio NOTE: Test sequence #2 is not achievable due to current test capability. Therefore, in the in terim, it is exempt.

APPENDIX A: VERIFICATION PLOTS A1 Date: 2025-04-23 30GHz System Verification Device Under Test Properties DUT Serial Number DUT Type 30 GHz Verification Source 1044 Phone Exposure Conditions Phantom Section Position Test Distance [mm] Band Frequency [MHz] 5G FRONT 5.55 Validation band 30000.0 Hardware Setup Probe, Calibration Date DAE, Calibration Date EUmmWV3 - SN9421_F1-55GHz, 2025-03-12 DAE4 Sn1213, 2024-12-04 Software Setup Software Software Version cDasy6 Module mmWave 3.2.0.1840 Scans Setup Scan Type 5G Scan Grid Extents [mm] 60.0 x 60.0 Grid Steps [lambda] 0.25 x 0.25 Sensor Surface [mm] 5.55 Measurement Results Scan Type 5G Scan Avg. Area [cm 2 ] 4.00 pS tot avg [W/m 2 ] 36.4 pS n avg [W/m 2 ] 35.9 E peak [V/m] 137 Power Drift [dB] 0.30

FCC ID: A3LSMF966U RF EXPOSURE PART 1 TEST REPORT Approved by: Technical Manager DUT Type: Portable Handset APPENDIX F: Page 1 of 8 A P P E N D I X F : PO W E R R E D U C T I O N V E R I F I C A T I O N Per the May 2017 TCBC Workshop Notes, demonstration of proper functioning of the power reduction mechanisms is required to support the corresponding SAR configurations. The verification process was divided into two parts: (1) evaluation of output power levels for individual or multiple triggering mechanisms and (2) evaluation of the triggering distances for proximity-based sensors. F.1 Power Verification Procedure The power verification was performed according to the following procedure: 1. A base station simulator was used to establish a conducted RF connection and the output power was monitored. The power measurements were confirmed to be within expected tolerances for all states before and after a power reduction mechanism was triggered. 2. Step 1 was repeated for all relevant modes and frequency bands for the mechanism being investigated. 3. Steps 1 and 2 were repeated for all individual power reduction mechanisms. The device state index as displayed on the device UI was recorded before and after the mechanism was triggered. F.2 Distance Verification Procedure The distance verification procedure was performed according to the following procedure: 1. A base station simulator was used to establish an RF connection and to monitor the power levels. The device being tested was placed below the relevant section of the phantom with the relevant side or edge of the device facing toward the phantom. For licensed modes, the device state index on the device UI was monitored to determine the triggering state. 2. The device was moved toward and away from the phantom to determine the distance at which the mechanism triggers and the output power is reduced, per KDB Publication 616217 D04v01r02 and FCC Guidance. Each applicable test position was evaluated. The distances were confirmed to be the same or larger (more conservative) than the minimum distances provided by the manufacturer. 3. Steps 1 and 2 were repeated for low, mid, and high bands, as appropriate (see note in section F.3 for more details). 4. Steps 1 through 3 were repeated for all distance-based power reduction mechanisms. 5. The device state index on the device UI was monitored to determine the triggering state. FCC ID: A3LSMF966U RF EXPOSURE PART 1 TEST REPORT Approved by: Technical Manager DUT Type: Portable Handset APPENDIX F: Page 2 of 8 F.3 Main Antenna Verification Summary - Low band refers to: GSM850, UMTS B5, LTE B5/12/13/14/26/71, NR n71/12/14/26/5; Mid band refers to: GSM1900, UMTS B2/4, LTE B2/4/25/66, NR n66/70/25/2; High band refers to: LTE B7/30/38/41, NR n30/7/38/41; Ultra High band refers to: LTE B48, NR n48/77/78. - This device uses different Device State Indices (DSI) to configure different time averaged power levels based on certain exposure scenarios. For Folder Closed states, DSI = 3 represents the case where the device is held-to-ear. DSI = 5 represents the case where the grip sensor is triggered. DSI = 1 is configured when the device cannot detect the held-to-ear or grip use conditions. For Folder Open states, DSI = 4 represents the case where the grip sensor is triggered. DSI = 0 is configured when the device cannot detect the held-to-ear or grip use conditions Table F-1 Power Measurement Verification for WWAN Antennas – Folder Closed Table F-2 Power Measurement Verification for NTN – Folder Closed Table F-3 Power Measurement Verification for WWAN Antennas – Folder Open 1st Free Space Mechanism #1 Held-to-Ear Mid Band Ant B 1 3 Held-to-Ear Mid Band Ant G 1 3 Held-to-Ear High band Ant B 1 3 Held-to-Ear High Band Ant G 1 3 Held-to-Ear Ultra High Band Ant F 1 3 Held-to-Ear Ultra High Band Ant C 1 3 Held-to-Ear 2.4 GHz WLAN Ant H 1 3 Held-to-Ear 2.4 GHz WLAN Ant F 1 3 Held-to-Ear 5 GHz WLAN Ant F 1 3 Held-to-Ear 5 GHz WLAN Ant E 1 3 Held-to-Ear 6 GHz WLAN Ant F 1 3 Held-to-Ear 6 GHz WLAN Ant E 1 3 Mechanism(s) Mode/Band Device State Index (DSI) 1st Free Space Mechanism #1 Grip NTN Band 255 24.00 20.00 Mode/Band Mechanism(s) Conducted Power (dBm) 1st Free Space Mechanism #1 Grip Mid Band Ant G 0 4 Grip High Band Ant G 0 4 Mechanism(s) Mode/Band Device State Index (DSI) FCC ID: A3LSMF966U RF EXPOSURE PART 1 TEST REPORT Approved by: Technical Manager DUT Type: Portable Handset APPENDIX F: Page 3 of 8 Table F-4 Power Measurement Verification for NTN – Folder Open Table F-5 Power Measurement Verification for WWAN Antennas – Folder Open and Closed 1stFree SpaceMechanism #1 GripNTN Band 25524.0013.00 Mechanism(s) Mode/Band Conducted Power (dBm) 1stFree SpaceMechanism #1 OpenLow Band Ant A+C01 OpenLow Band Ant E01 OpenMid Band Ant B01 OpenMid Band Ant G01 OpenHigh Band Ant B01 OpenHigh Band Ant G01 OpenHigh Band Ant H01 OpenHigh Band Ant D01 OpenUltra High Band Ant F01 OpenUltra High Band Ant C01 OpenUltra High Band Ant A01 OpenUltra High Band Ant G01 ClosedLow Band Ant A+C10 ClosedLow Band Ant E10 ClosedMid Band Ant B10 ClosedMid Band Ant G10 ClosedHigh Band Ant B10 ClosedHigh Band Ant G10 ClosedHigh Band Ant H10 ClosedHigh Band Ant D10 ClosedUltra High Band Ant F10 ClosedUltra High Band Ant C10 ClosedUltra High Band Ant A10 ClosedUltra High Band Ant G10 Mode/Band Mechanism(s)Device State Index (DSI) FCC ID: A3LSMF966U RF EXPOSURE PART 1 TEST REPORT Approved by: Technical Manager DUT Type: Portable Handset APPENDIX F: Page 4 of 8 F.4 WIFI Verification Summary Table F-6 Power Measurement Verification WIFI – Folder Closed Table F-7 Power Measurement Verification WIFI – Folder Open and Closed *Note: MIMO WIFI modes were not evaluated due to equipment limitations. 1st Free Space Mechanism #1 Held-to-Ear 2.4 GHz WLAN Ant H 1 3 Held-to-Ear 2.4 GHz WLAN Ant F 1 3 Held-to-Ear 5 GHz WLAN Ant F 1 3 Held-to-Ear 5 GHz WLAN Ant E 1 3 Held-to-Ear 6 GHz WLAN Ant F 1 3 Held-to-Ear 6 GHz WLAN Ant E 1 3 Mechanism(s) Mode/Band Device State I…

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FCC ID: A3LSMF966U RF EXPOSURE PART 1 TEST REPORT Approved by: Technical Manager DUT Type: Portable Handset APPENDIX D: Page 1 of 3 A P P E N D I X D : S A R T I S S U E S P E C I F I C A T I O N S Measurement Procedure for Tissue verification: 1) The network analyzer and probe system was configured and calibrated. 2) The probe was immersed in the tissue. The tissue was placed in a nonmetallic container. Trapped air bubbles beneath the flange were minimized by placing the probe at a slight angle. 3) The complex admittance with respect to the probe aperture was measured 4) The complex relative permittivity ε ’ can be calculated from the below equation (Pournaropoulos and Misra): where Y is the admittance of the probe in contact with the sample, the primed and unprimed coordinates refer to source and observation points, respectively, ,  is the angular frequency, and . Figure D-1 Note: Liquid recipes are proprietary SPEAG. Since the composition is approximate to the actual liquids utilized, the manufacturer tissue-equivalent liquid data sheets are provided below. ( )          −  = b a b a r r d d d r r j a b j Y            0 2 / 1 0 ' 0 2 0 ) ( exp cos ln 2        −  + = cos 2 2 2 2 r 1 − = j FCC ID: A3LSMF966U RF EXPOSURE PART 1 TEST REPORT Approved by: Technical Manager DUT Type: Portable Handset APPENDIX D: Page 2 of 3 Figure D-2 600 – 10000 MHz Head Tissue Equivalent Matter FCC ID: A3LSMF966U RF EXPOSURE PART 1 TEST REPORT Approved by: Technical Manager DUT Type: Portable Handset APPENDIX D: Page 3 of 3 Figure D-3 5– 250 MHz Head Tissue Equivalent Matter

SRS 02/05/25 Object: Date Issued: Page 1 of 3 D3700V2 – SN: 1067 01/12/2024 Certification of Calibration Object D3700V2 – SN: 1067 Calibration procedure(s) Procedure for Calibration Extension for SAR Dipoles. Extension Calibration date: 01/12/2024 Description: SAR Validation Dipole at 3700 MHz. Calibration Equipment used: Measurement Uncertainty = ±23% (k=2) Name Function Signature Calibrated By: Tho Tong Test Engineer Approved By: Greg Snyder Executive VP of Operations, Regulatory Manufacturer Model Description Cal Date Cal Interval Ca l Due Serial Number Agilent N5182A MXG Vector Signal Generator 4/1/2023Annual 4/1/2024MY47420837 Amplifier Research 15S1G6 Amplifier CBTN/A CBT343971 Anritsu MA24106A Pulse Power Sensor 4/21/2023Annual 4/21/20241349503 Control Company 4040Therm./ Clock/ Humidity Monitor 1/17/2023Biennial 1/17/2024160574418 Control Company 4353Long Stem Thermometer 9/15/2022Biennial 9/15/2024221767767 Mini-Circuits BW-N20W5+ DC to 18 GHz Precision Fixed 20 dB Attenuator CBTN/A CBTN/A Mini-Circuits NLP-2950+ Low Pass Fi l te r DC to 2700 MHz CBTN/A CBTN/A Narda 4772-3 Attenuator (3dB) CBTN/A CBT9406 Pasternack NC-100 Torque Wrench 12/5/2022Biennial 12/5/20241240 Mini-CircuitsZHDC-16-63-S+Coupler CBTN/A CBTN/A Rohde & Schwarz ZNLE6Vector Network Analyzer 10/25/2023Annual 10/25/2024101307 SPEAG DAK-3.5 Dielectric Assessment Kit 11/13/2023Annual 11/13/20241277 Keysight Technologies85033E3.5mm Standard Calibration Kit7/18/2023Annual7/18/2024MY53402352 SPEAGEX3DV 4SAR Probe6/14/2023Annual6/14/20247661 SPEAG DAE4 Dasy Data Acquisition Electronics 5/11/2023Annual5/11/2024728 ELEMENT MATERIALS TECHNOLOGY (formerly PCTEST) 7185 Oakland Mills Road, Columbia, MD 21046 USA Tel. +1.410.290.6652 / Fax +1.410.290.6654 http://www.element.com Object: Date Issued: Page 2 of 3 D3700V2 – SN: 1067 01/12/2024 DIPOLE CALIBRATION EXTENSION Per KDB 865664 D01, calibration intervals of up to three years may be considered for reference dipoles when it is demonstrated that the SAR target, impedance and return loss of a dipole have remained stable according to the following requirements: 1. The measured SAR does not deviate more than 10% from the target on the calibration certificate. 2. The return-loss does not deviate more than 20% from the previous measurement and meets the required 20dB minimum return-loss requirement. 3. The measurement of real or imaginary parts of impedance does not deviate more than 5Ω from the previous measurement. The following dipole was checked to pass the above 3 requirements to have 2-year calibration period from the calibration date: Calibration Date Extension Date Certificate Electrical Delay (ns) Certificate SAR Target Head (1g) W/kg @ 20.0 dBm Measured Head SAR (1g) W/kg @ 20.0 dBm Deviation 1g (%) Certificate SAR Target Head (10g) W/kg @ 20.0 dBm Measured Head SAR (10g) W/kg @ 20.0 dBm Deviation 10g (%) Certificate Impedance Head (Ohm) Real Measured Impedance Head (Ohm) Real Difference (Ohm) Real Certificate Impedance Head (Ohm) Imaginary Measured Impedance Head (Ohm) Imaginary Difference (Ohm) Imaginary Certificate Return Loss Head (dB) Measured Return Loss Head (dB) Deviation (%)PASS/FAIL 1/13/20231/12/20241.146.696.892.99%2.432.534.12%48.748.50.20.51.10.6-37-34.66.60%PASS Object: Date Issued: Page 3 of 3 D3700V2 – SN: 1067 01/12/2024 Impedance & Return-Loss Measurement Plot for Head TSL Object: Date Issued: Page 1 of 3 D3700V2 – SN: 1067 01/08/2025 Certification of Calibration Object D3700V2 – SN: 1067 Calibration procedure(s) Procedure for Calibration Extension for SAR Dipoles. Extension Calibration date: 01/08/2025 Description: SAR Validation Dipole at 3700 MHz. Calibration Equipment used: Measurement Uncertainty = ±23% (k=2) Name Function Signature Calibrated By: Tho Tong Test Engineer Approved By: Greg Snyder Executive VP of Operations, Regulatory Manufacturer Model Description Cal Date Cal Interval Ca l Due Serial Number Agilent N5182A MXG Vector Signal Generator 3/7/ 2024Annual 3/7/2025MY47420603 Amplifier Research 15S1G6 Amplifier CBTN/A CBT343971 Anritsu MA24106A USB Power Sensor 3/14/2024Annual 3/14/20251349513 Control Company 4040Digital Thermometer3/27/2023Biennial 3/27/2025230208311 Control Company 4052Long Stem Thermometer 2/27/2024Annual 2/27/2025240171059 MCL BW-N6W5+ 6dB Attenuator CBTN/A CBT1139 M ini-Circuits BW-N20W5+ DC to 18 GHz Precision Fixed 20 dB Attenuator CBTN/A CBTN/A Narda 4772-3 Attenuator (3dB) CBTN/A CBT9406 Huber + Suhner74Z-0-0-21Torque Wrench 10/17/2023Biennial 10/17/202516476 Mini-CircuitsZHDC-16-63-S+Coupler CBTN/A CBTN/A Rohde & Schwarz ZNLE6Vector Network Analyzer 3/8/2024Annual 3/8/20251204153 SPEAG DAK-3.5 Dielectric Assessment Kit 10/15/2024Annual 10/15/20251091 Keysight Technologies85033EStandard Mechanical Calibration Kit (DC to 9GHz, 3.5mm)2/12/2024Annual2/12/2025MY53401181 SPEAGEX3DV 4SAR Probe6/17/2024Annual6/17/20257409 SPEAG DAE4 Dasy Data Acquisition Electronics 6/11/2024Annual6/11/20251334 ELEMENT MATERIALS TECHNOLOGY (formerly PCTEST) 7185 Oakland Mills Road, Columbia, MD 21046 USA Tel. +1.410.290.6652 / Fax +1.410.290.6654 http://www.element.com Object: Date Issued: Page 2 of 3 D3700V2 – SN: 1067 01/08/2025 DIPOLE CALIBRATION EXTENSION Per KDB 865664 D01, calibration intervals of up to three years may be considered for reference dipoles when it is demonstrated that the SAR target, impedance and return loss of a dipole have remained stable according to the following requirements: 1. The measured SAR does not deviate more than 10% from the target on the calibration certificate. 2. The return-loss does not deviate more than 20% from the previous measurement and meets the required 20dB minimum return-loss requirement. 3. The measurement of real or imaginary parts of impedance does not deviate more than 5Ω from the previous measurement. The following dipole was checked to pass the above 3 requirements to have 3-year calibration period from the calibration date: Calibration Date Extension Date Certificate Electrical D…

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A P P E N D I X E : C A L I B R A T I O N C E R T I F I C A T E S

YW 10/11/2024 Object: Date Issued: Page 1 of 3 D1900V2 – SN: 5d180 08/08/2024 Certification of Calibration Object D1900V2 – SN: 5d180 Calibration procedure(s) Procedure for Calibration Extension for SAR Dipoles. Extension Calibration date: August 08, 2024 Description: SAR Validation Dipole at 1900 MHz. Calibration Equipment used: Measurement Uncertainty = ±23% (k=2) Name Function Signature Calibrated By: Arturo Oliveros Compliance Engineer Approved By: Greg Snyder Executive VP of Operations Manufacturer Model Description Cal Date Cal Interval Cal Due Serial Number Hewlett Packard 8753E RF Vector Network Analyzer 5/21/2024 Annual 5/21/2025 US38161081 Agilent E4438C ESG Vector Signal Generator 5/19/2024 Annual 5/19/2025 US41460739 Amplifier Research 15S1G6 Amplifier CBT N/A CBT 343972 Anritsu ML2496A Power Meter 7/15/2024 Annual 7/15/2025 1138001 Anritsu MA2411B Pulse Power Sensor 7/10/2024 Annual 7/10/2025 1126066 Anritsu MA2411B Pulse Power Sensor 7/1/2024 Annual 7/1/2025 1911105 Traceable 4040 90080-06 Therm./ Clock/ Humidity Monitor 1/15/2024 Annual 1/15/2025 160574418 Control Company 4352 Ultra Long S…

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