A3LVE15UOLCD Monitor

TUNER Component (480i/480p/576i/576p) Scart FullScart(A/V In/Out,RGBIn)

FCC ID SAMPLE LABEL & LOCATION LABELLING REQUIREMENTS PER §§ 2.925 & §§ 15.19 The Label shown shall be permanently affixed at a conspicuous location on the device and be readily visible to the user at the time of purchase. (SEE NEXT PAGE) Page : 17 of 17 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050101 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. LCD TV MONITOR MODEL : LNR-1550 TYPE. NO :15UO RATED INPUT 120 ~ ,60Hz 45 W CHASSIS NO.: Manufactured/Fabrique : XX. XX. 2004 Serial NO. XXXXXXXXXXXXXXXXXXXXX MADE IN SUWON KOREA(SEC) FABRIQUE EN SUWON COREE FDXWLRQ RISK OF ELECTRIC SHOCK DO NOT OPEN WARNING :TO PREVENT FIRE OR SHOCK HAZARD DO NOT OPEN EXPOSE THIS UNIT TO RAIN OR MOISTURE AVIS : RISQUE DE CHOC ELECTRIQUE-NE PAS OUVRIR SAMSUNG ELECTRONICS CANADA INC 7037 Financial Drive Mississauge,Ontario L5N 6R3 CANADA SAMSUNG ELECTRONICS AMERICA INC. 105 CHALLENGER ROAD,RIDGEFIELD PARK N.J.07660-0511,U.S.A FCC ID : A3LVE15UO U L R LISTED 77HN E215927 LR38329 Picture 7. Label

Page : 1 of 17 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050101 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. EMC Test Report According to FCC Part 15 Subpart B Project No. LBE050101 Equipment under Test Address 416 Maetan3-Dong,Yeongtong-Gu,Suwon-City,Gyeonggi-Do, Korea,443-742 Product Name TFT LCD MONITOR Model Name VE15UO Manufacturer Samsung Electronics Co., Ltd Brand Name SAMSUNG Variant Model See Page 3 FCC ID A3LVE15UO Date of Test January 20 ~ 21, 2005 Issued Date January 27, 2005 Name/Position Signature Tested by Dong Min, Lee Test Engineer Reviewed by No Cheon, Park Manager of EMC Lab. Authorized by Seung Kyu, Cha Chief of EMC Lab. 1. This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. 2. This test report is to certify that the tested device properly complies with the requirements of FCC Rules and Regulations Part 15 Subpart B Unintentional Radiators. All tests necessary to show compliance to the requirements were and these results met the specifications requirement. This laboratory is registered by the NIST/NVLAP, U.S.A. The test reported herein have been performed in accordance with its terms of registration. NVLAP LAB CODE 200623-0 Page : 2 of 17 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050101 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Table of Contents 1. General Information 1.1 Basic Information related Product 1.2 Detail Information related Product 1.3 Test Configuration 1.4 EUT Operating Conditions 1.5 Applied Standard 1.6 Test Facility 2. Summary of Test Results 3. Description of individual tests 3. 1 Conducted Emission 3. 2 Radiated Emission 4. Appendix A 4.1 Test Photography 4.2 EUT Photography Page : 3 of 17 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050101 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1. General Information 1.1 Basic Information related Product Applicant Samsung Electronics Co., Ltd Model name VE15UO Applicant Address Samsung Electronics Co., Ltd 416 Maetan3- Dong, Yeongtong-Gu, Suwon-City, Gyeonggi-Do, Korea, 443-742 Kind of product TFT LCD Monitor Valiant Model list None Manufacturer Samsung Electronics Co.,Ltd New / Alternative / Permissive change Information This report is original report # 1.2 Detail Information related Product Specification Item(s) Description Model Name VE15UO Product Name LCD MONITOR Resolution 1024 * 768 Horizontal Frequency 30 ~ 69 KHz Vertical Frequency 50 ~ 75 Hz Page : 4 of 17 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050101 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.3 Operating Mode and Condition The system was configured for testing in typical fashion use. Cable were attached to each of the available I/O Ports. The mode of operation utilized for testing was selected to best simulate typical EUT use. 1.4 Equipment Modifications No equipment modifications were required. Page : 5 of 17 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050101 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.5 Test Configuration Used EUT and Peripherals Seq Device Model Name Serial # Maker Note A LCD Monitor VE15UO SAMSUNGEUT B Desktop PC M6050 802092FRC02513 SAMSUNGDOC C Printer ML-1740 BABX820386E SAMSUNGA3LML-1710P D PS/2 Keyboard 5900 K03119305 Samsung DOC E Mouse FRE204-USB 020002943 Boan DOC Used Cable Description No Connect Cable Length [m] Shielded [Y/N] Remark 1 Power 1.7 No For EUT 2 Power 1.7 No For PC 3 Power 1.7 No For Printer 4 Monitor Analog 1.5 Yes 5 Parallel (Printer) 1.5 Yes 6 Keyboard 1.5 No 7 PS/2 Mouse 1.5 No Page : 6 of 17 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050101 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Block Diagram Page : 7 of 17 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050101 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.6 Applied Standards List Product or Generic Standards Basic Standards FCC Part15 Subpart B ANSI C63.4 : 2003 Page : 8 of 17 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050101 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.7 Test Facility General Information The sites are constructed in conformance with the requirements of ANSI C63.4 and CISPR 22. This EMC Testing Lab. is accredited by Korea Laboratory Accreditation Scheme(KOLAS) which signed the International Laboratory Accreditation Cooperation (ILAC) Mutual Recognition Arrangement (MRA) for the above test item(s) and test method(s). This Lab. is operated as testing laboratory in accordance with the requirements of ISO/IEC 17025:1998. Accreditation and Listing Uncertainty Test Item Expanded Uncertainty Radiated Disturbance ±5.09 Disturbance voltage at the mains terminals ±1.64 (According to NAMAS Pub.NIS81) Page : 9 of 17 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050101 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 2. Summary of Test Results Result : PASS The equipment under test(EUT) has been found to comply with the applied standards. Test Name Applied Standard Result Electromagnetic Emission Test 3.1 Conducted Emission FCC Part15 Subpart B Complied 3.2 Radiated Emission FCC Part15 Subpart B Complied Page : 10 of 17 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050101 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 3. Description o…

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Page : 14 of 17 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050101 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 4. Appendix A 4.1 Test Photography Picture 1. Conducted Emission (Front) Picture 2. Conducted Emission (Side) Page : 15 of 17 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050101 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Picture 3. Radiated Emission (Front) Picture 4. Radiated Emission (Rear)