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A3LVN32UO32-inch LCD TV Monitor

Samsung Electronics Co Ltd
32-inch LCD TV Monitor - FCC ID A3LVN32UO - Samsung Electronics Co Ltd
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Application Details

Equipment Class
JBP - Part 15 Class B Computing Device Peripheral
Date of Grant
Apr 06, 2004
Application Purpose
Original Equipment
Date of Application
Apr 06, 2004
Equipment Note
32-inch LCD TV Monitor
Company
Samsung Electronics Co Ltd
Country
United States

Documents & Files

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Users Manual

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Block Diagram

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External Photos

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ID Label/Location Info

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Internal Photos

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Test Report

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Test Setup Photos

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

Block Diagram

NJM4580 Surround R/L Amplifier MSP4450G Multi-Sound Decoder NJM4580 Main R/L Amplifier HC4052 Sound S/W -.Dual 4Ch' NJM4580 Center Woofer Amplifier L RR L C H.P-R/L 4052-R/L TDA7050T H.P Amplifier NJW1151 Volume Controller 74VHC157MX MUX AK4586 DAC Main-R/LSur-R/LCenterWoofer MSP-BCLKMSP-LALKMSP-SDTO DSP56366 DSP KS86P4208 Sub-Micom LALKBCLKSDTO MC74HC126 MUX TA2024 Main R/L Sound Amp. TA2024 Surr R/L Sound Amp. TA2024 Sound Amp. Center Woofer Line Out S-VHS1 DP-TV(3D) Main Analog Picture -.De-interlacer & Scaler -.ADC & DAC-.3D_Comb-.Decoder-.MPIP DS90C385 LVDS -.DCC-.ISBC K4S64322E SDRAM (2Mbit) K4S64322E SDRAM (2Mbit) 24C16 EEPROM M27V160 EPROM (1Mbyte) PP-MM Scaler -.Digital I/O-.3CH ADC-.Scaler/FRC-.Auto Detection-.Sync Separation-.Digital OSG-.Dithering-.Digital_IPQ-.MPIP With FB-.Gamma Correction VPC3230PIP Picture -.Multi Video Decoder -.4H Comb K4S64322E SDRAM (4Mbit) CCIR601 16-bit 24-bit CCIR656 8-bit Mega TTX (Europe Only) Manual Key Matrix & Buzzer K4S64322E SDRAM (4Mbit) TEA6425 Video switch -.6x8Video Mat.-.0.5dB/6.5dB CVBS1 Component 1&2 8-bit 24C16 EEPROM PC_DDC TTX RGBF/B Sil-169 DVI Receiver UXGA DVI 48-bit,CLK,DE,H/V-Sync PC-RGB,H/V-Sync DS90C385 LVDS -.DCC-.ISBC 24-bit H/V/ DE/CK Panel Option SDA6001 TTX Character Generator (2000P) K4S631632F SDRAM (2Mbit) GS1881 Sync Separator AD9883A ADC -.Component ADC 24C16 EEPROM DVI_DDC FST3125 S/W IIC Switch TEA6425 Video switch -.6x8Video Mat.-.0.5dB/6.5dB TEA6425 Video switch -.6x8Video Mat.-.0.5dB/6.5dB S-VHS(Y/C)->CVBS Component 1&2 BA7657F RGB switch -.SC1/TTX RGB FST3125 S/W F/B Switch SDA5550M TTX Character Generator (2000P) 24C16 EEPROM M27W40P EPROM (512Kbyte) I2C I2C Panel H:1280 V:768 DNI(2) Scaler -. IFC (InterFace Control) -.TIMING_GEN-. MMU -. PRE_Processor -. NRP -. SOURCE DETECTION -. DEP -. CE -. DCE -. CCS -. CTI -. BWS -. WTE -. CTE -.POST K4S64322E SDRAM (4Mbit) K4S64322E SDRAM (4Mbit) 24-bit CLK : 67 Mhz CLK : 67 Mhz CLK : 67 Mhz CLK : 67 Mhz 1080i:75Mhz 720p :75Mhz 480p:27Mhz 480i:13.5Mhz

ID Label/Location Info

Samsung EMC Testing and Certification Laboratory Project No. : LBE040517 * Label and Label Location - Label - Label Location This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory

Test Report

Page : 1 of 11 Samsung EMC Testing and Certification Laboratory Project No. : LBE040517 Applicant Product Name Model Name Manufacturer Brand Name Variant Model Name/Position Tae Young, Jang Test Engineer No Cheon, Park Manager of EMC Lab. Kyu Baek, Chung Chief of EMC Lab. Address Telephone No. Fax No. This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory Samsung EMC Testing and Certification Laboratory EMC Test Report Authorized by LBE040517 Passed The equipment under test has found to be compliant with the applied standards. Signature Tested by Reviewed by Applied Standards Result Project No. Issued Date Equipment under Test Samsung Electronics Co.Ltd 416 Maetan-3 Dong, Yeongtong-Ku, Suwon City, Gyeonggi-Do, Korea, 443-742 LCD TV Monitor VN32UO Samsung Electronics Co. Ltd SAMSUNG See Page 2 25-Mar-04 FCC Part 15 Subpart B 82-31-200-2189 1. This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. 2. This test report is to certify that the tested device properly complies with the requirements of FCC Rules and Regulations Part 15 Subpart B Unintentional Radiators.All tests necessary to show compliance to the requirements were and these results met the specifications requirement. This laboratory is registered by the NIST/NVLAP, U.S.A. The test reported herein have been performed in accordance with its terms of registration. 416 Maetan-3 Dong, Yeongtong-Ku, Suwon City, Gyeonggi-Do,Korea, 443-742 82-31-200-2135 NVLAP LAB CODE 200623-0 Page : 2 of 11 Samsung EMC Testing and Certification Laboratory Project No. : LBE040517 1. General Information 1.1 Basic Information related Product 1.2 Power Input Ports DescriptionVoltage(V)Frequency(Hz)No. of phases Mains Cable120V60Hz1 1.3 EUT & Support Equipment MarkItemModel No.Serial No.ManufacturerRemark ALCD TV MonitorVN32UO-SAMSUNGEUT BPersonal ComputerGX2706Q4Q81SDELL- CPrinterLQ-580HCG2Y014504Epson- DPS/2 KeyboardSK-8110 MY-04N729-71619-3AT-0137 DELL- EPS/2 MouseM-S69LZB33503033DELL- This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory Applicant Samsung Electronics Co. Ltd Product name LCD TV Monitor Model name VN32UO Brand Name SAMSUNG Used EUT and Peripherals Manufacturer Samsung Electronics Co. Ltd Variant Models - Page : 3 of 11 Samsung EMC Testing and Certification Laboratory Project No. : LBE040517 No.ItemLength[m]ShieldedRemark 1PS/2 Mouse Cable1.8N 2USB Keyboard Cable1.6N 3Video Cable1.5Y 4 AC Power Cable(Monitor) 1.2N 5AC Power Cable(PC)1.8N 6Printer Cable1.6Y 7AC Power Cable(Printer)1.8N This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory Used Cable Description Page : 4 of 11 Samsung EMC Testing and Certification Laboratory Project No. : LBE040517 1.4 Operating Mode and Conditions The system was configured for testing in typical fashion use. The mode of operation utilized for testing was selected to best simulate typical EUT use. - PC Video Input Operating Condition Operating ConditionResolutionsRefresh RatesColors "H" Pattern Display1280 * 768 Horizontal Freq. : 30 ~ 61kHz 24 bits Vertical Freq. : 56 ~ 75Hz The EUT Exercise program used during radiated and conducted testing was designed to exercise the various system components in a manner similar to typical use. 1.5 Block Diagram This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory 4 B C A E D 1 2 3 5 6 POWER POWER POWER 7 Page : 5 of 11 Samsung EMC Testing and Certification Laboratory Project No. : LBE040517 1.6 Test Facility The EMI/EMS measurement facilities used to collect the tested data are located at 416 Maetan 3 Dong, Yeongtong-Ku, Suwon City, Gyeonggi-Do, Korea. This sites are constructed in conformance with the requirements of ANSI C63.4 and CISPR 16-1 & 16-2. SAMSUNG Electronics Co.,Ltd is accredited by Korea Laboratory Accreditation scheme(KOLAS) which . signed the International Laboratory Accreditation Cooperation(ILAC) Mutual Recognition Arrangement (M for the above test item(s) and test method(S) This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory General Information Accreditation and Listing LAB CODE 200623-0 R-1221,C-1095 No.195 Reg. No.98856 Reg. No. KR0004 App. No.001 H9354285 Reg. No. 124 Page : 6 of 11 Samsung EMC Testing and Certification Laboratory Project No. : LBE040517 1.7 Applied Standards List This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory - - FCC Rule Part(s)Test Procedure(s) FCC Part 15 Subpart BANSI C63.4-2001 Page : 7 of 11 Samsung EMC Testing and Certification Laboratory Project No. : LBE040517 2. Summary of Test Results Result :Pass The equipment under test(EUT) has been found to comply with the applied standards Applied StandardResult FCC Part 15 Subpart BComplied FCC Part 15 Subpart BComplied * N/A : Test not applicable This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory Test Method Conducted Emission Radiated Emission Page : 8 of 11 Samsung EMC Testing and Certification Laboratory Project No. : LBE040517 3. Description of Individual Tests 3.1 Disturbance voltage at the mains terminals Test Information Test Engineer Test Date Climate Condition Test Place Test Equipments EquipmentModel NameManufacturerSerial No. Next Calibration Date TEST RECEIVERESI26R & S839809/00227/06/2004 LISNESH3-Z5R & S847265/02816/07/2004 LISNESH3-Z5R & S10026116/07/2004 Test SoftwareEP5/CETOYOVersion : 2.0.860N/A Test Setup EUT was placed on a platform of nominal size, raised 80cm above the conducting ground plane. The rear of table top was located 40cm to the vertical conducting plane. The rear of EUT was aligned and flushed with rear of tabletop. All other surfaces of tabletop was at least 80cm from any other grounded conducting surface. All โ€ฆ

Text truncated - open the document above for the full version.

Test Setup Photos

Samsung EMC Testing and Certification Laboratory Project No. : LBE040517 * Test Set up Photographs This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory Samsung EMC Testing and Certification Laboratory Project No. : LBE040517 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory

Contact Information

Applicant

Jenni Chun(General Manager)
[email protected]973-808-6375Fax: 973-808-6361

Technical Contact

PCTEST Engineering Lab., Inc.Randy Ortanez
[email protected]410-290-6652

6660-B Dobbin Road ยท Columbia, Maryland ยท United States

Test Firm

SAMSUNG ELECTRONICS CO., LTD.No Cheon Park
[email protected]82-31-200-2185Fax: 82-31-200-2189

Technical Specifications

#Rule PartsFrequency RangePower Output
115B--
Grant Notes
Max. Resolution: 1280 x 768

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