A3LWEA303I

Application Details

Equipment Class: NII - Unlicensed National Information Infrastructure TX
Date of Grant: Jan 13, 2014
Application Purpose: Original Equipment
Date of Application: Nov 15, 2013
Equipment Note: WLAN Access Point
Frequency Range: 5600 - 5700
Company: Samsung Electronics Co Ltd
Country: United States

Documents & Files

Select a file to view

Users Manual

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a3lwea303i-usersmanual-2120406.pdf

11/15/2013•3.10 MB•PDF

Cover Letter(s)

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a3lwea303i-coverletters-2120373.pdf

11/15/2013•44.13 KB•PDF

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a3lwea303i-coverletters-2120376.pdf

11/15/2013•59.67 KB•PDF

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a3lwea303i-coverletters-2120377.pdf

11/15/2013•59.16 KB•PDF

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a3lwea303i-coverletters-2120378.pdf

11/15/2013•86.64 KB•PDF

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a3lwea303i-coverletters-2120379.pdf

11/15/2013•60.55 KB•PDF

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a3lwea303i-coverletters-2120395.pdf

11/15/2013•40.06 KB•PDF

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a3lwea303i-coverletters-2120398.pdf

11/15/2013•69.89 KB•PDF

External Photos

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a3lwea303i-externalphotos-2120408.pdf

11/15/2013•800.87 KB•PDF

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a3lwea303i-externalphotos-2120420.pdf

11/15/2013•727.02 KB•PDF

ID Label/Location Info

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a3lwea303i-idlabellocationinfo-2120397.pdf

11/15/2013•204.44 KB•PDF

Internal Photos

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a3lwea303i-internalphotos-2120409.pdf

11/15/2013•1.31 MB•PDF

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a3lwea303i-internalphotos-2120421.pdf

11/15/2013•1.40 MB•PDF

RF Exposure Info

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a3lwea303i-rfexposureinfo-2120422.pdf

11/15/2013•517.95 KB•PDF

Test Report

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a3lwea303i-testreport-2120396.pdf

11/15/2013•1.81 MB•PDF

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a3lwea303i-testreport-2120412.pdf

11/15/2013•3.45 MB•PDF

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a3lwea303i-testreport-2120413.pdf

11/15/2013•5.08 MB•PDF

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a3lwea303i-testreport-2120414.pdf

11/15/2013•5.50 MB•PDF

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a3lwea303i-testreport-2120415.pdf

11/15/2013•3.85 MB•PDF

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a3lwea303i-testreport-2120416.pdf

11/15/2013•5.07 MB•PDF

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a3lwea303i-testreport-2120417.pdf

11/15/2013•5.49 MB•PDF

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a3lwea303i-testreport-2120418.pdf

11/15/2013•974.05 KB•PDF

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a3lwea303i-testreport-2120433.pdf

11/15/2013•3.36 MB•PDF

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a3lwea303i-testreport-2120434.pdf

11/15/2013•4.71 MB•PDF

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a3lwea303i-testreport-2120435.pdf

11/15/2013•5.63 MB•PDF

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a3lwea303i-testreport-2120436.pdf

11/15/2013•3.22 MB•PDF

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a3lwea303i-testreport-2120437.pdf

11/15/2013•4.81 MB•PDF

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a3lwea303i-testreport-2120438.pdf

11/15/2013•5.71 MB•PDF

Test Setup Photos

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a3lwea303i-testsetupphotos-2120375.pdf

11/15/2013•189.05 KB•PDF

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a3lwea303i-testsetupphotos-2120407.pdf

11/15/2013•1.45 MB•PDF

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a3lwea303i-testsetupphotos-2120419.pdf

11/15/2013•1.44 MB•PDF

Contact Information

Applicant Contact Person

Name: Jenni Chun
Title: General Manager
Email: [email protected]
Phone: 973-808-6375
Fax: 973-808-6361

Technical Contact

Firm Name: HCT America
Name: SunWoo Kim
Email: [email protected]
Phone: (510)933-8848
Fax: (510)933-8849
Address: 44946 Osgood Rd
Fremont, California, 94539

Non-Technical Contact

Firm Name: MiCOM Labs
Name: Bill Graff
Email: [email protected]
Phone

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A3LWEA303I

Application Details

Documents & Files

Users Manual

Cover Letter(s)

External Photos

ID Label/Location Info

Internal Photos

RF Exposure Info

Test Report

Test Setup Photos

Contact Information

Applicant Contact Person

Technical Contact

Non-Technical Contact

Other Applications from Samsung Electronics Co Ltd

Test Firm