
Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.
< PHOTOS > Model No.: MDR-EX750BT Exterior Front Back Top Bottom Side Driver
L R MDR β EX750BT SAFETY LABEL LOCATION CONFIDENTIAL Note:Sony Corporation, declare that nameplate label is able to last the expected lifetime of the equipment in the environment in which the equipment will be operated and isn't readily detachable. Driver < Nameplate >
< PHOTOS > Model No.: MDR-EX750BT Exterior Main PWB Back Sub PWB including NFC FPC switch PWB R-channel L-channel L-channel
UL Japan, Inc. Ise EMC Lab 4383-326 Asama-cho, Ise-shi, Mie 516-0021 Japan T:: +81.596.24.8999 / F:: +81.596.24.8124 / W:: ul.com/jp October 26, 2015 UL Japan, Inc. 4383-326 Asama-cho, Ise-shi, Mie 516-0021 Japan FCC ID: AK8MDREX750BT To whom it may concern, We, UL Japan, Inc, hereby declare that Wireless Stereo Headset, model: MDR-EX750BT (FCC ID: AK8MDREX750BT) of Sony Corporation is exempt from RF exposure SAR evaluation as its output power meets the exclusion limits stated in KDB 447498D01(v05r02). KDB 447498D01(v05r02) has the following exclusion for portable devices: The 1g and 10g SAR test exclusion thresholds for 100 MHz to 6 GHz at test separation distances β€ 50 mm are determined by: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] Β·[βf(GHz)] β€ 3.0 for 1-g SAR and β€ 7.5 for 10-g extremity SAR, where β’f(GHz) is the RF channel transmit frequency in GHz β’Power and distance are rounded to the nearest mW and mm before calculation β’The result is rounded to one decimal place for comparison The test exclusions are applicable only when the minimum test separation distance is β€ 50 mm and for transmission frequencies between 100 MHz and 6 GHz. When the minimum test separation distance is < 5 mm, a distance of 5 mm is applied to determine SAR test exclusion. This device has f = 2.48 GHz and distance = 5 mm (minimum separation distance: 5 mm was used in the calculation) and the maximum average output power was 1 mW So for this device: 1 mW[maximum average output power]/5 mm[minimum separation distance]*β2.48 = 0.3 *This is less than 3.0, so no SAR is required. Even taking into account the tolerance, this device can be satisfied with the limits. Thank you for your attention to this matter. Takahiro Hatakeda Leader of Ise EMC Lab. Consumer Technology Division UL Japan, Inc.
Test report No. : 10990297H-A-R1 Page : 1 of 52 Issued date : October 26, 2015 Revised date : November 11, 2015 FCC ID : AK8MDREX750BT UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124 13-EM-F0429 RADIO TEST REPORT Test Report No. : 10990297H-A-R1 Applicant : Sony Corporation Type of Equipment : Wireless Stereo Headset Model No. : MDR-EX750BT FCC ID : AK8MDREX750BT Test regulation: FCC Part 15 Subpart C: 2015 Test Result : Complied 1. This test report shall not be reproduced in full or partial, without the written approval of UL Japan, Inc. 2. The results in this report apply only to the sample tested. 3. This sample tested is in compliance with the above regulation. 4. The test results in this report are traceable to the national or international standards. 5. This test report must not be used by the customer to claim product certification, approval, or endorsement by NVLAP, NIST, or any agency of the Federal Government. 6. This test report covers Radio technical requirements. It does not cover administrative issues such as Manual or non-Radio test related Requirements. (if applicable) 7. This report is a revised version of 10990297H-A. 10990297H-A is replaced with this report. Date of test: October 9 to 12, 2015 Representative test engineer: Takafumi Noguchi Engineer Consumer Technology Division Approved by: Takahiro Hatakeda Leader Consumer Technology Division NVLAP LAB CODE: 200572-0 This laboratory is accredited by the NVLAP LAB CODE 200572-0, U.S.A. The tests reported herein have been performed in accordance with its terms of accreditation. *As for the range of Accreditation in NVLAP, you may refer to the WEB address, http://japan.ul.com/resources/emc_accredited/ Test report No. : 10990297H-A-R1 Page : 2 of 52 Issued date : October 26, 2015 Revised date : November 11, 2015 FCC ID : AK8MDREX750BT UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124 REVISION HISTORY Original Test Report No.: 10990297H-A Revision Test report No. Date Page revised Contents - (Original) 10990297H-A October 26, 2015 - - 1 10990297H-A-R1 November 11, 2015 P.9 Correction of clause 4.2 Configuration and peripherals Test report No. : 10990297H-A-R1 Page : 3 of 52 Issued date : October 26, 2015 Revised date : November 11, 2015 FCC ID : AK8MDREX750BT UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124 CONTENTS PAGE SECTION 1: Customer information ....................................................................................................... 4 SECTION 2: Equipment under test (E.U.T.) ......................................................................................... 4 SECTION 3: Test specification, procedures & results .......................................................................... 5 SECTION 4: Operation of E.U.T. during testing .................................................................................. 8 SECTION 5: Radiated Spurious Emission .......................................................................................... 10 SECTION 6: Antenna Terminal Conducted Tests .............................................................................. 11 APPENDIX 1: Test data ........................................................................................................................ 12 20dB Bandwidth and Carrier Frequency Separation ......................................................................... 12 Number of Hopping Frequency ........................................................................................................ 15 Dwell time ......................................................................................................................................... 17 Maximum Peak Output Power .......................................................................................................... 20 Average Output Power ...................................................................................................................... 21 Radiated Spurious Emission ............................................................................................................. 23 Conducted Spurious Emission .......................................................................................................... 34 Conducted Emission Band Edge compliance ................................................................................... 46 99%Occupied Bandwidth ................................................................................................................. 48 APPENDIX 2: Test instruments ........................................................................................................... 50 APPENDIX 3: Photographs of test setup ............................................................................................. 51 Radiated Spurious Emission ............................................................................................................. 51 Worst Case Position .......................................................................................................................... 52 Test report No. : 10990297H-A-R1 Page : 4 of 52 Issued date : October 26, 2015 Revised date : November 11, 2015 FCC ID : AK8MDREX750BT UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124 SECTION 1: Customer information Company Name : Sony Corporation Address : 2-10-1 Osaki, Shinagawa-ku, Tokyo 141-8610 Japan Telephone Number : +81-50-3750-7634 Facsimile Number : +81-50-3750-6574 Contact Person : Shigeru Higai SECTION 2: Equipment under test (E.U.T.) 2.1 Identification of E.U.T. Type of Equipment : Wireless Stereo Headset Model No. : MDR-EX750BT Serial No. : Refer to Section 4, Clause 4.2 Raβ¦
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Test report No. : 10990297H-A-R1 Page : 51 of 52 Issued date : October 26, 2015 Revised date : November 11, 2015 FCC ID : AK8MDREX750BT UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124 APPENDIX 3: Photographs of test setup Radiated Spurious Emission Photo 1 Photo 2 Test report No. : 10990297H-A-R1 Page : 52 of 52 Issued date : October 26, 2015 Revised date : November 11, 2015 FCC ID : AK8MDREX750BT UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124 Worst Case Position Below 1GHz (Horizontal: Y-axis/ Vertical: Y-axis) Above 1GHz (Horizontal: X-axis/ Vertical: Z-axis) X-axis Y-axis Z-axis End of Report
4383-326 Asama-cho, Ise-shi Β· Mie-ken Β· Japan
| # | Rule Parts | Frequency Range | Power Output |
|---|---|---|---|
| 1 | 15C | 2.40 GHz - 2.48 GHz | 2.10 mW |
Radio Equipment
Equipment Class
DSS - Part 15 Spread Spectrum TransmitterWireless Controller
Equipment Class
DSS - Part 15 Spread Spectrum TransmitterLCD Monitor
Equipment Class
JAD - Part 15 Class A Digital DeviceLCD Monitor
Equipment Class
JAD - Part 15 Class A Digital DeviceLCD Monitor
Equipment Class
JAD - Part 15 Class A Digital Device