BEK9E3UH-42WIRELESS MICROPHONE

FCC NOTE: This device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions:(1)this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. The manufacturer is not responsible for any radio or TV interference caused by unauthorized modifications to this equipment. Such modifications could void the user's authority to operate the equipment.

1 2 34 ABCD 4 3 2 1 D CBA Title Number Revision Size A4 Date: 10-Dec-2009 Sheet of File: C:\Do cument s and Sett in gs\EN G04 \ 桌面 \UH -4 FCC 资料 \UH -4\UH -4.dd b Drawn By: GAIN MIC AMP Compressor32.768KHz Pilotone signal MOD DEVIATION Frequency Modulation osc f =Y1*3 osc f f *12= AMP BPF Y1f=Y1*36 25. 166666 MHz 90 6 MHz UH-4

Nady Systems Inc FCC ID: BEK9E3U H-42 POWER OF ATTORNEY Dec. 07, 2009 Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 To Whom It May Concern: We, the undersigned, hereby authorize Waltek Services (ShenZhen) Co., Ltd. (Philo Zhong) on our behalf, to apply to the Federal Communications Commission on our equipment. Any and all acts carried out by Waltek Services (ShenZhen) Co., Ltd. (Philo Zhong) on our behalf shall have the same effect as acts of our own. This authorization expires on Dec. 08, 2010. This is to advise that we are in full compliance with the Anti-Drug Abuse Act. We, Nady Systems Inc., are not subject to a denial of federal benefits pursuant to Section 5301 of the Anti-Drug Act of 1988, 21 USC853a, and no party to the application is subject to a denial of federal benefits pursuant to that section. Sincerely, Nady Systems Inc. President

EUT - Front View EUT - Back View

Nady Systems Inc. FCC ID: BEK9E3UH-42 Page 25 of 25 12 FCC ID Label This device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation The Label must not be a stick-on paper. The Label on these products must be permanently affixed to the product and readily visible at the time of purchase and must last the expected lifetime of the equipment not be readily detachable. Proposed Label Location on EUT EUT Bottom View/proposed FCC Mark Location FCC ID: BEK9E3UH-42 This device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation

FCC ID Label Sample for Model UH-4 FCC ID: BEK9E3UH-42 This device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation

PCB - Front View PCB - Back View

Circuit introduce TX part: 1. Audio frequency amplify and compress parts MIC change tone signal through IC3B amplify, enter C7,R5,C10,R7 network, and deal with The signal by the control plus amplifier. So the audio frequency compress finish. Other way the plus of IC3A is controlled. 2. Modulate and RF parts: The audio signal out of IC3A modulate In D1,Y1 (Y1=25.166666MHz)decides the frequency of carrier wave ,the osc is 32.768KHz. Q5 Finish oscillate and triple frequency. Q3, Q4 and Q2 finish double frequency ,which is 906MHz) . Q1 is power amplifier.

Y1 F

Nady Systems Inc. FCC ID: BEK9E3UH-42 FCC TEST REPORT Page 1 of 25 FCC ID : BEK9E3UH-42 Applicant : Nady Systems Inc Address : 6701 Bay Street Emeryville California United States Equipment Under Test (EUT) : Product description : Wireless Microphone Model No. : UH-4 Frequency Range : 906MHz Standards : FCC 15 Paragraph 15.249 Date of Test : Dec. 07, 2009 Test Engineer : Olic huang Reviewed By : PERPARED BY: Waltek Services (Shenzhen) Co., Ltd. 8C,West Tower, Aidi Building, No.5003 Binhe Rd, Futian District, Shenzhen518045, Guangdong, China. Tel: 86-755-83551033 Fax: 86-755-83552400 Nady Systems Inc. FCC ID: BEK9E3UH-42 Page 2 of 25 2 Contents Page 1 COVER PAGE..........................................................................................................................................................1 2 CONTENTS ...............................................................................................................................................................2 3 TEST SUMMARY .....................................................................................................................................................4 4 GENERAL INFORMATION ...................................................................................................................................5 4.1 CLIENT INFORMATION..........................................................................................................................................5 4.2 GENERAL DESCRIPTION OF E.U.T. .......................................................................................................................5 4.3 DETAILS OF E.U.T................................................................................................................................................5 4.4 DESCRIPTION OF SUPPORT UNITS.........................................................................................................................5 4.5 STANDARDS APPLICABLE FOR TESTING...............................................................................................................5 4.6 TEST FACILITY.....................................................................................................................................................6 4.7 TEST LOCATION...................................................................................................................................................6 5 EQUIPMENT USED DURING TEST .....................................................................................................................7 6 CONDUCTED EMISSION TEST..........................................................................................................................10 6.1 TEST EQUIPMENT...............................................................................................................................................10 6.2 TEST PROCEDURE...............................................................................................................................................10 6.3 CONDUCTED TEST SETUP...................................................................................................................................11 6.4 EUT OPERATING CONDITION.............................................................................................................................11 6.5 CONDUCTED EMISSION LIMITS...........................................................................................................................12 7 RADIATION EMISSION TEST ............................................................................................................................13 7.1 TEST EQUIPMENT...............................................................................................................................................13 7.2 MEASUREMENT UNCERTAINTY..........................................................................................................................13 7.3 TEST PROCEDURE...............................................................................................................................................14 7.4 RADIATED TEST SETUP......................................................................................................................................14 7.5 SPECTRUM ANALYZER SETUP............................................................................................................................15 7.6 CORRECTED AMPLITUDE & MARGIN CALCULATION..........................................................................................15 7.7 SUMMARY OF TEST RESULTS.............................................................................................................................16 7.8 RADIATED EMISSIONS LIMIT..............................................................................................................................16 7.9 RADIATED EMISSIONS TEST RESULT..................................................................................................................17 8 OCCUPIED BANDWIDTH....................................................................................................................................20 8.1 TEST EQUIPMENT...............................................................................................................................................20 8.2 TEST PROCEDURE...............................................................................................................................................20 8.3 TEST RESULTS....................................................................................................................................................20 9 BAND EDGE TEST RESULT................................................................................................................................21 9.1 TEST REQUIREMENT.................................................................................................…

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