EW780-1005-00900MHz Wireless E-Mail Device

EXHIBIT C - EUT EXTERNAL PHOTOGRAPHS Base Chassis - Top View Base Chassis - Bottom View Terminal Chassis - Top View Terminal Chassis - Bottom View Base Power Adapter - Overall View Terminal Power Adapter - Overall View

Danger of explosion if battery is incorrectly replaced USE ONLY BATTERY 80-1007-00-00 OR BATTERY 2414 CAUTION This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: 1) This device may not cause harmful interference, 2) This device must accept any interference received, including interference that may cause undesired operation. MADE IN CHINA VTECH TELECOMMUNICATIONS LTD. MODEL: COMPANION II CORDLESS MODEL NO.: 8009 USE ONLY DC 6V 300mA CLASS 2 POWER SOURCE ONLY OR 3.6V 1300mAh Ni-MH BATTERY FCC ID: EW780-1005-00 I.T.E. C2C BS AND TERMINAL FCC DRAFTS CAUTION LABEL BACK INLAY LABEL ALL ARE ENGRAVING POWER ADAPTOR DC 9V LINEPHONE PRODUCT CONTAINSNICKEL METAL HYDRIDEBATTERY: MUST BERECYCLED OR DISPOSED OF PROPERLY. DO NOT BURN ORPUNCTURE BATTERY. LIKE OTHERBATTERIES OF THIS TYPE. IF IT ISBURNED OR PUNCTURED. ITCOULD RELEASE TOXIC MATERIALWHICH COULD CAUSE INJURY. Serial No. LBL NiMH MODEL: COMPANION II CORDLESSMODEL NO.: 8009DC 9V 200mACLASS 2 POWER SOURCE ONLY e-Mail PostBox MADE IN CHINA I.T.E. COMPLIES WITH 47 CFR PART 68 REGISTRATION NO.: US: EW7OT00B80-100500 RINGER EQUIVALENCE: 0.0B USOC JACK: RJ11C/RJ11W THIS DEVICE COMPLIES WITH PART 15 OF THE FCC RULES. OPERATION IS SUBJECT TO THE FOLLOWING TWO CONDITIONS: 1) THIS DEVICE MAY NOT CAUSE HARMFUL INTERFERENCE; AND 2) THIS DEVICE MUST ACCEPT ANY INTERFERENCE RECEIVED, INCLUDING INTERFERENCE THAT MAY CAUSE UNDESIRED OPERATION. PRIVACY OF COMMUNICATIONS MAY NOT BE ENSURED WHEN USING THIS PHONE. FCC ID: EW780-1005-00

EXHIBIT C - EUT INTERNAL PHOTOGRAPHS Base Main Board - Component View Base Main Board - Solder View Base Transceiver - Component View Base Transceiver - Solder View Terminal Main Board - Component View Terminal Main Board - Solder View Terminal Transceiver - Component View Terminal Transceiver - Solder View

Note: This test report is specially limited to the above client company and the product model only. It may not be duplicated without prior written consent of Bay Area Compliance Laboratory Corporation. This report must not be used by the client to claim product endorsement by NVLAP or any agency of the U.S. Government. FCC PART 15 Subpart C EMI MEASUREMENT AND TEST REPORT For VTech Telecommunications Ltd. 23/F Tai Ping Industrial Center Block 1 57 Ting Kok Road, Tai Po NT, Hong Kong FCC ID: EW780-1005-00 July 11, 2002 This Report Concerns: Original Report Equipment Type: Cordless Phone Test Engineer: Benjamin Jing Report No.: R0206111 Test Date: June 15, 2002 Reviewed By: Jeff Lee Prepared By: Bay Area Compliance Laboratory Corporation 230 Commercial Street Sunnyvale, CA 94085 Tel (408) 732-9162 Fax (408) 732-9164 VTech Telecommunications Ltd. FCC ID: EW780-1005-00 Report # R0206111Rpt Page 2 of 17 FCC Part 15 Subpart C Report TABLE OF CONTENTS 1 - GENERAL INFORMATION..................................................................................................................................3 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ..............................................................................3 1.2 OBJECTIVE.............................................................................................................................................................3 1.3 RELATED SUBMITTAL(S)/GRANT(S) ......................................................................................................................3 1.4 TEST METHODOLOGY............................................................................................................................................3 1.5 TEST FACILITY.......................................................................................................................................................4 1.6 TEST EQUIPMENT LIST...........................................................................................................................................4 1.8 LOCAL SUPPORT EQUIPMENT LIST AND DETAILS...................................................................................................5 1.9 EXTERNAL I/O CABLING LIST AND DETAILS.........................................................................................................5 2 - SYSTEM TEST CONFIGURATION.....................................................................................................................6 2.1 DESCRIPTION OF TEST CONFIGURATION................................................................................................................6 2.2 EQUIPMENT MODIFICATIONS.................................................................................................................................6 2.3 CONFIGURATION OF TEST SYSTEM.........................................................................................................................7 2.4 TEST SETUP BLOCK DIAGRAM...............................................................................................................................7 3 - CONDUCTED EMISSION .....................................................................................................................................8 3.1 MEASUREMENT UNCERTAINTY..............................................................................................................................8 3.2 EUT SETUP............................................................................................................................................................8 3.3 SPECTRUM ANALYZER SETUP................................................................................................................................8 3.4 TEST PROCEDURE..................................................................................................................................................9 3.5 SUMMARY OF TEST RESULTS.................................................................................................................................9 3.6 CONDUCTED EMISSIONS TEST DATA.....................................................................................................................9 3.7 PLOT OF CONDUCTED EMISSIONS TEST DATA.......................................................................................................9 4 - RADIATED EMISSION........................................................................................................................................11 4.1 MEASUREMENT UNCERTAINTY............................................................................................................................11 4.2 EUT SETUP..........................................................................................................................................................11 4.3 SPECTRUM ANALYZER SETUP..............................................................................................................................11 4.4 TEST PROCEDURE................................................................................................................................................12 4.5 CORRECTED AMPLITUDE & MARGIN CALCULATION...........................................................................................12 4.6 SUMMARY OF TEST RESULTS...............................................................................................................................13 4.7 RADIATED EMISSIONS TEST RESULT DATA.........................................................................................................14 5 - BAND EDGES TESTING .....................................................................................................................................16 5.1 TEST PROCEDURE................................................................................................................................................16 5.2 TEST EQUIPMENT...............…

Text truncated - open the document above for the full version.

EXHIBIT B - TEST SETUP PHOTOGRAPHS Base Conducted Emission - Front View Base Conducted Emission - Rear View Base Radiated Emission - Front View Base Radiated Emission - Rear View Terminal Conducted Emission - Front View Terminal Conducted Emission - Rear View Terminal Radiated Emission - Front View Terminal Radiated Emission - Rear View