JFZTWX7RWireless Headphones with Bluetooth

FCC ID: JFZTWX7RIC: 1752B-TWX7R ExternalPhotos 1.EUTfrontview 2.EUTrearview 3.EUTleftsideview 4.EUTrightsideview 5.EUTtopview 6.EUTbottomview 7.EUTfrontview 8.EUTfrontview 9.EUTrearview 10.EUTleftsideview 11.EUTrightsideview 12.EUTtopview 13.EUTbottomview 14.Accessories

1.Charging case Label 2.Lable location Pasted on the charging case bottom side. Label Size: 3.9*2.3 cm 3.Gift box label 4.Label location

Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 32 TEST REPORT Reference No. .................... : WTX23X10231914W003 FCC ID ................................ : JFZTWX7R Applicant ........................... : Audio-Technica Corporation Address ............................. : 2-46-1 Nishi-naruse, Machida, Tokyo 194-8666, Japan Manufacturer ..................... The same as Applicant Address ............................. The same as Applicant Product Name ................... : Wireless Headphones Model No.. .......................... : ATH-TWX7R Standards .......................... : FCC Part 2.1093, IEEE Std C95.1: 2019 IEEE Std C95.3: 2002 + Rev. 2008 IEC/IEEE 62209-1528 Ed. 1.0 (2020-10) Date of Receipt sample .... : 2023-10-30 Date of Test........................ : 2023-10-30 to 2023-11-01 Date of Issue ..................... : 2023-11-01 Test Report Form No. ....... : WTX_Part2_1093W Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Jack Sun Silin Chen Reference No.: WTX23X10231914W003 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 32 TABLE OF CONTENTS 1. General Information ................................................................................................................................................... 4 1.1 Product Description for Equipment Under Test (EUT) ......................................................................................... 4 1.2 Test Standards .................................................................................................................................................... 5 1.3 Test Methodology ................................................................................................................................................ 5 1.4 Test Facility ......................................................................................................................................................... 5 2. Summary of Test Results .......................................................................................................................................... 6 3. Specific Absorption Rate (SAR) ................................................................................................................................ 7 3.1 Introduction .......................................................................................................................................................... 7 3.2 SAR Definition ..................................................................................................................................................... 7 4. SAR Measurement System ........................................................................................................................................ 8 4.1 The Measurement System .................................................................................................................................. 8 4.2 Probe ................................................................................................................................................................... 8 4.3 Probe Calibration Process ................................................................................................................................. 10 4.4 Phantom ............................................................................................................................................................ 10 4.5 Device Holder .................................................................................................................................................... 11 4.6 Test Equipment List ........................................................................................................................................... 12 5. Tissue Simulating Liquids ....................................................................................................................................... 13 5.1 Composition of Tissue Simulating Liquid ........................................................................................................... 13 5.2 Tissue Dielectric Parameters for Head and Body Phantoms ............................................................................. 14 5.3 Tissue Calibration Result ................................................................................................................................... 15 6. SAR Measurement Evaluation ................................................................................................................................ 16 6.1 Purpose of System Performance Check ............................................................................................................ 16 6.2 System Setup .................................................................................................................................................... 16 6.3 Validation Results .............................................................................................................................................. 17 7. EUT Testing Position ............................................................................................................................................... 18 7.1 DUTs with alternative form factor ...................................................................................................................... 18 7.2 EUT …

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Page: 1/13 Ref : ACR.104.1.23.SATU.A Calibrated at MVG Z.I. de la pointe du diable Technopôle Brest Iroise – 295 avenue Alexis de Rochon 29280 PLOUZANE - FRANCE Calibration date: 08/20/2023 Accreditations #2-6789 and #2-6814 Scope available on www.cofrac.fr The use of the Cofrac brand and the accreditation references is prohibited from any reproduction. Summary: This document presents the method and results from an accredited SAR reference dipole calibration performed in MVG using the COMOSAR test bench. All calibration results are traceable to nationa l metrology institutions. SAR Reference Dipole Calibration Report Waltek Testing Group (Shenzhen) Co., Ltd. 1/F, Building A, Hongwei Industrial Park, Liuxian 2 nd Road BAO'AN DISTRICT SHENZHEN, P.R.C. (518101) MVG COMOSAR REFERENCE DIPOLE FREQUENCY: 2450 MHZ SERIAL NO.: SN 13/15 DIP 2G450-364 SAR REFERENCE DIPOLE CALIBRATION REPORT Ref: ACR.104.1.23.SATU.A Page: 2/13 Template_ACR.DDD.N.YY.MVGB.ISSUE_SAR Reference Dipole vJ This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. NameFunctionDateSignature Prepared by :Jérôme LucTechnical Manager 08/20/2023 Checked by :Jérôme LucTechnical Manager 08/20/2023 Approved by:Yann ToutainLaboratory Director 08/20/2023 Customer Name Distribution : IssueNameDateModifications AJérôme Luc 08/20/2023 Initial release 2023.08.20 11:56:55 +01'00' Waltek Testing Group (Shenzhen) Co., Ltd. SAR REFERENCE DIPOLE CALIBRATION REPORT Ref: ACR.104.1.23.SATU.A Page: 3/13 Template_ACR.DDD.N.YY.MVGB.ISSUE_SAR Reference Dipole vJ This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. TABLE OF CONTENTS 1 Introduction ................................................................................................................ 4 2 Device Under Test ..................................................................................................... 4 3 Product Description ................................................................................................... 4 3.1 General Information _______________________________________________________ 4 4 Measurement Method ................................................................................................ 5 4.1 Return Loss Requirements __________________________________________________ 5 4.2 Mechanical Requirements ___________________________________________________ 5 5 Measurement Uncertainty .......................................................................................... 5 5.1 Return Loss ______________________________________________________________ 5 5.2 Dimension Measurement ___________________________________________________ 5 5.3 Validation Measurement ____________________________________________________ 5 6 Calibration Measurement Results .............................................................................. 6 6.1 Return Loss and Impedance In Head Liquid ____________________________________ 6 6.2 Return Loss and Impedance In Body Liquid ____________________________________ 6 6.3 Mechanical Dimensions ____________________________________________________ 7 7 Validation measurement ............................................................................................ 7 7.1 Head Liquid Measurement __________________________________________________ 8 7.2 SAR Measurement Result With Head Liquid ____________________________________ 8 7.3 Body Liquid Measurement _________________________________________________ 11 7.4 SAR Measurement Result With Body Liquid __________________________________ 12 8 List of Equipment .................................................................................................... 13 SAR REFERENCE DIPOLE CALIBRATION REPORT Ref: ACR.104.1.23.SATU.A Page: 4/13 Template_ACR.DDD.N.YY.MVGB.ISSUE_SAR Reference Dipole vJ This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 1 INTRODUCTION This document contains a summary of the requirements set forth by the IEC/IEEE 62209-1528 and FCC KDB865664 D01 standards for reference dipoles used for SAR measurement system validations and the measurements that were performed to verify that the product complies with the fore mentioned standards. 2 DEVICE UNDER TEST Device Under Test Device Type COMOSAR 2450 MHz REFERENCE DIPOLE Manufacturer MVG Model SID2450 Serial Number SN 13/15 DIP 2G450-364 Product Condition (new / used) New 3 PRODUCT DESCRIPTION 3.1 GENERAL INF ORMATION MVG’s COMOSAR Validation Dipoles are built in accordance to the IEC/IEEE 62209-1528 and FCC KDB865664 D01 standards. The product is designed for use with the COMOSAR test bench only. Figure 1 – MVG COMOSAR Validation Dipole SAR REFERENCE DIPOLE CALIBRATION REPORT Ref: ACR.104.1.23.SATU.A Page: 5/13 Template_ACR.DDD.N.YY.MVGB.ISSUE_SAR Reference Dipole vJ This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 4 MEASUREMENT METHOD The IEC/IEEE 62209-1528 and FCC KDB865664 D01 standards provide requirements for reference dipoles used for system validation measurements. The following measurements were performed to verify that the product complies with the fore mentioned standards. 4.1 RETURN LOSS REQUIREMENTS The dipole used for SAR system validati…

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1 Antenna Model: ATH-TWX7 FIC RnD V1 26 May 2023 Charter Media (Dongguan) Co., Ltd. Address: Dabandi Industrial Zone, Daning District, Humen Town, 523930 Dongguan City, Guangdong, China 2 Characteristics: 1. Antenna type: FPC Monopole 2. Gain and efficiency 3. Reflection coefficient 4. 2D antenna pattern at CH0, CH39 and CH78 Test Environment Condition 1)Temperature:18-30°C 2)Relative Humidity:45-65% Test environment EUT L CH R CH 6 Antenna size L CH R CH Gain and efficiency L CH R CH Reflection coefficient L CH R CH 9 Passive 2D antenna pattern L CH R CH 10 Passive 2D antenna pattern L CH R CH 11 thanks

Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 75 TEST REPORT Reference No. .................... : WTX23X10231914W002 FCC ID ................................ : JFZTWX7R Applicant ........................... : Audio-Technica Corporation Address ............................. : 2-46-1 Nishi-naruse, Machida, Tokyo 194-8666, Japan Manufacturer ..................... : The same as Applicant Address ............................. : The same as Applicant Product Name ................... : Wireless Headphones Model No.. .......................... : ATH-TWX7R Standards .......................... : 47 CFR Part 15 Subpart C Date of Receipt sample .... : 2023-10-30 Date of Test........................ : 2023-10-30 to 2023-11-01 Date of Issue ..................... : 2023-11-01 Test Report Form No. ....... : WTX_Part 15_247W Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Jason Su Silin Chen Reference No.: WTX23X10231914W002 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 75 TABLE OF CONTENTS 1. GENERAL INFORMATION .................................................................................................................................... 5 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ......................................................................... 5 1.2 TEST STANDARDS ................................................................................................................................................. 6 1.3 TEST METHODOLOGY ........................................................................................................................................... 6 1.4 TEST FACILITY ...................................................................................................................................................... 6 1.5 EUT SETUP AND TEST MODE .............................................................................................................................. 7 1.6 MEASUREMENT UNCERTAINTY ............................................................................................................................. 8 1.7 TEST EQUIPMENT LIST AND DETAILS ................................................................................................................... 9 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 12 3. ANTENNA REQUIREMENT ................................................................................................................................. 13 3.1 STANDARD APPLICABLE ..................................................................................................................................... 13 3.2 EVALUATION INFORMATION ................................................................................................................................ 13 4. DUTY CYCLE OF TEST SIGNAL ....................................................................................................................... 14 4.1 REQUIREMENT .................................................................................................................................................... 14 4.2 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 14 5. POWER SPECTRAL DENSITY ........................................................................................................................... 15 5.1 STANDARD APPLICABLE ..................................................................................................................................... 15 5.2 TEST SETUP BLOCK DIAGRAM ........................................................................................................................... 15 5.3 TEST PROCEDURE .............................................................................................................................................. 15 5.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 15 6. DTS BANDWIDTH ................................................................................................................................................. 16 6.1 STANDARD APPLICABLE ..................................................................................................................................... 16 6.2 TEST SETUP BLOCK DIAGRAM ........................................................................................................................... 16 6.3 TEST PROCEDURE .............................................................................................................................................. 16 6.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 16 7. RF OUTPUT POWER ............................................................................................................................................ 17 7.1 STANDARD APPLICABLE ..................................................................................................................................... 17 7.2 TEST SETUP BLOCK DIAGRAM ........................................................................................…

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Reference No.: WTX23X10231914W Page 1 of 2 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn ANNEX EXHIBIT 1 - TEST SETUP PHOTOGRAPHS Radiation Emission Test Setup (Below 30MHz) Radiation Emission Test Setup (30MHz to 1GHz) Reference No.: WTX23X10231914W Page 2 of 2 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (1GHz to 18GHz) Radiation Emission Test Setup (Above 18GHz) ***** END OF REPORT *****

Reference No.: WTX23X10231914W003 Page 1 of 3 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Test Setup Photos Body mode Exposure Conditions Test distance: 0mm Body Back Body Front Reference No.: WTX23X10231914W003 Page 2 of 3 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Body Right Body Left Reference No.: WTX23X10231914W003 Page 3 of 3 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Body Top Body Bottom