
Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.
Report No: SSP24050269-1E FCC ID: L76-PORTAPRO2P0 Annex of Test Report Annex A. EUT External Photos EUT View 1 EUT View 2 Report No: SSP24050269-1E FCC ID: L76-PORTAPRO2P0 Annex of Test Report EUT View 3 EUT View 4 Report No: SSP24050269-1E FCC ID: L76-PORTAPRO2P0 Annex of Test Report EUT View 5 EUT View 6 Report No: SSP24050269-1E FCC ID: L76-PORTAPRO2P0 Annex of Test Report EUT View 7 EUT View 8
Report No: SSP24050269-1E FCC ID: L76-PORTAPRO2P0 Annex of Test Report Annex D. Label and Information FCC Label Sample FCC Label Specifications Text is Black in color and is justified. Labels are printed in indelible ink on permanent adhesive backing or silk-screened onto the EUT or shall be affixed at a conspicuous location on the EUT. Where the EUT is constructed in two or more sections connected by wires and marketed together, the above statement is required to be affixed only to the main control unit. When the EUT is so small or for such use that it is not practicable to place the statement on it, the above information shall be placed in a prominent location in the instruction manual or pamphlet supplied to the user or, alternatively, shall be placed on the container in which the device is marketed. FCC Label Location
CCUT Testing & Certification Report No: SSP24050269-2E FCC Test Report Page 1 of 7 RF Exposure Report FCC ID: L76-PORTAPRO2P0 Report No. : SSP24050269-2E Applicant : Koss Corporation Product Name : Bluetooth Headset Model Name : Porta Pro Wireless 2.0 Test Standard : FCC CFR 47 PART 2.1093 Date of Issue : 2024-08-03 Shenzhen CCUT Quality Technology Co., Ltd. 1F, Building 35, Changxing Technology Industrial Park, Yutang Street, Guangming District, Shenzhen, Guangdong, China; (Tel.:+86-755-23406590 website: www.ccuttest.com) This test report is limited to the above client company and the product model only. It may not be duplicated without prior permitted by Shenzhen CCUT Quality Technology Co., Ltd. CCUT Testing & Certification Report No: SSP24050269-2E FCC Test Report Page 2 of 7 Test Report Basic Information Applicant..................................: Koss Corporation Address of Applicant...............: 4129 N. Port Washington Avenue, Milwaukee, Wisconsin 53212, United States Manufacturer..........................: Koss Corporation Address of Manufacturer........: 4129 N. Port Washington Avenue, Milwaukee, Wisconsin 53212, United States Product Name.........................: Bluetooth Headset Brand Name.............................: KOSS Main Model..............................: Porta Pro Wireless 2.0 Series Models..........................: - Test Standard..........................: FCC CFR 47 PART 2.1093 KDB 447498 D01 v06 Date of Test .............................: 2024-05-31 to 2024-07-16 Test Result...............................: PASSED Tested By ................................: (Colin Chen) Reviewed By............................: (Lieber Ouyang) Authorized Signatory............: (Lahm Peng) Note : This test report is limited to the above client company and the product model only. It may not be duplicated without prior permitted by Shenzhen CCUT Quality Technology Co., Ltd.. All test data presented in this test report is only applicable to presented test sample. CCUT Testing & Certification Report No: SSP24050269-2E FCC Test Report Page 3 of 7 CONTENTS 1. General Information ....................................................................................................................................................5 1.1 Product Information .............................................................................................................................................5 1.2 Test Facilities ........................................................................................................................................................5 2. RF Exposure .................................................................................................................................................................6 2.1 Standard and Limit................................................................................................................................................6 2.2 Test Procedure......................................................................................................................................................6 2.3 Test Data and Results ............................................................................................................................................7 CCUT Testing & Certification Report No: SSP24050269-2E FCC Test Report Page 4 of 7 Revision History Revision Issue Date Description Revised By V1.0 2024-08-03 Initial Release Lahm Peng CCUT Testing & Certification Report No: SSP24050269-2E FCC Test Report Page 5 of 7 1. General Information 1.1 Product Information Product Name: Bluetooth Headset Trade Name: KOSS Main Model: Porta Pro Wireless 2.0 Series Models: - Rated Voltage: DC 3.7V by battery, USB 5V charging Battery: DC3.7V, 100mAh Hardware Version: PPWV2-V6 Software Version: V2 Note 1: The test data is gathered from a production sample, provided by the manufacturer. Wireless Specification Wireless Standard: Bluetooth BR/EDR Operating Frequency: 2402MHz ~ 2480MHz RF Output Power: -2.45dBm Number of Channel: 79 Channel Separation: 1MHz Modulation: GFSK, Pi/4 DQPSK, 8DPSK Antenna Gain: 1.75dBi Type of Antenna: SMD Antenna Type of Device: Portable Device Mobile Device Modular Device 1.2 Test Facilities Laboratory Name: Shenzhen CCUT Quality Technology Co., Ltd. 1F, Building 35, Changxing Technology Industrial Park, Yutang Street, Guangming District, Shenzhen, Guangdong, China CNAS Laboratory No.: L18863 A2LA Certificate No.: 6893.01 FCC Registration No: 583813 ISED Registration No.: CN0164 All measurement facilities used to collect the measurement data are located at 1F, Building 35, Changxing Technology Industrial Park, Yutang Street, Guangming District, Shenzhen, Guangdong, China. CCUT Testing & Certification Report No: SSP24050269-2E FCC Test Report Page 6 of 7 2.RF Exposure 2.1 Standard and Limit 3.0 for 1g SAR. 2.2 Test Procedure Unless specifically required by the published RF exposure KDB procedures, standalone 1-g head or body and 10-g extremity SAR evaluation for general population exposure conditions, by measurement or numerical simulation, is not required when the corresponding SAR Test Exclusion Threshold condition(s), listed below, is (are) satisfied. These test exclusion conditions are based on source-based time-averaged maximum conducted output power of the RF channel requiring evaluation, adjusted for tune-up tolerance, and the minimum test separation distance required for the exposure conditions. The minimum test separation distance defined in 4.1 f) is determined by the smallest distance from the antenna and radiating structures or outer surface of the device, according to the host form factor, exposure conditions and platform requirements, to any part of the body or extremity of a user or bystander. To qualify for SAR test exclusion, the test separation distances applied must be fully explained and justified, typically in the SAR measurement or SAR analysis report, by the operating co…
Text truncated - open the document above for the full version.
承 認 書 SPECIFICATION FOR APPROVAL 客戶名稱 CUSTOMER : 客戶料號 CUSTOMER’S P/N : 料號 PART NUMBER : WAN3216F245H0X 規格 DESCRIPTION : Chip Antenna 3216 L Ant 2.45G Type 0X 版本 VERSION : V2.1 日期 ISSUE DATE : 2018/07/01 客 戶 承 認 CUSTOMER APPROVED 工 程 部 R&D CENTER 承 認 APPROVAL 確 認 CHECKED 製 作 DRAWN Ray Nate Kelvin 萬誠科技股份有限公司 OneWave Electronic Co., Ltd. 112台北市北投區中央南路二段36號3樓 2F., No.163, Sec. 1, Xi'an St., Beitou Dist., Taipei City 112, Taiwan 電話: (02) 2898-2220 TEL: +886 2 2898-2220 傳真: (02) 2898-5055 FAX: +886 2 2898-5055 2/11 ONEWAVE TECHNOLOGY CO., LTD. SMD Antenna For Bluetooth / WLAN Applications Dimension (mm) L 3.23 ± 0.20 W 1.66 ± 0.20 T 0.45 ± 0.20 P/N: WAN3216F245H0X 3/11 ONEWAVE TECHNOLOGY CO., LTD. Part Number Information WAN 3216 F 245 H 0X A B C D E F A Product Series Antenna B Dimension L x W 3.2X1.6mm (+-0.2mm) C Material High K material D Working Frequency 2.4 ~ 2.5GHz E Feeding mode PIFA & Single Feeding F Antenna type X=06,07,08 / Type=06,07,08 1.Electrical Specification Remark : Bandwidth & Peak Gain was measured under evaluation board of next page Specification Part Number WAN3216F245H0X Central Frequency 2450 MHz Bandwidth 120 (Min.) MHz Return Loss -6.5 (Max)dB Peak Gain 1.75 dBi Impedance 50 Ohm Operating Temperature -40~+85°C Maximum Power 4 W Resistance to Soldering Heats 10 ( @ 260°C) sec. Polarization Linear Azimuth Beamwidth Omni-directional Termination Ni / Au (Leadless) 4/11 ONEWAVE TECHNOLOGY CO., LTD. 2. Recommended PCB Pattern Evaluation Board Dimension 2 nd Evaluation Board Dimension Suggested Matching Circuit 重要資訊 : 匹配元件建議使用精準度±1%以下的電感、電容、電阻 Layout Dimensions in Clearance area( Size=5.9*5.0mm) 5/11 ONEWAVE TECHNOLOGY CO., LTD. FootPrint (Unit : mm) ◆ 2 nd Layout Dimensions in Clearance area( Size=8.0*3.0mm) Matching Circuit 50 ohm transmission Line 6/11 ONEWAVE TECHNOLOGY CO., LTD. 3. Measurement Results Return Loss 7/11 ONEWAVE TECHNOLOGY CO., LTD. Radiation Pattern Efficiency Peak Gain Directivity 2450MHz 85.65% 1.75 dBi 1.5dBi Chamber Coordinate System X Y Z 8/11 ONEWAVE TECHNOLOGY CO., LTD. 4.Reliability and Test Condictions ITEM REQUIREMENTS TEST CONDITION Solderability 1.Wetting shall exceed 90% coverage 2. No visible mechanical damage Pre-heating temperature:150°C/60sec. Solder temperature:230±5°C Duration:4±1sec. Solder:Sn-Ag3.0-Cu0.5 Flux for lead free: rosin Solder heat Resistance 1. No visible mechanical damage 2.Central Freq. change :within ± 6% 10±0.5 sec. 60sec .. TEMP (°C) 150°C 260°C Pre-heating temperature:150°C/60sec. Solder temperature:260±5°C Duration:10±0.5sec. Solder:Sn-Ag3.0-Cu0.5 Flux for lead free: rosin Component Adhesion (Push test) 1. No visible mechanical damage The device should be reflow soldered(230±5°C for 10sec.) to a tinned copper substrate A dynometer force gauge should be applied the side of the component. The device must with-ST-F 0.5 Kg without failure of the termination attached to component. Component Adhesion (Pull test) 1. No visible mechanical damage Insert 10cm wire into the remaining open eye bend ,the ends of even wire lengths upward and wind together. Terminal shall not be remarkably damaged. Thermal shock 1. No visible mechanical damage 2.Central Freq. change :within ±6% Phase Temperature(°C) Time(min) 1 +85±5°C 30±3 2 Room Temperature Within 3sec 3 -40±2°C 30±3 4 Room Temperature Within 3sec +85°C=>30±3min -40°C=>30±3min Test cycle:10 cycles The chip shall be stabilized at normal condition for 2~3 hours before measuring. Resistance to High Temperature 1. No visible mechanical damage 2. Central Freq. change :within ±6% 3.No disconnection or short circuit. Temperature: 85±5°C Duration: 1000±12hrs The chip shall be stabilized at normal condition for 2~3 hours before measuring. Resistance to Low Temperature 1. No visible mechanical damage 2. Central Freq. change :within ±6% 3.No disconnection or short circuit. Temperature:-40±5°C Duration: 1000±12hrs The chip shall be stabilized at normal condition for 2~3 hours before measuring. Humidity 1. No visible mechanical damage 2. Central Freq. change :within ±6% 3.No disconnection or short circuit. Temperature: 40±2°C Humidity: 90% to 95% RH Duration: 1000±12hrs The chip shall be stabilized at normal condition for 2~3 hours before measuring. 4±1 sec. 60sec TEMP (°C) 150°C 230°C 9/11 ONEWAVE TECHNOLOGY CO., LTD. 5.Soldering and Mounting Mildly activated rosin fluxes are preferred. The minimum amount of solder can lead to damage from the stresses caused by the difference in coefficients of expansion between solder, chip and substrate. The terminations are suitable for all wave and re-flow soldering systems. If hand soldering cannot be avoided, the preferred technique is the utilization of hot air soldering tools. Recommended temperature profiles for re-flow soldering in Figure 1. Products attachment with a soldering iron is discouraged due to the inherent process control limitations. In the event that a soldering iron must be employed the following precautions are recommended. ‧Preheat circuit and products to 150°C ‧Never contact the ceramic with the iron tip ‧Use a 20 watt soldering iron with tip diameter of 1.0mm ‧280°C tip temperature (max) ‧1.0mm tip diameter (max) ‧Limit soldering time to 3 sec. SOLDERING COOLING NATURAL PRE-HEATING TEMPERATURE(°C) 60~120 s 10s max. 30~60s 250~260 230 180 150 TIME(sec.) Reflow Soldering SOLDERING COOLING NATURAL PRE-HEATING TEMPERATURE(°C) within 3s Gradual cooling 150 TIME(sec.) Iron Soldering Over 60s 350 300 10/11 ONEWAVE TECHNOLOGY CO., LTD. 6.Packaging Information Tape Specification: Reel Specification: (7’’, Φ180 mm) Tape Width(mm) A(mm) B(mm) C(mm) D(mm) Chip/Reel(pcs) 8 9.0±0.5 60±2 13.5±0.5 178±2 3000 11/11 ONEWAVE TECHNOLOGY CO., LTD. 7.Storage and Transportation Information Storage Conditions To maintain the solderability of terminal electrodes: 1. Temperature and humidity conditions: -10~ 40°C and 30~70% RH. 2. Recommended products should be used within 6 months from the time of delivery. 3. The packaging material should be kept where…
Text truncated - open the document above for the full version.
CCUT Testing & Certification Report No: SSP24050269-1E FCC Test Report Page 1 of 52 FCC TEST REPORT FCC ID: L76-PORTAPRO2P0 Report No. : SSP24050269-1E Applicant : Koss Corporation Product Name : Bluetooth Headset Model Name : Porta Pro Wireless 2.0 Test Standard : FCC Part 15.247 Date of Issue : 2024-08-03 Shenzhen CCUT Quality Technology Co., Ltd. 1F, Building 35, Changxing Technology Industrial Park, Yutang Street, Guangming District, Shenzhen, Guangdong, China; (Tel.:+86-755-23406590 website: www.ccuttest.com) This test report is limited to the above client company and the product model only. It may not be duplicated without prior permitted by Shenzhen CCUT Quality Technology Co., Ltd. CCUT Testing & Certification Report No: SSP24050269-1E FCC Test Report Page 2 of 52 Test Report Basic Information Applicant..................................: Koss Corporation Address of Applicant...............: 4129 N. Port Washington Avenue, Milwaukee, Wisconsin 53212, United States Manufacturer..........................: Koss Corporation Address of Manufacturer........: 4129 N. Port Washington Avenue, Milwaukee, Wisconsin 53212, United States Product Name.........................: Bluetooth Headset Brand Name.............................: KOSS Main Model..............................: Porta Pro Wireless 2.0 Series Models..........................: - Test Standard..........................: FCC Part 15 Subpart C ANSI C63.4-2014 ANSI C63.10-2013 Date of Test .............................: 2024-05-31 to 2024-07-16 Test Result...............................: PASS Tested By ................................: (Colin Chen) Reviewed By............................: (Lieber Ouyang) Authorized Signatory............: (Lahm Peng) Note : This test report is limited to the above client company and the product model only. It may not be duplicated without prior permitted by Shenzhen CCUT Quality Technology Co., Ltd.. All test data presented in this test report is only applicable to presented test sample. CCUT Testing & Certification Report No: SSP24050269-1E FCC Test Report Page 3 of 52 CONTENTS 1. General Information ....................................................................................................................................................5 1.1 Product Information .............................................................................................................................................5 1.2 Test Setup Information..........................................................................................................................................6 1.3 Compliance Standards ...........................................................................................................................................7 1.4 Test Facilities ........................................................................................................................................................7 1.5 List of Measurement Instruments ..........................................................................................................................8 1.6 Measurement Uncertainty .....................................................................................................................................9 2. Summary of Test Results ........................................................................................................................................... 10 3. Antenna Requirement ............................................................................................................................................... 11 3.1 Standard and Limit.............................................................................................................................................. 11 3.2 Test Result .......................................................................................................................................................... 11 4. Conducted Emissions ................................................................................................................................................ 12 4.1 Standard and Limit.............................................................................................................................................. 12 4.2 Test Procedure.................................................................................................................................................... 12 4.3 Test Data and Results .......................................................................................................................................... 13 5. Radiated Emissions ................................................................................................................................................... 16 5.1 Standard and Limit.............................................................................................................................................. 16 5.2 Test Procedure.................................................................................................................................................... 16 5.3 Test Data and Results .......................................................................................................................................... 18 6. Band-edge Emissions(Radiated) ............................................................................................................................ 22 6.1 Standard and Limit.............................................................................................................................................. 22 6.2 Test Procedure.................................................................................................................................................... 22 6.3 Test Data and Results .......................................................................................................................................... 22 7. Frequency Hopping S…
Text truncated - open the document above for the full version.
| # | Rule Parts | Frequency Range | Power Output |
|---|---|---|---|
| 1 | 15C | 2.40 GHz - 2.48 GHz | 600.00 µW |

Bluetooth Headset
Equipment Class
DSS - Part 15 Spread Spectrum Transmitter
Bluetooth Headset
Equipment Class
DSS - Part 15 Spread Spectrum Transmitter
Bluetooth Headset
Equipment Class
DTS - Digital Transmission System
Bluetooth Speaker
Equipment Class
DSS - Part 15 Spread Spectrum Transmitter
STRIVΛ PRO Headphones
Equipment Class
DTS - Digital Transmission System