
Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.
FCC ID. : PA2WS-100 File No. : E00OR-032 ONETECH Testing & Evaluation Lab . IDENTIFICATION LABEL: PROPOSED FCC ID LABEL The label included following statement will be attached on the rear side of product. This device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operations. Warning: Modification of this device to receive cellular radiotelephone service signals is prohibited under FCC Rules and Federal Law. Made in Korea FCC ID : PA2WS-100 FCC ID AREA
Page 1 of 17 FCC ID.: Error! Unknown docume nt prope rty name . File No.: Error! Unknown docume nt prope rty name . This report shall not be reproduced except in full without our written approval.EMC-004 (Rev.0) HEAD OFFICE : #505 SK APT. Factory 223-28, Sangdaewon 1 Dong, Jungwon- Gu, Seongnam- C ity, K yunggi- Do, 462-121, Korea (TEL: 82- 31-746-8500 FAX: 82-31-746-8700 ) EM C Te s ting De pt : 426-1 Daessangryung- Ri, C howol- Myun, K wangju- K un, K yunggi- Do 464-860 Korea. (TEL: 82- 31-765-8289 FAX: 82-31-766-2904) ONETECH Testing & Evaluation Lab . ELECTROMAGNETIC EMISSION COMPLIANCE REPORT Test report file number : E00OR-032 Applicant : Woori Technology, Inc Address: WooriTG. Bldg., 1595, Bongchun 7-Dong, Kwanak-G u, 151-835 Korea Manufacturer : Woori Technology, Inc Address: WooriTG. Bldg., 1595, Bongchun 7-Dong, Kwanak-G u, 151-835 Korea Type of Equipme nt : Scanning Re ce ive r - Bugging De vice De te ction Syste m FCC ID.: PA2WS-100 Model / Type No. : WS-100 Se rial numbe r: N/ A Total page of Report: 17 pages (including this page) Date of Incoming: September 22, 2000 Date of issue : October 19, 2000 SUMMARY The equipment complies with the regulation; FCC CFR 47 PART 15 SUBPART B §15.101 and §15.121. This test report contains only the result of a single test of the sample supplied for the examination. It is not a generally valid assessment of the features of the respective products of the mass-production Prepared by: Reviewed by: G. W. Lee/ Asst. Chief EngineerY. K. Kwon/ Chief Engineer EMC Dept.EMC Dept. ONETECH Corp.ONETECH Corp. Page 2 of 17 FCC ID.: Error! Unknown docume nt prope rty name . File No.: Error! Unknown docume nt prope rty name . This report shall not be reproduced except in full without our written approval.EMC-004 (Rev.0) HEAD OFFICE : #505 SK APT. Factory 223-28, Sangdaewon 1 Dong, Jungwon- Gu, Seongnam- C ity, K yunggi- Do, 462-121, Korea (TEL: 82- 31-746-8500 FAX: 82-31-746-8700 ) EM C Te s ting De pt : 426-1 Daessangryung- Ri, C howol- Myun, K wangju- K un, K yunggi- Do 464-860 Korea. (TEL: 82- 31-765-8289 FAX: 82-31-766-2904) ONETECH Testing & Evaluation Lab . CONTENTS PAGE 1. VERIFICATION OF COMPLIANCE...............................................................................................................................3 2. GENERAL INFORMATION ............................................................................................................................................. 4 2.1 P RODUCT D ESCRIPTIO N .................................................................................................................................................... 4 2.2 R ELATED S UBMITTAL ( S ) / G RANT ( S ) ................................................................................................................................ 4 2.3 T EST S YSTEM D ETAILS ..................................................................................................................................................... 5 2.4 T EST M ETHODOLOGY ....................................................................................................................................................... 5 2.5 T EST F ACILITY ................................................................................................................................................................. 5 3. SYSTEM TEST CONFIGURATION................................................................................................................................. 5 3.1 J USTIFICATIO N ................................................................................................................................................................. 5 3.2 EUT EXERCISE S OFTWARE ............................................................................................................................................... 6 3.3 C ABLE D ESCRIPTIO N ........................................................................................................................................................ 6 3.4 N OISE S UPPRESSION P ARTS ON C ABLE ............................................................................................................................. 6 3.5 E QUIPMENT M ODIFICATIONS ........................................................................................................................................... 6 4. 4. REFERENCED RULES SECTIONS AND TEST PROCEDURE............................................................................... 7 4.1 Section 15.121(a): ...................................................................................................................................................... 7 4.2 Section 15.121(b): Cellular Image and Spurious Rejection in Scanning Receiver................................................... 7 4.3 Line Conducted Test:.................................................................................................................................................. 7 4.4 Radiated Emission Test:............................................................................................................................................. 7 4.5 Antenna-Conducted Power Measurement:................................................................................................................. 7 4.6 Coherent Test: ............................................................................................................................................................ 7 5. PRELIMINARY TEST........................................................................................................................................................ 8 5.1 AC P O WER LIN E C ONDUCTED E MISSION T EST ................................................................................................................. 8 5.2 R ADIATED E MISSIONS T ESTS ..........................................................................................................…
Text truncated - open the document above for the full version.
ΦΧΧ Ι∆.: ΠΑ2ΩΣ −100 Φιλε Νο. : Ε00ΟΡ−032 ONETECH Testing & Evaluation Lab . ΦΧΧ Ι∆.: ΠΑ2ΩΣ −100 Φιλε Νο. : Ε00ΟΡ−032 ONETECH Testing & Evaluation Lab . ΦΧΧ Ι∆.: ΠΑ2ΩΣ −100 Φιλε Νο. : Ε00ΟΡ−032 ONETECH Testing & Evaluation Lab .
426-1 DAESSANGRYUNG-RI · KYUNGGI-DO · South Korea
| # | Rule Parts | Frequency Range | Power Output |
|---|---|---|---|
| 1 | 15B | 1.7 MHz - 781.1 MHz | - |