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PA2WS-100Bugging Device Detection System

Woori Technology, Inc.
Bugging Device Detection System - FCC ID PA2WS-100 - Woori Technology, Inc.
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Application Details

Equipment Class
CSR - Scanning Receiver
Date of Grant
Dec 19, 2000
Application Purpose
Original Equipment
Date of Application
Dec 19, 2000
Equipment Note
Bugging Device Detection System
Frequency Range
1.70000000 - 781.10000000
Company
Woori Technology, Inc.
Country
South Korea

Documents & Files

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Users Manual

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Attestation Statements

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External Photos

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ID Label/Location Info

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Test Report

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Test Setup Photos

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

ID Label/Location Info

FCC ID. : PA2WS-100 File No. : E00OR-032 ONETECH Testing & Evaluation Lab . IDENTIFICATION LABEL: PROPOSED FCC ID LABEL The label included following statement will be attached on the rear side of product. This device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operations. Warning: Modification of this device to receive cellular radiotelephone service signals is prohibited under FCC Rules and Federal Law. Made in Korea FCC ID : PA2WS-100 FCC ID AREA

Test Report

Page 1 of 17 FCC ID.: Error! Unknown docume nt prope rty name . File No.: Error! Unknown docume nt prope rty name . This report shall not be reproduced except in full without our written approval.EMC-004 (Rev.0) HEAD OFFICE : #505 SK APT. Factory 223-28, Sangdaewon 1 Dong, Jungwon- Gu, Seongnam- C ity, K yunggi- Do, 462-121, Korea (TEL: 82- 31-746-8500 FAX: 82-31-746-8700 ) EM C Te s ting De pt : 426-1 Daessangryung- Ri, C howol- Myun, K wangju- K un, K yunggi- Do 464-860 Korea. (TEL: 82- 31-765-8289 FAX: 82-31-766-2904) ONETECH Testing & Evaluation Lab . ELECTROMAGNETIC EMISSION COMPLIANCE REPORT Test report file number : E00OR-032 Applicant : Woori Technology, Inc Address: WooriTG. Bldg., 1595, Bongchun 7-Dong, Kwanak-G u, 151-835 Korea Manufacturer : Woori Technology, Inc Address: WooriTG. Bldg., 1595, Bongchun 7-Dong, Kwanak-G u, 151-835 Korea Type of Equipme nt : Scanning Re ce ive r - Bugging De vice De te ction Syste m FCC ID.: PA2WS-100 Model / Type No. : WS-100 Se rial numbe r: N/ A Total page of Report: 17 pages (including this page) Date of Incoming: September 22, 2000 Date of issue : October 19, 2000 SUMMARY The equipment complies with the regulation; FCC CFR 47 PART 15 SUBPART B §15.101 and §15.121. This test report contains only the result of a single test of the sample supplied for the examination. It is not a generally valid assessment of the features of the respective products of the mass-production Prepared by: Reviewed by: G. W. Lee/ Asst. Chief EngineerY. K. Kwon/ Chief Engineer EMC Dept.EMC Dept. ONETECH Corp.ONETECH Corp. Page 2 of 17 FCC ID.: Error! Unknown docume nt prope rty name . File No.: Error! Unknown docume nt prope rty name . This report shall not be reproduced except in full without our written approval.EMC-004 (Rev.0) HEAD OFFICE : #505 SK APT. Factory 223-28, Sangdaewon 1 Dong, Jungwon- Gu, Seongnam- C ity, K yunggi- Do, 462-121, Korea (TEL: 82- 31-746-8500 FAX: 82-31-746-8700 ) EM C Te s ting De pt : 426-1 Daessangryung- Ri, C howol- Myun, K wangju- K un, K yunggi- Do 464-860 Korea. (TEL: 82- 31-765-8289 FAX: 82-31-766-2904) ONETECH Testing & Evaluation Lab . CONTENTS PAGE 1. VERIFICATION OF COMPLIANCE...............................................................................................................................3 2. GENERAL INFORMATION ............................................................................................................................................. 4 2.1 P RODUCT D ESCRIPTIO N .................................................................................................................................................... 4 2.2 R ELATED S UBMITTAL ( S ) / G RANT ( S ) ................................................................................................................................ 4 2.3 T EST S YSTEM D ETAILS ..................................................................................................................................................... 5 2.4 T EST M ETHODOLOGY ....................................................................................................................................................... 5 2.5 T EST F ACILITY ................................................................................................................................................................. 5 3. SYSTEM TEST CONFIGURATION................................................................................................................................. 5 3.1 J USTIFICATIO N ................................................................................................................................................................. 5 3.2 EUT EXERCISE S OFTWARE ............................................................................................................................................... 6 3.3 C ABLE D ESCRIPTIO N ........................................................................................................................................................ 6 3.4 N OISE S UPPRESSION P ARTS ON C ABLE ............................................................................................................................. 6 3.5 E QUIPMENT M ODIFICATIONS ........................................................................................................................................... 6 4. 4. REFERENCED RULES SECTIONS AND TEST PROCEDURE............................................................................... 7 4.1 Section 15.121(a): ...................................................................................................................................................... 7 4.2 Section 15.121(b): Cellular Image and Spurious Rejection in Scanning Receiver................................................... 7 4.3 Line Conducted Test:.................................................................................................................................................. 7 4.4 Radiated Emission Test:............................................................................................................................................. 7 4.5 Antenna-Conducted Power Measurement:................................................................................................................. 7 4.6 Coherent Test: ............................................................................................................................................................ 7 5. PRELIMINARY TEST........................................................................................................................................................ 8 5.1 AC P O WER LIN E C ONDUCTED E MISSION T EST ................................................................................................................. 8 5.2 R ADIATED E MISSIONS T ESTS ..........................................................................................................…

Text truncated - open the document above for the full version.

Test Setup Photos

ΦΧΧ Ι∆.: ΠΑ2ΩΣ −100 Φιλε Νο. : Ε00ΟΡ−032 ONETECH Testing & Evaluation Lab . ΦΧΧ Ι∆.: ΠΑ2ΩΣ −100 Φιλε Νο. : Ε00ΟΡ−032 ONETECH Testing & Evaluation Lab . ΦΧΧ Ι∆.: ΠΑ2ΩΣ −100 Φιλε Νο. : Ε00ΟΡ−032 ONETECH Testing & Evaluation Lab .

Contact Information

Applicant

Keun-Sang Lee(Project Engineer)
[email protected]82-2-886-0351Fax: 82-2-886-8560

Technical Contact

ONETECH CORP.Y.K. KWON
[email protected]82-31-765-8289

426-1 DAESSANGRYUNG-RI · KYUNGGI-DO · South Korea

Test Firm

ONETECH Corp.Y. Kwon
[email protected]+82-347-765-8289Fax: +82-347-766-2904

Technical Specifications

#Rule PartsFrequency RangePower Output
115B1.7 MHz - 781.1 MHz-
Confidentiality
Long Term
Grant Notes
In addition to frequency range listed in the Grant. Device is also capable of scanning from 895MHz to 2400 MHz. Grant will be reissued to show correct frequency range.