PKAFGTHR750Microwave Oven

QINGDAO HAIER MICROWAVE PRODUCTION CO., LTD. FCC ID: PKAFGTHR750 Report # B0207019 FCC ID Per Part 18 Test Report EXTERNAL EUT PHOTOGRAPHS EUT – Chassis Front View EUT – Chassis Rear View QINGDAO HAIER MICROWAVE PRODUCTION CO., LTD. FCC ID: PKAFGTHR750 Report # B0207019 FCC ID Per Part 18 Test Report EUT – Chassis Left Side View EUT – Chassis Right Side View QINGDAO HAIER MICROWAVE PRODUCTION CO., LTD. FCC ID: PKAFGTHR750 Report # B0207019 FCC ID Per Part 18 Test Report EUT – Chassis Uncovered Left View

QINGDAO HAIER MICROWAVE PRODUCTION CO., LTD. FCC ID: PKAFGTHR750 Report # B0207019 FCC ID Per Part 18 Test Report Proposed FCC Label Format Specifications: Text is white in color and is left justified. Labels are silk-screened and shall be “permanently affixed” at a conspicuous location on the EUT. FCC ID: PKAFGTHR750

QINGDAO HAIER MICROWAVE PRODUCTION CO., LTD. FCC ID: PKAFGTHR750 Report # B0207019 FCC ID Per Part 18 Test Report Proposed Label Location on EUT Rear View of EUT Proposed FCC ID Location

QINGDAO HAIER MICROWAVE PRODUCTION CO., LTD. FCC ID: PKAFGTHR750 Report # B0207019 FCC ID Per Part 18 Test Report INTERNAL EUT PHOTOGRAPHS EUT – Chassis Uncovered Right View QINGDAO HAIER MICROWAVE PRODUCTION CO., LTD. FCC ID: PKAFGTHR750 Report # B0207019 FCC ID Per Part 18 Test Report Controller PCB Component View Controller PCB Solder View

Note: This test report is specially limited to the above client company and the product model only. It may not be duplicated without prior written consent of Bay Area Compliance Laboratory Corporation. This report must not be used by the client to claim product endorsement by NVLAP or any agency of the U.S. Government. FCC ID PER PART 18 EMI MEASUREMENT AND TEST REPORT For QINGDAO HAIER MICROWAVE PRODUCTION CO., LTD. Qingdao Industry Park, Qingdao Development District, Qingdao, Shandong 266510, China FCC ID: PKAFGTHR750 July 12, 2002 This Report Concerns: Original Report Equipment Type: Microwave Oven – Consumer ISM Equipment Test Engineer:Eastern Chan Report Number:B0207019 Test Date:June 12, 2002 Reviewed By:Wayne Chia Prepared By:Bay Area Compliance Laboratory Corporation 230 Commercial Street Sunnyvale, CA 94085 Tel: (408) 732-9162 Fax: (408) 732-9164 QINGDAO HAIER MICROWAVE PRODUCTION CO., LTD. FCC ID: PKAFGTHR750 Report # B0207019 FCC ID Per Part 18 Test ReportPage 2 of 32 TABLE OF CONTENTS 1 - GENERAL INFORMATION.................................................................................................................................................3 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT).........................................................................................3 1.2 OBJECTIVE................................................................................................................................................................................3 1.3 TEST METHODOLOGY.............................................................................................................................................................3 1.4 TEST FACILITY.........................................................................................................................................................................3 1.5 TEST EQUIPMENT LIST AND DETAILS...................................................................................................................................4 1.6 LOCAL SUPPORT EQUIPMENT LIST AND DETAILS...............................................................................................................4 2 – OPERATING CONDITION/TEST CONFIGURATION..............................................................................................5 2.1 JUSTIFICATION.........................................................................................................................................................................5 2.2 SCHEMATICS / BLOCK DIAGRAM..........................................................................................................................................5 2.3 EQUIPMENT MODIFICATIONS.................................................................................................................................................5 2.4 CONFIGURATION OF TEST SYSTEM.......................................................................................................................................6 2.5 TEST SETUP BLOCK DIAGRAM..............................................................................................................................................6 3 – RADIATION HAZARD MEASUREMENT.....................................................................................................................7 3.1 RADIATION HAZARD MEASUREMENT..................................................................................................................................7 3.2 INPUT POWER...........................................................................................................................................................................7 3.3 LOAD FOR MICROWAVE OVENS.............................................................................................................................................7 3.4 RF OUTPUT POWER MEASUREMENT....................................................................................................................................8 3.5 OPERATING FREQUENCY MEASUREMENT...........................................................................................................................9 4 - RADIATED EMISSION DATA..........................................................................................................................................20 4.1 MEASUREMENT UNCERTAINTY...........................................................................................................................................20 4.2 EUT SETUP.............................................................................................................................................................................20 4.3 SPECTRUM ANALYZER SETUP.............................................................................................................................................20 4.4 TEST PROCEDURE..................................................................................................................................................................20 4.5 CORRECTED AMPLITUDE & MARGIN CALCULATION......................................................................................................21 4.6 SUMMARY OF TEST RESULTS...............................................................................................................................................21 4.7 RADIATED EMISSIONS TEST RESULT DATA......................................................................................................................22 5 – FCC PRODUCT LABELING AND WARNING STATEMENT..............................................................................24 5.1 PROPOSED FCC LABEL FORMAT........................................................................................................................................24 5.2 PROPOSED LABEL LOCATION ON EUT..........................................................................................…

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QINGDAO HAIER MICROWAVE PRODUCTION CO., LTD. FCC ID: PKAFGTHR750 Report # B0207019 FCC ID Per Part 18 Test Report Setup Photographs Radiated Setup Photograph – Front View Radiated Setup Photograph – Side View QINGDAO HAIER MICROWAVE PRODUCTION CO., LTD. FCC ID: PKAFGTHR750 Report # B0207019 FCC ID Per Part 18 Test Report Variation with Voltage Setup – Front View Leakage Test Setup – Front View