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QDOFD100USB Flash Disk

Hansol Microsystem Co., Ltd.
USB Flash Disk - FCC ID QDOFD100 - Hansol Microsystem Co., Ltd.
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Application Details

Equipment Class
JBP - Part 15 Class B Computing Device Peripheral
Date of Grant
May 27, 2002
Application Purpose
Original Equipment
Date of Application
May 27, 2002
Equipment Note
USB Flash Disk
Company
Hansol Microsystem Co., Ltd.
Country
South Korea

Documents & Files

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Users Manual

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Block Diagram

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External Photos

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ID Label/Location Info

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Internal Photos

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Test Report

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Test Setup Photos

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

Users Manual

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ID Label/Location Info

ID Label Sample & Location Information Hansol Microsystem Co., Ltd. Model Name : FD-100 Flash Disk Read & Write capacity : 8M/16M/32M/64M/128M This device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. FCC ID: QDOFD100 Made in Korea

Test Report

IST EMC LAB. 116 IST EMC Lab. San 21-8 Goan-Ri, Baekam-Myun, Yongin-Si, Kyunggi-Do, KOREA International - Tel : 82-31 - 333 - 4093. Fax : 82-31 - 333 - 4094. Domestic - Tel : 031 - 333 - 4093. Fax : 031 - 333 - 4094. IST EMC LAB. EMISSION TEST REPORT Test report file No. : 02-IST-077/FB Date of issue : May. 10, 2002. Model / Type No. Kind of product Brand name Applicant Manufacturer Address : FD-100 : Flash Disk : Hansol Microsystem : Hansol Microsystem Co., Ltd. : Hansol Microsystem Co., Ltd. : Suite 410-2 Building #D, Bundang Techno-Park 151 Yatap-Dong, Bundang-Gu, Sungnam City, Kyung-Gi Do, Korea Test result according to the regulation(s) Positive Negative at page 3. This test report without appendix consists of 16 pages. It is not allowed to copy this report even partly without the allowance of the Test Laboratory. This equipment is complied with the applicable technical standards as indicated in the measurement report and was tested in accordance with the measurement procedures specified in ANSI C63.4-1992. IST EMC LAB. 216 IST EMC Lab. San 21-8 Goan-Ri, Baekam-Myun, Yongin-Si, Kyunggi-Do, KOREA International - Tel : 82-31 - 333 - 4093. Fax : 82-31 - 333 - 4094. Domestic - Tel : 031 - 333 - 4093. Fax : 031 - 333 - 4094. DIRECTORY A) Documentation. Page Directory Test regulations Environmental Conditions Test Conditions Equipment under Test Test Result Test-setups (Photos ) Test-setup (Figures) Summary 2 3 3 4~5 6 7 8~9 10 16 B) Test Data. Conducted emissions (Mains) Radiated emissions : 450 kHz - 30 MHz : 30 MHz – 1 GHz 11~13 14~15 C) Appendix IST EMC LAB. 316 IST EMC Lab. San 21-8 Goan-Ri, Baekam-Myun, Yongin-Si, Kyunggi-Do, KOREA International - Tel : 82-31 - 333 - 4093. Fax : 82-31 - 333 - 4094. Domestic - Tel : 031 - 333 - 4093. Fax : 031 - 333 - 4094. TEST REGULATIONS The tests were performed according to the following regulations ; - FCC Part 15, Subpart B (Unintentional Radiators, Class B) Information of Test Laboratory IST EMC Lab. San 21-8 Goan-Ri, Baekam-Myun, Yongin-Si, Kyunggi-Do, Korea International - Tel : 82-31 - 333 - 4093. Fax : 82-31 - 333 - 4094. Domestic - Tel : 031 - 333 - 4093. Fax : 031 - 333 - 4094. ENVIRONMENTAL CONDITIONS Temperature Humidity Atmospheric pressure 19 41 % 1000 mbar IST EMC LAB. 416 IST EMC Lab. San 21-8 Goan-Ri, Baekam-Myun, Yongin-Si, Kyunggi-Do, KOREA International - Tel : 82-31 - 333 - 4093. Fax : 82-31 - 333 - 4094. Domestic - Tel : 031 - 333 - 4093. Fax : 031 - 333 - 4094. TEST CONDITIONS The measurement of the conducted emissions (Interference voltage) was performed in a shielded room. Test location : Shielded room. No.1 Compact chamber 2 Used testing instruments : Name Type Manufacturer Calibration. Date Serial Number ESH 3 Test Receiver Rohde & Schwarz Jun. 16, 2001 861742/015 3725/2 LISN EMCO Jul. 30, 2001 9101-2068 KNW-407 LISN Hyup-Rip Jul. 26, 2001 8-883-10 ESH 3-Z2 Pulse Limiter Rohde & Schwarz Jul. 13, 2001 357.8810.52 Test - accessories : Type Manufacturer Aneroid Barometer Sato Hygrometer Sato Measurement Procedures : Conducted emissions measurments were made in accordance with ANSI C-63.4-1992, “Method of Measurement of Radio-Noise Emissions from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz”. The measurement were performed over the frequency range of 0.45MHz to 30MHz using a 50?/50uH LISN as the input transducer to an EMI/Field Intensity Meter. The measurements were made with the detector set for “Peak” amplitude within an IF bandwidth of 10kHz or for “quasi-peak” within a bandwidth of 9kHz. All used test-instruments as well as the test-accessories are calibrated regularly. Test engineer : Y.J.Kim / Research Engineer IST EMC Lab. IST EMC LAB. 516 IST EMC Lab. San 21-8 Goan-Ri, Baekam-Myun, Yongin-Si, Kyunggi-Do, KOREA International - Tel : 82-31 - 333 - 4093. Fax : 82-31 - 333 - 4094. Domestic - Tel : 031 - 333 - 4093. Fax : 031 - 333 - 4094. The measurement of the radiated emissions (Electric field) in the frequency range from 30 MHz to 1GHz was performed in horizontal and vertical antenna polarization at a open-site which meet the site attenuation requirement of ANSI C63.4-1992 and a test distance of : Location : Open Site No. 1 Open Site No. 2 Open Site No. 3 Distance : 3 meters 10 meters Used testing instruments : Name Type Manufacturer Calibration. Date Serial Number ESVP Test Receiver Rohde & Schwarz Jun. 12, 2001 861744/018 VULB 9160 Antenna Schwarzbeck Jun. 04, 2001 3048 Test - accessories : Type Manufacturer Aneroid Barometer Sato Hygrometer Sato Measurement procedures Radiated measurements were in accordance with ANSI C63.4-1992 “Method of Measurement of Radio- Noise Emissions from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz”. The measurements were performed over the frequency range of 30MHz to 1GHz using antenna as the input transducer to a EMI/Field Intensity Meter. The measurements were made with the detector set for “quasi-peak” within a bandwidth of 120kHz. All used test-instruments as well as the test-accessories are calibrated regularly. Test engineer : Y.J.Kim / Research Engineer IST EMC Lab. IST EMC LAB. 616 IST EMC Lab. San 21-8 Goan-Ri, Baekam-Myun, Yongin-Si, Kyunggi-Do, KOREA International - Tel : 82-31 - 333 - 4093. Fax : 82-31 - 333 - 4094. Domestic - Tel : 031 - 333 - 4093. Fax : 031 - 333 - 4094. EQUIPMENT UNDER TEST Equipment Description The Equipment Under Test (EUT) is the Flash Disk of Hansol Microsystem Co., Ltd. Outer dimensions 22.7(W) x 12.2(H) x 72.35(L) : (mm) Weight g Power requirements DC 5.0V(Draw power directly from USB port) Read and Write SMC card capacity 16/32/64/128MB SMC card format support SSFDC format ? When driver Install Etc. UFI(USB Floppy Interface) protocol application USB high-speed transfer read/write function (Read transfer rate: 6MB, Write transfer rate: 3MB) PC OS Windows 98, ME, 2000, XP, Mc OS support EUT Type : Table-Top. Floor-Standing. Table-Top and Floor-Standing(Combination). Operation – mo…

Text truncated - open the document above for the full version.

Test Setup Photos

Radiated Emission 30MHz ~ 1000MHz Conducted Emission 450kHz ~ 30MHz

Contact Information

Applicant

Jong-Hyo Lim(Chief Manager / R&D Team)
[email protected]82-31-708-6097Fax: 82-31-707-0294

Test Firm

IST Co., LtdBong Kyoon Bae
@.com82-31-333-4093Fax: 82-31-333-4094

Technical Specifications

#Rule PartsFrequency RangePower Output
115B--

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Smart Media Card Reader

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Equipment Class

JBP - Part 15 Class B Computing Device Peripheral