V8VCNE8415BBSSmart High Line

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SCS-F18: Project and Product Certification Representative Authorization Letter Page 1 of 2 Rev 2.0 2206 Ringwood Avenue San Jose, CA 95131 Tel: 408-526-1188 Fax: 408-526-1088 Email: [email protected] Project and Product Certification Representative Authorization Letter Revision History Reason for Amendment (current / obsolete) From To Approved Date Initial Release (current) 1.0 1.0 Nov-14-2006 Revised wording (current) 1.0 2.0 Sept–25-2007 SCS-F18: Project and Product Certification Representative Authorization Letter Page 2 of 2 Rev 2.0 2011-3-22 To: SIEMIC, INC. 2206 Ringwood Avenue, San Jose, CA 95131 USA Dear Sir/Madam, Re: Project and Product Certification Representative Authorization Letter We, hereby authorize SIEMIC, INC. to act as a Certification Body for certifying for the following project(s): Smart High Line We affirm that between SIEMIC and , any difference in understanding, including test plan, measurement methods, applicable standards and relevant procedures and processes have been resolved prior to commencement of testing activities. Sincerely, Client’s signature: Aaron Zheng Client’s name / titleVice President Contact information / address2/F.A incubation Building,Taohua Yuan High-Tech innovation Park, Baoan District, Shenzhen City

SCS-F19: Confidentiality Request Letter Page 1 of 2 Rev 2.0 2206 Ringwood Avenue San Jose, CA 95131 Tel: 408-526-1188 Fax: 408-526-1088 Email: [email protected] Confidentiality Request Letter Revision History Reason for Amendment (current / obsolete) From To Approved Date Initial Release (current) 1.0 1.0 Nov-14-2006 Adding CFR 2.459 1.0 2.0 August – 11 - 2008 SCS-F19: Confidentiality Request Letter Page 2 of 2 Rev 2.0 SKYPINE ELECTRONICS(SHEN ZNEN）CO.,LTD 2011-3-22 To: Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD Confidentiality Request regarding application for certification of FCC ID: V8VCNE8415BBS We hereby request confidential treatment of information accompanying this application as outlined below: - Block Diagram – - Circu it - Circuit description The above materials contain trade secrets and proprietary information not customarily released to the public. The public disclosure of these materials may be harmful to the applicant and provide unjustified benefits to its competitors. The applicant understands that pursuant to Section 0.457 & 0.459 of the Rules, disclosure of this application and all accompanying documentation will not be made before the date of the Grant for this application. Sincerely, Client’s signature : Aaron Zheng Client’s name / title : Vice President Contact information / address: 2/F.A incubation Building,Taohua Yuan High-Tech innovation Park, Baoan District, Shenzhen City

EXTERNAL PHOTOS OF EUT External View of EUT-1 External View of EUT-2 External View of EUT-3 External View of EUT-4

INTERNAL PHOTOS OF EUT Internal View of EUT-1 Internal View of EUT-2 Internal View of EUT-3 Internal View of EUT-4 Internal View of EUT-5 Internal View of EUT-6 Internal View of EUT-7 Internal View of EUT-8 Bluetooth Module and Antenna Internal View of EUT-9 Internal View of EUT-10 Internal View of EUT-11 Internal View of EUT-12

RF Exposures Evaluation For Maximum Permissible Exposure (MPE) evaluation of the product, the maximum power density at 20 cm from this transmitter shall be less than the General Population / Uncontrolled MPE limit in OET Bulletin 65. For the EUT of tested model NAR, the measured maximum field strength measured (FS) was 88.1 dBμV/m. The distance (D) between the antenna and the equipment under test (EUT) was 3 meters. From these data, the exposed power density at a distance (R) of 20cm from the center of radiation of the antenna can be calculated according to OET Bulletin 65 as follow: The radiated power = (FS*D) 2 / 30 = 0.194mW The power density at 20 cm from the antenna = EIRP / = 0.00004 mW cm -2 In the frequency range of 2.4-2.4835GHz, the MPE limit is 1.0 mWcm -2 for general population and uncontrolled exposure. As the measured power density at 20cm from the transmitter is lower than the MPE limit, the compliance to the MPE limit can be ensured by indicating the minimum 20cm separation between the transmitter's radiating structures and body of the user or nearby persons. The following RF exposure statement is proposed to be included in the user manual: “This equipment complies with FCC RF radiation exposure limits set forth for an uncontrolled environment. This equipment should be installed and operated with a minimum distance of 20 centimeters between the radiator and your body.”

Report No. : EESZD03140005 Page 1 of 44 ELECTROMAGNETIC EMISSIONS COMPLIANCE REPORT INTENTIONAL RADIATOR CERTIFICATION Product Name : Smart High Line Model Number : NAR, SAM Trade Name : BOSCH FCC ID : V8VCNE8415BBS Report Number : EESZD03140005 Date : March 31, 2011 Prepared for: SKYPINE ELECTRONICS (SHENZHEN) CO., LTD. A1 Building, No.6 Xinxing Industrial Park, Xinhe Village, Fuyong Town, Baoan District, Shenzhen, China. Prepared by: CENTRE TESTING INTERNATIONAL Building C, Hongwei Industrial Zone, Baoan 70 District, Shenzhen, Guangdong, China TEL: +86-755-3368 3668 FAX: +86-755-3368 3385 Check No.: 15111084 This report shall not be reproduced, except in full, without the written approval of CENTRE TESTING INTERNATIONAL Building C, Hongwei Industrial Zone, Baoan 70 District, Shenzhen Standards Results 47 CFR FCC Part 15 Subpart C 15.247 PASS Report No. : EESZD03140005 Page 2 of 44 TABLE OF CONTENTS Description Page 1. CERTIFICATION INFORMATION ............................................................................................................... 4 2. TEST SUMMARY ........................................................................................................................................ 5 3. MEASUREMENT UNCERTAINTY .............................................................................................................. 5 4. PRODUCT INFORMATION ......................................................................................................................... 5 5. SYSTEM TEST CONFIGURATION.............................................................................................................. 6 6. TEST EQUIPMENT LIST............................................................................................................................. 7 7. SUPPORT EQUIPMENT LIST .................................................................................................................... 7 8. 20DB BANDWIDTH MEASUREMENT ....................................................................................................... 8 8.1. LIMITS ................................................................................................................................................. 8 8.2. BLOCK DIAGRAM OF TEST SETUP.................................................................................................. 8 8.3. TEST PROCEDURE ........................................................................................................................... 8 8.4. TEST RESULT .................................................................................................................................... 8 9. CARRIER FREQUENCY SEPARATION ...................................................................................................11 9.1. LIMITS ............................................................................................................................................... 11 9.2. BLOCK DIAGRAM OF TEST SETUP................................................................................................ 11 9.3. TEST PROCEDURE ......................................................................................................................... 11 9.4. TEST RESULT .................................................................................................................................. 11 10. NUMBER OF HOPPING FREQUENCY................................................................................................ 13 10.1. LIMITS ............................................................................................................................................... 13 10.2. BLOCK DIAGRAM OF TEST SETUP................................................................................................ 13 10.3. TEST PROCEDURE ......................................................................................................................... 13 10.4. TEST RESULT .................................................................................................................................. 13 11. TIME OF OCCUPANCY (DWELL TIME)................................................................................................... 14 11.1. LIMITS ............................................................................................................................................... 14 11.2. BLOCK DIAGRAM OF TEST SETUP................................................................................................ 14 11.3. TEST PROCEDURE ......................................................................................................................... 14 11.4. TEST RESULT .................................................................................................................................. 14 Report No. : EESZD03140005 Page 3 of 44 12. MAXIMUM PEAK CONDUCTED OUTPUT POWER MEASUREMENT .............................................. 18 12.1. LIMITS ............................................................................................................................................... 18 12.2. BLOCK DIAGRAM OF TEST SETUP................................................................................................ 18 12.3. TEST PROCEDURE ......................................................................................................................... 18 12.4. TEST RESULT .................................................................................................................................. 18 13. BAND EDGE EMISSION MEASUREMENT ......................................................................................... 20 13.1. LIMITS ............................................................................................................................................... 20 13.2. BLOCK DIAGRAM OF TEST SETUP................................................................................................…

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TEST SETUP PHOTOS TEST SETUP OF RADIATED EMISSION (30MHz-1GHz) TEST SETUP OF RADIATED EMISSION (above 1GHz)