VY5D155D12002Electronic Ballast

FCC Statement 1．This device complies with Part 18 of the FCC Rules. 2．Information on the following matters shall be provided to the user in the instruction manual: (a) The interference potential of the device or system; (b) Maintenance of the system; (c) Simple measures that can be taken by the user to correct interference; (d) Manufacturers of RF lighting devices must provide an advisory statement, either on the product packaging or with other user documentation, similar to the following: This product may cause interference to radio equipment and should not be installed near maritime safety communications equipment or other critical navigation or communication equipment operating between 0.45-30MHz. Variations of this language are permitted provided all the points of the statement are addressed and may be resented in any legible font or text style.

EMI Restrain AC120V 60Hz in put Diploid commute Half Bridge circuit Half Bridge Controller Fluorescent Lamp Dimmer Fed back/ Fail Detect

External Photos EUT - All View EUT – Electronic Ballast Front View EUT – Electronic Ballast Rear View EUT – Dimmer View

ID Label/Location FCC ID Label Label Location Information Specifications: Text is Black or white in color and is left justified. Labels are printed in indelible ink on permanent adhesive backing or silk-screened onto the EUT or shall be affixed at a conspicuous location on the EUT. Label Location: FCC ID: VY5D155D12002

Internal Photos EUT- Electronic Ballast Uncovered View EUT – Electronic Ballast Board Components View EUT – Electronic Ballast Board Circuit View EUT- Dimmer Uncovered View EUT – Dimmer Board Components View EUT – Dimmer Board Circuit View

WTEB-D155D-120 Circuitry description The product is designed for driving electronically ballasted fluorescent lamps. It is a typical half bridge circuit drives by a monolithic integrated circuit. It include a EMI bate circuit, diploid commutate & filter circuit, a half bridge consists of 2 discrete power MOSFETs and series resonance LC circuit, an oscillator, a lamp voltage monitor, a current detect and control circuit, some protection circuit. The minimum frequency is determined by R3,R21 and C7. As a result the maximum preheat frequency is equal to 2.5 multiple-frequency of minimum frequency determined. During the start-up phase the working frequency start at the maximum frequency. As the load on the half bridge circuit consists of the series connected LC circuit, this is a safe frequency at which currents and voltages are low. R3, R21 and C5 determines the preheating time. The preheating current, which is flowing through the electrodes and lamp capacitor C20, is controlled by the preheat current sensor circuit (PCS) and is determined by R11 and R25. As the lamp voltage should not exceed during this phase a certain maximum value, C20(6.8nF) is determined. During the ignition phase the working frequency is decreased due to the charging of C6 by an internally fixed current.. During this continuously decrease in frequency ,the circuit approaches the resonance frequency of the load(T2 and C20). The ignition of the lamp is designed above the V-lamp fail level. If the lamp voltage passes the V-lamp fail level the ignition timer is started .If the preheating of the electrodes was correct, the increasing voltage across the lamp will ignite it. The frequency will further decrease until the minimum frequency is reached .Then it is assumed that the lamp is ignited and the Burn state begins. If however at the end of the ignition time the lamp voltage still exceeds the lamp fail level(V-lamp>V-lamp fail),then it is assumed that the lamp is not ignited and the IC will be switched in the Power Down state. During the ignition of the lamp and the Burn phase the Capacitive Mode protection(ACM)ensures a safe operation of the Power MOSFET. The ignition voltage however with the ageing of the lamp. To avoid overload of the key components, the maximum ignition voltage(V-lamp max) is limited and controlled by the lamp voltage sensor(LVS)circuit(pin 13The maximum ignition time, in which the lamp should ignite, is determined In the burn state the average current sensor (ACS) of the IC controls the lamp current, the lamp power can be kept constant by controlling the averaged voltage across resistor R11. In this way the lamp current is controlled. Dimming is performed by changing the reference level at the CS+ pin(pin15) by turning rheostat VR. In this way the input voltage of the voltage controlled oscillator regulates the frequency and herewith the lamp current. The start-up current for the IC is derived from the diploid commutate & filter circuit, R6,R7,R8 and one of the lamp electrodes. If the lamp is not present, the IC will not start-up. As soon as VDD- high is exceeded the IC starts oscillating. The half bridge voltage together with C13,D5,D6,C8,C9 (dv/dt) capacitors behave like a current source, which supplies not only the IC and the MOSFET but generates also a stable 13V supply.

1 2 34 ABCD 4 3 2 1 D CBA Title Number Revision Size A4 Date: 20-Feb-2008 Sheet of File: D:\ 刘治国 \UL 认证资料 \2D55 W PCB-A1 UL .DD B Drawn By: WTEB-D155D-120 F1 125V/3A D1 RL207 D3 1N4007 D4 1N4007 D2 RL207 T1 UU10.5 C1 220NF/250V C15 100nF/25V C11 47nF/50V Q1 730 Q2 730 R15 1.5Ω C17 4.7nF/25V R18 11K Ω C5 150nF/25V R16 130K Ω C14 10nF/25V C6 220nF/25V C7 100pF /25V C20 6.8NF/1250V VRB10K R14 10KΩ R12 3.0KΩ D6LL4148 D7 Not use C8 100nF/50V R11 1.0Ω 12 34 Lamp1 55W CT 1 CSW 2 CF 3 IREF 4 GND 5 GL 6 VDD 7 PCS 8 FVDD 9 GH 10 SH 11 ACM 12 LVS 13 VREF 14 CS+ 15 CS- 16 U1 UBA2014 C10 47NF/400V C12 1000PF/1KV C13 680PF/1KV D5 14V R13 100K Ω R1751K Ω R9 22 Ω R10 22 Ω LN C18 330NF/63V C19 330NF/63V VR B10K R8 100KΩ + C9 10uF/50V Q3 BC846B R4 270Ω R22 22KΩ R23100KΩ + C3 68uF/200V + C4 68uF/200V R1 470KΩ R2 470KΩ R7 100KΩ R6 100K Ω R3 33.2K Ω R21 910K + C16 10uF/50V C21 330PF/1KV C22 10nF/50V D8 LL4148 R5 100K R25 100 Ω R24 30K 123 4 5 6 T2 EF25/25 R19 4.32KΩ R20 51K or EE196.0mH Min not use 120VAC 1.2mH

Note: This test report is for the customer shown above and their specific product only. It may not be duplicated or used in part without prior written consent from Bay Area Compliance Laboratories Corp. (Shenzhen). This report must not be used by the customer to claim product certification, approval, or endorsement by NVLAP, NIST or any agency of the Federal Government. FCC PART 18 MEASUREMENT AND TEST REPORT For WENTAI ENTERPRISE CO., LTD 6F-3, No 123, Lane235, Pao-chiao Road, Shintien city, Taipei Hsien, Taiwan FCC ID: VY5D155D12002 This Report Concerns: Original Report Equipment Type: Electronic Ballast Test Engineer: Amanda Wei Report Number: RSZ08013051 Test Date: 2008-02-19 Report Date: 2008-02-21 Reviewed By: EMC Manager: Green Xu Prepared By: Bay Area Compliance Laboratories Corp. (Shenzhen). 6/F, the 3rd Phase of WanLi Industrial Building, ShiHua Road, FuTian Free Trade Zone Shenzhen, Guangdong, China Tel: +86-755-33320018 Fax: +86-755-33320008 Wentai Enterprise Co., Ltd. FCC ID: VY5D155D12002 Report No.: RSZ08013051 Page 2 of 14 FCC Part 18 Report TABLE OF CONTENTS GENERAL INFORMATION.......................................................................................................................................3 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) .....................................................................................3 OBJECTIVE...................................................................................................................................................................3 RELATED SUBMITTAL(S)/GRANT(S).............................................................................................................................3 TEST METHODOLOGY..................................................................................................................................................3 TEST FACILITY.............................................................................................................................................................4 SYSTEM TEST CONFIGURATION ..........................................................................................................................5 JUSTIFICATION.............................................................................................................................................................5 EQUIPMENT MODIFICATIONS.......................................................................................................................................5 EXTERNAL I/O CABLE..................................................................................................................................................5 CONFIGURATION OF TEST SETUP.................................................................................................................................6 BLOCK DIAGRAM OF TEST SETUP................................................................................................................................6 CONDUCTED EMISSIONS ........................................................................................................................................7 MEASUREMENT UNCERTAINTY....................................................................................................................................7 EUT SETUP..................................................................................................................................................................7 EMI TEST RECEIVER SETUP.........................................................................................................................................8 TEST EQUIPMENT LIST AND DETAILS...........................................................................................................................8 TEST PROCEDURE........................................................................................................................................................8 TEST RESULTS SUMMARY............................................................................................................................................8 TEST DATA..................................................................................................................................................................9 PLOT(S) OF TEST DATA..............................................................................................................................................10 Wentai Enterprise Co., Ltd. FCC ID: VY5D155D12002 Report No.: RSZ08013051 Page 3 of 14 FCC Part 18 Report GENERAL INFORMATION Product Description for Equipment under Test (EUT) The WENTAI ENTERPRISE CO., LTD’s model: WTEB-D155D-120, or the “EUT” as referred to in this report is an Electronic Ballast which measures approximately 9.5 cm L x 9.5 cm W x 3.5 cm H, rated input voltage: AC 120V/60Hz. * All measurement and test data in this report was gathered from production sample serial number: 0801051 (Assigned by BACL, Shenzhen). The EUT was received on 2008-01-30. Objective The following test report is prepared on behalf of WENTAI ENTERPRISE CO., LTD in accordance with Part 2, Subpart J, and Part 18, Subparts A, B and C of the Federal Communication Commissions rules and regulations. The objective of the manufacturer is to determine compliance with FCC Part 18 limits. Related Submittal(s)/Grant(s) No related submittal(s). Test Methodology All measurements contained in this report were conducted with MP-5, FCC Methods of Measurements of Radio Noise Emissions from ISM Equipment, February 1986. All measurement was performed at Bay Area Compliance Laboratories Corp. (ShenZhen). The radiated testing was performed at an antenna-to- EUT distance of 3 meters. Wentai Enterprise Co., Ltd. FCC ID: VY5D155D12002 Report No.: RSZ08013051 Page 4 of 14 FCC Part 18 Report Test Facility The Test site used by Bay Area Compliance Laboratories Corp. (Shenzhen) to collect test data is located in the 6/F, the 3r…

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Test Setup Photos Low Power: Conducted Emissions - Front View Low Power: Conducted Emissions - Rear View High Power: Conducted Emissions - Front View High Power: Conducted Emissions - Rear View