2A2T9-KB09119Keyboard

ShenzhenInateckTechnologyCo.,Ltd. 2.911(d)(5)(i)EquipmentTypeAttestationv1.2 Section2.911(d)(5)(i)Certification–EquipmentType Companyname:ShenzhenInateckTechnologyCo.,Ltd. Address:Rm.2507,Bldg.11,TianAnCloudPark,BantianStreet,LonggangDistrict,Shenzhen, China ProductName:Keyboard FCCID:2A2T9-KB09119 Model(s):KB09119 2.911(d)(5)(i)EquipmentType We,ShenzhenInateckTechnologyCo.,Ltd.(“theapplicant”)certifythattheequipmentforwhich authorizationissoughtthroughcertificationisnot:  Prohibitedfromreceivinganequipmentauthorizationpursuantto§2.903;oftheFCCrules.  Identifiedasanequipmenttypeinthe“CoveredList” NOTE1 Yourssincerely, Name:FretHuangDate:2024.9.25 TitleandCompanyname:Manager/ShenzhenInateckTechnologyCo.,Ltd. NOTE1 “CoveredList”;istheListofEquipmentandServicesCoveredBySection2ofTheSecureNetworksAct,availableat https://www.fcc.gov/supplychain/coveredlist References; 1)986446D01CoveredEquipmentv01 https://apps.fcc.gov/oetcf/kdb/forms/FTSSearchResultPage.cfm?switch=P&id=325672 2)FederalRegisterdocument2022-28263publishedon02/06/23 https://www.federalregister.gov/documents/2023/02/06/2022-28263/protecting-against-national-security-threats-to-the-com munications-supply-chain-through-the

ShenzhenInateckTechnologyCo.,Ltd. 2.911(d)(5)(ii)ApplicantAttestationv1.3 Section2.911(d)(5)(ii)Certification–Applicant(CoveredList) Companyname:ShenzhenInateckTechnologyCo.,Ltd. Address:Rm.2507,Bldg.11,TianAnCloudPark,BantianStreet,LonggangDistrict,Shenzhen, China ProductName:Keyboard FCCID:2A2T9-KB09119 Model(s):KB09119 2.911(d)(5)(ii)Applicantfiling We,ShenzhenInateckTechnologyCo.,Ltd.(“theapplicant”)certifythat,asofthedateofthefilingof theapplication,theapplicantisnotidentified NOTE1 onthe“CoveredList” NOTE2 ,established pursuantto§1.50002ofthischapter,asanentityproducingcoveredcommunicationsequipment. Yourssincerely, Name:FretHuangDate:2024.9.25 TitleandCompanyname:Manager/ShenzhenInateckTechnologyCo.,Ltd. NOTE1 Deleteoptionnotapplicabletothisapplication. NOTE2 “CoveredList”;istheListofEquipmentandServicesCoveredBySection2ofTheSecureNetworksAct,availableat https://www.fcc.gov/supplychain/coveredlist References; 1)986446D01CoveredEquipmentv01 https://apps.fcc.gov/oetcf/kdb/forms/FTSSearchResultPage.cfm?switch=P&id=325672 2)FederalRegisterdocument2022-28263publishedon02/06/23 https://www.federalregister.gov/documents/2023/02/06/2022-28263/protecting-against-national-security-threats-to-the-com munications-supply-chain-through-the

Shenzhen Inateck Technology Co., Ltd. 2.911 (d)(7)USA Agent v1.4 Section 2.911(d)(7) USA Agent for Service of Process Company name: Shenzhen Inateck Technology Co., Ltd. Address:Rm. 2507, Bldg. 11, TianAn Cloud Park, Bantian Street, Longgang District, Shenzhen, China Product Name:Keyboard FCC ID: 2A2T9-KB09119 Model(s):KB09119 2.911(d)(7) USA Designated Agent for Service of Process We, Shenzhen Inateck Technology Co., Ltd. (“the applicant”) designate [Stone Trading Limited] NOTE1 for the purpose of accepting service of process on behalf of the applicant. Applicant consent: We acknowledge our consent to accept service of process in the United States for matters related to the applicable equipment, and at the physical U.S. address and email address of the designated agent and acknowledge our acceptance of our obligation to maintain an agent for service of process in the United States for no less than one year after either we the grantee have permanently terminated all marketing and importation of the applicable equipment within the U.S., or at the conclusion of any Commission-related administrative or judicial proceeding involving the equipment, whichever is later. Agent obligation: We acknowledge our obligation to accept service of process in the United States for matters related to the applicable equipment at our physical U.S. address and email address for no less than one year after either the grantee has permanently terminated all marketing and importation of the applicable equipment within the U.S., or at the conclusion of any Commission-related administrative or judicial proceeding involving the equipment, whichever is later. USA Agent Company name: Stone Trading Limited USA Address: 6547 N Academy Blvd #2266, Colorado Springs, CO 80918, United States FRN Number: 0033401936 Contact Name: Dongmei Fang Telephone No: +12134573118 Email: [email protected] Applicant Company name:Shenzhen Inateck Technology Co., Ltd. Address:Rm. 2507, Bldg. 11, TianAn Cloud Park, Bantian Street, Longgang District, Shenzhen, China Grantee FRN Number：0031248057 FCC Grantee Code:2A2T9 Contact Name:Fret Huang Telephone No:0755-23484029 Email:[email protected] Signature: Title: Manager Signature: Title:Manager Shenzhen Inateck Technology Co., Ltd. 2.911 (d)(7)USA Agent v1.4 Date: 2024.9.25 Date: 2024.9.25 NOTE 1: An applicant located in the United States may designate itself as the agent for service of process. Reference; Federal Register document 2022-28263 published on 02/06/23 https://www.federalregister.gov/documents/2023/02/06/2022-28263/protecting-against-nation al-security-threats-to-the-communications-supply-chain-through-the

ShenzhenInateckTechnologyCo.,Ltd. AgentAuthorization Company:ShenzhenInateckTechnologyCo.,Ltd. Address:Rm.2507,Bldg.11,TianAnCloudPark,BantianStreet,LonggangDistrict, Shenzhen,China ProductName:Keyboard ModelNumber(s):KB09119 ProductDescription:Keyboard WeauthorizeMiCOMLabsInc.,575BoulderCourt,Pleasanton,California94566,USA, toactonourbehalfonallmattersconcerningthecertificationofabovenamed equipment. WedeclarethatMiCOMLabsInc.isallowedtoforwardallinformationrelatedtothe approvalandcertificationofequipmenttotheregulatoryagenciesasrequiredandto discussanyissuesconcerningtheapprovalapplication.Anyandallactscarriedoutby MiCOMLabsonourbehalfshallhavethesameeffectasactsofourown. Signature:Date:2024.9.25 Name:FretHuang Title:Manager Company:ShenzhenInateckTechnologyCo.,Ltd.

ShenzhenInateckTechnologyCo.,Ltd. OfficeofEngineeringTechnology FederalCommunicationsCommission 7435OaklandMillsRoad Columbia,MD21046 USA Date:2024.9.25 Subject;RequestforConfidentiality FCCID:2A2T9-KB09119 ToWhomItMayConcern, PursuanttotheprovisionsoftheCommission’srulesTitle47Sections§0.457and§0.459,we arerequestingtheCommissiontowithholdthefollowingattachment(s)asconfidential documentsfrompublicdisclosureindefinitely. Thesedocumentscontaindetailedsystemandequipmentdescriptionsandareconsideredas proprietaryinformationinoperationoftheequipment.Thepublicdisclosureofthesedocuments mightbeharmfultoourcompanyandwouldgivecompetitorsanunfairadvantageinthemarket. SchematicDiagram BlockDiagram PartsList OperationalDescription Tune-upProcedure Inadditionaltoabovementioneddocuments,inordertocomplywiththemarketingregulations inTitle47CFR§2.803andtheimportationrulesinTitle47CFR§2.1204,whileensuringthat businesssensitiveinformationremainsconfidentialuntiltheactualmarketingofnewly authorizeddevices,werequestShortTermConfidentialityofthefollowingattachment(s); ExternalPhotos TestSetupPhotos InternalPhotos UserManual For45days,pursuanttoPublicNoticeDA04-1705. OR For180dayspursuanttoKDB726920D01. Itisourunderstandingthatallmeasurementtestreports,FCCIDlabelformatand correspondenceduringthecertificationreviewprocesscannotbegrantedasconfidential documentsandthisinformationwillbeavailableforpublicreviewoncethegrantofequipment authorizationisissued. Sincerely, Signature: Name:FretHuang Title:Manager

EUTPHOTO(ExternalPhotos) Productname:Keyboard Model:KB09119 ※※※※※ENDOFREPORT※※※※※

Labelandlabellocation 6.0cm Keyboard FCCID:2A2T9-KB09119 3.0cm

EUTPHOTO(InternalPhotos) Productname:Keyboard Model:KB09119 ※※※※※ENDOFREPORT※※※※※ ANT

FCCID:2A2T9-KB09119 RFExposureEvaluation AccordingtoKDB447498D01GeneralRFExposureGuidancev06andpart2.1093， UnlessspecificallyrequiredbythepublishedRFexposureKDBprocedures,standalone 1-gheadorbodyand10-gextremitySARevaluationforgeneralpopulationexposure conditions,bymeasurementornumericalsimulation,isnotrequiredwhenthe correspondingSARTestExclusionThresholdcondition(s),listedbelow,is(are)satisfied. For100MHzto6GHzandtestseparationdistances≤50mm,the1-gand10-gSARtest exclusionthresholdsaredeterminedbythefollowing: [(max.powerofchannel,includingtune-uptolerance,mW)/(min.testseparationdistance, mm)]·[√f (GHz) ]≤3.0for1-gSAR,and≤7.5for10-gextremitySAR,where f (GHz) istheRFchanneltransmitfrequencyinGHz PoweranddistanceareroundedtothenearestmWandmmbeforecalculation Theresultisroundedtoonedecimalplaceforcomparison Here, BLE ModeMax Power(dBm) Max Power(mW) Frequency(MHz)Min. distance(mm) Calc. thresholds limit GFSK1.8591.534240250.4763.0 SoaSARtestisnotrequired.

UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Report for Broadcom By Alfred Grau UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Tested Products.• Antenna 1: integrated antenna. • Frequency = 2.402GHz. • Frequency = 2.441GHz. • Frequency = 2.480GHz. UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Coordinate System Reference: Antenna 1. Top view Side view Z Y X Front view Front view Rear view SMA connector X Z Y UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Radiation pattern: Antenna 1. XZ Plane at f = 2.402GHz Co-cross polarization field (dBi) Solid line: vertical polarizationDash line: horizontal polarization Total field (dBi) 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 -15 -20 -20 -25 -25 -30 -30 -35 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Radiation pattern: Antenna 1. YZ Plane at f = 2.402GHz Co-cross polarization field (dBi) Solid line: vertical polarizationDash line: horizontal polarization Total field (dBi) 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 -15 -20 -20 -25 -25 -30 -30 -35 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Radiation pattern: Antenna 1. XY Plane at f = 2.402GHz Co-cross polarization field (dBi) Solid line: vertical polarizationDash line: horizontal polarization Total field (dBi) 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 -15 -20 -20 -25 -25 -30 -30 -35 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Radiation pattern: Antenna 1. XZ Plane at f = 2.441GHz Co-cross polarization field (dBi) Solid line: vertical polarizationDash line: horizontal polarization Total field (dBi) 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 -15 -20 -20 -25 -25 -30 -30 -35 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Radiation pattern: Antenna 1. YZ Plane at f = 2.441GHz Co-cross polarization field (dBi) Solid line: vertical polarizationDash line: horizontal polarization Total field (dBi) 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 -15 -20 -20 -25 -25 -30 -30 -35 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Radiation pattern: Antenna 1. XY Plane at f = 2.441GHz Co-cross polarization field (dBi) Solid line: vertical polarizationDash line: horizontal polarization Total field (dBi) 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 -15 -20 -20 -25 -25 -30 -30 -35 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Radiation pattern: Antenna 1. XZ Plane at f = 2.480GHz Co-cross polarization field (dBi) Solid line: vertical polarizationDash line: horizontal polarization Total field (dBi) 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 -15 -20 -20 -25 -25 -30 -30 -35 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Radiation pattern: Antenna 1. YZ Plane at f = 2.480GHz Co-cross polarization field (dBi) Solid line: vertical polarizationDash line: horizontal polarization Total field (dBi) 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 -15 -20 -20 -25 -25 -30 -30 -35 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Radiation pattern: Antenna 1. XY Plane at f = 2.480GHz Co-cross polarization field (dBi) Solid line: vertical polarizationDash line: horizontal polarization Total field (dBi) 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 -15 -20 -20 -25 -25 -30 -30 -35 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Return Loss: Antenna 1 BW(-10dB) ¡ 13.48% 2 2.2 2.4 2.6 2.8 3 Frequency (GHz) -16-14-12-10 -8-6-4-2 R e t u r n L o s s ( d B ) UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Measurements summary Frequency (GHz) Plane Return Loss (dB) Polarization Gain max. (dBi) θ for Gain max. φ for Gain max. Antenna 1 2.402 XZ -10.90 Vertical -7.8 290 2.402 XZ -10.90 Horizontal 0.786 182 2.402 YZ -10.90 Vertical 1.21 226 2.402 YZ -10.90 Horizontal -7.75 10 2.402 XY -10.90 Vertical -15.4 20 2.402 XY -10.90 Horizontal 0.93 180 2.441 XZ -12.20 Vertical -7.36 318 2.441 XZ -12.20 Horizontal 1.32 180 2.441 YZ -12.20 Vertical 0.981 204 2.441 YZ -12.20 Horizontal -8.23 24 2.441 XY -12.20 Vertical -14.1 -14 2.441 XY -12.20 Horizontal 1.74 180 2.48 XZ -13.80 Vertical -7.95 312 2.48 XZ -13.80 Horizontal 1.81 186 2.48 YZ -13.80 Vertical 0.204 214 2.48 YZ -13.80 Horizontal -8.38 8 2.48 XY -13.80 Vertical -15.8 12 2.48 XY -13.80 Horizontal 1.87 180

ProjectNo.:ZKT-2406257031E Page 1 of 39 FCCTESTREPORT FCCID:2A2T9-KB09119 ReportNumber. .................................. :ZKT-2406257031E DateofTest ....................................................... : Aug.28,2024toSep.19,2024 Dateofissue ......................................... : Sep.19,2024 Totalnumberofpages..........................39 TestResult .......................................... : PASS TestingLaboratory............................: ShenzhenZKTTechnologyCo.,Ltd. Address...............................................: 1/F,No.101,BuildingB,No.6,TangweiCommunityIndustrial Avenue,FuhaiStreet,Bao'anDistrict,Shenzhen,China Applicant'sname.............................: ShenzhenInateckTechnologyCo.,Ltd. Address ............................................... : Rm.2507,Bldg.11,TianAnCloudPark,BantianStreet,Longgang District,Shenzhen,China Manufacturer'sname......................: ShenzhenInateckTechnologyCo.,Ltd. Address...............................................: Rm.2507,Bldg.11,TianAnCloudPark,BantianStreet,Longgang District,Shenzhen,China Testspecification: Standard................................................: FCCCFRTitle47Part15SubpartCSection15.247 ANSIC63.10:2013 Testprocedure.....................................: / Non-standardtestmethod................:N/A TestReportFormNo. ....................... : / TestReportForm(s)Originator.....: ZKTTesting MasterTRF........................................: Dated:2020-01-06 ThisdevicedescribedabovehasbeentestedbyZKT,andthetestresultsshowthattheequipmentunder test(EUT)isincompliancewiththeFCCrequirements.Anditisapplicableonlytothetestedsample identifiedinthereport. Thisreportshallnotbereproducedexceptinfull,withoutthewrittenapprovalofZKT,thisdocumentmay bealteredorrevisedbyZKT,personalonly,andshallbenotedintherevisionofthedocument. Productname.....................................:Keyboard Trademark...........................................:Inateck Model/Typereference......................: KB09119 Ratings .................................................. : Input:5V250mA Battery:3.7V,500mAh,1.85Wh ProjectNo.:ZKT-2406257031E Page 2 of 39 Testingprocedureandtestinglocation: TestingLaboratory.......................................: ShenzhenZKTTechnologyCo.,Ltd. Address............................................................:1/F,No.101,BuildingB,No.6,TangweiCommunity IndustrialAvenue,FuhaiStreet,Bao'anDistrict, Shenzhen,China JimLiu Testedby(name+signature).......................: JacksonFang Reviewer(name+signature) ....................... : LakeXie Approved(name+signature).......................: ProjectNo.:ZKT-2406257031E Page 3 of 39 TableofContents Page 1.VERSION....................................................................................................................5 2.SUMMARYOFTESTRESULTS...............................................................................6 2.1TESTFACILITY.................................................................................................................7 2.2MEASUREMENTUNCERTAINTY....................................................................................7 3.GENERALINFORMATION........................................................................................8 3.1GENERALDESCRIPTIONOFEUT.................................................................................8 3.2DESCRIPTIONOFTESTMODES....................................................................................9 3.3BLOCKDIGRAMSHOWINGTHECONFIGURATIONOFSYSTEMTESTED..............9 3.4DESCRIPTIONOFSUPPORTUNITS(CONDUCTEDMODE)........................................9 3.5EQUIPMENTSLISTFORALLTESTITEMS.................................................................10 4.EMCEMISSIONTEST.............................................................................................12 4.1CONDUCTEDEMISSIONMEASUREMENT..................................................................12 4.1.1POWERLINECONDUCTEDEMISSIONLimits...................................................12 4.1.2TESTPROCEDURE...............................................................................................12 4.1.3DEVIATIONFROMTESTSTANDARD..................................................................12 4.1.4TESTSETUP...........................................................................................................13 4.1.5EUTOPERATINGCONDITIONS...........................................................................13 4.2.1RADIATEDEMISSIONLIMITS...............................................................................16 4.2.2TESTPROCEDURE...............................................................................................17 4.2.3DEVIATIONFROMTESTSTANDARD..................................................................17 4.2.4TESTSETUP...........................................................................................................17 4.2.5EUTOPERATINGCONDITIONS...........................................................................18 5.RADIATEDBANDEMISSIONMEASUREMENT.....................................................23 5.1TESTREQUIREMENT:..............................................................................................23 5.2TESTPROCEDURE..................................................................................................23 5.3DEVIATIONFROMTESTSTANDARD.....................................................................23 5.4TESTSETUP..............................................................................................................24 5.5EUTOPERATINGCONDITIONS..............................................................................24 5.6TESTRESULT...........................................................................................................25 6.POWERSPECTRALDENSITYTEST......................................................................26 6.1APPLIEDPROCEDURES/LIMIT..........................................................................…

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EUTTESTPHOTO ※※※※※ENDOFREPORT※※※※※