2A44B-QV003AI Voice Recorder

FCC ID LABEL: Ca. 5mm x 30mm Label Location FCC ID: 2A44B-QV003

FCC RF Exposure EUT Description: AI Voice Recorder Model No.: QV003 FCC ID: 2A44B-QV003 1. Limits According to KDB 447498 D01 General RF Exposure Guidance v06 The 1‐g and 10‐g SAR test exclusion thresholds for 100 MHz to 6 GHz at test separation distances ≤50 mm are determined by: [(max power of channel, including tune‐up tolerance, mW)/(min. test separation distance, mm)]·[√f(GHz)]≤3.0 for 1‐g SAR and ≤ 7.5 for 10‐g extremity SAR, Where: Result=P/D*√F F= the RF channel transmit frequency in GHz P=Maximum turn‐up power in mw D=Min. test separation distance in mm 2. Test Result of RF Exposure Evaluation Frequency (MHz) Output power (dBm) Tune Up Power (dBm) Max Tune Up power (mW) Min test separation distance (mm) Result Limit SAR Test Exclusion BLE 2480 1.95 1±1(2) 1.585 5 0.499 3.0 Pass Note: PK Output power= conducted power. Conducted power see the test report DLE-260904005R, antenna gain = 1.24dBi Per KDB 447498 D01, when the minimum test separation distance is < 5 mm, a distance of 5 mm is applied to determine SAR test exclusion. The test exclusion threshold is 0.499 which is<= 3, SAR testing is not required. Note: Exclusion Thresholds Results=[(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] ·[√f(GHz)] f(GHz) is the RF channel transmit frequency in GHz Distance=5mm

2.4 Ap Fe Pa (A)P (B) S (C)M (D)F (E)F (F) A Ele Wor Ban Pea Impe Retu Pola Azim Ope Res Term The Dim 4GHz 32 pplicatio WLAN, 80 eatures SMD, high rt numbe RANT321 (A)(B)(C Product Typ SizeCode Material Frequency Feedingmod Antenna ty ectrical S rkingFreque dwidth akGain edance urnloss arization muth Beam eration Tem sistance to mination specification i mension 咏成國 RAINInt 深圳市 A707, Ru District, S 216 Chi on: 02.11b/g,Bl hreliability,u erInform 6F245C0X C) (D)(E pe de ype Specifica encyRange mwidth mperature( SolderingH s definedonEV and Ter 國際科技有 ternational Te 宝安区固戍 uite Technolog Shenzhen pAnten uetooth,W ultraImpac ation X ) (F) Chip Ante 3.2x1.6mm HighKmat 2.4 ~2.5G PIFA &Sin Type=01 ation e °C) Heats VB. rminal Co 有限公司 echnology Co 戍兴裕路锐特 gy Park, Xingy na:RAN WLAN, etc... t, Omni-dir enna m(±0.2mm erial Hz ngleFeedin 2400 ~ 120M 1.24d 50 10d Li Omni- -4 10sec. Ni / Au onfigurat o.,Ltd. 特科技园A707 yu Road, Gush NT3216F ... rectional... m) g ~2500MHz MHz(Min.) dBi(Typ.) 0Ohm B(Min) near -directiona 0~85°C (@280°C) u(Leadless) tion Dimensio L 3 W 1 T 0 7 hu, Baoan F245C0X z l ) ) on (mm) .20± 0.20 .60±0.20 .45± 0.20 電話:1353 TEL: 135 X 30576606 530576606 No. 1 2 Term Fee GND minal Name ding/GNG D/Feeding e 2.4 Ev Ele R R 4GHz 32 valuationB ectrical C ReturnLos 1 Radiation 216 Chi Board Re PCB Characte s 2400MHz Efficiency PeakGain Directivity pAnten eference Dimension eristics 2400MHz 82.52% 1.15dBi 1.89dBi na:RAN e n ReturnL 2450MH 2450MH 85.26% 1.24dB 1.97dB NT3216F Loss &Rad Hz Hz 2500M % 83.01 i 1.19d i 1.91d F245C0X An diation 2500 MHz 1% dBi dBi X ntennaLay Freq 0MHz youtRefere quency(MHz 2400 2450 2500 X Y ence Unit:mm z) S11(d -10.5 -30.6 -11.4 Z m B) 50 62 47 2.4 Tap R 4GHz 32 ping Spe Reel Speci Tapping S Packaging Paper Type 216 Chi ecificatio fication TYPE 3216 Specificati Type 3216 1.9 0 pAnten ons SIZE 7” 5 ion A B 0±0.20 3.50±0. na:RAN Reel and E K/Reel 9 W 20 8.0±0.20 NT3216F d Taping S A 9.0±0.5 E 1.75±0.10 3.5 F245C0X pecificatio B 60±2 F G 5±0.054.0±0.1 X n C 13.5±0 H 102.0±0.05 0.5 1 T ψ 0.75±0.10 1.5 0 D 178±2 ψD P 0±0.10 4.0±0. 1 2.4 Re E C T S T C H T s L T a S (S S R (R V M S H B 4GHz 32 eliability T TestItem Electrical Characterizatio Thermal Shock Temperature Cycling High TemperatureEx sure Low TemperatureSto age Solderability SMD BottomSi SolderingHeat Resistance RSH) Vibration Mechanical Shock Humidity Bias 216 Chi Table n 1. P 5 mea 3. R -3 1 1 1.In 2.10 3. M xpo 1.I n 2. U 3. M or 1.I n 2. U 3. M de) Di p a. T b. D Pre Pre Sol Di p 5g's Not side mo Thr mu sh o Dur Vel W a 1. H 2. T 3. M pAnten Preconditioning 50 ±10°C/1 hr, th asure:Spec: ref Rapidchangeoft 30°Cto +85°C;10 15 minutes atLow 15 minutes atUp nitial measure:S 00Cycles (-30°C Measurementat nitial measure:S Unpowered;500 Measurementat nitial measure:S Unpowered:500 Measurementat pping method: Temperature: 23 Dippingtime:3±0 eheating tempera eheating time:1~ der temperature pping time: 5±0.5 s for 20 min.,12 te:Use 8"X5"PC e and 2 secure unted within 2" ree shocks in e tually perpend ocks)Peak value ration: 0.5ms ocity change:1 5 aveform: Half-sin Humidity: 85%R Time:500± 24ho Measurementat na:RAN Procedu : henkeep for 24±1 ferInitialspec. temperaturetest 00 cycles; wer category te pper category te Spec: referInitials °Cto +85°C), Soa 24 ± 2Hoursaf t Spec: referInitials hours@T=+85°C 24 ±2hoursafte Spec: referInitials hours@ T=-30°C 24 ±2hoursafte 35±5°C 0.5s ature:150 ±10°C ~2min. e: 260 ± 5°C. 5s cycles eachof 3 CB.031" thick 7 s points atcorners from any secure each direction s dicular axes o e:1,500g’s 5.4 ft/s ne R.H., Temperatu ours. 24 ± 2hrsaftert NT3216F ure 1hrsatroomtemp t: mperature; mperature. spec. k Mode=1(2Cy c tertestcondition spec. °C. ertest. spec. °C. ertest. C. 3orientations secure pointson, sof oppositeside epoint. Test from shall beapplieda of the test s ure:85 ±2°C. estcondition. F245C0X p. 2.Initial cle/hours). . ,onelong es.Parts m10-2000Hz. alongthe three pecimen (18 X Requi Ceram Fulfill the electricals p on No Visible Damage. F electricalsp n. No Visible Damage. F electricalsp n. No Visible Damage. F electricalsp n. No Visible Damage. F electricalsp n. The sol coverover criticalare a bottomside No Visible No Visible No Visible No Visible Damage. F electricalsp n. irements mic Type pecificati Fulfill the pecificatio Fulfill the pecificatio Fulfill the pecificatio Fulfill the pecificatio lder should 95% of the a of e. Damage. Damage. Damage. Fulfill the pecificatio Rema (Refere User Spe MIL-STD- 202107 JESD22 JA104 MIL-STD- 202108 MIL-STD- 202108 IEC 6038 21/224.10 IEC 6038 21/224.10 MIL-STD- Method 2 MIL-STD- Method 2 MIL-STD- Method10 ark ence) c. - - - 84- 0 84- 0 -202 04 -202 13 -202 06 2.4 B F (S A P D Re R 4GHz 32 Board Flex SMD) Adhesion Physical Dimension evision H Revision 1 2 216 Chi 1. M IR 2. A unti For Any cali equ spe istory Dat 2019/0 2020/0 pAnten Mountingmethod R-Reflow.PCB S Apply the loadin ilbendingreache rce of1.8Kg for 6 y applicable me ipers, gauges, c uipment, capabl ecimendimensio e Co 3/01 N e 2/22 Ad na:RAN d: Size (L:100× W: n direction of the es2mm. 60 seconds. thod using x10m contour projecto e of determining ons. ontent ewDatashee dd 2D radiat 客 CUSTOM NT3216F :40× T:1.6mm) e arrow magnification, m ors, or other mea g the actual et tioncharacte 戶承認 MER APPRO F245C01 micrometers, asuring eristic OVED 1 No Visible No Visible Magnifica t greater ma for inspect mechanica vicebodyte body/term In accorda withspecifi Damage. Damage tion of 20X or aybeemployed tion of the alintegrityofthed erminalsand inaljunction. ance cation. AEC- Q200005 e AEC- Q200006 JESD22 JB100 _

C DL-Cert ert DL-Cert DL D L-Cert DL-Cert DL-Cer D L-Cert DL-Cert DL-Cert Cert D L-Cert DL-Cert DL-Cert DL-C DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert ert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert D DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Ce DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL- DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert ert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-C DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert ert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Ce L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert D DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-C L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert rt DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Ce DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-C L-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert rt DL-Cert DL-Cert DL-Cert D L-Cert DL-Ce DL-Cert DL-Cert DL-Cert D L-Cert DL Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert D L-C L-Cert DL-Cert rt DL-Cer DL Shenzhen DL Testing Technology Co., Ltd. Report No.: DL E-260904005R T est Report Tel: 400-688-3552 Web:www.dl-cert.com Email: [email protected] Page 1 of 41 FCC T est Report FCC ID: 2A44B-QV003 Applica nt: Shenzhen Ruidian Technology Co., Ltd. Address: 301, 3rd Floor, Building 11, Longbi Industrial Zone, No. 27 Dafa Road, Dafa Pu Community, Bantian Street, Longgang District, Shenzhen City, China Manufacturer: Shenzhen Ruidian Technology Co., Ltd. Address: 301, 3rd Floor, Building 11, Longbi Industrial Zone, No. 27 Dafa Road, Dafa Pu Community, Bantian Street, Longgang District, Shenzhen City, China Product Name: AI Voice Recorder Trade Mark: N/A Model Number: QV003, QV011, QV013, QV015, QV016, QV017, QV018, QV019, QV020, QV021, QV022, QV023, QV024 Date of Receipt: Jul. 13, 2026 Test Date: Jul. 13, 2026 ~ Sep. 04, 2026 Date of Report: Sep. 04, 2026 Prepared By: Shenzhen DL Testing Technology Co., Ltd. Address: 101-201, Comprehensive Building, Tongzhou Electronics Longgang Factory Area, No.1 Baolong Fifth Road, Baolong Community, Baolong Street, Longgang District, Shenzhen, China Applicable Standards: 47 CFR FCC Part 15 Subpart C 15.247 KDB 558074 D01 15.247 Meas Guidance v05r02 ANSI C63.10: 2020 Test Result: Pass Report Number: DLE-260904005R Prepared by(Engineer): Ken Tan Reviewer(Supervisor): Jack Bu Approved(Manager): Jade Yang This test report is based on a single evaluation of one sample of above mentioned products. It is not permitted to be duplicated in extracts without written approval of Shenzhen DL Testing Technology Co., Ltd. C DL-Cert ert DL-Cert DL D L-Cert DL-Cert DL-Cer D L-Cert DL-Cert DL-Cert Cert D L-Cert DL-Cert DL-Cert DL-C DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert ert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert D DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Ce DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL- DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert ert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-C DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert ert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Ce L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert D DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-C L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert rt DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Ce DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-C L-Cert DL-Cert DL-Cert DL-Cert D L-Cert DL-Cert rt DL-Cert DL-Cert DL-Cert D L-Cert DL-Ce DL-Cert DL-Cert DL-Cert D L-Cert DL Cert DL-Cert DL-Cert D L-Cert DL-Cert DL-Cert D L-C L-Cert DL-Cert rt DL-Cer DL Shenzhen DL Testing Technology Co., Ltd. Report No.: DLE-260904005R Test Report Tel: 400-688-3552 Web:www.dl-cert.com Email: [email protected] Page 2 of 41 Contents Page 1 Summary ......................................................................................................................................................... 4 1.1 Test Procedures and Results .................................................................................................................... 4 1.2 Measurement Uncertainty ......................................................................................................................... 5 1.3 Information of the Test Laboratory ............................................................................................................ 5 2 General Information ..............................................................…

Text truncated - open the document above for the full version.

Test Model: QV003 Radiated Emission AC Conducted Emission RF Conducted Emission