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2ADINNUUX4LTE mobile phone

Sun Cupid Technology (HK) Ltd.
LTE mobile phone - FCC ID 2ADINNUUX4 - Sun Cupid Technology (HK) Ltd.
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Application Details

Equipment Class
PCE - PCS Licensed Transmitter held to ear
Date of Grant
Nov 17, 2015
Application Purpose
Original Equipment
Date of Application
Nov 17, 2015
Equipment Note
LTE mobile phone
Frequency Range
709.00000000 - 711.00000000
Company
Sun Cupid Technology (HK) Ltd.
Country
Hong Kong

Documents & Files

Select a file to view

Users Manual

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Cover Letter(s)

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External Photos

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ID Label/Location Info

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Internal Photos

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RF Exposure Info

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Test Report

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Test Setup Photos

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

Users Manual

X4 Overview X4 X4 Google Play ™ Google Chrome ™ Google Play is a trademark of Google Inc. The Google Play store allows you to download apps, music, movies, and games directly to your device. Br owse the web with Google Chrome by tapping the Google Chrome icon. Type an address or search term into the Omnibox to get started. store ©2015 Google Inc., used with permission. Google and the Google logo are registered trademarks of Google Inc. X4 IC statement This device complies with Industry Canada licence-exempt RSS standard(s). Operation is subject to the following two conditions: (1) This device may not cause interference, and. (2) This device must accept any interference, including interference that may cause undesired operation of the device. This equipment complies with FCC radiation exposure limits set forth for an uncontrolled environment. End user must follow the specific operating instructions for satisfying RF exposure compliance. This transmitter must not be co-located or operating in conjunction with any other antenna or transmitter. The mobile device is designed to meet the requirements for exposure to radio waves established by the Federal Communi- cations Commission (USA). These requirements set a SAR limit of 1.6 W/kg, averaged over one gram of tissue. The highest SAR value reported under. This standard during product certification for use when properly worn on the head is W/kg and when worn on the body is W/Kg. The maximum scaled SAR in hotspot mode is W/Kg IC Radiation Exposure Statement This device was tested for typical body-worn operations. To comply with RF exposure requirements, a minimum separation distance of 10mm must be maintained between the user’s body and the handset, including the antenna. Third-party belt-clips,holsters, and similar accessories used by this device should not contain any metallic components. Body-worn accessories that do not meet these requirements may not comply with RF exposure requirements and should be avoided. Use only the supplied or an approved antenna. Le présent appareil est conforme aux CNR d'Industrie Canada applicables aux appareils radio exempts de licence. L'exploitation est autorisée aux deux conditions suivantes: (1) l'appareil ne doit pas produire de brouillage, et (2) l'utilisateur de l'appareil doit accepter tout brouillage radioélectrique subi, même si le brouillage est susceptible d'en compromettre le fonctionnement. Cet équipement est conforme aux limites d'exposition aux rayonnements de la FCC définies pour un environnement non contrôlé. L'utilisateur final doit respecter les instructions de fonctionnement spécifiques pour satisfaire la conformité aux expositions RF. Cet émetteur ne doit pas être co-localisées ou opérant en conjonction avec une autre antenne ou émetteur. L'appareil mobile est conçu pour répondre aux exigences en matière d'exposition aux ondes radio établies par la Federal Communications Commission (Etats-Unis). Ces exigences définissent la valeur SAR limite à 1.6 W/kg, en moyenne pour un gramme de tissu. La valeur SAR la plus élevée pour ce modèle de téléphone testé à l'oreille est W/Kg et lorsque porté sur le corps est W/Kg. L'échelle maximale SAR en mode hotspot est W/Kg Cet appareil a été testé pour des opérations portés sur le corps typiques. Pour se conformer aux exigences d'exposition aux radiofréquences, une distance minimale de 10 mm doit être maintenue entre le corps de l'utilisateur et le combiné, y compris l'antenne. Les pinces de ceinture, les étuis et autres accessoires similaires utilisés par cet appareil ne doivent pas contenir de composants métalliques. Les accessoires portatifs qui ne répondent pas à ces exigences peuvent ne pas se conformer aux exigences d'exposition RF et doit être évitée. Utilisez uniquement l'antenne fournie ou une antenne approuvée. SAR Information Statement Your wireless phone is a radio transmitter and receiver. It is designed and manufactured not to exceed the emission limits for exposure to radiofrequency (RF) energy set by the Federal Communications Commission of the U.S. Government. These limits are part of comprehensive guidelines and establish permitted levels of RF energy for the general population. The guidelines are based on standards that were developed by independent scientific organizations through periodic and thorough evaluation of scientific studies. The standards include a substantial safety margin designed to assure the safety of all persons, regardless of age and health. The exposure standard for wireless mobile phones employs a unit of measurement known as the Specific Absorption Rate, or SAR. The SAR limit set by the FCC is 1.6 W/kg. * Tests for SAR are conducted with the phone transmitting at its highest certified power level in all tested frequency bands. Although the SAR is determined at the highest certified power level, the actual SAR level of the phone while operating can be well below the maximum value. This is because the phone is designed to operate at multiple power levels so as to use only the power required to reach the network. In general, the closer you are to a wireless base station antenna, the lower the power output. Before a phone model is available for sale to the public, it must be tested and certified to the FCC that it does not exceed the limit established by the government adopted requirement for safe exposure. The tests are performed in positions and locations (e.g., at the ear and worn on the body) as required by the FCC for each model. The highest SAR value for this model phone when tested for use at the ear is W/Kg and when worn on the body, as described in this user guide, is W/K- g(Body-worn measurements differ among phone models, depending upon available accessories and FCC requirements). The maximum scaled SAR in hotspot mode is W/Kg. While there may be differences between the SAR levels of various phones and at various positions, they all meet the government requirement for safe exposure. The FCC has granted an Equ…

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Cover Letter(s)

SUN CUPID TECHNOLOGY(HK)LIMITED 16/F,CEO Tower,77 Wing Hong Street,Cheung Sha Wan,Hong Kong DoC Attestation Letter Date: 2015-11-13 To: Federal Communications Commission 7435 Oakland Mills Road Columbia, MD We USA111 INC., as the grantee of this project FCC ID: 2ADINNUUX4 , would like to declare that the INTEL Tablet PC (FCC ID: 2ADINNUUX4) should be confirmed that his products comply with the FCC 15.101 requirement. Dated this 2015-11-13 By: Danny Sit Signature Printed Title: General manager On behalf of : SUN CUPID TECHNOLOGY (HK)LIMITED. Telephone: +852-27250161

External Photos

Report No: CCIS15100078001 Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCIS151000780RF No. B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road, Bao’an District, Shenzhen, Guangdong, China Telephone: +86 (0) 755 23118282 Fax: +86 (0) 755 23116366 Page 74 of 84 8 EUT Constructional Details Report No: CCIS15100078001 Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCIS151000780RF No. B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road, Bao’an District, Shenzhen, Guangdong, China Telephone: +86 (0) 755 23118282 Fax: +86 (0) 755 23116366 Page 75 of 84 Report No: CCIS15100078001 Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCIS151000780RF No. B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road, Bao’an District, Shenzhen, Guangdong, China Telephone: +86 (0) 755 23118282 Fax: +86 (0) 755 23116366 Page 76 of 84 Report No: CCIS15100078001 Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCIS151000780RF No. B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road, Bao’an District, Shenzhen, Guangdong, China Telephone: +86 (0) 755 23118282 Fax: +86 (0) 755 23116366 Page 77 of 84 Report No: CCIS15100078001 Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCIS151000780RF No. B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road, Bao’an District, Shenzhen, Guangdong, China Telephone: +86 (0) 755 23118282 Fax: +86 (0) 755 23116366 Page 78 of 84

ID Label/Location Info

1 Label and label location Size:30*34mm Label location Label location

Internal Photos

Report No: CCIS15100078001 Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCIS151000780RF No. B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road, Bao’an District, Shenzhen, Guangdong, China Telephone: +86 (0) 755 23118282 Fax: +86 (0) 755 23116366 Page 79 of 84 Report No: CCIS15100078001 Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCIS151000780RF No. B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road, Bao’an District, Shenzhen, Guangdong, China Telephone: +86 (0) 755 23118282 Fax: +86 (0) 755 23116366 Page 80 of 84 Report No: CCIS15100078001 Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCIS151000780RF No. B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road, Bao’an District, Shenzhen, Guangdong, China Telephone: +86 (0) 755 23118282 Fax: +86 (0) 755 23116366 Page 81 of 84 Report No: CCIS15100078001 Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCIS151000780RF No. B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road, Bao’an District, Shenzhen, Guangdong, China Telephone: +86 (0) 755 23118282 Fax: +86 (0) 755 23116366 Page 82 of 84 Report No: CCIS15100078001 Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCIS151000780RF No. B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road, Bao’an District, Shenzhen, Guangdong, China Telephone: +86 (0) 755 23118282 Fax: +86 (0) 755 23116366 Page 83 of 84 Report No: CCIS15100078001 Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCIS151000780RF No. B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road, Bao’an District, Shenzhen, Guangdong, China Telephone: +86 (0) 755 23118282 Fax: +86 (0) 755 23116366 Page 84 of 84 ------End of report------

RF Exposure Info

Shenzhen Zhongjian Nanfang Testing Co., Ltd. Report No: CCIS15100078101 Authorized Signature: Bruce Zhang Laboratory Manager This report details the results of the testing carried out on one sample. The results contained in this test report do not relate to other samples of the same product and does not permit the use of the CCIS product certification mark. The manufacturer should ensure that all products in series production are in conformity with the product sample detailed in this report. This report may only be reproduced and distributed in full. If the product in this report is used in any configuration other than that detailed in the report, the manufacturer must ensure the new system complies with all relevant standards. This document cannot be reproduced except in full, without prior written approval of the Company. Any unauthorized alteration, forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law. Unless otherwise stated the results shown in this test report refer only to the sample(s) tested and such sample(s) are retained for 90 days only. 1 24Cover Page FCC SAR REPORT Applicant: SUN CUPID TECHNOLOGY(HK)LIMITED Address of Applicant: 16/F, CEO Tower, 77 Wing Hong Street, Cheung Sha Wan, Hong Kong Equipment Under Test (EUT) Product Name: LTE mobile phone Model No.: X4 Trade mark NUU Canada IC: 2ADINNUUX4 Applicable standards: FCC 47 CFR Part 2.1093 Date of Test: 23 Oct., 2015 ~ 06 Nov., 2015 Test Result: Maximum Reported 1-g SAR (W/kg) Head: 0.235 Body: 0.591 Hotspot: 1.335 Report No: CCIS15100078101 Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCIS151000781RF No. B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road, Bao’an District, Shenzhen, Guangdong, China Telephone: +86 (0) 755 23118282 Fax: +86 (0) 755 23116366 Page 2 of 203 2 Version Version No. Date Description 00 09 Nov., 2015 Original 01 13 Nov., 2015 1. Updated WLAN body test position on page 59. 2. Updated LTE band 4 head SAR on page 5. Prepared by: Date: 09 Nov., 2015 Report Clerk Reviewed by: Date: 09 Nov., 2015 Project Engineer Report No: CCIS15100078101 Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCIS151000781RF No. B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road, Bao’an District, Shenzhen, Guangdong, China Telephone: +86 (0) 755 23118282 Fax: +86 (0) 755 23116366 Page 3 of 203 3 Contents 1 COVER PAGE ....................................................................................................................................................... 1 2 VERSION ............................................................................................................................................................... 2 3 CONTENTS ........................................................................................................................................................... 3 4 SAR RESULTS SUMMARY ................................................................................................................................. 5 5 GENERAL INFORMATION .................................................................................................................................. 7 5.1 CLIENT INFORMATION ..................................................................................................................................................................... 7 5.2 GENERAL DESCRIPTION OF EUT ................................................................................................................................................... 7 5.3 MAXIMUM RF OUTPUT POWER ...................................................................................................................................................... 8 5.4 ENVIRONMENT OF TEST SITE ......................................................................................................................................................... 9 5.5 TEST LOCATION ............................................................................................................................................................................. 9 6 INTRODUCTION ................................................................................................................................................. 10 6.1 INTRODUCTION ............................................................................................................................................................................. 10 6.2 SAR DEFINITION .......................................................................................................................................................................... 10 7 RF EXPOSURE LIMITS ..................................................................................................................................... 11 7.1 UNCONTROLLED ENVIRONMENT ................................................................................................................................................... 11 7.2 CONTROLLED ENVIRONMENT ....................................................................................................................................................... 11 7.3 RF EXPOSURE LIMITS .................................................................................................................................................................. 11 8 SAR MEASUREMENT SYSTEM ....................................................................................................................... 12 8.1 E-FIELD PROBE............................................................................................................................................................................ 13 8.2 DATA ACQUISITION ELECTRONICS (DAE) .................................................................................................................................... 13 8.3 ROBOT .........…

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Test Report

Shenzhen Zhongjian Nanfang Testing Co., Ltd. Report No: CCIS15100078001 Authorized Signature: Bruce Zhang Laboratory Manager This report details the results of the testing carried out on one sample. The results contained in this test report do not relate to other samples of the same product and does not permit the use of the CCIS product certification mark. The manufacturer should ensure that all products in series production are in conformity with the product sample detailed in this report. This report may only be reproduced and distributed in full. If the product in this report is used in any configuration other than that detailed in the report, the manufacturer must ensure the new system complies with all relevant standards. This document cannot be reproduced except in full, without prior written approval of the Company. Any unauthorized alteration, forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law. Unless otherwise stated the results shown in this test report refer only to the sample(s) tested and such sample(s) are retained for 90 days only. 1. Cover Page FCC REPORT Applicant: SUN CUPID TECHNOLOGY(HK)LIMITED Address of Applicant: 16/F, CEO Tower, 77 Wing Hong Street, Cheung Sha Wan, Hong Kong Equipment Under Test (EUT) Product Name: LTE mobile phone Model No.: X4 Trade mark: NUU FCC ID: 2ADINNUUX4 Applicable standards: FCC CFR Title 47 Part 2 FCC CFR Title 47 Part 22 Subpart H FCC CFR Title 47 Part 24 Subpart E FCC CFR Title 47 Part 27 Subpart L Date of sample receipt: 12 Oct., 2015 Date of Test: 12 Oct., to 29 Oct., 2015 Date of report issued: 30 Oct., 2015 Test Result: PASS * * In the configuration tested, the EUT complied with the standards specified above. Report No: CCIS15100078001 Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCIS151000780RF No. B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road, Bao’an District, Shenzhen, Guangdong, China Telephone: +86 (0) 755 23118282 Fax: +86 (0) 755 23116366 Page 2 of 83 2. Version Version No. Date Description 00 30 Oct., 2015 Original Tested by: Date: 30 Oct., 2015 Test Engineer Reviewed by: Date: 30 Oct., 2015 Project Engineer Report No: CCIS15100078001 Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCIS151000780RF No. B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road, Bao’an District, Shenzhen, Guangdong, China Telephone: +86 (0) 755 23118282 Fax: +86 (0) 755 23116366 Page 3 of 83 3. Contents Page 1. COVER PAGE .............................................................................................................................................................. 1 2. VERSION ....................................................................................................................................................................... 2 3. CONTENTS ................................................................................................................................................................... 3 4. TEST SUMMARY ......................................................................................................................................................... 4 5. GENERAL INFORMATION ........................................................................................................................................ 5 5.1 CLIENT INFORMATION ............................................................................................................................................ 5 5.2 GENERAL DESCRIPTION OF E.U.T. ....................................................................................................................... 5 5.3 TEST MODES .......................................................................................................................................................... 8 5.4 RELATED SUBMITTAL(S) / GRANT (S) .................................................................................................................... 8 5.5 TEST METHODOLOGY ............................................................................................................................................ 8 5.6 LABORATORY FACILITY .......................................................................................................................................... 9 5.7 LABORATORY LOCATION ....................................................................................................................................... 9 5.8 TEST INSTRUMENTS LIST ....................................................................................................................................... 9 6. SYSTEM TEST CONFIGURATION ........................................................................................................................ 10 6.1 EUT CONFIGURATION ......................................................................................................................................... 10 6.2 EUT EXERCISE .................................................................................................................................................... 10 6.3 CONFIGURATION OF TESTED SYSTEM ................................................................................................................ 10 6.4 DESCRIPTION OF TEST MODES ........................................................................................................................... 10 6.5 CONDUCTED OUTPUT POWER ............................................................................................................................ 11 6.6 OCCUPY BANDWIDTH .......................................................................................................................................... 17 6.7 PEAK-TO-AVERAGE POWER RATIO .................................................................................................................... 33 6.8 MODULATION CHARA…

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Test Report

Shenzhen Zhongjian Nanfang Testing Co., Ltd. Report No: CCIS15100078004 Authorized Signature: Bruce Zhang Laboratory Manager This report details the results of the testing carried out on one sample. The results contained in this test report do not relate to other samples of the same product and does not permit the use of the CCIS product certification mark. The manufacturer should ensure that all products in series production are in conformity with the product sample detailed in this report. This report may only be reproduced and distributed in full. If the product in this report is used in any configuration other than that detailed in the report, the manufacturer must ensure the new system complies with all relevant standards. This document cannot be reproduced except in full, without prior written approval of the Company. Any unauthorized alteration, forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law. Unless otherwise stated the results shown in this test report refer only to the sample(s) tested and such sample(s) are retained for 90 days only. 1. Cover Page FCC REPORT Applicant: SUN CUPID TECHNOLOGY(HK)LIMITED Address of Applicant: 16/F, CEO Tower, 77 Wing Hong Street, Cheung Sha Wan, Hong Kong Equipment Under Test (EUT) Product Name: LTE mobile phone Model No.: X4 Trade mark: NUU FCC ID: 2ADINNUUX4 Applicable standards: FCC CFR Title 47 Part 2 FCC CFR Title 47 Part 22 Subpart H FCC CFR Title 47 Part 24 Subpart E FCC CFR Title 47 Part 27 Subpart H FCC CFR Title 47 Part 27 Subpart L Date of sample receipt: 12 Oct., 2015 Date of Test: 12 Oct., to 30 Oct., 2015 Date of report issued: 30 Oct., 2015 Test Result: PASS* * In the configuration tested, the EUT complied with the standards specified above. Report No: CCIS15100078004 Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCIS150600511RF No.B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road, Bao’an District, Shenzhen, Guangdong, China Telephone: +86 (0) 755 23118282 Fax: +86 (0) 755 23116366 Page 2 of 573 2. Version Version No. Date Description 00 30 Oct., 2015 Original Tested by: Date: 30 Oct., 2015 Test Engineer Reviewed by: Date: 30 Oct., 2015 Project Engineer Report No: CCIS15100078004 Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCIS151000780RF No. B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road, Bao’an District, Shenzhen, Guangdong, China Telephone: +86 (0) 755 23118282 Fax: +86 (0) 755 23116366 Page 3 of 573 3. Contents Page 1. COVER PAGE .............................................................................................................................................................. 1 2. VERSION ....................................................................................................................................................................... 2 3. CONTENTS ................................................................................................................................................................... 3 4. TEST SUMMARY ......................................................................................................................................................... 4 5. GENERAL INFORMATION ........................................................................................................................................ 5 5.1 CLIENT INFORMATION ............................................................................................................................................ 5 5.2 GENERAL DESCRIPTION OF E.U.T. ....................................................................................................................... 5 5.3 TEST MODES ........................................................................................................................................................ 12 5.4 RELATED SUBMITTAL(S) / GRANT (S) .................................................................................................................. 12 5.5 TEST METHODOLOGY .......................................................................................................................................... 12 5.6 LABORATORY FACILITY ........................................................................................................................................ 12 5.7 LABORATORY LOCATION ..................................................................................................................................... 13 5.8 TEST INSTRUMENTS LIST ..................................................................................................................................... 13 6. SYSTEM TEST CONFIGURATION ........................................................................................................................ 14 6.1 EUT CONFIGURATION ......................................................................................................................................... 14 6.2 EUT EXERCISE .................................................................................................................................................... 14 6.3 CONFIGURATION OF TESTED SYSTEM ................................................................................................................ 14 6.4 DESCRIPTION OF TEST MODES ........................................................................................................................... 14 6.5 CONDUCTED OUTPUT POWER ............................................................................................................................ 15 6.6 PEAK-TO-AVERAGE RATIO .................................................................................................................................. 25 6.7 OCCUPY BANDWIDTH .............................................................................................................................…

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Test Report

Report No: CCIS15100078004 Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCIS151000780RF No. B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road, Bao’an District, Shenzhen, Guangdong, China Telephone: +86 (0) 755 23118282 Fax: +86 (0) 755 23116366 Page 170 of 570 15MHz Test Mode: LTE band 4(15MHz 16QAM) RB Size 1 & RB Offset 0 Test Channel: Lowest channel 30MHz~1GHz 1GHz~20GHz Test Mode: LTE band 4(15MHz 16QAM) RB Size 1 & RB Offset 0 Test Channel: Middle channel 30MHz~1GHz 1GHz~20GHz Ref 30 dBmAtt 30 dB * Offset 10 dB A LVL 97 MHz/Start30 MHzStop1 GHz * * 3DB RBW 100 kHz VBW 300 kHz SWT 100 ms 1 PK MAXH -70 -60 -50 -40 -30 -20 -10 0 10 20 30 1 Marker 1 [T1 ] -38.23 dBm 123.120000000 MHz D1 -13 dBm Date: 23.OCT.2015 13:47:01 Ref 30 dBmAtt 30 dB * * Offset 10 dB A LVL 3DB RBW 1 MHz VBW 3 MHz SWT 380 ms * Start1 GHzStop20 GHz1.9 GHz/ 1 PK MAXH -70 -60 -50 -40 -30 -20 -10 0 10 20 30 1 Marker 1 [T1 ] -21.77 dBm 13.616000000 GHz D1 -13 dBm Date: 23.OCT.2015 13:49:55 Ref 30 dBmAtt 30 dB * Offset 10 dB A LVL 97 MHz/Start30 MHzStop1 GHz * * 3DB RBW 100 kHz VBW 300 kHz SWT 100 ms 1 PK MAXH -70 -60 -50 -40 -30 -20 -10 0 10 20 30 1 Marker 1 [T1 ] -37.28 dBm 699.300000000 MHz D1 -13 dBm Date: 23.OCT.2015 13:55:33 Ref 30 dBmAtt 30 dB * * Offset 10 dB A LVL 3DB RBW 1 MHz VBW 3 MHz SWT 380 ms * Start1 GHzStop20 GHz1.9 GHz/ 1 PK MAXH -70 -60 -50 -40 -30 -20 -10 0 10 20 30 1 Marker 1 [T1 ] -21.10 dBm 13.616000000 GHz D1 -13 dBm Date: 23.OCT.2015 13:52:04 Report No: CCIS15100078004 Shenzhen Zhongjian Nanfang Testing Co., Ltd. Project No.: CCIS151000780RF No. B-C, 1/F., Building 2, Laodong No.2 Industrial Park, Xixiang Road, Bao’an District, Shenzhen, Guangdong, China Telephone: +86 (0) 755 23118282 Fax: +86 (0) 755 23116366 Page 171 of 570 Test Mode: LTE band 4(15MHz 16QAM) RB Size 1 & RB Offset 0 Test Channel: Highest channel 30MHz~1GHz 1GHz~20GHz Test Mode: LTE band 4(15MHz 16QAM) RB Size 36 & RB Offset 0 Test Channel: Lowest channel 30MHz~1GHz 1GHz~20GHz Ref 30 dBmAtt 30 dB * Offset 10 dB A LVL 97 MHz/Start30 MHzStop1 GHz * * 3DB RBW 100 kHz VBW 300 kHz SWT 100 ms 1 PK MAXH -70 -60 -50 -40 -…

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Contact Information

Applicant

Danny Sit
[email protected]+852-2725 0161Fax: +852- 27250090

Test Firm

Shenzhen Zhongjian Nanfang Testing Co.,LtdBruce Zhang
[email protected]86-755-23118282Fax: 86-755-23116366

Technical Specifications

#Rule PartsFrequency RangePower OutputEmissionTolerance
1727709 MHz - 711 MHz103.00 mW9M08W7D0.219718 ppm
Confidentiality
Long Term
Grant Notes
Output power listed is ERP for below 1GHz, EIRP for above 1GHz. SAR compliance for body-worn operating conditions is restricted to belt clips, holsters or similar accessories that have no metallic component in the assembly and must provide a minimum separation distance of 1 cm between the device and the body. End-users must be informed of the body-worn operating requirements for satisfying RF exposure compliance. The highest reported SAR for head, body-worn accessory, product specific (wireless router), and simultaneous transmission exposure conditions are 0.235W/kg, 0.591 W/kg, 1.335 W/kg, and 1.401 W/kg, respectively. This device contains functions that are not operational in the U.S. Territories. This filing is only applicable for U.S. operations.

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