2AGAJTYV-1639BSelfie stick

This device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. Changes or modifications not expressly approved by the party responsible for compliance could void the user's authority to operate the equipment. NOTE: This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to Part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates, uses instructions, may cause harmful interference to radio communications. However, there is no guarantee that interference will not occur in a particular installation. If this equipment does cause harmful interference to radio or television reception, which can be determined by turning the equipment off and on, the user is encouraged to try to correct the interference by one or more of the following measures: -- Reorient or relocate the receiving antenna. -- Increase the separation between the equipment and receiver. -- Connect the equipment into an outlet on a circuit different from that to which the receiver is connected. -- Consult the dealer or an experienced radio/TV technician for help.

Oct.-22-15 Equipment Autorisation Division Federal Communications Commission 7435 Oakland Mills Road Columbia, MD 21046 FCC ID: 2AGAJTYV-1639B _ Product Name: Selfie stick Request for Confidentiality Pursuant to Sections 0.457 and 0.459 of the commissions rules, we hereby request that the following documents be held confidential: • Schematics Long-term confidential • Block diagram Long-term confidential • Operation description Long-term confidential These materials contain trade secrets and proprietary information and are not customarily released to the public. The public disclosure of this information might be harmful to the company and provide unjustified benefits to our competitors. Signature: Name Xiao Hui Position General Manager Company Name Shenzhen Tilv Technology Co., Ltd. Address 4/F Dongshan No.8 factory, Xinwuyuan Industrial Area, Gushu Community, Xixiang, Shenzhen, China Tel 0755‐33936911 Fax 0755‐33936952 Email [email protected]

Label 10mm 10mm Label FCC ID: 2AGAJTYV-1639B Shenzhen Tilv Technology Co., Ltd. Model name: Selfie stick Model No.: TYV‐1639B

FCCID:2AGAJTYV1639B     RFExposureevaluation According to 447498 D01 General RF Exposure Guidance v05 The 1-g and 10-g SAR test exclusion thresholds for 100 MHz to 6 GHz at test separation distances İ50 mm are determined by: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] g[Ĝf(GHz)]İ3.0 for 1-g SAR and İ7.5 for 10-g extremity SAR, where f(GHz) is the RF channel transmit frequency in GHz Power and distance are rounded to the nearest mW and mm before calculation The result is rounded to one decimal place for comparison Worse case is as below: [2441MHz 1.71(1.482mW) output power] (1.482mW /5mm) g[Ĝ2.441(GHz)]= 0.463 <3.0 for 1-g SAR ThenSARevaluationisnotrequired [2441MHz 1.71dBm(1.483mW) output power] 1.483 0.47

Shenzhen Alpha Product Testing Co., Ltd. TEST REPORT FCC ID: 2AGAJTYV-1639B Applicant : Shenzhen Tilv Technology Co., Ltd. Address : 4/F Dongshan No.8 factory, Xinwuyuan Industrial Area, Gushu Community, Xixiang, Shenzhen, China Equipment Under Test (EUT): Name : Selfie stick Model : TYV-1639B Trade Name N/A Standards : FCC PART 15, SUBPART C : 2015 (Section 15.247) Report No : T1851357 01 Date of Test : September 25-October 23, 2015 Date of Issue : October 23, 2015 Ts e t R e s u l t : PASS In the configuration tested, the EUT complied with the standards specified above Authorized Signature (Mark Zhu) Manager The manufacture should ensure that all the products in series production are in conformity with the product sample detailed in this report. If the product in this report is used in any configuration other than that detailed in the report, the manufacturer must ensure the new system complies with all relevant standards. Any mention of Shenzhen Alpha Product Testing Co., Ltd. Or test done by Shenzhen Alpha Product Testing Co., Ltd. Approvals in connection with, distribution or use of the product described in this report must be approved by Shenzhen Alpha Product Testing Co., Ltd. Approvals in writing. Page 2 of 75 Report No.: T1851357 01 Contents 1. General Information ............................................................................................................... 4 1.1. Description of Device (EUT) ...............................................................................4 1.2. Accessories of device (EUT) ...............................................................................5 1.3. Test Lab information ............................................................................................5 2. Summary of test ...................................................................................................................... 6 2.1. Summary of test result .........................................................................................6 2.2. Assistant equipment used for test .........................................................................6 2.3. Block Diagram .....................................................................................................7 2.4. Test mode .............................................................................................................7 2.5. Test Conditions .....................................................................................................8 2.6. Measurement Uncertainty (95% confidence levels, k=2) ....................................8 2.7. Test Equipment .....................................................................................................9 3. Maximum Peak Output power ............................................................................................ 10 3.1. Limit ...................................................................................................................10 3.2. Test Procedure ....................................................................................................10 3.3. Test Setup ...........................................................................................................10 3.4. Test Result ..........................................................................................................10 4. Bandwidth ............................................................................................................................. 11 4.1. Limit ................................................................................................................... 11 4.2. Test Procedure .................................................................................................... 11 4.3. Test Result .......................................................................................................... 11 5. Carrier Frequency Separation ............................................................................................. 17 5.1. Limit ...................................................................................................................17 5.2. Test Procedure ....................................................................................................17 5.3. Test Result ..........................................................................................................17 6. Number Of Hopping Channel ............................................................................................. 20 6.1. Limit ...................................................................................................................20 6.2. Test Procedure ....................................................................................................20 6.3. Test Result ..........................................................................................................20 7. Dwell Time ............................................................................................................................. 23 7.1. Test limit ............................................................................................................23 7.2. Test Procedure ....................................................................................................23 7.3. Test Results ........................................................................................................23 8. Radiated emissions ................................................................................................................ 30 8.1. Limit ...................................................................................................................30 8.2. Block Diagram of Test setup ..............................................................................31 8.3. Test Procedure ....................................................................................................32 8.4. Test Result ..............................................................................…

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Photos of Radiated emission Photos of Conducted Emission test