FCCID.CO- FCC ID Database
HomeCompaniesEquipment ClassesSearch

© 2026 FCC ID Database. All rights reserved.

AboutContactData sourced from FCC public records
  1. Home/
  2. Cyrus Technology GmbH/
  3. 2AI3KCM17XA

2AI3KCM17XARugged Phone

Cyrus Technology GmbH
Rugged Phone - FCC ID 2AI3KCM17XA - Cyrus Technology GmbH
Click to zoom

Application Details

Equipment Class
DSS - Part 15 Spread Spectrum Transmitter
Date of Grant
Oct 31, 2020
Application Purpose
Original Equipment
Date of Application
Oct 31, 2020
Equipment Note
Rugged Phone
Frequency Range
2402.00000000 - 2480.00000000
Company
Cyrus Technology GmbH
Country
Germany

Documents & Files

Select a file to view

Users Manual

Attestation Statements

↗

Cover Letter(s)

↗
↗

External Photos

↗

ID Label/Location Info

↗

Internal Photos

↗

RF Exposure Info

↗
↗

Test Report

↗

Test Setup Photos

Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

Attestation Statements

Cyrus Technology GmbH Hergelsbendenstr. 49 D-52080 Aachen Germany Federal Communications Commission Authorization and Evaluation Division 1435 Oakland Mills Road Columbia, MD 21046 Date: 2020-10-29 SUBJECT: FCC Application for FCC ID: 2AI3KCM17XA To Whom It May Concern: I, the undersigned, hereby states this equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to part 15 of the FCC Rules, and will apply the Supplier's Declaration of Conformity procedure to the class B computer peripheral portion and receivers that operate in the range between 30 and 960 MHz of this composite device. I understand the following FCC requirements: 1. Devices subject to the SDoC procedure are required to be tested to show compliance with the FCC technical regulations by a recognized accredited testing laboratory. The testing laboratory must be accredited by a Commission approved accreditation body or designated under the terms of a government-to-government Mutual Recognition Agreement (MRA). A listing of those accredited testing laboratories that have been recognized by the Commission is published on the FCC Webpage: https://apps.fcc.gov/oetcf/eas/reports/TestFirmSearch.cfm (Select the "accredited" option to search for FCC recognized accredited test firms.) 2. Pt 2.1077 contains the list of information that must be included in the Supplier's Declaration of Conformity, which must be supplied with each product sold. The SDoC compliance info shall be included in the User’s Manual or as a separate sheet. The info must contain the name, address, and phone number of the responsible party, which must be located within the United States. According to 2.909(b), the responsible party is either the Manufacturer or if the product is imported the Importer. Regards, ------------------------------------------------- (Torsten Belverato) (Manager)

Cover Letter(s)

Cyrus Technology GmbH Hergelsbendenstr. 49 D-52080 Aachen Germany --------------------------------------------------------------------------------------------------------------------- Date: 2020-10-29 Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 FCC ID: 2AI3KCM17XA Confidentiality Request To whom it may concern, Pursuant to Sections 0.457 and 0.459 of the Commission’s Rules, we hereby request confidential treatment of the information accompanying this application as outlined below: ☒ Block Diagram ☒ Tune-Up Information ☒ Operational Description ☒ Security Information ☒ Schematics ☐ Software Defined Radio (SDR) Information ☒ Parts List The above materials contain trade secrets and proprietary information not customarily released to the public. The public disclosure of these materials may be harmful to the applicant and provide unjustified benefits to its competitors. The applicant understands that pursuant to Section 0.457 of the Rules, disclosure of this application and all accompanying documentation will not be made before the date of the Grant for this application. Sincerely, Cyrus Technology GmbH ------------------------------- (Torsten Belverato) (Manager)

Cover Letter(s)

Cyrus Technology GmbH Hergelsbendenstrasse 49, 52080 Aachen, Germany -------------------------------------------------------------------------------- October 29, 2020 FEDERAL COMMUNICATIONS COMMISSION AUTHORIZATION AND EVALUATION DIVISION 7435 OAKLAND MILLS ROAD COLUMBIA, MD 21046 SUBJECT: FCCID: 2AI3KCM17XA TO WHOM IT MAY CONCERN: We place the FCC label in the battery compartment due to below reasons: 1. The FCC label is visible when user open the battery door and install the batteries, otherwise, the equipment doesn’t work. 2. The equipment is separated from the battery and the cover in the packing box, users can read the FCC ID information at the time of purchase. 3. Label placed on the exterior of the equipment affect the appearance according to design requirements; otherwise, it would be easily removed or damaged. Sincerely, Cyrus Technology GmbH ------------------------------- (Torsten Belverato) (Manager)

External Photos

Reference Waltek Tes http://www EXHIBI EUT EUT e No.: WTX20 sting Group w.semtest.co T 2 - EUT View 1 View 2 0X09068188 (Shenzhen) m.cn T EXTER 8W-1/2/3/4/5/ Co., Ltd. RNAL PH /6/7/8/9/10 HOTOGR Page 2 of APHS 13 Reference Waltek Tes http://www EUT EUT e No.: WTX20 sting Group w.semtest.co View 3 View 4 0X09068188 (Shenzhen) m.cn 8W-1/2/3/4/5/ Co., Ltd. /6/7/8/9/10 Page 3 of 13 Reference Waltek Tes http://www EUT EUT e No.: WTX20 sting Group w.semtest.co View 5 View 6 0X09068188 (Shenzhen) m.cn 8W-1/2/3/4/5/ Co., Ltd. /6/7/8/9/10 Page 4 of 13 Reference Waltek Tes http://www EUT e No.: WTX20 sting Group w.semtest.co View 7 0X09068188 (Shenzhen) m.cn 8W-1/2/3/4/5/ Co., Ltd. /6/7/8/9/10 Page 5 of 13

ID Label/Location Info

Reference Waltek Tes http://www EXHIBI Proposed Specificatio n it is visible durable to r expected lif e Proposed FCC I Loc e No.: WTX20 sting Group w.semtest.co T 1 - PRO FCC ID La ns: The label or easily acc emain fully l etime. Label Loca ID Label cation 0X09068188 (Shenzhen) m.cn ODUCT L abel Forma shall be secu cessible to th legible and in ation on EU 8W-1/2/3/4/5/ Co., Ltd. LABELIN at FCC ID urely affixed t he user, and ntact on the UT /6/7/8/9/10 ANNEX NG D: 2AI3KC to a permane shall not be device in al l Page 1 of M17XA ently attached readily detac l normal cond 13 d part of the d chable. The l ditions of use device, in a lo label shall be e throughout ocation where e sufficiently t the device’s e y s

Internal Photos

Reference Waltek Tes http://www EXHIBI EUT Housi V i EUT Housi V i e No.: WTX20 sting Group w.semtest.co T 3 - EUT ng and Boar iew 1 ng and Boar iew 2 0X09068188 (Shenzhen) m.cn T INTER rd rd 8W-1/2/3/4/5/ Co., Ltd. NAL PHO /6/7/8/9/10 OTOGRA Page 6 of APHS 13 Reference Waltek Tes http://www EUT Housi Vi So Board-Com e No.: WTX20 sting Group w.semtest.co ng and Boar iew 2 older mponent View 1 0X09068188 (Shenzhen) m.cn rd w 8W-1/2/3/4/5/ Co., Ltd. /6/7/8/9/10 Page 7 of 13 Reference Waltek Tes http://www S o Board-Com So Board-Com e No.: WTX20 sting Group w.semtest.co older mponent View 2 older mponent View 3 0X09068188 (Shenzhen) m.cn w w 8W-1/2/3/4/5/ Co., Ltd. /6/7/8/9/10 Page 8 of 13 Reference Waltek Tes http://www S o Board-Com Anten e No.: WTX20 sting Group w.semtest.co older mponent View 4 nna View 0X09068188 (Shenzhen) m.cn w 8W-1/2/3/4/5/ Co., Ltd. /6/7/8/9/10 Page 9 of 13 Reference Waltek Tes http://www Ante n e No.: WTX20 sting Group w.semtest.co nna View 0X09068188 (Shenzhen) m.cn 8W-1/2/3/4/5/ Co., Ltd. /6/7/8/9/10 Page 10 o of 13

RF Exposure Info

Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 282 TEST REPORT Reference No. ....................: WTX20X09068188W FCC ID ............................... .: 2AI3KCM17XA Applicant .......................... .: Cyrus Technology GmbH Address ............................ .: Hergelsbendenstrasse 49, D-52080 Aachen, Germany Product Name .................. .: Rugged Phone Test Model. ....................... .: CM17XA Standards ......................... .: FCC Part 2.1093 ANSI / IEEE C95.1 : 2005+A1:2010 ANSI / IEEE C95.3 : 2002(R2008) IEEE 1528 :2013 Date of Receipt sample ... .: Sep.24, 2020 Date of Test....................... .: Oct.13, 2020 to Oct.26, 2020 Date of Issue .................... .: Oct.27, 2020 Test Result ........................ .: Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jack Sun / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTX20X09068188W Page 2 of 282 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. General Information ................................................................................................................................................... 3 1.1 Product Description for Equipment Under Test (EUT) ......................................................................................... 3 1.2 Test Standards .................................................................................................................................................... 7 1.3 Test Methodology ................................................................................................................................................ 7 1.4 Test Facility ......................................................................................................................................................... 7 2. Summary of Test Results .......................................................................................................................................... 8 3. Specific Absorption Rate (SAR) ................................................................................................................................ 9 3.1 Introduction .......................................................................................................................................................... 9 3.2 SAR Definition ..................................................................................................................................................... 9 4. SAR Measurement System ...................................................................................................................................... 10 4.1 The Measurement System ................................................................................................................................ 10 4.2 Probe ................................................................................................................................................................. 10 4.3 Probe Calibration Process ................................................................................................................................. 12 4.4 Phantom ............................................................................................................................................................ 13 4.5 Device Holder .................................................................................................................................................... 13 4.6 Test Equipment List ........................................................................................................................................... 14 5. Tissue Simulating Liquids ....................................................................................................................................... 15 5.1 Composition of Tissue Simulating Liquid ........................................................................................................... 15 5.2 Tissue Dielectric Parameters for Head and Body Phantoms ............................................................................. 16 5.3 Tissue Calibration Result ................................................................................................................................... 17 6. SAR Measurement Evaluation ................................................................................................................................ 18 6.1 Purpose of System Performance Check ............................................................................................................ 18 6.2 System Setup .................................................................................................................................................... 18 6.3 Validation Results .............................................................................................................................................. 19 7. EUT Testing Position ............................................................................................................................................... 21 7.1 Define Two Imaginary Lines on The Handset .................................................................................................... 21 7.2 Cheek Position ............................................................................................................................…

Text truncated - open the document above for the full version.

RF Exposure Info

Ref : ACR.233.1.17.SATU.A WALTEK TESTING GROUP (SHENZHEN) CO., LTD. 1/F, BUILDING A, HONGWEI INDUSTRIAL PARK, LIUXIAN 2ND ROAD BAO'AN DISTRICT SHENZHEN (518101), CHINA MVG COMOSAR DOSIMETRIC E-FIELD PROBE SERIAL NO.: SN 45/15 EPGO280 Calibrated at MVG US 2105 Barrett Park Dr. - Kennesaw, GA 30144 Calibration Date: 07/03/2020 Summary: This document presents the method and results from an accredited COMOSAR Dosimetric E-Field Probe calibration performed in MVG USA using the CALISAR / CALIBAIR test bench, for use with a COMOSAR system only. All calibration results are traceable to national metrology institutions. COMOSAR E-Field Probe Calibration Report COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.233.1.17.SATU.A Page: 2/10 This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. Name Function Date Signature Prepared by : Jérôme LUC Product Manager 7/3/2020 Checked by : Jérôme LUC Product Manager 7/3/2020 Approved by : Kim RUTKOWSKI Quality Manager 7/3/2020 Customer Name Distribution : Waltek Testing Group (Shenzhen) Co., Ltd. Issue Date Modifications A 7/3/2020 Initial release COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.233.1.17.SATU.A Page: 3/10 This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. TABLE OF CONTENTS 1 Device Under Test ..................................................................................................... 4 2 Product Description ................................................................................................... 4 2.1 General Information _______________________________________________________ 4 3 Measurement Method ................................................................................................ 4 3.1 Linearity ________________________________________________________________ 4 3.2 Sensitivity _______________________________________________________________ 5 3.3 Lower Detection Limit _____________________________________________________ 5 3.4 Isotropy _________________________________________________________________ 5 3.5 Boundary Effect __________________________________________________________ 5 4 Measurement Uncertainty .......................................................................................... 5 5 Calibration Measurement Results .............................................................................. 6 5.1 Sensitivity in air __________________________________________________________ 6 5.2 Linearity ________________________________________________________________ 7 5.3 Sensitivity in liquid ________________________________________________________ 7 5.4 Isotropy _________________________________________________________________ 8 6 List of Equipment .................................................................................................... 10 COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.233.1.17.SATU.A Page: 4/10 This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 1DEVICE UNDER TEST Device Under Test Device Type COMOSAR DOSIMETRIC E FIELD PROBE Manufacturer MVG Model SSE2 Serial Number SN 45/15 EPGO280 Product Condition (new / used) New Frequency Range of Probe 0.7 GHz-6GHz Resistance of Three Dipoles at Connector Dipole 1: R1=0.193 M Dipole 2: R2=0.188 M Dipole 3: R3=0.198 M A yearly calibration interval is recommended. 2PRODUCT DESCRIPTION 2.1 GENERAL INFORMATION MVG’s COMOSAR E field Probes are built in accordance to the IEEE 1528, OET 65 Bulletin C and CEI/IEC 62209 standards. Figure 1 – MVG COMOSAR Dosimetric E field Dipole Probe Length 330 mm Length of Individual Dipoles 2 mm Maximum external diameter 8 mm Probe Tip External Diameter 2.5 mm Distance between dipoles / probe extremity 1 mm 3 MEASUREMENT METHOD The IEEE 1528, OET 65 Bulletin C, CENELEC EN50361 and CEI/IEC 62209 standards provide recommended practices for the probe calibrations, including the performance characteristics of interest and methods by which to assess their affect. All calibrations / measurements performed meet the fore mentioned standards. 3.1 LINEARITY The evaluation of the linearity was done in free space using the waveguide, performing a power sweep to cover the SAR range 0.01W/kg to 100W/kg. COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.233.1.17.SATU.A Page: 5/10 This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 3.2 SENSITIVITY The sensitivity factors of the three dipoles were determined using a two step calibration method (air and tissue simulating liquid) using waveguides as outlined in the standards. 3.3 LOWER DETECTION LIMIT The lower detection limit was assessed using the same measurement set up as used for the linearity measurement. The required lower detection limit is 10 mW/kg. 3.4 ISOTROPY The axial isotropy was evaluated by exposing the probe to a reference wave from a standard dipole with the dipole mounted under the flat phantom in the test configuration suggested for system validations and checks. The probe was rotated along its main axis from 0 - 360 degrees in 15 degree steps. The hemispherical isotropy is determined by inserting the probe in a thin plastic box filled with tissue-equivalent liquid, with the plastic …

Text truncated - open the document above for the full version.

Test Report

Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 54 TEST REPORT Reference No. .................... : WTX20X09068188W-8 FCC ID ................................ : 2AI3KCM17XA Applicant ........................... : Cyrus Technology GmbH Address ............................. : Hergelsbendenstrasse 49, D-52080 Aachen, Germany Product Name ................... : Rugged Phone Test Model. ........................ : CM17XA Standards .......................... : FCC Part 15.247 Date of Receipt sample .... : Sep.18, 2020 Date of Test........................ : Sep.18, 2020 to Oct.23, 2020 Date of Issue ..................... : Oct.23, 2020 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jason Su / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTX20X09068188W-8 Page 2 of 54 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ................................................................................................................................... 5 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ............................................................................... 5 1.2 TEST STANDARDS ................................................................................................................................................... 6 1.3 TEST METHODOLOGY ............................................................................................................................................. 6 1.4 TEST FACILITY ....................................................................................................................................................... 6 1.5 EUT SETUP AND TEST MODE ................................................................................................................................. 7 1.6 MEASUREMENT UNCERTAINTY .............................................................................................................................. 8 1.7 TEST EQUIPMENT LIST AND DETAILS ..................................................................................................................... 9 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 11 3. RF EXPOSURE ....................................................................................................................................................... 12 3.1 STANDARD APPLICABLE ....................................................................................................................................... 12 3.2 TEST RESULT........................................................................................................................................................ 12 4. ANTENNA REQUIREMENT ................................................................................................................................ 13 4.1 STANDARD APPLICABLE ....................................................................................................................................... 13 4.2 EVALUATION INFORMATION ................................................................................................................................ 13 5. FREQUENCY HOPPING SYSTEM REQUIREMENTS ................................................................................... 14 5.1 STANDARD APPLICABLE ....................................................................................................................................... 14 5.2 FREQUENCY HOPPING SYSTEM............................................................................................................................. 14 5.3 EUT PSEUDORANDOM FREQUENCY HOPPING SEQUENCE .................................................................................... 15 6. QUANTITY OF HOPPING CHANNELS AND CHANNEL SEPARATION ................................................... 16 6.1 STANDARD APPLICABLE ....................................................................................................................................... 16 6.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 16 6.3 TEST PROCEDURE ................................................................................................................................................. 16 6.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 17 7. DWELL TIME OF HOPPING CHANNEL .......................................................................................................... 20 7.1 STANDARD APPLICABLE ....................................................................................................................................... 20 7.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 20 7.3 TEST PROCEDURE ................................................................................................................................................. 20 7.4 SUMMARY OF TEST RESULTS/PLOTS ..............................................................................................…

Text truncated - open the document above for the full version.

Contact Information

Applicant

Torsten Belverato
[email protected]+49-241-919970-15Fax: +49-241-919970-11

Test Firm

Waltek Testing Group (Shenzhen) Co., Ltd.Jandy So
[email protected]86 755 33663308Fax: 86-755-33663309

Technical Specifications

#Rule PartsFrequency RangePower Output
115C2.40 GHz - 2.48 GHz3.30 mW
Confidentiality
Long Term
Grant Notes
Output Power listed is conducted.

Other Applications from Cyrus Technology GmbH

ConnectedRide Navigator - FCC ID 2AI3KCRN1 - Cyrus Technology GmbH
2AI3KCRN1

ConnectedRide Navigator

Aug 07, 2023

Equipment Class

NII - Unlicensed National Information Infrastructure TX