2AIDG-SP-807RBTPARTY SPEAKER with Bluetooth

100-240V

Reference No.: WTX21X04030225W Page 2 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTX21X04030225W Page 3 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 3 EUT View 4 Reference No.: WTX21X04030225W Page 4 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 5 EUT View 6 Reference No.: WTX21X04030225W Page 5 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 7

Reference No.: WTX21X04030225W Page 1 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format Product Name: PARTY SPEAKER Model No.: SP-807RBT Trade Name: DOLPHIN FCC ID: 2AIDG-SP-807RBT Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

Reference No.: WTX21X04030225W Page 6 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 EUT Housing and Board View 2 Reference No.: WTX21X04030225W Page 7 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Solder Board-Component View 1 Solder Board-Component View 2 Reference No.: WTX21X04030225W Page 8 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Solder Board-Component View 3 Solder Board-Component View 4 Reference No.: WTX21X04030225W Page 9 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Solder Board-Component View 5 Solder Board-Component View 6 Reference No.: WTX21X04030225W Page 10 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Solder Board-Component View 7 Antenna View

1. MAXIMUM PERMISSIBLE EXPOSURE (MPE) 1.1 General Information Client Information Applicant: General Sound Corporation Address of applicant: 4809 Alcoa Ave. Vernon California United States Manufacturer: GUANGZHOU LANGTING ELECTRONICS CO.,LTD Address of manufacturer: NO.28 JUFU WEST ROAD,YAYAO TOWN,HUADU DISTRICT, GUANGZHOU, CHINA General Description of EUT: Product Name: PARTY SPEAKER Trade Name: DOLPHIN Model No.: SP-807RBT Adding Model(s): SP-850RBT, SP-8RBT Rated Voltage: Charging Port:DC9V Battery:DC7.4V Battery Capacity: 1800mAh Power Adapter MODEL:HY-12A09015-R INPUT:AC100-240V, 50/60Hz, 0.3A OUTPUT:DC9V,1.5A FCC ID: 2AIDG-SP-807RBT Technical Characteristics of EUT: Bluetooth Bluetooth Version: V5.1 (BR/EDR mode) Frequency Range: 2402-2480MHz RF Output Power: -13.41dBm (Conducted) Data Rate: 1Mbps, 2Mbps, 3Mbps Modulation: GFSK, π/4 DQPSK, 8DPSK Quantity of Channels: 79 Channel Separation: 1MHz Type of Antenna: PCB antenna Antenna Gain: 0dBi 1.2 Standard Applicable According to §1.1307(b)(1) and KDB 447498 D01 General RF Exposure Guidance v06, system operating under the provisions of this section shall be operating in a manner that the public is not exposed to radio frequency energy level in excess limit for maximum permissible exposure. (a) Limits for Occupational / Controlled Exposure Frequency range (MHz) Electric Field Strength (E) (V/m) Magnetic Field Strength (H) (A/m) Power Density (S) (mW/cm 2 ) Averaging Times | E | 2 , | H | 2 or S (minutes) 0.3-3.0 614 1.63 (100)* 6 3.0-30 1842/f 4.89/f (900/f)* 6 30-300 61.4 0.163 1.0 6 300-1500 / / F/300 6 1500-100000 / / 5 6 (b) Limits for General Population / Uncontrolled Exposure Frequency range (MHz) Electric Field Strength (E) (V/m) Magnetic Field Strength (H) (A/m) Power Density (S) (mW/cm 2 ) Averaging Times | E | 2 , | H | 2 or S (minutes) 0.3-1.34 614 1.63 (100)* 30 1.34-30 824/f 2.19/f (180/f)* 30 30-300 27.5 0.073 0.2 30 300-1500 / / F/1500 30 1500-100000 / / 1 30 Note: f = frequency in MHz: * = Plane-wave equivalents power density 1.3 MPE Calculation Method S = (30*P*G) / (377*R 2 ) S = power density (in appropriate units, e.g., mw/cm 2 ) P = power input to the antenna (in appropriate units, e.g., mw) G = power gain of the antenna in the direction of interest relative to an isotropic radiator, the power gain factor is normally numeric gain. R = distance to the center of radiation of the antenna (in appropriate units, e.g., cm) 1.4 MPE Calculation Result For Bluetooth Maximum Tune-Up output power: -13(dBm) Maximum peak output power at antenna input terminal: 0.05(mW) Prediction distance: >20(cm) Prediction frequency: 2480(MHz) Antenna gain: 0 (dBi) Directional gain (numeric gain): 1.00 The worst case is power density at prediction frequency at 20cm: 0.00001(mw/cm 2 ) MPE limit for general population exposure at prediction frequency: 1 (mw/cm 2 ) Result: Pass

Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 55 TEST REPORT Reference No. ....................: WTX21X04030225W FCC ID ............................... .: 2AIDG-SP-807RBT Applicant .......................... .: General Sound Corporation Address ............................ .: 4809 Alcoa Ave. Vernon California United States Product Name .................. .: PARTY SPEAKER Test Model. ....................... .: SP-807RBT Standards ......................... .: FCC Part 15.247 Date of Receipt sample ... .: Apr.08, 2021 Date of Test....................... .: Apr.08, 2021 to Apr.27, 2021 Date of Issue .................... .: Apr.27, 2021 Test Result ........................ .: Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Mike Shi/ Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTX21X04030225W Page 2 of 55 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ................................................................................................................................... 4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ............................................................................... 4 1.2 TEST STANDARDS ................................................................................................................................................... 5 1.3 TEST METHODOLOGY ............................................................................................................................................. 5 1.4 TEST FACILITY ....................................................................................................................................................... 5 1.5 EUT SETUP AND TEST MODE ................................................................................................................................. 6 1.6 MEASUREMENT UNCERTAINTY .............................................................................................................................. 7 1.7 TEST EQUIPMENT LIST AND DETAILS ..................................................................................................................... 8 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 10 3. ANTENNA REQUIREMENT ................................................................................................................................ 11 3.1 STANDARD APPLICABLE ....................................................................................................................................... 11 3.2 EVALUATION INFORMATION ................................................................................................................................ 11 4. FREQUENCY HOPPING SYSTEM REQUIREMENTS ................................................................................... 12 4.1 STANDARD APPLICABLE ....................................................................................................................................... 12 4.2 FREQUENCY HOPPING SYSTEM............................................................................................................................. 12 4.3 EUT PSEUDORANDOM FREQUENCY HOPPING SEQUENCE .................................................................................... 13 5. QUANTITY OF HOPPING CHANNELS AND CHANNEL SEPARATION ................................................... 14 5.1 STANDARD APPLICABLE ....................................................................................................................................... 14 5.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 14 5.3 TEST PROCEDURE ................................................................................................................................................. 14 5.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 15 6. DWELL TIME OF HOPPING CHANNEL .......................................................................................................... 16 6.1 STANDARD APPLICABLE ....................................................................................................................................... 16 6.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 16 6.3 TEST PROCEDURE ................................................................................................................................................. 16 6.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 17 7. 20DB BANDWIDTH ............................................................................................................................................... 18 7.1 STANDARD APPLICABLE ....................................................................................................................................... 18 7.2 TEST SETUP BLOCK DIAGRAM ....................................................................................................................…

Text truncated - open the document above for the full version.

Reference No.: WTX21X04030225W Page 11 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Conducted Emission Test Setup Radiation Emission Test Setup (Below 30MHz) Reference No.: WTX21X04030225W Page 12 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Radiation Emission Test Setup (30MHz to 1GHz) Radiation Emission Test Setup (1GHz to 18GHz) Reference No.: WTX21X04030225W Page 13 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Radiation Emission Test Setup (Above 18GHz) ***** END OF REPORT *****