2AIZN-X1302Tablet

Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 71 of 77 Vertical: Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 72 of 77 Middle channel: 2441MHz Horizontal: Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 73 of 77 Vertical: Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 74 of 77 High channel: 2480MHz Horizontal: Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 75 of 77 Vertical: Note: 1. The emission levels of other frequencies are very lower than the limit and not show in test report. 2. Measurements were conducted from 1 GHz to the 10th harmonic of highest fundamental frequency. 3. Data of measurement shown “---“in the above table mean that the reading of emissions is attenuated more than 20 dB below the limits or the field strength is too small to be measured. 4. Measurements were conducted in all three modulation (GFSK, Pi/4 DQPSK, 8DPSK), and the worst case Mode (GFSK) was submitted only. 5. EUT has been tested in unfolded states, and the report only reflects data in the unfolded state (worst-case scenario) Note: Freq. = Emission frequency in MHz Reading level (dBμV) = Receiver reading Corr. Factor (dB) = Attenuation factor + Cable loss Level (dBμV) = Reading level (dBμV) + Corr. Factor (dB) Limit (dBμV) = Limit stated in standard Margin (dB) = Level (dBμV) – Limits (dBμV) Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 76 of 77 6.11.3. Restricted Bands Requirements Bluetooth (GFSK, Pi/4-DQPSK, 8DPSK)mode have been tested, and the worst result GFSK model was report as below Frequency Reading Correct Factor Emission Level Limit Margin Polar Detector (MHz) (dBuV/m) dB/m (dBuV/m) (dBuV/m) (dB) H/V Low Channel 2387 66.31 -5.24 61.07 74 12.93 H PK 2387 51.31 -5.24 46.07 54 7.93 H AV 2387 67.84 -4.87 62.97 74 11.03 V PK 2387 52.01 -4.87 47.14 54 6.86 V AV 2390 69.16 -5.24 63.92 74 10.08 H PK 2390 51.43 -5.24 46.19 54 7.81 H AV 2390 69.60 -4.87 64.73 74 9.27 V PK 2390 52.93 -4.87 48.06 54 5.94 V AV High Channel 2483.5 66.58 -5.24 61.34 74 12.66 H PK 2483.5 52.34 -5.24 47.10 54 6.90 H AV 2483.5 65.40 -4.87 60.53 74 13.47 V PK 2483.5 50.73 -4.87 45.86 54 8.14 V AV Note: Freq. = Emission frequency in MHz Reading level (dBμV) = Receiver reading Corr. Factor (dB) = Attenuation factor + Cable loss Level (dBμV) = Reading level (dBμV) + Corr. Factor (dB) Limit (dBμV) = Limit stated in standard Margin (dB) = Level (dBμV) – Limits (dBμV) Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 77 of 77 7. Test Setup Photographs Please refer to Annex "Set Up Photos-15C" for test setup photos *****END OF REPORT*****

Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 39 of 77 Hopping No. 2-DH5 2402MHz Hopping No. 3-DH5 2402MHz Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 40 of 77 6.7. Dwell Time 6.7.1. Test Specification Test Requirement: FCC Part15 C Section 15.247 (a)(1) Test Method: ANSI C63.10:2020 Limit: The average time of occupancy on any channel shall not be greater than 0.4 seconds within a period of 0.4 seconds multiplied by the number of hopping channels employed. Test Setup: Test Mode: Hopping mode Test Procedure: 1. The testing follows ANSI C63.10:2020 Measurement Guidelines. 2. The RF output of EUT was connected to the spectrum analyzer by RF cable and attenuator. The path loss was compensated to the results for each measurement. 3. Set to the maximum power setting and enable the EUT transmit continuously. 4. Enable the EUT hopping function. 5. Use the following spectrum analyzer settings: Span = zero span, centered on a hopping channel; RBW shall be ≤ channel spacing and where possible RBW should be set >> 1 / T, where T is the expected dwell time per channel; VBW≥RBW; Sweep = as necessary to capture the entire dwell time per hopping channel; Detector function = peak; Trace = max hold. 6. Measure and record the results in the test report. Test Result: PASS Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 41 of 77 6.7.2. Test Data Mode Frequency (MHz) Pulse Time (ms) Total Dwell Time (ms) Burst Count Period Time (ms) Limit (ms) Verdict 1-DH1 2402 0.381 120.015 315 31600 400 Pass 1-DH1 2441 0.381 120.015 315 31600 400 Pass 1-DH1 2480 0.382 119.566 313 31600 400 Pass 1-DH3 2402 1.637 260.283 159 31600 400 Pass 1-DH3 2441 1.637 271.742 166 31600 400 Pass 1-DH3 2480 1.638 268.632 164 31600 400 Pass 1-DH5 2402 2.885 288.5 100 31600 400 Pass 1-DH5 2441 2.885 265.42 92 31600 400 Pass 1-DH5 2480 2.886 314.574 109 31600 400 Pass Note: 1. In normal mode, hopping rate is 1600 hops/s with 6 slots in 79 hopping channels. For DH1, With channel hopping rate (1600 / 2 / 79) in Occupancy Time Limit (0.4 x 79) (s), Hops Over Occupancy Time comes to (1600 / 2 / 79) x (0.4 x 79) = 320 hops For DH3, With channel hopping rate (1600 / 4 / 79) in Occupancy Time Limit (0.4 x 79) (s), Hops Over Occupancy Time comes to (1600 / 4 / 79) x (0.4 x 79) = 160 hops For DH5, With channel hopping rate (1600 / 6 / 79) in Occupancy Time Limit (0.4 x 79) (s), Hops Over Occupancy Time comes to (1600 / 6 / 79) x (0.4 x 79) = 106.67 hops 2. Dwell Time(s) = Hops Over Occupancy Time (hops) x Package Transfer Time Test plots as follows: Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 42 of 77 Test Graphs Dwell 1-DH1 2402MHz One Burst Dwell 1-DH1 2402MHz Accumulated Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 43 of 77 Dwell 1-DH1 2441MHz One Burst Dwell 1-DH1 2441MHz Accumulated Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 44 of 77 Dwell 1-DH1 2480MHz One Burst Dwell 1-DH1 2480MHz Accumulated Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 45 of 77 Dwell 1-DH3 2402MHz One Burst Dwell 1-DH3 2402MHz Accumulated Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 46 of 77 Dwell 1-DH3 2441MHz One Burst Dwell 1-DH3 2441MHz Accumulated Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 47 of 77 Dwell 1-DH3 2480MHz One Burst Dwell 1-DH3 2480MHz Accumulated Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 48 of 77 Dwell 1-DH5 2402MHz One Burst Dwell 1-DH5 2402MHz Accumulated Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 49 of 77 Dwell 1-DH5 2441MHz One Burst Dwell 1-DH5 2441MHz Accumulated Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 50 of 77 Dwell 1-DH5 2480MHz One Burst Dwell 1-DH5 2480MHz Accumulated Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 51 of 77 6.8. Pseudorandom Frequency Hopping Sequence Test Requirement: FCC Part15 C Section 15.247 (a)(1) requirement: Frequency hopping systems shall have hopping channel carrier frequencies separated by a minimum of 25 kHz or the 20 dB bandwidth of the hopping channel, whichever is greater. Alternatively. Frequency hopping systems operating in the 2400-2483.5 MHz band may have hopping channel carrier frequencies that are separated by 25 kHz or two-thirds of the 20 dB bandwidth of the hopping channel, whichever is greater, provided the systems operate with an output power no greater than 125 mW. The system shall hop to channel frequencies that are selected at the system hopping rate from a Pseudorandom ordered list of hopping frequencies. Each frequency must be used equally on the average by each transmitter. The system receivers shall have input bandwidths that match the hopping channel bandwidths of their corresponding transmitters and shall shift frequencies in synchronization with the transmitted signals. EUT Pseudorandom Frequency Hopping Sequence The pseudorandom sequence may be generated in a nine-stage shift register whose 5th and 9th stage outputs are added in a modulo-two addition stage. And the result is fed back to the input of the first stage. The sequence begins with the first one of 9 consecutive ones; i.e. the shift register is initialized with nine ones. • Number of shift register stages: 9 • Length of pseudo-random sequence: 2 9 -1 = 511 bits • Longest sequence of zeros: 8 (non-inverted signal) An example of Pseudorandom Frequency Hopping Sequence as follow: Each frequency used equally on the average by each transmitter. The system receivers have input bandwidths that match the hopping channel bandwidths of their corresponding transmitters and shift frequencies in synchronization with the transmitted signals. Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 52 of 77 6.9. Conducted Band Edge Measurement 6.9.1. Test …

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Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 2 of 77 TABLE OF CONTENTS 1. Test Certification....................................................................................... 3 2. Test Result Summary ............................................................................... 4 3. EUT Description ........................................................................................ 5 4. Genera Information ................................................................................... 7 4.1. TEST ENVIRONMENT AND MODE .............................................................................................................. 7 4.2. DESCRIPTION OF SUPPORT UNITS .......................................................................................................... 7 5. Facilities and Accreditations ................................................................... 8 5.1. FACILITIES ............................................................................................................................................ 8 5.2. ACCREDITATIONS ............................................................................................................................ 8 5.3. MEASUREMENT UNCERTAINTY ............................................................................................................... 9 5.4. MEASUREMENT INSTRUMENTS ................................................................................................... 10 6. Test Results and Measurement Data .................................................... 11 6.1. ANTENNA REQUIREMENT ...................................................................................................................... 11 6.2. CONDUCTED EMISSION ........................................................................................................................ 12 6.3. CONDUCTED OUTPUT POWER .............................................................................................................. 16 6.4. 20DB OCCUPY BANDWIDTH ................................................................................................................. 23 6.5. CARRIER FREQUENCIES SEPARATION .................................................................................................. 30 6.6. HOPPING CHANNEL NUMBER ............................................................................................................... 37 6.7. DWELL TIME ........................................................................................................................................ 40 6.8. PSEUDORANDOM FREQUENCY HOPPING SEQUENCE ............................................................................. 51 6.9. CONDUCTED BAND EDGE MEASUREMENT ............................................................................................ 52 6.10. CONDUCTED SPURIOUS EMISSION MEASUREMENT ................................................................................ 55 6.11. RADIATED SPURIOUS EMISSION MEASUREMENT ................................................................................... 65 7. Test Setup Photographs ........................................................................ 77 公�t 1 0少，九 ε、、、：‘＿＿，，，巳 』E主＝三：：：：：A 亏 予 乡 去 寺 ’4，“ 口，） ， ｝ ＇ － 血 一 一 一 ...... World Standardization Certification & Testing Group ( She n zhen ) Co . ,ltd . R e p o r t N o . : W S C T - A N A B - R & E 2 5 0 8 0 0 0 7 0 A - B T Issued D a t e : 1 4 N o v e m b e r 2 0 2 5 1. Test Certification Trade Mark: I lnfinix J .., }:i ' j INFINIX MOBILITY LIMITED Applicant: I FL AT N 16/F BLOCK B UNIVERSAL INDUSTRIAL CENTRE 19-25 SHAN MEI STREET FOTAN NT HONGKONG INFINIX MOBILITY LIMITED FLAT N 16/F BLOCK B UNIVERSAL INDUSTRIAL CENTRE 19-25 SHAN MEI STREET FOTAN NT HONGKONG Pr ? duct: M。del N。．： Manufacturer: Date of Test: Applicable Standards: Tablet X1302 02 August 2025 to 14 November 2025 FCC CFR Title 47 Part 15 Subpart C Secti。『115.247 The above equipment has been tested by World Standardization Ce此ification& Testing Group (Shenzhen) Co., Ltd. and found compliance with the requirements set forth in the technical stqndards mentioned above. The results of testing in this report apply only to the product, which was tested. Other similar equipment will not necessarily produce the same results due to production tolerance and measurement uncertainties. Tested By: Approved By: lA J 叫 � r i � .� a (Wang Xiang) Checked By: A《i·r D a te: A口D Bu ” ding A,B,Bao li'an lnduolr l!I Pa rk.No .SB and 60 ,Tangtou Avenue , Sh lyan St reet, Ba 。 ＇ an Dis trict , She nzho n City, Guangd 。 ng Province , Chino . TEL• 0086 755-26996192 26996053 269回 ’44 FAX · 0086 755 863768回 E -mail: fengblng wo咱@w盹I-cert .com H印 刷w wscH :ort com I Wor ld Stan dardi za tio n Cortln ca tlon & TH ting Group ( Shenzhen）归 ， Ltd Page 3 of 77 Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 4 of 77 2. Test Result Summary Requirement CFR 47 Section Result Antenna Requirement §15.203/§15.247 (c) PASS AC Power Line Conducted Emission §15.207 PASS Maximum conducted output power §15.247 (b)(1) §2.1046 PASS 20dB Occupied Bandwidth §15.247 (a)(1) §2.1049 PASS Carrier Frequencies Separation §15.247 (a)(1) PASS Hopping Channel Number §15.247 (a)(1) PASS Dwell Time §15.247 (a)(1) PASS Radiated Emission §15.205/§15.209 §2.1053, §2.1057 PASS Band Edge §15.247(d) §2.1051, §2.1057 PASS Note: 1. PASS: Test item meets the requirement. 2. Fail: Test item does not meet the requirement. 3. N/A: Test case does not apply to the test object. 4. The test result judgment is decided by the limit of test standard. Report No.: WSCT-ANAB-R&E250800070A-BT Issued Date: 14 November 2025 Page 5 of 77 3. EUT Description Product Name: Tablet Model : X1302 Trade Mark: Infinix Operation Frequency: 2402MHz~2480MHz Channel Separation: 1MHz Number of Channel: 79 Modulation Type: GFSK, π/4-DQPSK, 8-DPSK Antenna Type: Integral Antenna Antenna Gain: -0.33dBi Operating Voltage: …

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ElectricSpecifications TYPE TransmitterFrequency GSM900/WCDMAB8/LTEB8:880-915MHz GSM1800/WCMDAB4/LTEB3/B4/B66/:1710-1785MHz GSM1900/WCDMAB1/B2/LTEB1/B25:1850-1980MHz GSM850/WCDMA5/LTEB5/B20/B26/:814-850MHz LTEB7/B38/B41:2496-2690MHz LTEB28:703-748MHz LTEB40:2300-2400MHz LTEB13: 777-716MHz LTEB12/B17:699-748MHz ReceivedFrequency GSM900/WCDMAB8/LTEB8:925-960MHz GSM1800/WCMDAB4/LTEB3/B4/B66/:1805-2180MHz GSM1900/WCDMAB1/B2/LTEB1/B25:1930-1990MHz GSM850/WCDMA5/LTEB5/B20/B26/:791-894MHz LTEB7/B38/B41:2496-2690MHz LTEB28:758-803MHz LTEB40:2300-2400MHz LTEB13: 746-756MHz LTEB12/B17:729-746MHz RF-OutputPower (E.I.R.P) GSM850/900:32.5+/-2dbm DCS/PCS:29.5+/-2dbm WCDMAB1/2/4/5/823+/-2dbm LTEB1/2/3/4/5/7/8/12/13/17/20/26/28/ 38/40/41/66:22+/-2dbm AntennaGain(Peak Gain) GSM900/WCDMAB8/LTEB8:-4.35 GSM1800/WCMDAB4/LTEB3/B4/B66/:-2.78 GSM1900/WCDMAB1/B2/LTEB1/B25:-4.18 GSM850/WCDMA5/LTEB5/B20/B26/:-3.62 LTEB7/B38/B41:-0.12 LTEB28:-2.82 LTEB40:0.77 LTEB13:-3.34 LTEB12/B17:-3.14 WIFI2.4G:-0.33 WIFI5G:-1.6 GPS:-1.04 Antennasize AntennaGain ANT1 bandGain G900/W8/B8-4.35 bandGain G1900/W1W2/B1B2B25-4.18 bandGain B7B38B41-0.12 bandGain B3B4B66/W4/G1800-2.78 bandGain B5B20B26/G850/W5-3.62 bandGain B13-3.34 bandGain B28-2.82 bandGain B12/B17-3.14 bandGain B400.77 ANT2 bandGain GPS -1.04 bandGain WIFI2.4G -0.33 bandGain WIFI5G -1.6

ReportNo.: WSCT-ANAB-R&E250800070A-SAR Page 2 of 79 Table of contents 1 General information .......................................................................................................................................... 5 1.1 Notes ........................................................................................................................................................... 5 1.2 Application details ..................................................................................................................................... 5 1.3 Statement of Compliance .......................................................................................................................... 6 1.4 EUT Information ......................................................................................................................................... 7 2 Testing laboratory ............................................................................................................................................. 9 3 ACCREDITATIONS ............................................................................................................................................ 9 4 Test Environment .............................................................................................................................................. 9 5 Applicant and Manufacturer ............................................................................................................................ 9 6 Test standard/s: ................................................................................................................................................ 10 6.1 RF exposure limits ................................................................................................................................... 11 6.2 SAR Definition .......................................................................................................................................... 11 7 SAR Measurement System .............................................................................................................................. 12 7.1 The Measurement System ...................................................................................................................... 12 7.2 Robot ......................................................................................................................................................... 13 7.3 Probe ......................................................................................................................................................... 14 7.4 DAE ........................................................................................................................................................... 15 7.5 Phantom .................................................................................................................................................... 16 7.6 Device Holder ........................................................................................................................................... 17 7.7 SAR Scan General Requirement ............................................................................................................ 18 7.8 Measurement procedure ......................................................................................................................... 19 7.9 Tissue simulating liquids: dielectric properties ................................................................................... 20 7.10 Tissue simulating liquids: parameters .................................................................................................. 21 8 System Check .................................................................................................................................................. 22 8.1 System check procedure ........................................................................................................................ 22 8.2 System check results .............................................................................................................................. 23 ReportNo.: WSCT-ANAB-R&E250800070A-SAR Page 3 of 79 9 SAR Test Test Configuration ......................................................................................................................... 24 9.1 Wi-Fi Test Configuration ....................................................................................................................... 24 9.2 WiFi 5G SAR Test Procedures ................................................................................................................ 25 10 Detailed Test Results .............................................................................................................................. 27 10.1 Conducted Power measurements .......................................................................................................... 27 10.1.1 Conducted Power of GSM ....................................................................................................................... 27 10.1.2 Conducted Power of WCDMA ................................................................................................................. 28 10.1.3 Conducted Power of LTE Band 2 ........................................................................................................... 29 10.1.4 Conducted Power of LTE Band 4 ........................................................................................................... 31 10.1.5 Conducted Power of LTE Band 5 ........................................................................................................... 33 10.1.6 Conducted Power of LTE Band 7 ........................................................................................................... 35 10.1.7 Conducted Power of LTE Band 12 ...........................................................................…

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偶极子天线验证记录表 Dipole antenna verification record table date Frequency (MHz) Return Loss (dB) Lmpedance,transformed to feed point Manufacturer data 2024.08.19 750 -32.20 51.4Ω-2.06jΩ test data 2025.11.21 750 -32.02 51.6Ω-1.46jΩ Expected next lmpedance,transformed to feed point test on November 20, 2026 date Frequency (MHz) Return Loss (dB) Lmpedance,transformed to feed point Manufacturer data 2024.08.20 835 -29.90 49.1Ω-3.05jΩ test data 2025.11.21 835 -30.60 49.9Ω-4.30jΩ Expected next lmpedance,transformed to feed point test on November 20, 2026 date Frequency (MHz) Return Loss (dB) Lmpedance,transformed to feed point Manufacturer data 2024.08.20 1750 -32.80 47.8Ω-0.26jΩ test data 2025.11.21 1750 -31.33 48.3Ω-2.16jΩ Expected next lmpedance,transformed to feed point test on November 20, 2026 date Frequency (MHz) Return Loss (dB) Lmpedance,transformed to feed point Manufacturer data 2024.08.19 1900 -27.10 50.8Ω+4.38jΩ test data 2025.11.21 1900 -24.33 51.8Ω-5.94jΩ Expected next lmpedance,transformed to feed point test on November 20, 2026 date Frequency (MHz) Return Loss (dB) Lmpedance,transformed to feed point Manufacturer data 2024.08.16 2550 -37.40 50.4Ω-1.3jΩ test data 2025.11.21 2550 -37.11 50.6Ω-1.99jΩ Expected next lmpedance,transformed to feed point test on November 20, 2026 date Frequency (MHz) Return Loss (dB) Lmpedance,transformed to feed point Manufacturer data 2024.10.17 3500 -27.0 51.7Ω+4.2jΩ test data 2025.11.22 3500 -26.6 49.5Ω+0.56jΩ Expected next lmpedance,transformed to feed point test on November 20, 2026 date Frequency (MHz) Return Loss (dB) Lmpedance,transformed to feed point Manufacturer data 2024.10.17 3700 -22.6 43.3Ω+1.6jΩ test data 2025.11.22 3700 -22.2 43.3Ω-4.67jΩ Expected next lmpedance,transformed to feed point test on November 20, 2026 date Frequency (MHz) Return Loss (dB) Lmpedance,transformed to feed point Manufacturer data 2024.10.17 5200 -25.0 53.3Ω-4.8jΩ test data 2025.11.24 5200 -25.5 52.7Ω-2.40jΩ Expected next lmpedance,transformed to feed point test on November 20, 2026 date Frequency (MHz) Return Loss (dB) Lmpedance,transformed to feed point Manufacturer data 2024.10.17 5500 -29.5 47.6Ω-2.2jΩ test data 2025.11.24 5500 -28.6 49.8Ω-2.98jΩ Expected next lmpedance,transformed to feed point test on November 20, 2026 date Frequency (MHz) Return Loss (dB) Lmpedance,transformed to feed point Manufacturer data 2024.10.17 5800 -27.5 50.5Ω+4.2jΩ test data 2025.11.24 5800 -27.7 49.2Ω+5.12jΩ Expected next lmpedance,transformed to feed point test on November 20, 2026

阻抗与回波损耗记录 750MHZ天线的阻抗和损耗 Impedance and Return Loss of 750MHz Antenna 835MHZ天线的阻抗和损耗 Impedance and Return Loss of 835MHz Antenna 1750MHZ天线的阻抗和损耗 Impedance and Return Loss of 1750MHz Antenna 1900MHZ天线的阻抗和损耗 Impedance and Return Loss of 1900MHz Antenna 2550MHZ天线的阻抗和损耗 Impedance and Return Loss of 2550MHz Antenna 3500MHZ天线的阻抗和损耗 Impedance and Return Loss of 3500MHz Antenna 3700MHZ天线的阻抗和损耗 Impedance and Return Loss of 3700MHz Antenna 5200MHZ天线的阻抗和损耗 Impedance and Return Loss of 5200MHz Antenna 5500MHZ天线的阻抗和损耗 Impedance and Return Loss of 5500MHz Antenna 5800MHZ天线的阻抗和损耗 Impedance and Return Loss of 5800MHz Antenna

(INFINIXMOBILITYLIMITED) (September22,2025) EurofinsElectricalandElectronicTestingNA,Inc. 914WestPatapscoAvenue Baltimore,MD21230 RE:AttestationStatementsPart2.911(d)(5)(i)requestfor(FCCID:2AIZN-X1302#) [INFINIXMOBILITYLIMITED](“theapplicant”)certifiesthattheequipmentforwhich authorizationissoughtisnot“covered”equipmentprohibitedfromreceivingan equipmentauthorizationpursuanttosection2.903oftheFCCrules. Wealsocertifythat,asofthedateofthefilingoftheapplication,theequipmentdoes notutilizecyber-securityoranti-virussoftwarefromKasperskyLab,Inc,oranyofits successorsandassignees,whichisalsoonthe“coveredlist”. Sincerely, JerryLiu/Manger (INFINIXMOBILITYLIMITED) (September22,2025) EurofinsElectricalandElectronicTestingNA,Inc. 914WestPatapscoAvenue Baltimore,MD21230 RE:AttestationStatementsPart2.911(d)(5)(ii)requestfor(FCCID:2AIZN-X1302#) [INFINIXMOBILITYLIMITED](“theapplicant”)certifiesthat,asofthedateofthefiling oftheapplication,theapplicantisnotidentifiedontheCoveredListasanentity producing“covered”equipment. Sincerely, JerryLiu/Manger

Page 1 Annex C: Calibration Reports Tested Model : X1302 Report Number: WSCT-ANAB-R&E250800070A-SAR

Page 1 Annex B: Measurement Results Tested Model : X1302 Report Number: WSCT-ANAB-R&E250800070A-SAR . Measurement Report for Device, FRONT, GSM 850, Channel 251 (848.800MHz) Device under Test Properties Model, Manufacturer Dimensions [mm] IMEI DUT Type Device, Tablet Exposure Conditions Phantom Section, TSL Position, Test Distance [mm] Band Group, UID Frequency [MHz], Channel Number Conversion Factor TSL Conductivity [S/m] TSL Permittivity Flat, Head Simulating Liquid FRONT, 0.00 GSM 850 848.800, 251 8.89 0.914 43.6 Hardware Setup Phantom TSL, Measured Date Probe, Calibration Date DAE, Calibration Date Twin-SAM V5.0 (30deg probe tilt) - 1899 HBBL-600-10000 Charge:xxxx, -- EX3DV4 - SN7951, 2025-09-10 DAE4ip Sn1921, 2025-09-04 Scan Setup Area Scan Zoom Scan Grid Extents [mm] 120.0 x 210.0 30.0 x 30.0 x 30.0 Grid Steps [mm] 15.0 x 15.0 6.0 x 6.0 x 1.5 Sensor Surface [mm] 3.0 1.4 Graded Grid N/A Yes Grading Ratio N/A 1.5 MAIA Y N/A Surface Detection VMS + 6p VMS + 6p Scan Method Measured Measured Measurement Results Area Scan Zoom Scan Date 2025-09-02 2025-09-02 psSAR1g [W/kg] 0.075 0.074 psSAR10g [W/kg] 0.046 0.039 Power Drift [dB] -0.02 -1.05 Power Scaling Disabled Disabled Scaling Factor [dB] TSL Correction No correction No correction M2/M1 [%] 66.3 Dist 3dB Peak [mm] 5.2 Warning(s) / Error(s) Details Area Scan Zoom Scan Warning(s) Error(s) . Measurement Report for Device, BACK, PCS 1900, Channel 512 (1850.000MHz) Device under Test Properties Model, Manufacturer Dimensions [mm] IMEI DUT Type Device, Tablet Exposure Conditions Phantom Section, TSL Position, Test Distance [mm] Band Group, UID Frequency [MHz], Channel Number Conversion Factor TSL Conductivity [S/m] TSL Permittivity Flat, Head Simulating Liquid BACK, 0.00 PCS 1900 1850.000, 512 7.33 1.42 41.7 Hardware Setup Phantom TSL, Measured Date Probe, Calibration Date DAE, Calibration Date Twin-SAM V5.0 (30deg probe tilt) - 1899 HBBL-600-10000 Charge:xxxx, -- EX3DV4 - SN7951, 2025-09-10 DAE4ip Sn1921, 2025-09-04 Scan Setup Area Scan Zoom Scan Grid Extents [mm] 120.0 x 210.0 30.0 x 30.0 x 30.0 Grid Steps [mm] 15.0 x 15.0 6.0 x 6.0 x 1.5 Sensor Surface [mm] 3.0 1.4 Graded Grid N/A Yes Grading Ratio N/A 1.2 MAIA Y Y Surface Detection VMS + 6p VMS + 6p Scan Method Measured Measured Measurement Results Area Scan Zoom Scan Date 2025-09-06 2025-09-06 psSAR1g [W/kg] 0.097 0.116 psSAR10g [W/kg] 0.048 0.056 Power Drift [dB] 1.29 -0.15 Power Scaling Disabled Disabled Scaling Factor [dB] TSL Correction No correction No correction M2/M1 [%] 85.9 Dist 3dB Peak [mm] 2.2 Warning(s) / Error(s) Details Area Scan Zoom Scan Warning(s) Error(s) . Measurement Report for Device, EDGE REAR, Band 2, Channel 9400 (1880.000MHz) Device under Test Properties Model, Manufacturer Dimensions [mm] IMEI DUT Type Device, Tablet Exposure Conditions Phantom Section, TSL Position, Test Distance [mm] Band Group, UID Frequency [MHz], Channel Number Conversion Factor TSL Conductivity [S/m] TSL Permittivity Flat, Head Simulating Liquid EDGE REAR, 0.00 Band 2 1880.000, 9400 7.33 1.42 41.7 Hardware Setup Phantom TSL, Measured Date Probe, Calibration Date DAE, Calibration Date Twin-SAM V5.0 (30deg probe tilt) - 1899 HBBL-600-10000 Charge:xxxx, -- EX3DV4 - SN7951, 2025-09-10 DAE4ip Sn1921, 2025-09-04 Scan Setup Area Scan Zoom Scan Grid Extents [mm] 120.0 x 210.0 30.0 x 30.0 x 30.0 Grid Steps [mm] 15.0 x 15.0 6.0 x 6.0 x 1.5 Sensor Surface [mm] 3.0 1.4 Graded Grid N/A Yes Grading Ratio N/A 1.2 MAIA Y Y Surface Detection VMS + 6p VMS + 6p Scan Method Measured Measured Measurement Results Area Scan Zoom Scan Date 2025-09-06 2025-09-06 psSAR1g [W/kg] 0.097 0.962 psSAR10g [W/kg] 0.048 0.422 P…

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