2AIZN-XE36True Wireless Earphones

(INFINIX MOBILITY LIMITED) (June 06, 2026) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: Attestation Statements Part 2.911(d)(5)(i) request for (FCC ID: 2AIZN-XE36#) [INFINIX MOBILITY LIMITED] (“the applicant”) certifies that the equipment for which authorization is sought is not “covered” equipment prohibited from receiving an equipment authorization pursuant to section 2.903 of the FCC rules. We also certify that, as of the date of the filing of the application, the equipment does not utilize cyber-security or anti-virus software from Kaspersky Lab, Inc, or any of its successors and assignees, which is also on the “covered list”. Sincerely, Jerry Liu/ Manger (INFINIX MOBILITY LIMITED) (June 06, 2026) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: Attestation Statements Part 2.911(d)(5)(ii) request for (FCC ID: 2AIZN-XE36#) [INFINIX MOBILITY LIMITED] (“the applicant”) certifies that, as of the date of the filing of the application, the applicant is not identified on the Covered List as an entity producing “covered” equipment. Sincerely, Jerry Liu/ Manger

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INFINIX MOBILITY LIMITED Agent Authorization Letter (June 06, 2026) Eurofins MET Labs 914 West Patapsco Avenue Baltimore, MD 21230 RE: LETTER OF AGENT AUTHORIZATION To Whom It May Concern: We, the undersigned, hereby authorize (WORLD STANDARDIZATION CERTIFICATION & TESTING GROUP (SHENZHEN) CO., LTD.) to act on our behalf in all matters relating to application for equipment authorization, including the signing of all documents relating to these matters. We also hereby certify that no party to the application authorized hereunder is subject to the denial of benefits, including FCC benefits, pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C.853(a). This agreement expires one year from the current date. Sincerely, Client’s name / title : Jerry Liu/ Manger Company Name: INFINIX MOBILITY LIMITED Contact information / address: [email protected]/ FLAT N 16/F BLOCK B UNIVERSAL INDUSTRIAL CENTRE 19-25 SHAN MEI STREET FOTAN NT HONGKONG.

INFINIX MOBILITY LIMITED Long Term Confidentiality Request Letter (June 06, 2026) Eurofins MET Labs 914 West Patapsco Avenue Baltimore, MD 21230 RE: CONFIDENTIALITY REQUEST FOR EUT NAME: True Wireless Earphones Model No: XE36 FCC ID: 2AIZN-XE36 To Whom It May Concern: This letter serves as an official request for confidentiality under sections 0.457 and 0.459 of CFR 47. We have requested that the - Block Diagram - Schematics - Operational Description required to be submitted with this application be permanently withheld from public review. The above-mentioned documents belong to internal documents, is our proprietary information, that could never get into the possession of our competition. Please contact me if there is any information you may need. Sincerely, Client’s name / title :Jerry Liu / Manger Company Name: INFINIX MOBILITY LIMITED Contact information / address: [email protected] FLAT N 16/F BLOCK B UNIVERSAL INDUSTRIAL CENTRE 19-25 SHAN MEI STREET FOTAN NT HONGKONG.

Short Term Confidentiality Request Letter (June 06, 2026) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: Short Term Confidentiality Request For(True Wireless Earphones/XE36#FCC ID:2AIZN-XE36#) To Whom It May Concern: In accordance with sections 0.457 and 0.459 of CFR 47, < INFINIX MOBILITY LIMITED >. requests short-term Confidentiality of following sections of this application for a period of 180 days after grant is issued. Set up Photos Internal photos External photos User’s manual These documents contain detailed system and equipment descriptions and related information about the product, which < INFINIX MOBILITY LIMITED > considers to be proprietary, confidential, and a custom design and otherwise, would not release to the general public. Since this design is a basis from which future technological products will evolve, < INFINIX MOBILITY LIMITED.> feels that this information would be of benefit to its competitors, and that the disclosure of the information in these documents would give our competitors an unfair advantage in the market. Please contact me if there is any information you may need. Sincerely, Yiting Luo / Manger Signature:

Label&Label Location

Page 1 of 7 FCC RF Exposure Report For INFINIX MOBILITY LIMITED FLAT N 16/F BLOCK B UNIVERSAL INDUSTRIAL CENTRE 19-25 SHAN MEI STREET FOTAN NT HONGKONG Model : XE36 Report Number: WSCT-ANAB-R&E260500042A Report Date: 29 May 2026 FCC ID: 2AIZN-XE36 Prepared By: World Standardization Certification & Testing Group (Shenzhen) Co., Ltd. Building A-B,Baoli'an Industrial Park,No.58 and 60,Tangtou Avenue, Shiyan Street, Bao'an District, Shenzhen City, Guangdong Province, China Tel: +86-755-26996192 Fax: +86-755-86376605 Report No.: WSCT-ANAB-R&E260500042A SAR Evaluation Report Page 2 of 7 Table of contents 1 General information .......................................................................................................................................... 3 1.1 Notes ........................................................................................................................................................... 3 1.2 EUT Information ......................................................................................................................................... 4 2 Testing laboratory ............................................................................................................................................. 5 3 ACCREDITATIONS ............................................................................................................................................ 5 4 Applicant and Manufacturer ............................................................................................................................ 5 5 Test standard/s: ................................................................................................................................................ 5 6 Test result ........................................................................................................................................................... 6 7 Conclusion .......................................................................................................................................................... 7 Report No.: WSCT-ANAB-R&E260500042A SAR Evaluation Report Page 3 of 7 Modified History REV. Modification Description Issued Date Remark REV.1.0 Initial Test Report Relesse 29 May 2026 Li Huaibi 1 General information 1.1 Notes The test results of this test report relate exclusively to the test item specified in this test report. Shenzhen Timeway Testing Laboratories does not assume responsibility for any conclusions and generalisations drawn from the test results with regard to other specimens or samples of the type of the equipment represented by the test item. The test report is not to be reproduced or published in full without the prior written permission. Report No.: WSCT-ANAB-R&E260500042A SAR Evaluation Report Page 4 of 7 1.2 EUT Information Device Information： Product Type: True Wireless Earphones Model: XE36 Trade Name: Infinix Software version: V1.0 Hardware version: V0.1 Device Type: Portable device Exposure Category: uncontrolled environment / general population Production Unit or Identical Prototype： Production Unit Antenna Type : Integral Antenna Device Operating Configurations: Modulation: GFSK, π/4-DQPSK, 8-DPSK Channel Separation: BT: 1MHz BLE:2MHz Operation Frequency: 2402MHz~2480MHz Antenna Gain: 2.52dBi Power Source: Rechargeable Li-ion Polymer Battery: 501012 0.15Wh 3.7V Charging Box: 801635 3.7V 400mAh 1.48Wh Note:The test results of this test report relate exclusively to the test item specified in this test report. World Standardization Certification & Testing Group (Shenzhen) Co.,Ltd does not assume responsibility for any conclusions and generalisations drawn from the test results with regard to other specimens or samples of the type of the equipment represented by the test item. The test report is not to be reproduced or published in full without the prior written permission. Report No.: WSCT-ANAB-R&E260500042A SAR Evaluation Report Page 5 of 7 2 Testing laboratory Test Site World Standardization Certification & Testing Group (Shenzhen) Co., Ltd. Laboratory A: Building A-B,Baoli'an Industrial Park,No.58 and 60,Tangtou Avenue, Shiyan Street, Bao'an District, Shenzhen City, Guangdong Province, China TEL: +86-755-26996192 FAX: +86-755-86376605 3 ACCREDITATIONS Our laboratories are accredited and approved by the following approval agencies according to ISO/IEC 17025:2017. USA ANAB - Certificate Number: AT-3951 China CNAS (Registration Number: L3732) Canada ISED(CAB identifier:CN0178) Copies of granted accreditation certificates are available for downloading from our web site, http://www.wsct-cert.com 4 Applicant and Manufacturer Applicant/Client Name: INFINIX MOBILITY LIMITED Applicant Address: FLAT N 16/F BLOCK B UNIVERSAL INDUSTRIAL CENTRE 19-25 SHAN MEI STREET FOTAN NT HONGKONG Manufacturer Name: INFINIX MOBILITY LIMITED Manufacturer Address: FLAT N 16/F BLOCK B UNIVERSAL INDUSTRIAL CENTRE 19-25 SHAN MEI STREET FOTAN NT HONGKONG 5 Test standards: No. Identity Document Title 1 47 CFR Part 15C Radio frequency devices intentional radiators 2 47 CFR Part 2.1093 Radio frequency radiation exposure evaluation: portable devices 3 KDB447498 D01 General RF Exposure Guidance v06 Report No.: WSCT-ANAB-R&E260500042A SAR Evaluation Report Page 6 of 7 6 Test result According KDB 447498 D01 4.3.1 General SAR test exclusion guidance Unless specifically required by the published RF exposure KDB procedures, standalone 1-g head or body and 10-g extremity SAR evaluation for general population exposure conditions, by measurement or numerical simulation, is not required when the corresponding SAR Test Exclusion Threshold condition(s), listed below, is (are) satisfied. These test exclusion conditions are based on source-based time-averaged maximum conducted output power of the RF channel requiring evaluation, adjusted for tune-up tolerance, and the minimum test separation distance required for the exposure conditions. The minimum test separatio…

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Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 33 of 79 CFS NVNT 3-DH5 2402MHz Ant1 CFS NVNT 3-DH5 2441MHz Ant1 Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 34 of 79 CFS NVNT 3-DH5 2480MHz Ant1 Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 35 of 79 6.6. Hopping Channel Number 6.6.1. Test Specification Test Requirement: FCC Part15 C Section 15.247 (a)(1) Test Method: ANSI C63.10:2020 Limit: Frequency hopping systems in the 2400-2483.5 MHz band shall use at least 15 channels. Test Setup: Test Mode: Hopping mode Test Procedure: 1. The testing follows ANSI C63.10:2020 Measurement Guidelines. 2. The RF output of EUT was connected to the spectrum analyzer by RF cable and attenuator. The path loss was compensated to the results for each measurement. 3. Set to the maximum power setting and enable the EUT transmit continuously. 4. Enable the EUT hopping function. 5. Use the following spectrum analyzer settings: Span = the frequency band of operation; set the RBW to less than 30% of the channel spacing or the 20 dB bandwidth, whichever is smaller; VBW≥RBW; Sweep = auto; Detector function = peak; Trace = max hold. 6. The number of hopping frequency used is defined as the number of total channel. 7. Record the measurement data in report. Test Result: PASS Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 36 of 79 6.6.2. Test data Mode Hopping channel numbers Limit Result GFSK, P/4-DQPSK, 8DPSK 79 15 PASS Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 37 of 79 Test Graphs Hopping No. NVNT 1-DH5 2402MHz Ant1 Hopping No. NVNT 2-DH5 2402MHz Ant1 Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 38 of 79 Hopping No. NVNT 3-DH5 2402MHz Ant1 Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 39 of 79 6.7. Dwell Time 6.7.1. Test Specification Test Requirement: FCC Part15 C Section 15.247 (a)(1) Test Method: ANSI C63.10:2020 Limit: The average time of occupancy on any channel shall not be greater than 0.4 seconds within a period of 0.4 seconds multiplied by the number of hopping channels employed. Test Setup: Test Mode: Hopping mode Test Procedure: 1. The testing follows ANSI C63.10:2020 Measurement Guidelines. 2. The RF output of EUT was connected to the spectrum analyzer by RF cable and attenuator. The path loss was compensated to the results for each measurement. 3. Set to the maximum power setting and enable the EUT transmit continuously. 4. Enable the EUT hopping function. 5. Use the following spectrum analyzer settings: Span = zero span, centered on a hopping channel; RBW shall be ≤ channel spacing and where possible RBW should be set >> 1 / T, where T is the expected dwell time per channel; VBW≥RBW; Sweep = as necessary to capture the entire dwell time per hopping channel; Detector function = peak; Trace = max hold. 6. Measure and record the results in the test report. Test Result: PASS Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 40 of 79 6.7.2. Test Data Mode Frequency (MHz) Pulse Time (ms) Total Dwell Time (ms) Burst Count Period Time (ms) Limit (ms) Verdict 1-DH1 2402 0.383 121.794 318 31600 400 Pass 1-DH1 2441 0.383 121.411 317 31600 400 Pass 1-DH1 2480 0.383 121.028 316 31600 400 Pass 1-DH3 2402 1.637 250.461 153 31600 400 Pass 1-DH3 2441 1.639 258.962 158 31600 400 Pass 1-DH3 2480 1.638 260.442 159 31600 400 Pass 1-DH5 2402 2.886 314.574 109 31600 400 Pass 1-DH5 2441 2.885 262.535 91 31600 400 Pass 1-DH5 2480 2.887 300.248 104 31600 400 Pass Note: 1. In normal mode, hopping rate is 1600 hops/s with 6 slots in 79 hopping channels. For DH1, With channel hopping rate (1600 / 2 / 79) in Occupancy Time Limit (0.4 x 79) (s), Hops Over Occupancy Time comes to (1600 / 2 / 79) x (0.4 x 79) = 320 hops For DH3, With channel hopping rate (1600 / 4 / 79) in Occupancy Time Limit (0.4 x 79) (s), Hops Over Occupancy Time comes to (1600 / 4 / 79) x (0.4 x 79) = 160 hops For DH5, With channel hopping rate (1600 / 6 / 79) in Occupancy Time Limit (0.4 x 79) (s), Hops Over Occupancy Time comes to (1600 / 6 / 79) x (0.4 x 79) = 106.67 hops 2. Dwell Time(s) = Hops Over Occupancy Time (hops) x Package Transfer Time Test plots as follows: Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 41 of 79 Test Graphs Dwell NVNT 1-DH1 2402MHz Ant1 One Burst Dwell NVNT 1-DH1 2402MHz Ant1 Accumulated Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 42 of 79 Dwell NVNT 1-DH1 2441MHz Ant1 One Burst Dwell NVNT 1-DH1 2441MHz Ant1 Accumulated Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 43 of 79 Dwell NVNT 1-DH1 2480MHz Ant1 One Burst Dwell NVNT 1-DH1 2480MHz Ant1 Accumulated Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 44 of 79 Dwell NVNT 1-DH3 2402MHz Ant1 One Burst Dwell NVNT 1-DH3 2402MHz Ant1 Accumulated Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 45 of 79 Dwell NVNT 1-DH3 2441MHz Ant1 One Burst Dwell NVNT 1-DH3 2441MHz Ant1 Accumulated Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 46 of 79 Dwell NVNT 1-DH3 2480MHz Ant1 One Burst Dwell NVNT 1-DH3 2480MHz Ant1 Accumulated Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 47 of 79 Dwell NVNT 1-DH5 2402MHz Ant1 One Burst Dwell NVNT 1-DH5 2402MHz Ant1 Accumulated Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 48 of 79 Dwell NVNT 1-DH5 2441MHz Ant1 One Burst Dwell NVNT 1-DH5 2441MHz Ant1 Accumulated Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 49 of 79 Dwell NVNT 1-DH5 2480MHz Ant1 One Burst Dwell NVNT 1-DH5 2480MHz Ant1 Accumulated Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 50 of 79 6.8. Pseudorandom Frequency Hopping Sequence Test Requirement: FCC Part15 C Section 15.247 (a)(1) requirement: Frequency hopping systems shall have hopping channel carrier frequencies separated by a minimum of 25 kHz…

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Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 61 of 79 Tx. Spurious NVNT 2-DH5 2441MHz Ant1 Ref Tx. Spurious NVNT 2-DH5 2441MHz Ant1 Emission Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 62 of 79 Tx. Spurious NVNT 2-DH5 2480MHz Ant1 Ref Tx. Spurious NVNT 2-DH5 2480MHz Ant1 Emission Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 63 of 79 Tx. Spurious NVNT 3-DH5 2402MHz Ant1 Ref Tx. Spurious NVNT 3-DH5 2402MHz Ant1 Emission Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 64 of 79 Tx. Spurious NVNT 3-DH5 2441MHz Ant1 Ref Tx. Spurious NVNT 3-DH5 2441MHz Ant1 Emission Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 65 of 79 Tx. Spurious NVNT 3-DH5 2480MHz Ant1 Ref Tx. Spurious NVNT 3-DH5 2480MHz Ant1 Emission Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 66 of 79 6.11. Radiated Spurious Emission Measurement 6.11.1. Test Specification Test Requirement: FCC Part15 C Section 15.209 Test Method: ANSI C63.10:2020 Frequency Range: 9 kHz to 25 GHz Measurement Distance: 3 m Antenna Polarization: Horizontal & Vertical Receiver Setup: Frequency Detector RBW VBW Remark 9kHz- 150kHz Quasi-peak 200Hz 1kHz Quasi-peak Value 150kHz- 30MHz Quasi-peak 9kHz 30kHz Quasi-peak Value 30MHz-1GHz Quasi-peak 100KHz 300KHz Quasi-peak Value Above 1GHz Peak 1MHz 3MHz Peak Value Peak 1MHz 10Hz Average Value Limit: Frequency Field Strength (microvolts/meter) Measurement Distance (meters) 0.009-0.490 2400/F(KHz) 300 0.490-1.705 24000/F(KHz) 30 1.705-30 30 30 30-88 100 3 88-216 150 3 216-960 200 3 Above 960 500 3 Frequency Field Strength (microvolts/meter) Measurement Distance (meters) Detector Above 1GHz 500 3 Average 5000 3 Peak Test setup: For radiated emissions below 30MHz 30MHz to 1GHz Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 67 of 79 Above 1GHz Test Mode: Transmitting mode with modulation Test Procedure: 1. The testing follows the guidelines in Spurious Radiated Emissions of ANSI C63.10:2020 Measurement Guidelines. 2. For the radiated emission test below 1GHz: The EUT was placed on a turntable with 0.8 meter above ground. The EUT was set 3 meters from the interference receiving antenna, which was mounted on the top of a variable height antenna tower. The EUT was arranged to its worst case and then tune the antenna tower (from 1 m to 4 m) and turntable (from 0 degree to 360 degrees) to find the maximum reading. A pre-amp and a high PASS filter are used for the test in order to get better signal level. For the radiated emission test above 1GHz: Place the measurement antenna on a turntable with 1.5 meter above ground, which is away from each area of the EUT determined to be a source of emissions at the specified measurement distance, while keeping the measurement antenna aimed at the source of emissions at each frequency of significant emissions, with polarization oriented for maximum response. The measurement antenna may have to be higher or lower than the EUT, depending on the radiation pattern of the emission and staying aimed at the emission source for receiving the maximum signal. The final measurement antenna elevation shall be that which Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 68 of 79 maximizes the emissions. The measurement antenna elevation for maximum emissions shall be restricted to a range of heights of from 1 m to 4 m above the ground or reference ground plane. 3. Set to the maximum power setting and enable the EUT transmit continuously. 4. Use the following spectrum analyzer settings: (1) Span shall wide enough to fully capture the emission being measured; (2) Set RBW=100 kHz for f < 1 GHz, RBW=1MHz for f>1GHz ; VBW≥RBW; Sweep = auto; Detector function = peak; Trace = max hold for peak (3) For average measurement: use duty cycle correction factor method per 15.35(c). Duty cycle = On time/100 milliseconds On time =N1*L1+N2*L2+...+Nn-1*LNn-1+Nn*Ln Where N1 is number of type 1 pulses, L1 is length of type 1 pulses, etc. Average Emission Level = Peak Emission Level + 20*log(Duty cycle) Corrected Reading: Antenna Factor + Cable Loss + Read Level - Preamp Factor = Level Test results: PASS Note 1: The symbol of “--” in the table which means not application. Note 2: For the test data above 1 GHz，According the ANSI C63.10-2020, where limits are specified for both average and peak (or quasi-peak) detector functions, if the peak (or quasi-peak) measured value complies with the average limit, it is unnecessary to perform an average measurement. Note 3: The low frequency, which started from 9 kHz to 30 MHz, was pre-scanned and the result which was 20 dB lower than the limit line per 15.31(o) was not reported. Note 4: The EUT is working in the Normal link mode below 1 GHz. All modes have been tested and normal link mode is worst. Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 69 of 79 6.11.2. Test Data Please refer to following diagram for individual Below 1GHz Horizontal: Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 70 of 79 Vertical: Note1: Freq. = Emission frequency in MHz Reading level (dBμV) = Receiver reading Corr. Factor (dB) = Antenna factor + Cable loss - Amplifier factor. Measurement (dBμV) = Reading level (dBμV) + Corr. Factor (dB) Limit (dBμV) = Limit stated in standard Margin (dB) = Measurement (dBμV) – Limits (dBμV) Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 71 of 79 Above 1GHz Note 1: The marked spikes near 2400 MHz with circle should be ignored because they are Fundamental signal. Note 2: The spurious above 18G is noise only, do not show on the report. GFSK Low channel: 2402MHz Horizontal: Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 72 of 79 Vertical: Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 73 of 79 Middle channel: 2441MHz Horizontal: Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2…

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3216 Chip antenna For Bluetooth / WLAN Applications Dimension (mm) L 3.2 ± 0.20 W 1.6 ± 0.20 T 0.5 ± 0.10 HLX321605X6 Room 1004, Jinhuanyu Building, No. 56 Tiezai Road, Xixiang Street, Bao'an District, Shenzhen City, Guangdong Province Specification Part Number HLX321605X6 Central Frequency 2450 MHz Bandwidth 100 (Min.) MHz Return Loss -10 (Max) dB Peak Gain 2.52 dBi Impedance 50Ω Operating Temperature -40～+85 °C Maximum Power 1 W Resistance to Soldering Heats 10 ( @ 260°C) sec. PolarizationLinear Azimuth Beamwidth Omni-directional Termination Cu / Sn (Leadless) AProduct SeriesAntenna B Dimension L x W 3.2×1.6 mm (±0.2mm) C Material Low Loss & High K material DDimension T 0.5 ± 0.10 mm E Product NameX6 HLX 32 16 05 X 6 A B C D E 1. Electrical Specification HLX321605X6 Room 1004, Jinhuanyu Building, No. 56 Tiezai Road, Xixiang Street, Bao'an District, Shenzhen City, Guangdong Province 2. Recommended PCB Pattern (Unit : mm) a.Evaluation Board Dimension b.Layout Dimensions in Clearance area HLX321605X6 Room 1004, Jinhuanyu Building, No. 56 Tiezai Road, Xixiang Street, Bao'an District, Shenzhen City, Guangdong Province 4. Measurement Results u Return Loss 3. Suggested Matching Circuit HLX321605X6 Room 1004, Jinhuanyu Building, No. 56 Tiezai Road, Xixiang Street, Bao'an District, Shenzhen City, Guangdong Province Frequency (MHz) 240024502500 Gain (dBi) 2.272.232.32 Efficiency (dB) -1.45-1.25-1.34 Efficiency (%) 717473 XY-Plane Total ZY-Plane Total ZX-Plane Total Gain-Plane Efficiency-Plane u Radiation Pattern HLX321605X6 Room 1004, Jinhuanyu Building, No. 56 Tiezai Road, Xixiang Street, Bao'an District, Shenzhen City, Guangdong Province ITEM REQUIREMENTS TEST CONDITION Solderability1. Wetting shall exceed 90% coverage 2. No visible mechanical damage TEMP (°C) Pre-heating temperature:150°C/60sec. Solder temperature:230±5°C Duration:4±1sec. Solder:Sn-Ag3.0-Cu0.5 Flux for lead free: rosin 4±1 sec. 150°C 60sec Solder heat Resistance 1. No visible mechanical damage 2. Central Freq. change :within ± 6% TEMP (°C) Pre-heating temperature:150°C/60sec. Solder temperature:260±5°C Duration:10±0.5sec. Solder:Sn-Ag3.0-Cu0.5 Flux for lead free: rosin 260°C 150°C 10±0.5 sec. 60sec Component Adhesion (Push test) 1. No visible mechanical damage The device should be reflow soldered(230±5°C for 10sec.) to a tinned copper substrate A dynometer force gauge should be applied the side of the component. The device must with-ST-F 0.5 Kg without failure of the termination attached to component Component Adhesion (Pull test) 1. No visible mechanical damage Insert 10cm wire into the remaining open eye bend ,the ends of even wire lengths upward and wind together. Terminal shall not be remarkably damaged. Thermal shock 1. No visible mechanical damage 2. Central Freq. change :within ±6% +85°C=>30±3min -40°C=>30±3min Test cycle:10 cycles The chip shall be stabilized at normal condition for 2~3 hours before measuring. Phase Temperature(°C) Time(min) 1 +85±5°C 30±3 2 Room Temperature Within 3sec 3 -40±2°C 30±3 4 Room Temperature Within 3sec Resistance to High Temperature 1. No visible mechanical damage 2. Central Freq. change :within ±6% 3. No disconnection or short circuit. Temperature: 85±5°C Duration: 1000±12hrs The chip shall be stabilized at normal condition for 2~3 hours before measuring. Resistance to Low Temperature 1. No visible mechanical damage 2. Central Freq. change :within ±6% 3. No disconnection or short circuit. Temperature:-40±5°C Duration: 1000±12hrs The chip shall be stabilized at normal condition for 2~3 hours before measuring. Humidity 1. No visible mechanical damage 2. Central Freq. change :within ±6% 3. No disconnection or short circuit. Temperature: 40±2°C Humidity: 90% to 95% RH Duration: 1000±12hrs The chip shall be stabilized at normal condition for 2~3 hours before measuring. 5.Reliability and Test Condictions 230°C HLX321605X6 Room 1004, Jinhuanyu Building, No. 56 Tiezai Road, Xixiang Street, Bao'an District, Shenzhen City, Guangdong Province Recommended temperature profiles for re-flow soldering in Figure 1. Products attachment with a soldering iron is discouraged due to the inherent process control limitations. In the event that a soldering iron must be employed the following precautions are recommended. .Preheat circuit and products to 150°C .Never contact the ceramic with the iron tip .Use a 20 watt soldering iron with tip diameter of 1.0mm .280°C tip temperature (max) .1.0mm tip diameter (max) .Limit soldering time to 3 sec. 6.Soldering and Mounting Mildly activated rosin fluxes are preferred. The minimum amount of solder can lead to damage from the stresses caused by the difference in coefficients of expansion between solder, chip and substrate. The terminations are suitable for all wave and re-flow soldering systems. If hand soldering cannot be avoided, the preferred technique is the utilization of hot air soldering tools. PRE-HEATING 350 300 150 Over 60s PRE-HEATING 60~120 s SOLDERING 10s max. 30~60s 250~260 230 180 150 SOLDERING within 3s Gradual cooling Reflow Soldering Iron Soldering TIME(sec.) TIME(sec.) NATURAL COOLING NATURAL COOLING HLX321605X6 Room 1004, Jinhuanyu Building, No. 56 Tiezai Road, Xixiang Street, Bao'an District, Shenzhen City, Guangdong Province Tape Width(mm)A(mm)B(mm)C(mm)D(mm)Chip/Reel(pcs) 89.0±0.560±213.5±0.5178±26000 7.Packaging Information u Tape Specification u Reel Specification: (7’’, Φ180 mm) 7"x8 mm A- HLX321605X6 Room 1004, Jinhuanyu Building, No. 56 Tiezai Road, Xixiang Street, Bao'an District, Shenzhen City, Guangdong Province 8.Storage and Transportation Information Storage Conditions To maintain the solderability of terminal electrodes: 1. Temperature and humidity conditions: -10~ 40°C and 30~70% RH. 2. Recommended products should be used within 6 months from the time of delivery. 3. The packaging material should be kept where no chlorine or sulfur exists in the air. Transportation Conditions 1. Products should be handled with care to avoid damage or c…

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Report No.: WSCT-ANAB-R&E260500042A-BT Issued Date: 29 May 2026 Page 2 of 79 TABLE OF CONTENTS 1. Test Certification ..................................................................................... 3 2. Test Result Summary .............................................................................. 4 3. EUT Description ....................................................................................... 5 4. Genera Information .................................................................................. 7 4.1. TEST ENVIRONMENT AND MODE .............................................................................................................. 7 4.2. DESCRIPTION OF SUPPORT UNITS .......................................................................................................... 7 5. Facilities and Accreditations .................................................................. 8 5.1. FACILITIES ............................................................................................................................................ 8 5.2. ACCREDITATIONS ............................................................................................................................ 8 5.3. MEASUREMENT UNCERTAINTY ............................................................................................................... 9 5.4. MEASUREMENT INSTRUMENTS ................................................................................................... 10 6. Test Results and Measurement Data ................................................... 11 6.1. ANTENNA REQUIREMENT ...…

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