2AMRM-ST-700DPLUSPortable Spectrophotometer

ArraySpectrophotometerST-700d ST-700disanarrayspectrophotometerdevelopedby3nhusingitsownspectroscopiccore technology.Itusesabuilt-insiliconphotodiodearray(40setsofdualcolumns)sensorsandan industrial-gradeMCU.Thepowerfuldataprocessingcapabilityensuresthestabilityandaccuracyofthe measurementdata.ThearrayspectrophotometerST-700dcaneasilycontroltherepeatabilityΔE*ab within0.022,andtheinter-instrumenterrorΔE*abwithin0.2.Itcanbeusedforaccuratecolor measurementinvariousoccasionsandconditions,andthelarge-sizetouchscreencanviewthe measurementresultsmoreeasilyandconvenient.Themeasurementdataoftheinstrumentisconsistent withothercompetingproductsfromJapan,theUnitedStates,andEurope. ThearrayspectrophotometerST-700disequippedwiththreemeasurementapertures:Φ8mm,Φ 4mm,and1x3mm.Ithaswideradaptability,accuratecolormeasurementandstableperformance.Itis usedinplasticelectronics,paintandcoatings,textileprintinganddyeing,printedpaperproducts, automobiles,medicalcare,cosmeticsandfoodindustries,andalsoarewidelyusedinscientificresearch institutionsandlaboratories. FeaturesofArraySpectrophotometerST-700d 1、Siliconphotodiodearray(dual40array)sensor Largerareadual40arraysensor,willnotbesaturatedunderstronglight,sensitivityishigherunder weaklight,andthespectrumresponserangeiswider,whichensuresthemeasurementspeed,accuracy, stabilityandconsistencyoftheinstrument.Masterthecoretechnology,developedfromsameplatform asinternationalstandardswithfullcompatibility. 2、AdoptFull-bandbalancedLEDlightsource+UVlightsource ThearrayspectrophotometerST-700dadopts400~700nmfull-bandbalancedLEDlightsourceand UVlightsourceastheinstrumentlightingsource,whichhassufficientspectraldistributioninthevisible lightrange,avoidingthespectrumlackofwhitelightLEDinspecificbands.Itcanalsoeasilymeasure fluorescentmaterialsandensurestheaccuracyoftheinstrumentmeasurementresults. 3、GratingSpectroscopicTechnology Adoptingplanegratingspectroscopictechnology,ithashigherresolutionandmakescolor measurementmoreaccurate. 4、Non-contactautomaticwhiteboardCalibration ThearrayspectrophotometerST-700disequippedwithanintelligentcalibrationbase,whichcanbe usedfornon-contactautomaticwhiteboardcalibration.Theprofessional-gradestandardwhiteboard reflectanceR%≥95%hasgoodsurfaceuniformityandhighstability,andcanobtainrepeatableand accuratedata. 5、Novelfashiondesignbasedonergonomics Thelarge-sizetouchscreenismoreconvenienttocheckthemeasurementresultsandcolor judgment.Thepositionofthehandgripandthemeasurementbuttonarecarefullydesignedtomeet differentgriphabits.Thesmoothandfinesurfaceisderivedfromthehigh-precisionappearance processingart. 6、Equippedwiththreemeasuringaperturestomeettheneedsofmoresamplemeasurement ThearrayspectrophotometerST-700disequippedwithØ8mmplatformaperture,Ø4mmplatform aperture,and1x3mmapertureasstandardaccessory,whichmeetsthemeasurementneedsofmost specialsamples. 7、Cameraframingpositioningcanclearlyobservethemeasuredarea ThearrayspectrophotometerST-700dhasabuilt-incameraforviewingandpositioning.Through thereal-timeviewingofthecamera,itcanaccuratelydeterminewhetherthemeasuredpartoftheobject isatthecenterofthetarget,whichimprovesthemeasurementefficiencyandaccuracy. 8、Excellentinter-instrumentErrorandrepeatability RepeatabilityΔE*ab≤0.022,inter-instrumenterrorΔE*ab≤0.2,thedataisstableandreliable, ensuringtheconsistencyofmeasurementdataofmultipledevices,whichcanbeusedforcolormatching andaccuratecolortransfer. 9、MultipleColorMeasurementSpacesandObservationLightSources ProvideCIELAB,XYZ,Yxy,LCh,CIELUV,s-RGB,HunterLab,βxy,DINLab99,Munsell(C/2)color spaces,andmultipleobservationlightsources:D65,A,C,D50,D55,D75,F1,F2(CWF),F3,F4,F5,F6, F7(DLF),F8,F9,F10(TPL5),F11(TL84),F12(TL83/U30),B,U35,NBF,ID50,ID65,LED-B1,LED-B2,LED-B3, LED-B4,LED-B5,LED-BH1,LED-RGB1,LED-V1,LED-V2,LED-C2,LED-C3,LED-C5.Thelightsourcecanbe customized(atotalof41kindsoflightsources,someofwhicharerealizedthroughthehost computer/APP),whichcanmeetthespecialmeasurementrequirementsunderdifferentmeasurement conditions. 10、UsingtheInternationallyUniversalD/8SCI/SCESynthesisTechnology UseD/8(SCI/SCE)tomeasurethestructure,reflectthecoloritselfmoreobjectively,reducethe influenceofthesurfacetextureoftheobjectonthetestresult,andmeetthestandards:CIENo.15，GB/T 3978,GB2893,GB/T18833,ISO7724-1,ASTME1164,DIN5033Teil7. 11、DualOpticalPathSystemforMoreAccurateColorMeasurement Dualopticalpathsystem,theopticalresolutioninthevisiblelightrangeislessthan10nm,andcan measuretheSCIandSCEspectraofsamplesatthesametime. 12、SupportAndroid,IOS,Windows,WeChatApplet,HarmonyOS. ThearrayspectrophotometerST-700dsupportsAndroid,IOS,Windows,WeChatapplets,and HarmonyOS,andissuitableforqualitymonitoringandcolordatamanagementinvariousindustries. Codifytheuser'scolormanagementwithdata,comparecolordifferences,generatetestreports,provide avarietyofcolorspacemeasurementdata,andcustomizethecustomer'scolormanagementwork. TechnicalParametersofArraySpectrophotometerST-700d ProductNa me ArraySpectrophotometerST-700d OpticalGeo metry D/8（diffusedillumination,8-degreeviewingangle） SCI⪰IncludeUV&ExcludeUV. ConformtoStandards:CIENo.15,GB/T3978,GB2893,GB/T18833,ISO7724-1,ASTME11 64,DIN5033Teil7 Integrating SphereSize Φ40mm LightSourceCombinedFullSpectrumLEDLamp,UVLamp. Spectroscopi cMethod PlaneGrating SensorLarge-areasiliconphotodiodearray(40pairsofdualcolumns) Wavelength Range 400~700nm Wavelength Interval 10nm Reflectance Range 0~200% Measuring Apertures ThreeApertures:8mmPlatform+4mmPlatform+1*3mm LocatingMe thod CrossLocating+CameraLocating Whiteboard Calibration Non-contactautomaticwhiteboardCalibration SCI/SCEMeasureSCI+SCEatthesametime ColorSpace s CIELAB,XYZ,Yxy,LCh,CIELUV,s-RGB,HunterLab,βxy,DINLab99Munsell(C/2) ColorDiffer enceFormul a ΔE*ab,ΔE*uv,ΔE*94,ΔE*cmc(2:1),ΔE*cmc(1:1),ΔE*00,DINΔE99,ΔE(Hunter) OtherColori metricIndex SpectrumReflectanceRate,WI(ASTME313-00,ASTME313-73,CIE/ISO,AATCC,Hunte r,TaubeBergerStensby), YI(ASTMD1925,ASTME313-00,ASTME313-73) MetamerismIndexMt， StainingFastness,ColorFastness,Strength(dyestrength,tintingstrength),…

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ShenzhenThreeNHTechnologyCo.,Ltd. OfficeofEngineeringTechnology FederalCommunicationsCommission 7435OaklandMillsRoad Columbia,MD21046 USA Date:2022/12/14 Subject;RequestforConfidentiality FCCID:2AMRM-ST-700DPLUS ToWhomItMayConcern, PursuanttotheprovisionsoftheCommission’srulesTitle47Sections§0.457and§0.459,we arerequestingtheCommissiontowithholdthefollowingattachment(s)asconfidential documentsfrompublicdisclosureindefinitely. Thesedocumentscontaindetailedsystemandequipmentdescriptionsandareconsideredas proprietaryinformationinoperationoftheequipment.Thepublicdisclosureofthesedocuments mightbeharmfultoourcompanyandwouldgivecompetitorsanunfairadvantageinthemarket. SchematicDiagram BlockDiagram PartsList OperationalDescription Tune-upProcedure Inadditionaltoabovementioneddocuments,inordertocomplywiththemarketingregulations inTitle47CFR§2.803andtheimportationrulesinTitle47CFR§2.1204,whileensuringthat businesssensitiveinformationremainsconfidentialuntiltheactualmarketingofnewly authorizeddevices,werequestShortTermConfidentialityofthefollowingattachment(s); ExternalPhotos TestSetupPhotos InternalPhotos UserManual For45days,pursuanttoPublicNoticeDA04-1705. OR For180dayspursuanttoKDB726920D01. Itisourunderstandingthatallmeasurementtestreports,FCCIDlabelformatand correspondenceduringthecertificationreviewprocesscannotbegrantedasconfidential documentsandthisinformationwillbeavailableforpublicreviewoncethegrantofequipment authorizationisissued. Sincerely, Signature: Name:Ivyxu Title:Manager

ShenzhenThreeNHTechnologyCo.,Ltd. AgentAuthorization Company:ShenzhenThreeNHTechnologyCo.,Ltd. Address: ProductName:PortableSpectrophotometer ModelNumber(s):ST-700dPlus,ST-700d，ST1818，ST1616，ST1212，ST1111， ST2222，ST1010，ST-600d，ST-600dPlus，ST-400d，ST-400dPlus，CM700PLUS， CM3700PLUS，CM3600PLUS，CM2300PLUS，CR100,ST2020，CR-10，CR- 10Plus ， ST10 ProductDescription:PortableSpectrophotometer WeauthorizeMiCOMLabsInc.,575BoulderCourt,Pleasanton,California94566,USA, toactonourbehalfonallmattersconcerningthecertificationofabovenamed equipment. WedeclarethatMiCOMLabsInc.isallowedtoforwardallinformationrelatedtothe approvalandcertificationofequipmenttotheregulatoryagenciesasrequiredandto discussanyissuesconcerningtheapprovalapplication.Anyandallactscarriedoutby MiCOMLabsonourbehalfshallhavethesameeffectasactsofourown. Signature:Date:Dec.14,2022 Name:Ivyxu Title:Manager Company:ShenzhenThreeNHTechnologyCo.,Ltd. A2-513, Building A, Kexing Science Park, No.15 Keyuan Road, Community Science Park, Yuehai Street, Nanshan District, Shenzhen City, Guangdong Provinc,China A2-513, Building A, Kexing Science Park, No.15 Keyuan Road, Community Nanshan District, Shenzhen City, Guangdong Provinc,China Science Park, Yuehai Street,

FCCID:2AMRM-ST-700DPLUS ShenzhenThreeNHTechnologyCo.,Ltd. ModelConfirmationLetter We,ShenzhenThreeNHTechnologyCo.,Ltd. ,certifytheproduct: PortableSpectrophotometer,ModelNo.:ST-700dPlus,ST-700d ， ST1818 ， ST1616 ， ST1212 ， ST1111 ， ST2222 ， ST1010 ， ST-600d ， ST-600dPlus ， ST-400d ， ST-400dPlus ， CM700PLUS ， CM3700PLUS ， CM3600PLUS ， CM2300PLUS ， CR100 ， ST2020 ， CR-10 ， CR-10Plus ， ST10 Theirelectricalcircuitdesign,layout,componentsusedandinternal wiringareidentical,OnlytheModelwillbedifferent,sothename willbedifferent.Testsamplemodel:ST-700dPlus Signiture: GranteeContact: CompanyName:ShenzhenThreeNHTechnologyCo.,Ltd. Date:2022-12-14 Ivy xu

FCCID:2AMRM-ST-700DPLUS

Label:40*30mm

FCCID:2AMRM-ST-700DPLUS ANT

FCCID:2AMRM-ST-700DPLUS RFExposureEvaluation AccordingtoKDB447498D01GeneralRFExposureGuidancev06 ， Unlessspecificallyrequired bythepublishedRFexposureKDBprocedures,standalone1-gheadorbodyand10-gextremity SARevaluationforgeneralpopulationexposureconditions,bymeasurementornumerical simulation,isnotrequiredwhenthecorrespondingSARTestExclusionThresholdcondition(s), listedbelow,is(are)satisfied. For100MHzto6GHzandtestseparationdistances≤50mm,the1-gand10-gSARtest exclusionthresholdsaredeterminedbythefollowing: TheEUTisaportabledevice [(max.powerofchannel,includingtune-uptolerance,mW)/(min.testseparationdistance, mm)]·[√f (GHz) ]≤3.0for1-gSAR,and≤7.5for10-gextremitySAR,where f (GHz) istheRFchanneltransmitfrequencyinGHz PoweranddistanceareroundedtothenearestmWandmmbeforecalculation Theresultisroundedtoonedecimalplaceforcomparison Here, BLE-worstmodeandchannel Frequency (MHz) MaxPower (dBm) Tuneuptolerance (dBm) Maximumtune-up (dBm)(mW) 2402MHz -4.20 -4±1-30.501 Maxtune-upPower (dBm) Max tune-up Power (mW) Frequency (MHz) Min.distance (mm) Calc. thresholds limit -30.501240250.1553.0 Calculated value 0.155< 3.0, So there is no require SAR test

承認書 SPECIFICATION FOR APPROVAL 客戶名稱 CUSTOMER ： 客戶料號 CUSTOMER’S P/N ： 料號 PART NUMBER ： WAN3216F245W36 規格 DESCRIPTION ： Antenna 3216 M-Ant 2.45G Type 36 版本 VERSION ： V2.2 日期 ISSUE DATE ： 2018/01/30 客 戶 承 認 CUSTOMER APPROVED 工 程 部 R&D CENTER 承 認 APPROVAL 確 認 CHECKED 製 作 DRAWN Ray James Thor 萬誠科技股份有限公司 OneWave Electronic Co., Ltd. 112台北市北投區中央南路二段36號3樓 2F., No.163, Sec. 1, Xi'an St., Beitou Dist., Taipei City 112, Taiwan 電話: (02) 2898-2220 TEL: +886 2 2898-2220 傳真: (02) 2898-5055 FAX: +886 2 2898-5055 LUCKY SOUND TECHNOLOGY CO.,LTD ONEWAVE TECHNOLOGY CO., LTD. 2/11 For Bluetooth / WLAN A 3216 antenna pplications Dimension (mm) L 3.23 ± 0.20 W 1.66 ± 0.20 T 1.23 ± 0.20 P/N: WAN3216F245W36 ONEWAVE TECHNOLOGY CO., LTD. 3/11 Part Number Information WAN 3216 F 245 W 36 A B C D E F A Product Series Antenna B Dimension L x W 3.2X1.6mm (+-0.2mm) C Material High K material D Working Frequency 2.4 ~ 2.5GHz E Feeding mode Monopole & Single Feeding F Antenna type Type=36 1. Electrical Specification Remark : Bandwidth & Peak Gain was measured under evaluation board of next page Specification Part Number WAN3216F245W36 Central Frequency 2450 MHz Bandwidth 100 (Min.) MHz Return Loss -6.5 (Max) dB Peak Gain 2.71 dBi Impedance 50 Ohm Operating Temperature -40～+85 °C Maximum Power 4 W Resistance to Soldering Heats 10 ( @ 260°C) sec. Polarization Linear Azimuth Beamwidth Omni-directional Termination Cu / Sn (Leadless) ONEWAVE TECHNOLOGY CO., LTD. 4/11 2. Recommended PCB Pattern 1.Evaluation Board Dimension 2.Evaluation Board Dimension (若淨空區夠大，建議使用此Layout，效能較佳) Unit : mm Suggested Matching Circuit 重要資訊 : 匹配元件建議使用精準度±1%以下的電感、電容、電阻 ONEWAVE TECHNOLOGY CO., LTD. 5/11 1.Layout Dimensions in Clearance area(Size=5.2*5.0mm) 50 ohm transmission Line Matching Circuit 2.Layout Dimensions in Clearance area(Size=8.2*5.0mm) (若淨空區夠大，建議使用此Layout，效能較佳) 50 ohm transmission Line Matching Circuit FootPrint (Unit : mm) ONEWAVE TECHNOLOGY CO., LTD. 6/11 3. Measurement Results Return Loss ONEWAVE TECHNOLOGY CO., LTD. 7/11 Radiation Pattern Efficiency Peak Gain Directivity 2400MHz 55.21 % 1.45 dBi 5.32 dBi 2450MHz 66.45 % 2.71 dBi 5.21 dBi 2500MHz 57.53 % 1.98 dBi 5.29 dBi Chamber Coordinate System Y Z X ONEWAVE TECHNOLOGY CO., LTD. 8/11 4.Reliability and Test Condictions ITEM REQUIREMENTS TEST CONDITION Solderability 1. Wetting shall exceed 90% coverage 2. No visible mechanical damage Pre-heating temperature:150°C/60sec. Solder temperature:230±5°C Duration:4±1sec. Solder:Sn-Ag3.0-Cu0.5 Flux for lead free: rosin Solder heat Resistance 1. No visible mechanical damage 2. Central Freq. change :within ± 6% 10±0.5 sec. 60sec .. TEMP (°C) 150°C 260°C Pre-heating temperature:150°C/60sec. Solder temperature:260±5°C Duration:10±0.5sec. Solder:Sn-Ag3.0-Cu0.5 Flux for lead free: rosin Component Adhesion (Push test) 1. No visible mechanical damage The device should be reflow soldered(230±5°C for 10sec.) to a tinned copper substrate A dynometer force gauge should be applied the side of the component. The device must with-ST-F 0.5 Kg without failure of the termination attached to component. Component Adhesion (Pull test) 1. No visible mechanical damage Insert 10cm wire into the remaining open eye bend ,the ends of even wire lengths upward and wind together. Terminal shall not be remarkably damaged. Thermal shock 1. No visible mechanical damage 2. Central Freq. change :within ±6% Phase Temperature(°C) Time(min) 1 +85±5°C 30±3 2 Room Temperature Within 3sec 3 -40±2°C 30±3 4 Room Temperature Within 3sec +85°C=>30±3min -40°C=>30±3min Test cycle:10 cycles The chip shall be stabilized at normal condition for 2~3 hours before measuring. Resistance to High Temperature 1. No visible mechanical damage 2. Central Freq. change :within ±6% 3. No disconnection or short circuit. Temperature: 85±5°C Duration: 1000±12hrs The chip shall be stabilized at normal condition for 2~3 hours before measuring. Resistance to Low Temperature 1. No visible mechanical damage 2. Central Freq. change :within ±6% 3. No disconnection or short circuit. Temperature:-40±5°C Duration: 1000±12hrs The chip shall be stabilized at normal condition for 2~3 hours before measuring. Humidity 1. No visible mechanical damage 2. Central Freq. change :within ±6% 3. No disconnection or short circuit. Temperature: 40±2°C Humidity: 90% to 95% RH Duration: 1000±12hrs The chip shall be stabilized at normal condition for 2~3 hours before measuring. 4±1 sec. 60sec TEMP (°C) 150°C 230°C ONEWAVE TECHNOLOGY CO., LTD. 9/11 5.Soldering and Mounting Mildly activated rosin fluxes are preferred. The minimum amount of solder can lead to damage from the stresses caused by the difference in coefficients of expansion between solder, chip and substrate. The terminations are suitable for all wave and re-flow soldering systems. If hand soldering cannot be avoided, the preferred technique is the utilization of hot air soldering tools. Recommended temperature profiles for re-flow soldering in Figure 1. Products attachment with a soldering iron is discouraged due to the inherent process control limitations. In the event that a soldering iron must be employed the following precautions are recommended. ‧Preheat circuit and products to 150°C ‧Never contact the ceramic with the iron tip ‧Use a 20 watt soldering iron with tip diameter of 1.0mm ‧280°C tip temperature (max) ‧1.0mm tip diameter (max) ‧Limit soldering time to 3 sec. SOLDERING COOLING NATURAL PRE-HEATING TEMPERATURE(°C) 60~120 s 10s max. 30~60s 250~260 230 180 150 TIME(sec.) Reflow Soldering SOLDERING COOLING NATURAL PRE-HEATING TEMPERATURE(°C) within 3s Gradualcooling 150 TIME(sec.) Iron Soldering Over 60s 350 300 ONEWAVE TECHNOLOGY CO., LTD. 10/11 6.Packaging Information  Tape Specification: W Ao Bo Ko P F E D D1 Po P2 t 8.0 ±0.30 1.80 ±0.05 3.51 ±0.10 1.59 ±0.10 4.00 ±0.05 3.50 ±0.05 1.75 ±0.10 1.50 ±0.10 0.00 ±0.10 4.00 ±0.10 2.00 ±0.05 0.25 ±0.05  Reel Specification: (7’’, Φ180 mm) Tape Width(mm) A(mm) B(mm) C(mm) D(mm) Chip/Reel(pcs) 8 9.0±0.5 60±2 13.5±0.5 1…

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ProjectNo.:ZKT-221207L9141 Page 1 of 43 FCCTESTREPORT FCCID:2AMRM-ST-700DPLUS ReportNumber. .................................. :ZKT-221207L9141 DateofTest...........................................:Nov.16,2022--Dec.13,2022 Dateofissue.........................................:Dec.13,2022 Totalnumberofpages........................:43 TestResult............................................: PASS TestingLaboratory............................: ShenzhenZKTTechnologyCo.,Ltd. Address...............................................: 1/F,No.101,BuildingB,No.6,TangweiCommunityIndustrial Avenue,FuhaiStreet,Bao'anDistrict,Shenzhen,China Applicant'sname.............................: ShenzhenThreeNHTechnologyCo.,Ltd Address...............................................: A2-513,BuildingA,KexingSciencePark,No.15KeyuanRoad,Co mmunitySciencePark,YuehaiStreet,NanshanDistrict,Shenzhen City,GuangdongProvince Manufacturer'sname......................: ShenzhenThreeNHTechnologyCo.,Ltd Address...............................................: A2-513,BuildingA,KexingSciencePark,No.15KeyuanRoad,Co mmunitySciencePark,YuehaiStreet,NanshanDistrict,Shenzhen City,GuangdongProvince Testspecification: Standard................................................:FCCCFRTitle47Part15SubpartCSection15.247 Testprocedure.....................................: ANSIC63.10:2013 Non-standardtestmethod................:N/A TestReportFormNo. ....................... : TRF-EL-110_V0 TestReportForm(s)Originator ..... : ZKTTesting MasterTRF........................................: Dated:2020-01-06 ThisdevicedescribedabovehasbeentestedbyZKT,andthetestresultsshowthattheequipmentunder test(EUT)isincompliancewiththeFCCrequirements.Anditisapplicableonlytothetestedsample identifiedinthereport. Thisreportshallnotbereproducedexceptinfull,withoutthewrittenapprovalofZKT,thisdocumentmay bealteredorrevisedbyZKT,personalonly,andshallbenotedintherevisionofthedocument. Productname ..................................... :PortableSpectrophotometer Trademark...........................................:3nh Model/Typereference.........................: ST-700dPlus，ST-700d，ST1818，ST1616，ST1212，ST1111， ST2222，ST1010，ST-600d，ST-600dPlus，ST-400d，ST-400dPlus， CM700PLUS，CM3700PLUS，CM3600PLUS，CM2300PLUS， CR100，ST2020，CR-10，CR-10Plus，ST10 Ratings..................................................:DC5V/2.5Afromadapter;Battery:DC3.7V ProjectNo.:ZKT-221207L9141 Page 2 of 43 Testingprocedureandtestinglocation: TestingLaboratory.......................................:ShenzhenZKTTechnologyCo.,Ltd. Address ............................................................ :1/F,No.101,BuildingB,No.6,TangweiCommunity IndustrialAvenue,FuhaiStreet,Bao'anDistrict, Shenzhen,China AlenHe Testedby(name+signature).......................: JoeLiu Reviewer(name+signature).......................: LakeXie Approved(name+signature).......................: ProjectNo.:ZKT-221207L9141 Page 3 of 43 TableofContents Page 1.VERSION.....................................................................................................................5 2.SUMMARYOFTESTRESULTS..................................................................................6 2.1TESTFACILITY....................................................................................................................7 2.2MEASUREMENTUNCERTAINTY.......................................................................................7 3.GENERALINFORMATION..........................................................................................8 3.1GENERALDESCRIPTIONOFEUT....................................................................................8 3.2DESCRIPTIONOFTESTMODES......................................................................................9 3.3BLOCKDIGRAMSHOWINGTHECONFIGURATIONOFSYSTEMTESTED.................9 3.4DESCRIPTIONOFSUPPORTUNITS(CONDUCTEDMODE)...........................................9 3.5EQUIPMENTSLISTFORALLTESTITEMS.....................................................................10 4.EMCEMISSIONTEST...............................................................................................11 4.1CONDUCTEDEMISSIONMEASUREMENT....................................................................11 4.1.1POWERLINECONDUCTEDEMISSIONLimits......................................................11 4.1.2TESTPROCEDURE..................................................................................................11 4.1.3DEVIATIONFROMTESTSTANDARD.....................................................................11 4.1.4TESTSETUP.............................................................................................................12 4.1.5EUTOPERATINGCONDITIONS..............................................................................12 4.1.6TESTRESULT...........................................................................................................13 4.1.6TESTRESULT................................................................................................................13 4.2RADIATEDEMISSIONMEASUREMENT.........................................................................15 4.2.1RADIATEDEMISSIONLIMITS.................................................................................15 4.2.2TESTPROCEDURE..................................................................................................15 4.2.3DEVIATIONFROMTESTSTANDARD.....................................................................16 4.2.4TESTSETUP.............................................................................................................16 4.2.5EUTOPERATINGCONDITIONS..............................................................................17 4.2.6TESTRESULTS.........................................................................................................18 5.RADIATEDBANDEMISSIONMEASUREMENT........................................................22 5.1TESTREQUIREMENT:.........................................…

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FCCID:2AMRM-ST-700DPLUS RADIATEDEMISSIONMEASUREMENT（below1G） RADIATEDEMISSIONMEASUREMENT（Above1G） CONDUCTEDEMISSIONMEASUREMENT