
Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.
ShenzhenIntellirocksTech.Co.,Ltd. No.2901-2904,3002,BlockC,Section1,ChuangzhiYunchengBuilding,LiuxianAvenue,Xili CommunityXiliStreet,NanshanDistrict,Shenzhen,Guangdong,China --------------------------------------------------------------------------------------------------------------------- Date:2022-06-06 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 FCCID:2AQA6-H7132 ConfidentialityRequest Towhomitmayconcern, PursuanttoSections0.457and0.459oftheCommission’sRules,weherebyrequestconfidential treatmentoftheinformationaccompanyingthisapplicationasoutlinedbelow: ☒ BlockDiagram ☐ Tune-UpInformation ☒ OperationalDescription ☐ SecurityInformation ☒Schematics☐SoftwareDefinedRadio(SDR)Information ☐ PartsList Theabovematerialscontaintradesecretsandproprietaryinformationnotcustomarilyreleasedto thepublic.Thepublicdisclosureofthesematerialsmaybeharmfultotheapplicantandprovide unjustifiedbenefitstoitscompetitors. TheapplicantunderstandsthatpursuanttoSection0.457oftheRules,disclosureofthis applicationandallaccompanyingdocumentationwillnotbemadebeforethedateoftheGrantfor thisapplication. Sincerely, ShenzhenIntellirocksTech.Co.,Ltd. ------------------------------- (EricPan) (Manager)
ShenzhenIntellirocksTech.Co.,Ltd. No.2901-2904,3002,BlockC,Section1,ChuangzhiYunchengBuilding,Liuxian Avenue,XiliCommunityXiliStreet,NanshanDistrict,Shenzhen,Guangdong,China -------------------------------------------------------------------------------- (FCCID:2AQA6-H7132) POWEROFATTORNEY DATE:2022-06-06 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 ToWhomItMayConcern: We,theundersigned,herebyauthorizeWaltekTestingGroup(Shenzhen)Co.,Ltd. JandySoonourbehalf,toapplytotheFederalCommunicationsCommissiononour equipment.AnyandallactscarriedoutbyWaltekTestingGroup(Shenzhen)Co., Ltd.JandySoonourbehalfshallhavethesameeffectasactsofourown. ThisistoadvisethatweareinfullcompliancewiththeAnti-DrugAbuseAct. We,ShenzhenIntellirocksTech.Co.,Ltd.arenotsubjecttoadenialoffederal benefitspursuanttoSection5301oftheAnti-DrugActof1988,21USC853a,and nopartytotheapplicationissubjecttoadenialoffederalbenefitspursuant tothatsection. Sincerely, ShenzhenIntellirocksTech.Co.,Ltd. ------------------------------- (EricPan) (Manager)
Reference No.: WTX22X05095451W001/002 Page 2 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTX22X05095451W001/002 Page 3 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 3 EUT View 4 Reference No.: WTX22X05095451W001/002 Page 4 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 5 EUT View 6 Reference No.: WTX22X05095451W001/002 Page 5 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 7
Reference No.: WTX22X05095451W001/002 Page 1 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location
Reference No.: WTX22X05095451W001/002 Page 6 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 EUT Housing and Board View 2 Reference No.: WTX22X05095451W001/002 Page 7 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 1 Solder Board-Component View 2 Reference No.: WTX22X05095451W001/002 Page 8 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 3 Solder Board-Component View 4 Reference No.: WTX22X05095451W001/002 Page 9 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 5 Antenna View
1. MAXIMUM PERMISSIBLE EXPOSURE (MPE) 1.1 General Information Client Information Applicant: Shenzhen Intellirocks Tech. Co., Ltd. Address of applicant: No. 2901-2904, 3002, Block C, Section 1, Chuangzhi Yuncheng Building, Liuxian Avenue, Xili Community, Xili Street, Nanshan District, Shenzhen, China Manufacturer: Shenzhen Intellirocks Tech. Co., Ltd. Address of manufacturer: No. 2901-2904, 3002, Block C, Section 1, Chuangzhi Yuncheng Building, Liuxian Avenue, Xili Community, Xili Street, Nanshan District, Shenzhen, China General Description of EUT: Product Name: Govee Smart Heater Trade Name: Govee Model No.: H7132 Adding Model(s): / Rated Voltage: AC120V/60Hz Power Adapter / FCC ID: 2AQA6-H7132 Equipment Type: Fixed device Technical Characteristics of EUT: Wi-Fi Support Standards: 802.11b, 802.11g, 802.11n Frequency Range: 2412-2462MHz for 802.11b/g/n(HT20) RF Output Power: 15.41dBm (Conducted) Type of Modulation: CCK, OFDM, QPSK, BPSK, 16QAM, 64QAM Quantity of Channels: 11 for 802.11b/g/n(HT20) Channel Separation: 5MHz Type of Antenna: FPC Antenna Antenna Gain: 3dBi Bluetooth Bluetooth Version: V4.2 (BLE mode) Frequency Range: 2402-2480MHz RF Output Power: 2.781dBm (Conducted) Data Rate: 1Mbps Modulation: GFSK Quantity of Channels: 40 Channel Separation: 2MHz Type of Antenna: FPC Antenna Antenna Gain: 3dBi 1.2 Standard Applicable According to §1.1307(b)(1) and KDB 447498 D01 General RF Exposure Guidance v06, system operating under the provisions of this section shall be operating in a manner that the public is not exposed to radio frequency energy level in excess limit for maximum permissible exposure. (a) Limits for Occupational / Controlled Exposure Frequency range (MHz) Electric Field Strength (E) (V/m) Magnetic Field Strength (H) (A/m) Power Density (S) (mW/cm 2 ) Averaging Times | E | 2 , | H | 2 or S (minutes) 0.3-3.0 614 1.63 (100)* 6 3.0-30 1842/f 4.89/f (900/f)* 6 30-300 61.4 0.163 1.0 6 300-1500 / / F/300 6 1500-100000 / / 5 6 (b) Limits for General Population / Uncontrolled Exposure Frequency range (MHz) Electric Field Strength (E) (V/m) Magnetic Field Strength (H) (A/m) Power Density (S) (mW/cm 2 ) Averaging Times | E | 2 , | H | 2 or S (minutes) 0.3-1.34 614 1.63 (100)* 30 1.34-30 824/f 2.19/f (180/f)* 30 30-300 27.5 0.073 0.2 30 300-1500 / / F/1500 30 1500-100000 / / 1 30 Note: f = frequency in MHz: * = Plane-wave equivalents power density 1.3 MPE Calculation Method S = (30*P*G) / (377*R 2 ) S = power density (in appropriate units, e.g., mw/cm 2 ) P = power input to the antenna (in appropriate units, e.g., mw) G = power gain of the antenna in the direction of interest relative to an isotropic radiator, the power gain factor is normally numeric gain. R = distance to the center of radiation of the antenna (in appropriate units, e.g., cm) 1.4 MPE Calculation Result For Wi-Fi Maximum Tune-Up output power: 15.5(dBm) Maximum peak output power at antenna input terminal: 35.48(mW) Prediction distance: >20(cm) Prediction frequency: 2412 (MHz) Antenna gain: 3 (dBi) Directional gain (numeric gain): 2.00 The worst case is power density at prediction frequency at 20cm: 0.0141(mw/cm 2 ) MPE limit for general population exposure at prediction frequency: 1 (mw/cm 2 ) For Bluetooth Maximum Tune-Up output power: 3(dBm) Maximum peak output power at antenna input terminal: 2.00(mW) Prediction distance: >20(cm) Prediction frequency: 2402(MHz) Antenna gain: 3 (dBi) Directional gain (numeric gain): 2.00 The worst case is power density at prediction frequency at 20cm: 0.0008(mw/cm 2 ) MPE limit for general population exposure at prediction frequency: 1 (mw/cm 2 ) WIFI and BT is the use the same antenna cannot simultaneous transmission. Result: Pass
Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 37 TEST REPORT Reference No. ....................: WTX22X05095451W002 FCC ID ............................... .: 2AQA6-H7132 Applicant .......................... .: Shenzhen Intellirocks Tech. Co., Ltd. Address ............................ .: No. 2901-2904, 3002, Block C, Section 1, Chuangzhi Yuncheng Building, Liuxian Avenue, Xili Community, Xili Street, Nanshan District, Shenzhen, China Manufacturer .................... .: The same as Applicant Address ............................ .: The same as Applicant Product Name .................. .: Govee Smart Heater Model No.. ......................... .: H7132 Standards ......................... .: FCC Part 15.247 Date of Receipt sample ... .: 2022-05-16 Date of Test....................... .: 2022-05-16 to 2022-05-30 Date of Issue .................... .: 2022-05-30 Test Report Form No. ...... . : WTX_Part 15_247W Test Result ........................ .: Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Mike Shi Silin Chen Reference No.: WTX22X05095451W002 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 37 TABLE OF CONTENTS 1. GENERAL INFORMATION ................................................................................................................................... 4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ............................................................................... 4 1.2 TEST STANDARDS ................................................................................................................................................... 5 1.3 TEST METHODOLOGY ............................................................................................................................................. 5 1.4 TEST FACILITY ....................................................................................................................................................... 5 1.5 EUT SETUP AND TEST MODE ................................................................................................................................. 6 1.6 MEASUREMENT UNCERTAINTY .............................................................................................................................. 7 1.7 TEST EQUIPMENT LIST AND DETAILS ..................................................................................................................... 8 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 10 3. ANTENNA REQUIREMENT ................................................................................................................................ 11 3.1 STANDARD APPLICABLE ....................................................................................................................................... 11 3.2 EVALUATION INFORMATION ................................................................................................................................ 11 4. POWER SPECTRAL DENSITY ........................................................................................................................... 12 4.1 STANDARD APPLICABLE ....................................................................................................................................... 12 4.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 1 2 4.3 TEST PROCEDURE ................................................................................................................................................. 12 4.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 12 5. DTS BANDWIDTH ................................................................................................................................................. 13 5.1 STANDARD APPLICABLE ....................................................................................................................................... 13 5.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 1 3 5.3 TEST PROCEDURE ................................................................................................................................................. 13 5.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 13 6. RF OUTPUT POWER ............................................................................................................................................ 14 6.1 STANDARD APPLICABLE ....................................................................................................................................... 14 6.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 1 4 6.3 TEST PROCEDURE ................................................................................................................................................. 14 6.4 SUMMARY OF TEST RESULTS/PLOTS .........................................................................................…
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Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 55 TEST REPORT Reference No. ....................: WTX22X05095451W001 FCC ID ............................... .: 2AQA6-H7132 Applicant .......................... .: Shenzhen Intellirocks Tech. Co., Ltd. Address ............................ .: No. 2901-2904, 3002, Block C, Section 1, Chuangzhi Yuncheng Building, Liuxian Avenue, Xili Community, Xili Street, Nanshan District, Shenzhen, China Manufacturer .................... .: The same as Applicant Address ............................ .: The same as Applicant Product Name .................. .: Govee Smart Heater Model No... ........................ .: H7132 Standards ......................... .: FCC Part 15.247 Date of Receipt sample ... .: 2022-05-16 Date of Test....................... .: 2022-05-16 to 2022-05-30 Date of Issue .................... .: 2022-05-30 Test Report Form No. ...... . : WTX_Part 15_247W Test Result ........................ .: Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Mike Shi Silin Chen Reference No.: WTX22X05095451W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 55 TABLE OF CONTENTS 1. GENERAL INFORMATION ................................................................................................................................... 4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ............................................................................... 4 1.2 TEST STANDARDS ................................................................................................................................................... 5 1.3 TEST METHODOLOGY ............................................................................................................................................. 5 1.4 TEST FACILITY ....................................................................................................................................................... 5 1.5 EUT SETUP AND TEST MODE ................................................................................................................................. 6 1.6 MEASUREMENT UNCERTAINTY .............................................................................................................................. 7 1.7 TEST EQUIPMENT LIST AND DETAILS ..................................................................................................................... 8 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 10 3. ANTENNA REQUIREMENT ................................................................................................................................ 11 3.1 STANDARD APPLICABLE ....................................................................................................................................... 11 3.2 EVALUATION INFORMATION ................................................................................................................................ 11 4. POWER SPECTRAL DENSITY ........................................................................................................................... 12 4.1 STANDARD APPLICABLE ....................................................................................................................................... 12 4.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 1 2 4.3 TEST PROCEDURE ................................................................................................................................................. 12 4.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 12 5. DTS BANDWIDTH ................................................................................................................................................. 13 5.1 STANDARD APPLICABLE ....................................................................................................................................... 13 5.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 1 3 5.3 TEST PROCEDURE ................................................................................................................................................. 13 5.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 13 6. RF OUTPUT POWER ............................................................................................................................................ 14 6.1 STANDARD APPLICABLE ....................................................................................................................................... 14 6.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 1 4 6.3 TEST PROCEDURE ................................................................................................................................................. 14 6.4 SUMMARY OF TEST RESULTS/PLOTS .........................................................................................…
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Reference No.: WTX22X05095451W001/002 Page 10 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Conducted Emission Test Setup Radiation Emission Test Setup (Below 30MHz) Reference No.: WTX22X05095451W001/002 Page 11 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (30MHz to 1GHz) Radiation Emission Test Setup (1GHz to 18GHz) Reference No.: WTX22X05095451W001/002 Page 12 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (Above 18GHz) ***** END OF REPORT *****
| # | Rule Parts | Frequency Range | Power Output |
|---|---|---|---|
| 2 | 15C | 2.40 GHz - 2.48 GHz | 1.90 mW |
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