2AQRM-F117Feature Phone

The ANSI C63.19-2019 standard used to determine the hearing aid compatibility of the handset models air interfaces and frequency bands. The air interfaces or frequency bands on the handset that are not certified to be hearing aid-compatible, if applicable, or have been determined to be hearing aid- compatible under special testing circumstances. This phone has been tested and certified for use with hearing aids for some of the wireless technologies that it uses. However, there may be some newer wireless technologies used in this phone that have not been tested yet for use with hearing aids. It is important to try the different features of this phone thoroughly and in different locations, using your hearing aid or cochlear implant, to determine if you hear any interfering noise. Consult your service provider or the manufacturer of this phone for information on hearing aid compatibility. If you have questions about return or exchange policies, consult your service provider or phone retailer. ANSI C63.19-2019 standard does not use the rating system that older versions of the standard used. An explanation of special testing circumstances, if a handset model has air interfaces that have been certified as hearing aid -compatible under such circumstances, and how these circumstances affect the use and operation of the handset. The codec and air interface combination which pass testing or not testing for conversational gain, distortion/ noise, and frequency response.

FCCID:2AQRM-F117ReportNumber:BTF260521R00201 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page1of4 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 AppendixIIIInternalPhotos FCCID:2AQRM-F117ReportNumber:BTF260521R00201 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page2of4 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 FCCID:2AQRM-F117ReportNumber:BTF260521R00201 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page3of4 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 FCCID:2AQRM-F117ReportNumber:BTF260521R00201 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page4of4 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00

FCCID:2AQRM-F117ReportNumber:BTF260521R00201 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page1of2 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 AppendixITestSetupPhotos ConductedEmissionatACpowerline Emissionsinfrequencybands(below1GHz) Emissionsinfrequencybands(above1GHz) FCCID:2AQRM-F117ReportNumber:BTF260521R00201 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page2of2 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00

FCCID:2AQRM-F117ReportNumber:BTF260521R00301 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page1of2 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 ANNEXDSARTestSetupPhotos ReferencePhotos LeftHead-CheekLeftHead-Tilt RightHead-CheekRightHead-Tilt Front(dist.10mm)Back(dist.10mm) FCCID:2AQRM-F117ReportNumber:BTF260521R00301 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page2of2 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-755-23146130http://www.btf-lab.comVersion:1/00 Left(dist.10mm)Right(dist.10mm) Top(dist.10mm)Bottom(dist.10mm)

TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page1of97 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-0755-23146130http://www.btf-lab.comVersion:1/00 RFTestReport For Applicantname:FOXXDevelopmentInc. Address:3480PrestonRidgeRoad,Suite500,Alpharetta,GA30005,USA EUTname:FeaturePhone Brandname:FOXXD,FOXX,MIRO Modelnumber:F117 Seriesmodelnumber:N/A FCCID:2AQRM-F117 IssuedBy Companyname:BTFTestingLab(Shenzhen)Co.,Ltd. Address: Plant101,201and301,Building1,Block2,TantouIndustrialPark, TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Reportnumber:BTF260521R00202 Teststandards:47CFRPart15.247 Testconclusion:Pass Dateofsamplereceipt:2026-05-21 Testdate: 2026-05-22to2026-06-23 Dateofissue:2026-06-24 Preparedby:Approvedby: ChrisLiu/Project engineer Ryan.CJ/EMCManager Note:Allthetestresultsinthisreportonlyrelatedtothetestingsamples.Whichcanbeduplicatedcompletelyforthelegalusewithapprovalof applicant;itshallnotbereproducedexceptinfullwithoutthewrittenapprovalofBTFTestingLab(Shenzhen)Co.,Ltd.,Alltheobjectionsshouldbe raisedwithinthirtydaysfromthedateofissue.Tovalidatethereport,youcancontactus. ReportNumber:BTF260521R00202 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page2of97 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-0755-23146130http://www.btf-lab.comVersion:1/00 RevisionHistory VersionIssueDateRevisionsContent R_V02026-06-24Original Note: Oncetherevisionhasbeenmade,thenpreviousversionsreportsareinvalid. ReportNumber:BTF260521R00202 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page3of97 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen, Guangdong,China Email:[email protected]:+86-0755-23146130http://www.btf-lab.comVersion:1/00 TableofContents 1Introduction.........................................................................................................................................................4 1.1LaboratoryLocation....................................................................................................................................4 1.2LaboratoryFacility......................................................................................................................................4 1.3Announcement............................................................................................................................................4 2ProductInformation............................................................................................................................................5 2.1ApplicationInformation...............................................................................................................................5 2.2ManufacturerInformation...........................................................................................................................5 2.3FactoryInformation.....................................................................................................................................5 2.4GeneralDescriptionofEquipmentunderTest(EUT).................................................................................5 2.5TechnicalInformation..................................................................................................................................6 3SummaryofTestResults...................................................................................................................................7 3.1TestStandards............................................................................................................................................7 3.2UncertaintyofTest......................................................................................................................................7 3.3SummaryofTestResult..............................................................................................................................7 3.4Additionsto,deviations,orexclusionsfromthemethod............................................................................7 4TestConfiguration..............................................................................................................................................8 4.1TestEquipmentList....................................................................................................................................8 4.2TestAuxiliaryEquipment............................................................................................................................9 4.3TestModes..................................................................................................................................................9 4.4TestChannelofEUT...................................................................................................................................9 4.5Testsoftware.............................................................................................................................................10 5EvaluationResults(Evaluation)......................................................................................................................11 5.1Antennarequirement.................................................................................................................................11 5.1.1Conclusion....................................................................................................................................11 6RadioSpectrumMatterTestResults(RF)............................................................................................…

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ShenZhenQiXinTongDaTechnologyCo.,Ltd. Antenna Specifications ClientName:HUAYUE ProjectName：T1818MG FrequencyBand:FDDB2/4/5/12/17/66/71 RF：LIHAILONG（13760255827） 2026-05-15 Manufacturer: ShenZhen QiXinTongDa Technology Co., Ltd. Address:Room 503, Building 211, Taian 9th Road, Taian Industrial Zone, Chegongmiao, Futian District, Shenzhen City 1.TestProject TestProjectEquipment 1.SParameter1.ReturnLoss(RL) 2.VSWR NetworkAnalyzer： Agilent5071B 2.RFTest （2G+3G+4G+5G） 1.power 2.level 3.TRP/TIS ComprehensiveTest： CMW500/8960 TestEnvironment： AnechoicChamber 2.TestEquipment Agilent5071B（SParameter（RL/VSWR）TestEquipment） Agilent8960（2G/3GTestEquipment） CMW500（2G/3G/4GTestEquipment） 3.TestEnvironment AnechoicChamber 4.TestSteps PassiveVSWR/RLTestSteps: 50ΩCoaxialCable 100mmLength CopperPipe 5071BNetwork Analyzer TestFixture ActiveTRP/TISTestSteps： OpenComputerOTA TestSoftware OpenTurntable SwitchAndResetTo zero Open8960/CMW500 TestEquipment TestmobilephoneinserttestSIM cardandPutintothemicrowave darkroomtoconnect OTASoftwareautomatic testing OutputData 5.AntennaDimensions FPC ANTENNA Unit:mm 6．AntennaGain FrequencyBandGain（dBi） FDDB2（1850-1990MHz）0.21 FDDB4（1710-2155MHz）0.16 FDDB5（824-894MHz）-2.65 FDDB12（699-746MHz）-2.88 FDDB17（704-746MHz）-2.88 FDDB66（1700-2200MHz）0.18 FDDB71（638-698MHz）-2.88 Bluetooth0.15 WIFI-2.4G0.15 GPS 0.06 7．3DLobeDiagram FDD-B2 FDD-B4 FDD-B5 FDD-B12 FDD-B17 FDD-B66 FDD-B71 WIFI/BT-2.4G GPS-L1 9.IntroductiontoAntennaInformation T1818MG Antennatypeandfrequencyba nd MAINANTENNA(PIFA):2G/3G/4G DIVANTENNA(PIFA):2G/3G/4G GPS/WIFI/BTANTENNA(PIFA):L1/2.4GWIFI/BT AntennamateriaFPC

TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page 1 of 87 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen,Guangdong,China SARTestReport For ApplicantName: FOXXDevelopmentInc. Address: 3480PrestonRidgeRoad,Suite500,Alpharetta,GA30005,USA EUTName: FeaturePhone BrandName:FOXXD,FOXX,MIRO ModelNumber: F117 IssuedBy CompanyName: BTFTestingLab(Shenzhen)Co.,Ltd. Address: Plant101,201and301,Building1,Block2,TantouIndustrial Park,TantouCommunity,SonggangStreet,Bao'anDistrict, Shenzhen,Guangdong,China ReportNumber: BTF260521R00301 TestStandards: FCC47CFR§2.1093IEEEStd.1528-2013 IEEEC95.1-2019 FCCID: 2AQRM-F117 TestConclusion: Pass TestDate: 2026-06-15to2026-06-30 DateofIssue: 2026-07-01 TestedBy: EllaKu/Tester Date: 2026-07-01 PreparedBy: AmendaZhong/ProjectEngineer Date: 2026-07-01 ApprovedBy: Ryan.CJ/EMCManager Date: 2026-07-01 Note:Allthetestresultsinthisreportonlyrelatedtothetestingsamples.Whichcanbeduplicatedcompletelyforthelegalusewithapprovalof applicant;itshallnotbereproducedexceptinfullwithoutthewrittenapprovalofBTFTestingLab(Shenzhen)Co.,Ltd.,Alltheobjectionsshouldbe raisedwithinthirtydaysfromthedateofissue.Tovalidatethereport,youcancontactus. TestReportNumber:BTF260521R00301 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page 2 of 87 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen,Guangdong,China RevisionHistory VersionIssueDateRevisionsContent R_V02026-07-01Original Note:Oncetherevisionhasbeenmade,thenpreviousversionsreportsareinvalid. TestReportNumber:BTF260521R00301 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page 3 of 87 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen,Guangdong,China TableofContents 1.Introduction...............................................................................................................................................................................4 1.1IdentificationofTestingLaboratory.................................................................................................................................4 1.2IdentificationoftheResponsibleTestingLocation..........................................................................................................4 1.3LaboratoryCondition.......................................................................................................................................................4 1.4Announcement................................................................................................................................................................4 2.ProductInformation..................................................................................................................................................................5 2.1ApplicationInformation....................................................................................................................................................5 2.2ManufacturerInformation................................................................................................................................................5 2.3FactoryInformation.........................................................................................................................................................5 2.4GeneralDescriptionofEquipmentunderTest(EUT).....................................................................................................5 2.5EquipmentunderTestAncillaryEquipment....................................................................................................................5 2.6TechnicalInformation......................................................................................................................................................5 3.SummaryofTestResults.........................................................................................................................................................7 3.1TestStandards................................................................................................................................................................7 3.2DeviceCategoryandSARLimit......................................................................................................................................7 3.3TestResultSummary......................................................................................................................................................8 3.4TestUncertainty..............................................................................................................................................................9 4.MeasurementSystem.............................................................................................................................................................11 4.1SpecificAbsorptionRate(SAR)Definition....................................................................................................................11 4.2MVGSARSystem.........................................................................................................................................................11 5.SystemVerification.................................................................................................................................................................16 5.1PurposeofSystemCheck.............................................................................................................................................16 5.2SystemCheckSetup.....................................................................................................................................................16 6.TESTPO…

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TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page 1 of 7 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen,Guangdong,China SAR DipolePerformanceMeasurementReport CompanyName:BTFTestingLab(Shenzhen)Co.,Ltd. Address: Plant101,201and301,Building1,Block2,Tantou IndustrialPark,TantouCommunity,SonggangStreet, Bao'anDistrict,Shenzhen,Guangdong,China TestSystemName:SATIMO TestSystemVersion:OpenSARV5.3.15.8 Probe:0125-EPGO-445 Date(s)ofperformanceof tests: 2026-04-23 DateofIssue:2026-04-24 TestedBy: BirchZhang/Tester Date:2026-04-24 ReviewedBy: AmendaZhong/ProjectEngineer Date:2026-04-24 ApprovedBy: Ryan.CJ/EMCManager Date:2026-04-24 TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page 2 of 7 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen,Guangdong,China TestEquipmentList DescriptionManufacturerModelSerialNo./VersionCal.DateCal.Due ENASeriesNetworkAnalyzerAgilentE5071BMY423012212025/10/172026/10/16 MechanicalCalibrationKitPNAN/AN/A2025/10/212026/10/20 450MHzValidationDipoleMVGSID45007/22DIP0G450-6542025/05/262028/05/25 750MHzValidationDipoleMVGSID75007/22DIP0G750-6552025/05/262028/05/25 835MHzValidationDipoleMVGSID83507/22DIP0G835-6562025/05/262028/05/25 1800MHzValidationDipoleMVGSID180007/22DIP1G800-6572025/05/262028/05/25 1900MHzValidationDipoleMVGSID190007/22DIP1G900-6582025/05/262028/05/25 2000MHzValidationDipoleMVGSID200007/22DIP2G000-6592025/05/262028/05/25 2100MHzValidationDipoleMVGSID210007/22DIP2G100-6602025/05/262028/05/25 2300MHzValidationDipoleMVGSID230007/22DIP2G300-6612025/05/262028/05/25 2450MHzValidationDipoleMVGSID245007/22DIP2G450-6622025/05/262028/05/25 2600MHzValidationDipoleMVGSID260007/22DIP2G600-6632025/05/262028/05/25 3500MHzValidationDipoleMVGSID350007/22DIP3G500-6642025/05/262028/05/25 3700MHzValidationDipoleMVGSID370007/22DIP3G700-6652025/05/262028/05/25 3900MHzValidationDipoleMVGSID390007/22DIP3G900-6662025/05/262028/05/25 4200MHzValidationDipoleMVGSID420007/22DIP4G200-6672025/05/262028/05/25 4600MHzValidationDipoleMVGSID460007/22DIP4G600-6682025/05/262028/05/25 4900MHzValidationDipoleMVGSID490007/22DIP4G900-6692025/05/262028/05/25 5200MHz-5800MHzValidationDipoleMVGSID500007/22DIP5G000-6702025/05/262028/05/25 Note:Fordipoleantennas,BTFhasadopted3yearsascalibrationintervals,andonannualbasis,everymeasurementdipolehasbeenevaluatedandisincompliancewith thefollowingcriteria: 1.Thereisnophysicaldamageonthedipole; 2.Systemvalidationwithspecificdipoleiswithin10%ofcalibratedvalue; 3.Return-lossinwithin20%ofcalibratedmeasurement. 4.Impedance(realorimaginaryparts)inwithin5Ohmsofcalibratedmeasurement. TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page 3 of 7 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen,Guangdong,China SARDipolePerformanceMeasurement JustificationforExtendedSARDipoleCalibrations ReferringtoKDB865664D01V01r04,ifdipolesareverifiedinreturnloss(<-20dB,within20%ofpriorcalibration)andin impedance(within5ohmofpriorcalibration).theannualcalibrationisnotnecessaryandthecalibrationintervalcanbe extended.Whilecalibrationintervalsnotexceed3years. Frequency (MHz) Returnloss(dB)Impedance(Ω)errorrange（%）Results Dateof Measurement measurementtarget measurementtarget Return loss(±20%) Impedance(±5Ω)(P/F) realpart imaginary part realpart imaginary part CW450-26.38-26.4348.13-4.348.8-4.50.19%0.5P 23/4/2025 CW750-24.49-27.9255.18-3.653.6+1.4-12.29%3.4P 23/4/2025 CW835-29.67-30.9752.82-1.950.7-2.7-4.20%-3.0P 23/4/2025 CW1800-23.23-26.9149.976.950.8+4.3-13.7%-1.8P 23/4/2025 CW1900-25.61-27.0452.18-4.950.8-4.3-5.29%-0.8P 23/4/2025 CW2000-30.72-28.2147.30-0.847.9+2.98.90%4.3P 23/4/2025 CW2100-25.48-25.9148.665.148.1+4.5-1.66%-1.2P 23/4/2025 CW2300-27.60-25.2353.62-2.449.3+5.39.39%3.4P 23/4/2025 CW2450-20.41-22.2846.168.449.2+7.4-8.39%2.0P 23/4/2025 CW2600-26.6-28.7053.23.650.0+3.7-9.41%-3.1P 23/4/2025 CW3500-23.97-24.3556.36-2.256.3+1.1-1.56%3.2P 23/4/2025 CW3700-35.99-31.4051.430.747.4+0.714.62%-4.0P 23/4/2025 CW3900-26.48-26.5251.554.653.8+2.80.15%0.5P 23/4/2025 CW4200-25.62-24.7255.50.1452.4+5.33.64%2.0P 23/4/2025 CW4600-22.47-26.6945.215.445.9+1.6-15.8%-3.1P 23/4/2025 CW4900-31.19-29.5548.652.447.31.65.55%-2.2P 23/4/2025 CW5200-20.31-20.1058.2-6.549.9+2.41.04%0.6P 23/4/2025 CW5400-31.53-32.1950.022.6550.4+1.5-2.05%-0.8P 23/4/2025 CW5600-26.93-25.1948.4-0.348.4+1.86.91%-4.2P 23/4/2025 CW5800-29.28-27.1751.3-3.251.1-1.57.77%-4.9P 23/4/2025 Thereturnlossis<-20dB,within20%ofpriorcalibration;theimpedanceiswithin5ohmofpriorcalibration.Thereforetheverification resultshouldsupportextendedcalibration. TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page 4 of 7 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen,Guangdong,China datacomparison Self-examinationdata 450MHzDipole750MHzDipole 835MHzDipole1800MHzDipole 1900MHzDipole2000MHzDipole TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page 5 of 7 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen,Guangdong,China 2100MHzDipole2300MHzDipole 2450MHzDipole2600MHzDipole 3500MHzDipole3700MHzDipole TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallowed.Page 6 of 7 BTFTestingLab(Shenzhen)Co.,Ltd. Plant101,201and301,Building1,Block2,TantouIndustrialPark,TantouCommunity,SonggangStreet,Bao'anDistrict,Shenzhen,Guangdong,China 3900MHzDipole4200MHzDipole 4600MHzDipole4900MHzDipole 5000MHzDipole TotalorpartialreproductionofthisdocumentwithoutpermissionoftheLaboratoryisnotallow…

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Page: 1/10 Ref : ACR.78.3.26.PAR.A BTF TESTING LAB (SHENZHEN) CO., LTD. F101,201 AND 301, BUILDING 1, BLOCK 2, TANTOU INDUSTRIAL PARK, TANTOU COMMUNITY SONGGANG STREET, BAO'AN DISTRICT, SHENZHEN, CHINA MVG COMOSAR DOSIMETRIC E-FIELD PROBE SERIAL NO.: 0125-EPGO-445 Calibrated at MVG 13 Rue du Zephyr 91140 Villejust - FRANCE Calibration date: 03/03/2026 Scope available on :https://a2la.org/ Summary: This document presents the method and results from an accredited COMOSAR Dosimetric E-Field Probe calibration performed at MVG, using the CALIPROBE test bench, for use with a MVG COMOSAR system only. The test results covered by accreditation are traceable to the International System of Units (SI). COMOSAR E-Field Probe Calibration Report Docusign Envelope ID: B9F2DB03-1600-44DE-BB82-C27B1DB45E57 COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.78.3.26.PAR.A Page: 2/10 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vN This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. Name Function Date Signature Prepared by : Pedro Ruiz Technical Manager 3/18/2026 Checked & approved by: Pedro Ruiz Technical Manager 3/18/2026 Authorized by: Christophe Barrot Quality Manager Customer Name Distribution : BTF Testing Lab (Shenzhen) Co., Ltd. Issue Name Date Modifications A Pedro Ruiz 3/18/2026 Initial release Docusign Envelope ID: B9F2DB03-1600-44DE-BB82-C27B1DB45E57 2026 March 19 COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.78.3.26.PAR.A Page: 3/10 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vN This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. TABLE OF CONTENTS 1 Device Under Test ..................................................................................................... 4 2 Product Description ................................................................................................... 4 2.1 General Information _______________________________________________________ 4 3 Measurement Method ................................................................................................ 4 3.1 Sensitivity _______________________________________________________________ 4 3.2 Linearity ________________________________________________________________ 4 3.3 Isotropy _________________________________________________________________ 5 3.4 Boundary Effect __________________________________________________________ 5 3.5 Probe Modulation Response _________________________________________________ 5 4 Measurement Uncertainty .......................................................................................... 6 5 Calibration Results ..................................................................................................... 6 5.1 Calibration in air __________________________________________________________ 6 5.2 Calibration in liquid _______________________________________________________ 7 6 Verification Results ................................................................................................... 8 7 List of Equipment ...................................................................................................... 9 Docusign Envelope ID: B9F2DB03-1600-44DE-BB82-C27B1DB45E57 COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.78.3.26.PAR.A Page: 4/10 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vN This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 1 DEVICE UNDER TEST Device Under Test Device Type COMOSAR DOSIMETRIC E FIELD PROBE Manufacturer MVG Model SSE2 Serial Number 0125-EPGO-445 Product Condition (new / used) Used Frequency Range of Probe 0.15 GHz-7.5GHz Resistance of Three Dipoles at Connector Dipole 1: R1=0.206 M Dipole 2: R2=0.207 M Dipole 3: R3=0.226 M 2 PRODUCT DESCRIPTION 2.1 GENERAL INFORMATION MVG’s COMOSAR E field Probes are built in accordance to the IEC/IEEE 62209-1528 and FCC KDB865664 D01 standards. Figure 1 – MVG COMOSAR Dosimetric E field Probe Probe Length 330 mm Length of Individual Dipoles 2 mm Maximum external diameter 8 mm Probe Tip External Diameter 2.5 mm Distance between dipoles / probe extremity 1 mm 3 MEASUREMENT METHOD The IEC/IEEE 62209-1528 and FCC KDB865664 D01 standards provide recommended practices for the probe calibrations, including the performance characteristics of interest and methods by which to assess their effect. All calibrations / measurements performed meet the fore-mentioned standards. 3.1 SENSITIVITY The sensitivity factors of the three dipoles were determined using a two step calibration method (air and tissue simulating liquid) using waveguides as outlined in the standards for frequency range 600- 7500MHz and using the calorimeter cell method (transfer method) as outlined in the standards for frequency 150-450 MHz. 3.2 LINEARITY The evaluation of the linearity was done in free space using the waveguide, performing a power sweep to cover the SAR range 0.01W/kg to 100W/kg. Docusign Envelope ID: B9F2DB03-1600-44DE-B…

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