2ASJ3-AVIRONPLAYWireless Air Conduction Headphones

Aviron Interactive. 2.911 (d)(5)(i) Equipment Type Attestation v1.2 Section 2.911(d)(5)(i) Certification – EquipmentType Company name: Aviron Interactive. Address: 265 Bartley Drive. North York, M4A2N7, Canada Product Name: Wireless Air Conduction Headphones FCCID: 2ASJ3-AVIRONPLAY Model(s): AVIRON PLAY 2.911(d)(5)(i) EquipmentType We, [Aviron Interactive.] (“the applicant”) certify that the equipment for which authorization is sought through certification is not:  Prohibited from receiving an equipment authorization pursuant to § 2.903; of the FCC rules.  Identified as an equipment type in the “Covered List” NOTE 1 Yours sincerely, Name: Andy Hoang Date: Jun. 12, 2024 Title: CEO Company name: Aviron Interactive. Signature: NOTE 1 “Covered List ”; is the List of Equipment and Services Covered By Section 2 of The Secure Networks Act, available at https://www.fcc.gov/supplychain/coveredlist References; 1) 986446 D01 Covered Equipment v01 https://apps.fcc.gov/oetcf/kdb/forms/FTSSearchResultPage.cfm?switch=P&id=325672 2) Federal Register document 2022-28263 published on 02/06/23 https://www.federalregister.gov/documents/2023/02/06/2022-28263/protecting-against-national-security-threats-to-the-com munications-supply-chain-through-the

Aviron Interactive. 2.911 (d)(5)(ii) Applicant Attestation v1.3 Section 2.911(d)(5)(ii) Certification – Applicant (Covered List ) Company name: Aviron Interactive. Address: 265 Bartley Drive. North York, M4A2N7, Canada Product Name: Wireless Air Conduction Headphones FCCID: 2ASJ3-AVIRONPLAY Model(s): AVIRON PLAY 2.911(d)(5)(ii) Applicant filing We, [Aviron Interactive.] (“the applicant”) certify that, as of the date of the filing of the application, the applicant is not identified NOTE 1 on the “Covered List” NOTE 2 , established pursuant to §1.50002 of this chapter, as an entity producing covered communications equipment. Yours sincerely, Name: Andy Hoang Date: Jun. 12, 2024 Title: CEO Company name: Aviron Interactive. Signature: NOTE 1 Delete option not applicable to this application. NOTE 2 “Covered List ”; is the List of Equipment and Services Covered By Section 2 of The Secure Networks Act, available at https://www.fcc.gov/supplychain/coveredlist References; 1) 986446 D01 Covered Equipment v01 https://apps.fcc.gov/oetcf/kdb/forms/FTSSearchResultPage.cfm?switch=P&id=325672 2) Federal Register document 2022-28263 published on 02/06/23 https://www.federalregister.gov/documents/2023/02/06/2022-28263/protecting-against-national-security-threats-to-the-com munications-supply-chain-through-the

Aviron Interactive. Agent Authorization Company: Aviron Interactive. Address: 265 Bartley Drive. North York, M4A2N7, Canada Product Name: Wireless Air Conduction Headphones Model Number(s): AVIRON PLAY Product Description: Wireless Air Conduction Headphones We authorize MiCOM Labs Inc., 575 Boulder Court, Pleasanton, California 94566, USA, to act on our behalf on all matters concerning the certification of above named equipment. We declare that MiCOM Labs Inc. is allowed to forward all information related to the approval and certification of equipment to the regulatory agencies as required and to discuss any issues concerning the approval application. Any and all acts carried out by MiCOM Labs on our behalf shall have the same effect as acts of our own. Signature: Date: Jun. 12, 2024 Name: Andy Hoang Title: CEO Company: Aviron Interactive.

Aviron Interactive. Office of Engineering Technology Federal Communications Commission 7435 Oakland Mills Road Columbia, MD 21046 USA Date: Jun. 12, 2024 Subject; Request for Confidentiality FCC ID: 2ASJ3-AVIRONPLAY To Whom It May Concern, Pursuant to the provisions of the Commission’s rules Title 47 Sections §0.457 and §0.459, we are requesting the Commission to withhold the following attachment(s) as confidential documents from public disclosure indefinitely. These documents contain detailed system and equipment descriptions and are considered as proprietary information in operation of the equipment. The public disclosure of these documents might be harmful to our company and would give competitors an unfair advantage in the market. Schematic Diagram Block Diagram Parts List Operational Description Tune-up Procedure In additional to above mentioned documents, in order to comply with the marketing regulations in Title 47 CFR §2.803 and the importation rules in Title 47 CFR §2.1204, while ensuring that business sensitive information remains confidential until the actual marketing of newly authorized devices, we request Short Term Confidentiality of the following attachment(s); External Photos Test Setup Photos Internal Photos User Manual For 45 days, pursuant to Public Notice DA 04-1705. OR For 180 days pursuantto KDB 726920 D01. It is our understanding that all measurement test reports, FCC ID label format and correspondence during the certification review process cannot be granted as confidential documents and this information will be available for public review once the grant of equipment authorization is issued. Sincerely, Signature: Name: Andy Hoang Title: CEO

FCC ID LABEL: Ca. 20mm x 8mm Label Location FCC ID: 2ASJ3-AVIRONPLAY

FCC RF Exposure EUT Description: Wireless Air Conduction Headphones Model No.: AVIRON PLAY FCC ID: 2ASJ3‐AVIRONPLAY 1. Limits According to KDB 447498 D01 General RF Exposure Guidance v06 The 1‐g and 10‐g SAR test exclusion thresholds for 100 MHz to 6 GHz at test separation distances ≤50 mm are determined by: [(max power of channel, including tune‐up tolerance, mW)/(min. test separation distance, mm)] ·[√ f(GHz)]≤3.0 for 1‐g SAR and ≤ 7.5 for 10‐g extremity SAR, Where: Result=P/D*√F F= the RF channel transmit frequency in GHz P=Maximum turn‐up power in mw D=Min. test separation distance in mm 2. Test Result of RF Exposure Evaluation Frequency (MHz) Output power (dBm) Tune Up Power (dBm) Max Tune Up power (dBm/mW) Min test separation distance (mm) ResultLimit (mW/cm 2 ) SAR Test Exclusion 2480 2.82 2±1 3/1.995 5 0.6283.0 Pass Note: PK Output power= conducted power. Conducted power see the test report DL‐240612003ER, antenna gain= 1.75dBi Per KDB 447498 D01, when the minimum test separation distance is < 5 mm, a distance of 5 mm is applied to determine RF Exposure test exclusion. The test exclusion threshold is 0.628 which is<= 3, RF Exposure testing is not required. Note: Exclusion Thresholds Results=[(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] ·[√f (GHz)] f(GHz) is the RF channel transmit frequency in GHz Distance=5mm

承 認 書 SPECIFICATION FOR APPROVAL 客戶名稱 CUSTOMER ： 客戶料號 CUSTOMER’S P/N ： 料號 PART NUMBER ： WAN3216F245H0X 規格 DESCRIPTION ： Chip Antenna 3216 L Ant 2.45G Type 0X 版本 VERSION ： V2.1 日期 ISSUE DATE ： 2018/07/01 客 戶 承 認 CUSTOMER APPROVED 工 程 部 R&D CENTER 承 認 APPROVAL 確 認 CHECKED 製 作 DRAWN Ray Nate Kelvin 萬誠科技股份有限公司 OneWave Electronic Co., Ltd. 112台北市北投區中央南路二段36號3樓 2F., No.163, Sec. 1, Xi'an St., Beitou Dist., Taipei City 112, Taiwan 電話: (02) 2898-2220 TEL: +886 2 2898-2220 傳真: (02) 2898-5055 FAX: +886 2 2898-5055 2/11 ONEWAVE TECHNOLOGY CO., LTD. 3216 Chip antenna For Bluetooth / WLAN Applications Dimension (mm) L 3.23 ± 0.20 W 1.66 ± 0.20 T 0.45 ± 0.20 P/N: WAN3216F245H0X 3/11 ONEWAVE TECHNOLOGY CO., LTD. Part Number Information WAN 3216 F 245 H 0X A B C D E F A Product Series Antenna B Dimension L x W 3.2X1.6mm (+-0.2mm) C Material High K material D Working Frequency 2.4 ~ 2.5GHz E Feeding mode PIFA & Single Feeding F Antenna type X=06,07,08 / Type=06,07,08 1. Electrical Specification Remark : Bandwidth & Peak Gain was measured under evaluation board of next page Specification Part Number WAN3216F245H0X Central Frequency 2450 MHz Bandwidth 120 (Min.) MHz Return Loss -6.5 (Max) dB Peak Gain 1.75 dBi Impedance 50 Ohm Operating Temperature -40～+85 °C Maximum Power 4 W Resistance to Soldering Heats 10 ( @ 260°C) sec. Polarization Linear Azimuth Beamwidth Omni-directional Termination Ni / Au (Leadless) 4/11 ONEWAVE TECHNOLOGY CO., LTD. 2. Recommended PCB Pattern Evaluation Board Dimension 2 nd Evaluation Board Dimension Suggested Matching Circuit 重要資訊 : 匹配元件建議使用精準度±1%以下的電感、電容、電阻 Layout Dimensions in Clearance area( Size=5.9*5.0mm) 5/11 ONEWAVE TECHNOLOGY CO., LTD. FootPrint (Unit : mm) ◆ 2 nd Layout Dimensions in Clearance area( Size=8.0*3.0mm) Matching Circuit 50 ohm transmission Line 6/11 ONEWAVE TECHNOLOGY CO., LTD. 3. Measurement Results Return Loss 7/11 ONEWAVE TECHNOLOGY CO., LTD. Radiation Pattern Efficiency Peak Gain Directivity 2450MHz 85.65% 2.21 dBi 2.89 dBi Chamber Coordinate System X Y Z 8/11 ONEWAVE TECHNOLOGY CO., LTD. 4.Reliability and Test Condictions ITEM REQUIREMENTS TEST CONDITION Solderability 1. Wetting shall exceed 90% coverage 2. No visible mechanical damage Pre-heating temperature:150°C/60sec. Solder temperature:230±5°C Duration:4±1sec. Solder:Sn-Ag3.0-Cu0.5 Flux for lead free: rosin Solder heat Resistance 1. No visible mechanical damage 2. Central Freq. change :within ± 6% 10±0.5 sec. 60sec .. TEMP (°C) 150°C 260°C Pre-heating temperature:150°C/60sec. Solder temperature:260±5°C Duration:10±0.5sec. Solder:Sn-Ag3.0-Cu0.5 Flux for lead free: rosin Component Adhesion (Push test) 1. No visible mechanical damage The device should be reflow soldered(230±5°C for 10sec.) to a tinned copper substrate A dynometer force gauge should be applied the side of the component. The device must with-ST-F 0.5 Kg without failure of the termination attached to component. Component Adhesion (Pull test) 1. No visible mechanical damage Insert 10cm wire into the remaining open eye bend ,the ends of even wire lengths upward and wind together. Terminal shall not be remarkably damaged. Thermal shock 1. No visible mechanical damage 2. Central Freq. change :within ±6% Phase Temperature(°C) Time(min) 1 +85±5°C 30±3 2 Room Temperature Within 3sec 3 -40±2°C 30±3 4 Room Temperature Within 3sec +85°C=>30±3min -40°C=>30±3min Test cycle:10 cycles The chip shall be stabilized at normal condition for 2~3 hours before measuring. Resistance to High Temperature 1. No visible mechanical damage 2. Central Freq. change :within ±6% 3. No disconnection or short circuit. Temperature: 85±5°C Duration: 1000±12hrs The chip shall be stabilized at normal condition for 2~3 hours before measuring. Resistance to Low Temperature 1. No visible mechanical damage 2. Central Freq. change :within ±6% 3. No disconnection or short circuit. Temperature:-40±5°C Duration: 1000±12hrs The chip shall be stabilized at normal condition for 2~3 hours before measuring. Humidity 1. No visible mechanical damage 2. Central Freq. change :within ±6% 3. No disconnection or short circuit. Temperature: 40±2°C Humidity: 90% to 95% RH Duration: 1000±12hrs The chip shall be stabilized at normal condition for 2~3 hours before measuring. 4±1 sec. 60sec TEMP (°C) 150°C 230°C 9/11 ONEWAVE TECHNOLOGY CO., LTD. 5.Soldering and Mounting Mildly activated rosin fluxes are preferred. The minimum amount of solder can lead to damage from the stresses caused by the difference in coefficients of expansion between solder, chip and substrate. The terminations are suitable for all wave and re-flow soldering systems. If hand soldering cannot be avoided, the preferred technique is the utilization of hot air soldering tools. Recommended temperature profiles for re-flow soldering in Figure 1. Products attachment with a soldering iron is discouraged due to the inherent process control limitations. In the event that a soldering iron must be employed the following precautions are recommended. ‧Preheat circuit and products to 150°C ‧Never contact the ceramic with the iron tip ‧Use a 20 watt soldering iron with tip diameter of 1.0mm ‧280°C tip temperature (max) ‧1.0mm tip diameter (max) ‧Limit soldering time to 3 sec. SOLDERING COOLING NATURAL PRE-HEATING TEMPERATURE(°C) 60~120 s 10s max. 30~60s 250~260 230 180 150 TIME(sec.) Reflow Soldering SOLDERING COOLING NATURAL PRE-HEATING TEMPERATURE(°C) within 3s Gradualcooling 150 TIME(sec.) Iron Soldering Over 60s 350 300 10/11 ONEWAVE TECHNOLOGY CO., LTD. 6.Packaging Information Tape Specification: Reel Specification: (7’’, Φ180 mm) Tape Width(mm) A(mm) B(mm) C(mm) D(mm) Chip/Reel(pcs) 8 9.0±0.5 60±2 13.5±0.5 178±2 3000 11/11 ONEWAVE TECHNOLOGY CO., LTD. 7.Storage and Transportation Information Storage Conditions To maintain the solderability of terminal electrodes: 1. Temperature and humidity conditions: -10~ 40°C and 30~70% RH. 2. Recommended products should be used within 6 months from the time of delivery. 3. The packaging material shou…

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Shenzhen DL Testing Technology Co., Ltd. Report No.: DL-240612003ER Test Report Tel: 400-688-3552 Web:www.dl-cert.com Email: [email protected] Page 1 of 48 FCC Test Report Test Report On Behalf of Aviron Interactive. For Wireless Air Conduction Headphones Model No.: AVIRON PLAY FCC ID: 2ASJ3-AVIRONPLAY Prepared For: Aviron Interactive. 265 Bartley Drive. North York, M4A2N7, Canada Prepared By: Shenzhen DL Testing Technology Co., Ltd. 101-201, Building C, Shuanghuan, No.8, Baoqing Road, Baolong Industrial Zone, Baolong Street, Longgang District, Shenzhen, Guangdong, China Date of Test: May 17, 2024 ~ May 27, 2024 Date of Report: May 27, 2024 Report Number: DL-240612003ER Shenzhen DL Testing Technology Co., Ltd. Report No.: DL-240612003ER Test Report Tel: 400-688-3552 Web:www.dl-cert.com Email: [email protected] Page 2 of 48 Test Result Certification Applicant’s Name................. : Aviron Interactive. Address ................................. : 265 Bartley Drive. North York, M4A2N7, Canada Manufacturer's Name .......... : SHENZHEN SMART CARE TECHNOLOGY LIMITED Address ................................. : The 6th Floor, Block 2#, Anda Electronic Industrial Park, Heping Community, Fuhai Street, Bao'an District, Shenzhen, Guangdong, 518003, China Product Description Trade Mark ............................ : AVIRON Product Name ........................... : Wireless Air Conduction Headphones Model and/or Type Reference...: AVIRON PLAY Standards ............................. : 47 CFR FCC Part 15 Subpart C 15.247 This publication may be reproduced in whole or in part for non-commercial purposes as long as the Shenzhen DL Testing Technology Co., Ltd. is acknowledged as copyright owner and source of the material. Shenzhen DL Testing Technology Co., Ltd. takes no responsibility for and will not assume liability for damages resulting from the reader's interpretation of the reproduced material due to its placement and context. Date of Test ........................................... : Date (s) of Performance of Tests ............ : May 17, 2024 ~ May 27, 2024 Date of Issue .......................................... : May 27, 2024 Test Result ............................................. : Pass Testing Engineer Randy Xie Technical Manager Jack Bu Authorized Signatory Jade Yang Shenzhen DL Testing Technology Co., Ltd. Report No.: DL-240612003ER Test Report Tel: 400-688-3552 Web:www.dl-cert.com Email: [email protected] Page 3 of 48 Table of Contents Page 1. Summary .......................................................................................................................... 5 1.1. Test Standards ............................................................................................................ 5 1.2. Test Description .......................................................................................................... 5 1.3. Information of the Test Laboratory .............................................................................. 6 1.4. Statement of the Measurement Uncertainty ............................................................... 6 2. General Information ........................................................................................................ 7 2.1. Environmental Conditions ........................................................................................... 7 2.2. General Description of EUT ........................................................................................ 7 2.3. Description of Test Modes and Test Frequency .......................................................... 8 2.4. Equipments Used during the Test ............................................................................... 9 2.5. Related Submittal(s) / Grant (s) ................................................................................ 10 2.6. Modifications ............................................................................................................. 10 2.7. Description of Test Setup .......................................................................................... 10 2.8. Description of Support Units ..................................................................................... 11 3. Test Conditions and Results ........................................................................................ 12 3.1. Conducted Emissions Test........................................................................................ 12 3.2. Radiated Emissions and Band Edge ........................................................................ 15 3.3. Maximum Peak Conducted Output Power ................................................................ 26 3.4. 20dB Bandwidth........................................................................................................ 27 3.5. Frequency Separation .............................................................................................. 30 3.6. Number of Hopping Frequency ................................................................................. 32 3.7. Time of Occupancy (Dwell Time) .............................................................................. 34 3.8. Out-of-Band Emissions ............................................................................................. 37 3.9. Pseudorandom Frequency Hopping Sequence ........................................................ 44 3.10. Antenna Requirement ............................................................................................... 45 4. Test Setup Photos of the EUT ...................................................................................... 46 5. Photos of the EUT ......................................................................................................... 48 Shenzhen DL Testing Technology Co., Ltd. Report No.: DL-240612003ER Test Report Tel: 400-688-3552 Web:www.dl-cert.com Email: [email protected] Page 4 of 48 ** Modified History ** Revision Description Issued…

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Model: AVIRON PLAY Radiated Emission Conducted Emission