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2ATLT-ITAG10ITAG10

shenzhen dibet technology co.,LTD
ITAG10 - FCC ID 2ATLT-ITAG10 - shenzhen dibet technology co.,LTD
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Application Details

Equipment Class
DTS - Digital Transmission System
Date of Grant
Sep 11, 2026
Application Purpose
Original Equipment
Equipment Note
ITAG10
Frequency Range
2402.00000000 - 2480.00000000
Company
shenzhen dibet technology co.,LTD
Country
China

Documents & Files

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Attestation Statements

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Cover Letter(s)

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External Photos

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ID Label/Location Info

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RF Exposure Info

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Test Report

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Test Setup Photos

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

Attestation Statements

shenzhen dibet technology co.,LTD (Room 101, 1st Floor, Block D, No. 1 Chuangjin, Block 28, Dalang Community, Xin'an Street, Bao'an District, Shenzhen, Guangdong ) U.S. Agent Letter of Attestation 7435 Oakland Mills Road, Columbia, MD 21046, USA To: Federal Communications Commission Date: Sep. 7, 26 Ref: Attestation Statement –Part2.911(d)(7) filing FCC ID:2ATLT-ITAG10 [shenzhen dibet technology co.,LTD](“the applicant”) certifies that, as of the date of the filing of the application, [HOPEK CORPORATION INC](“the agent”) is our designated U.S. agent for service of process for the above reference FCC ID. The applicant accepts to maintain an agent for service of process in the United States for no less than one year after either the grantee has permanently terminated all marketing and importation of the applicable equipment within the U.S., or the conclusion of any Commission-related administrative or judicial proceeding involving the equipment, whichever is later. The applicant further acknowledges it is ourresponsibility to inform the FCC whenever the agent information changes. [HOPEK CORPORATION INC] ("the agent) understand it is the agent's obligation to accept service of process in the United States for matters related to the applicable equipment, and at the physical U.S. address and email address. Designated U.S. Agent Company Name: HOPEK CORPORATION INC FRN: 0034562900 GC: N/A Address: 16755 Coyote Bush Dr Unit 84, San Diego, CA 92127 United States Signature: Contact Person: Yangyang Xu Tel: 561-875-9826 Email: [email protected] Applicant Company Name: shenzhen dibet technology co.,LTD Address: Room 101, 1st Floor, Block D, No. 1 Chuangjin, Block 28, Dalang Community, Xin'an Street, Bao'an District, Shenzhen, Guangdong FRN: 0028550374 Signature: Contact Person: jiang jianju Email: [email protected] Tel: 0755-86097629

Attestation Statements

(shenzhen dibet technology co.,LTD) (September 7, 2026) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: Attestation Statements Part 2.911(d)(5)(i) request for (FCC ID: 2ATLT-ITAG10) [shenzhen dibet technology co.,LTD] (“the applicant”) certifies that the equipment for which authorization is sought is not “covered” equipment prohibited from receiving an equipment authorization pursuant to section 2.903 of the FCC rules. We also certify that, as of the date of the filing of the application, the equipment does not utilize cyber-security or anti-virus software from Kaspersky Lab, Inc, or any of its successors and assignees, which is also on the “covered list”. Sincerely, (Applicant signature) (Applicant printed name) jiang jianju (shenzhen dibet technology co.,LTD) (September 7, 2026) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: Attestation Statements Part 2.911(d)(5)(ii) request for (FCC ID: 2ATLT-ITAG10) [shenzhen dibet technology co.,LTD] (“the applicant”) certifies that, as of the date of the filing of the application, the applicant is not identified on the Covered List as an entity producing “covered” equipment. Sincerely, (Applicant signature) (Applicant printed name) jiang jianju

Cover Letter(s)

shenzhen dibet technology co.,LTD Model Difference Data: September 11, 2026 Product description: ITAG10 Model name: ITAG10, iTag 1, iTag 2, iTag 3, iTag 4, iTag 5, iTag 6, iTag 7, iTag 7L, iTag 8, iTag 9, iTag 10, iTag 11, iTag 12, iTag 13, iTag 14, iTag 15, iTag 16, iTag 17, iTag 18, iTag 19, iTag 20, iTag 21, iTag 22, iTag 23, iTag 24, iTag 25, iTag R1, iTag T1, iTag P1, iTag P2, iTag CP1, iTag SC1, iTag 1, iTag A1, iTag W1 Trade Name: N/A FCC ID: 2ATLT-ITAG10 All the model are the same circuit and RF module, only the model name are different. Regards Sincerely Client’s signature: Client’s name / title: jiang jianju (Manager) Contact information / address: Room 101, 1st Floor, Block D, No. 1 Chuangjin, Block 28, Dalang Community, Xin'an Street, Bao'an District, Shenzhen, Guangdong

Cover Letter(s)

shenzhen dibet technology co.,LTD (September 7, 2026) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: LETTER OF AGENT AUTHORIZATION To Whom It May Concern: We, the undersigned, hereby authorize (Shenzhen DACE Testing Technology Co., Ltd.) to act on our behalf in all matters relating to application for equipment authorization, including the signing of all documents relating to these matters. We also hereby certify that no party to the application authorized hereunder is subject to the denial of benefits, including FCC benefits, pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C.853(a). This agreement expires one year from the current date. Sincerely, Signature: Name: jiang jianju Title: Manager

Cover Letter(s)

shenzhen dibet technology co.,LTD (September 11, 2026) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: CONFIDENTIALITY REQUEST FOR (ITAG10 / ITAG10, iTag 1, iTag 2, iTag 3, iTag 4, iTag 5, iTag 6, iTag 7, iTag 7L, iTag 8, iTag 9, iTag 10, iTag 11, iTag 12, iTag 13, iTag 14, iTag 15, iTag 16, iTag 17, iTag 18, iTag 19, iTag 20, iTag 21, iTag 22, iTag 23, iTag 24, iTag 25, iTag R1, iTag T1, iTag P1, iTag P2, iTag CP1, iTag SC1, iTag 1, iTag A1, iTag W1 / FCC ID: 2ATLT-ITAG10) To Whom It May Concern: This letter serves as an official request for confidentiality under sections 0.457 and 0.459 of CFR 47. We have requested that the Exhibits Long-Term Confidentiality Short-Term Confidentiality NOTE 2 ID Label/Location No No Attestation Statement No No External Photos No ☐ Block Diagram ☒ ☐ Schematics ☒ ☐ Test Report No No Test Setup Photos No ☐ User’s Manual ☐ NOTE 1 ☒ Internal Photos ☐ NOTE 1 ☒ Parts List / Tune Up ☐ ☐ RF Exposure Info No No Operational Description ☒ ☐ Cover Letter(s) No No SDR Software / Security Info ☐ No required to be submitted with this application be permanently withheld from public review. Above mentioned document contains detailed system and equipment description are considered as proprietary information in operation of the equipment. The public disclosure of above documents might be harmful to our company and would give competitor an unfair advantage in the market. Please contact me if there is any information you may need. Sincerely, Signature: Name: jiang jianju Title: Manager

External Photos

External Appendix FCC ID: 2ATLT-ITAG10 Model: ITAG10

ID Label/Location Info

Label Location: ITAG10 Model: ITAG10 FCC ID: 2ATLT-ITAG10

RF Exposure Info

shenzhen dibet technology co.,LTD FCC ID: 2ATLT-ITAG10 Portable device According to §15.247(e)(i) and §1.1307(b)(1), systems operating under the provisions of this section shall be operated in a manner that ensures that the public is not exposed to radio frequency energy level in excess of the Commission’s guidelines. According to KDB447498 D01 General RF Exposure Guidance V06 The 1-g SAR and 10-g SAR test exclusion thresholds for 100 MHz to 6 GHz at test separation distances ≤ 50 mm are determined by: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)]·[√f(GHZ)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where: • f(GHZ) is the RF channel transmit frequency in GHz • Power and distance are rounded to the nearest mW and mm before calculation • The result is rounded to one decimal place for comparison When the minimum test separation distance is < 5 mm, a distance of 5 mm is applied to determine SAR test exclusion. BLE: Modulation Channel Freq. (GHz) Conduct ed power (dBm) Conducte d power (mW) Tune-up power (dBm) Max tune-up power (dBm) Max tune-up power (mW) Distance (mm) Result calculatio n SAR Exclusion threshold SAR test exclusion 2.402 4.17 2.61 5±1 6.00 3.98 <5 1.23400 3.00 YES 2.44 3.64 2.31 4±1 5.00 3.16 <5 0.98793 3.00 YES 2.480 2.98 1.99 3±1 4.00 2.51 <5 0.79114 3.00 YES 2.402 4.35 2.72 5±1 6.00 3.98 <5 1.23400 3.00 YES 2.44 3.91 2.46 4±1 5.00 3.16 <5 0.98793 3.00 YES 2.480 3.28 2.13 4±1 5.00 3.16 <5 0.99599 3.00 YES GFSK(1M Hz) GFSK(2M Hz) Conclusion: For the max result: 1.23400≤ FCC Limit 3.0 for 1g SAR.

Test Report

2.4GHz3216ChipAntenna:RANT3216F245C03 _ Application: WLAN,802.11b/g,Bluetooth,WLAN,etc... Features SMD,highreliability,ultraImpact,Omni-directional... PartnumberInformation RANT3216F245C03 (A)(B)(C)(D)(E)(F) ElectricalSpecification ThespecificationisdefinedonEVB. DimensionandTerminalConfiguration No.TerminalName 1Feeding/GNG 2GND/Feeding (A)ProductTypeChipAntenna (B)SizeCode 3.2x1.6mm( ± 0.2mm) (C)MaterialHighKmaterial (D)Frequency2.4~2.5GHz (E)FeedingmodePIFA&SingleFeeding (F)AntennatypeType=03 WorkingFrequencyRange2400~2500MHz Bandwidth120MHz(Min.) PeakGain2.7dBi(Typ.) Impedance50Ohm Returnloss10dB(Min) PolarizationLinear AzimuthBeamwidthOmni-directional OperationTemperature( °C )-40~85 °C ResistancetoSolderingHeats 10sec.(@280 °C ) TerminationNi/Au(Leadless) Dimension(mm) L 3.20 ± 0.20 W 1.60±0.20 T 0.45±0.20 咏成國際科技有限公司電話:13530576606 RAINInternationalTechnologyCo.,Ltd. Room707,BuildingF,TonganZhichuangyuan,xixiangstreet,BaoanDistrict, Shenzhen. 2.4GHz3216ChipAntenna:RANT3216F245C03 _ 1 EvaluationBoardReference 长条板PCB 推荐 Dimension 圆板AntennaLayoutReference Unit:mm ElectricalCharacteristics ReturnLoss&Radiation ReturnLoss Frequency(MHz) S11(dB) 2400-10.50 2450-30.62 2500-11.47 Radiation 2400MHz2450MHz2500MHz Efficiency82.52%85.26%83.01% X Y Z 2.4GHz3216ChipAntenna:RANT3216F245C03 _ TapingSpecifications ReelandTapingSpecification ReelSpecification TYPESIZEABCD 32167”5K/Reel 9.0±0.5 60±213.5±0.5178±2 TappingSpecification PackagingTypeABWEFGHTψDP PaperType3216 1.90±0.2 0 3.50±0.2 0 8.0±0.2 0 1.75±0.1 0 3.5±0.054.0±0.102.0±0.050.75±0.1 0 1.50±0.1 0 4.0±0.1 2.4GHz3216ChipAntenna:RANT3216F245C03 _ ReliabilityTable TestItemProcedure Requirements CeramicType Remark (Reference) Electrical Characterization Fulfilltheelectrical specification UserSpec. Thermal Shock 1.Preconditioning: 50±10°C/1hr,thenkeepfor24±1hrsatroomtemp. 2.Initialmeasure:Spec:referInitialspec. 3.Rapidchangeoftemperaturetest: -30°Cto+85°C;100cycles; 15minutesatLowercategorytemperature; 15minutesatUppercategorytemperature. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 107 Temperature Cycling 1.Initialmeasure:Spec:referInitialspec. 2.100Cycles(-30°Cto+85°C),SoakMode=1(2Cycle/hours). 3.Measurementat24±2Hoursaftertestcondition. NoVisibleDamage. Fulfilltheelectrical specification. JESD22 JA104 HighTemperature Exposure 1.Initialmeasure:Spec:referInitialspec. 2.Unpowered;500hours@T=+85°C. 3.Measurementat24±2hoursaftertest. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 108 LowTemperature Storage 1.Initialmeasure:Spec:referInitialspec. 2.Unpowered:500hours@T=-30°C. 3.Measurementat24±2hoursaftertest. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 108 Solderability (SMDBottomSide) Dippingmethod: a.Temperature:235±5°C b.Dippingtime:3±0.5s Thesoldershouldcover over95%ofthecritical areaofbottomside. IEC60384-21/22 4.10 SolderingHeat Resistance (RSH) Preheatingtemperature:150±10°C. Preheatingtime:1~2min. Soldertemperature:260±5°C. Dippingtime:5±0.5s NoVisibleDamage.IEC60384-21/22 4.10 Vibration5g'sfor20min.,12cycleseachof3orientations Note:Use8"X5"PCB.031"thick7securepointson,onelong sideand2securepointsatcornersofoppositesides.Parts mountedwithin2"fromanysecurepoint.Testfrom10-2000 Hz. NoVisibleDamage.MIL-STD-202 Method204 Mechanical Shock Threeshocksineachdirectionshallbeappliedalongthethree mutuallyperpendicularaxesofthetestspecimen(18shocks) Peakvalue:1,500g’s Duration:0.5ms Velocitychange:15.4ft/s Waveform:Half-sine NoVisibleDamage.MIL-STD-202 Method213 Humidity Bias 1.Humidity:85%R.H.,Temperature:85±2°C. 2.Time:500±24hours. 3.Measurementat24±2hrsaftertestcondition. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 Method106 2.4GHz3216ChipAntenna:RANT3216F245C03 _ Board Flex (SMD) 1.Mountingmethod: IR-Reflow.PCBSize(L:100×W:40×T:1.6mm) 2.Applytheloadindirectionofthearrowuntilbendingreaches 2mm. NoVisibleDamage.AEC-Q200 005 AdhesionForceof1.8Kgfor60seconds.NoVisibleDamage Magnificationof20Xor greatermaybeemployed forinspectionofthe mechanicalintegrityofthe devicebodyterminalsand body/terminaljunction. AEC-Q200 006 Physical Dimension Anyapplicablemethodusingx10magnification,micrometers, calipers,gauges,contourprojectors,orothermeasuring equipment,capableofdeterminingtheactualspecimen dimensions. Inaccordancewith specification. JESD22 JB100 RevisionHistory RevisionDateContent 12019/03/01NewDatasheet 22020/02/22Add2Dradiationcharacteristic 32020/02/22Add2Dradiationcharacteristic

Test Report

V1.0 Report No.: DACE260902006RF001 102, Building H1, & 1/F., Building H, Hongfa Science & Technology Park, Tangtou Community, Shiyan Subdistrict, Bao'an District, Shenzhen, Guangdong, China Web: http://www.dace-lab.com Tel: +86-755-23010613 E-mail: [email protected] Page 1 of 69 RF TEST REPORT For shenzhen dibet technology co.,LTD Product Name: ITAG10 Test Model(s): ITAG10 Report Reference No. : DACE260902006RF001 FCC ID : 2ATLT-ITAG10 Applicant’s Name : shenzhen dibet technology co.,LTD Address : Room 101, 1st Floor, Block D, No. 1 Chuangjin, Block 28, Dalang Community, Xin'an Street, Bao'an District, Shenzhen, Guangdong Testing Laboratory : Shenzhen DACE Testing Technology Co., Ltd. Address : 102, Building H1, & 1/F., Building H, Hongfa Science & Technology Park, Tangtou Community, Shiyan Subdistrict, Bao'an District, Shenzhen, Guangdong, China Test Specification Standard : 47 CFR Part 15.247 Date of Receipt : September 1, 2026 Date of Test : September 1, 2026 to September 3, 2026 Date of Issue : September 3, 2026 Result : Pass Note: This report shall not be reproduced except in full, without the written approval of Shenzhen DACE Testing Technology Co., Ltd. This document may be altered or revised by Shenzhen DACE Testing Technology Co., Ltd. personnel only, and shall be noted in the revision section of the document. The test results in the report only apply to the tested sample V1.0 Report No.: DACE260902006RF001 102, Building H1, & 1/F., Building H, Hongfa Science & Technology Park, Tangtou Community, Shiyan Subdistrict, Bao'an District, Shenzhen, Guangdong, China Web: http://www.dace-lab.com Tel: +86-755-23010613 E-mail: [email protected] Page 2 of 69 Apply for company information Applicant’s Name : shenzhen dibet technology co.,LTD Address : Room 101, 1st Floor, Block D, No. 1 Chuangjin, Block 28, Dalang Community, Xin'an Street, Bao'an District, Shenzhen, Guangdong Product Name : ITAG10 Test Model(s) : ITAG10 Series Model(s) : iTag 1, iTag 2, iTag 3, iTag 4, iTag 5, iTag 6, iTag 7, iTag 7L, iTag 8, iTag 9, iTag 10, iTag 11, iTag 12, iTag 13, iTag 14, iTag 15, iTag 16, iTag 17, iTag 18, iTag 19, iTag 20, iTag 21, iTag 22, iTag 23, iTag 24, iTag 25, iTag R1, iTag T1, iTag P1, iTag P2, iTag CP1, iTag SC1, iTag 1, iTag A1, iTag W1 Test Specification Standard(s) : 47 CFR Part 15.247 NOTE1: The manufacturer should ensure that all products in series production are in conformity with the product sample detailed in this report. If the product in this report is used in any configuration other than that detailed in the report, the manufacturer must ensure the new system complies with all relevant standards. Compiled by: Supervised by: Approved by: Lucy Mo / Test Engineer Arron Liu / Project Engineer Tom Chen / Manager September 3, 2026 September 3, 2026 September 3, 2026 V1.0 Report No.: DACE260902006RF001 102, Building H1, & 1/F., Building H, Hongfa Science & Technology Park, Tangtou Community, Shiyan Subdistrict, Bao'an District, Shenzhen, Guangdong, China Web: http://www.dace-lab.com Tel: +86-755-23010613 E-mail: [email protected] Page 3 of 69 Revision History Of Report Version Description REPORT No. Issue Date V1.0 Original DACE260902006RF001 September 3, 2026 V1.0 Report No.: DACE260902006RF001 102, Building H1, & 1/F., Building H, Hongfa Science & Technology Park, Tangtou Community, Shiyan Subdistrict, Bao'an District, Shenzhen, Guangdong, China Web: http://www.dace-lab.com Tel: +86-755-23010613 E-mail: [email protected] Page 4 of 69 CONTENTS 1 TEST SUMMARY ........................................................................................................................................... 6 1.1 TEST STANDARDS .................................................................................................................................. 6 1.2 SUMM ARY OF TEST RESULT .................................................................................................................... 6 2 GENERAL INFORMATION ............................................................................................................................ 8 2.1 CLIENT INFORMATION ............................................................................................................................. 8 2.2 DESCRIPTION OF DEVICE (EUT) .............................................................................................................. 8 2.3 DESCRIPTION OF TEST MODES ................................................................................................................ 8 2.4 DESCRIPTION OF SUPPORT UNITS ........................................................................................................... 8 2.5 OPERATION FREQUENCY EACH OF CHANNEL ............................................................................................ 9 2.6 EQUIPMENTS USED DURING THE TEST .................................................................................................. 10 2.7 STATEMENT OF THE MEASUREMENT UNCERTAINTY ............................................................................... 12 3 EVALUATION RESULTS (EVALUATION) ................................................................................................... 13 3.1 ANTENNA REQUIREMENT ....................................................................................................................... 13 3.1.1 Conclusion: ............................................................................................................................. 13 4 RADIO SPECTRUM MATTER TEST RESULTS (RF) ................................................................................. 14 4.1 6DB BANDWIDTH .................................................................................................................................. 14 4.1.1 E.U.T. Operation: .................................................................................................................... 14 4.1.2 Test Setup Diagram: ........…

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Test Setup Photos

Setup Appendix FCC ID: 2ATLT-ITAG10 Model: ITAG10

Contact Information

Applicant

jiang jianju(CTO)
[email protected]Fax: 0755-86097629

Technical Contact

HOPEK CORPORATION INCYangyang Xu
[email protected]

16755 Coyote Bush Dr Unit 84, · San Diego · United States

Test Firm

Shenzhen DACE Testing Technology Co., Ltd.Colin Huang
[email protected]

Technical Specifications

#Rule PartsFrequency RangePower Output
115C2.40 GHz - 2.48 GHz2.72 mW
Confidentiality
Long Term
Grant Notes
Output power listed is conducted.

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