
Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.
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Reference No.: WTX20X11091628W -1 Page 2 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTX20X11091628W -1 Page 3 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 3 EUT View 4 Reference No.: WTX20X11091628W -1 Page 4 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 5 EUT View 6
Reference No.: WTX20X11091628W -1 Page 1 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format FCC ID: 2AU7E- FD620 Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location
Reference No.: WTX20X11091628W -1 Page 5 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 EUT Housing and Board View 2 Reference No.: WTX20X11091628W -1 Page 6 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Solder Board-Component View 1 Solder Board-Component View 2 Reference No.: WTX20X11091628W -1 Page 7 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Antenna View BT Antenna
RF Exposure Requirements Product Description: SMART FINDER Model No.: FD620 FCC ID: 2AU7E- FD620 According to the KDB 447498 D01 v06 section 4.3.1, for 100 MHz to 6 GHz and test separation distances ≤ 50 mm, the 1-g and 10-g SAR test exclusion thresholds are determined by the following: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] · [√f(GHz)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where - f(GHz) is the RF channel transmit frequency in GHz - Power and distance are rounded to the nearest mW and mm before calculation - The result is rounded to one decimal place for comparison Calculation Result: Tx frequency range: 2402-2480MHz Min. test separation distance: 5mm Maximum Conducted Output Power: 3.641dBm Tune-Up output power: 4dBm RF channel transmit frequency: 2402MHz Result: 0.8 Limit: 3.0 The exclusion thresholds is 0.8 < 3, so the transmitter complies with the RF exposure requirements and the SAR is not required.
Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 38 TEST REPORT Reference No. .................... : WTX20X11091628W-1 FCC ID ................................ : 2AU7E-FD620 Applicant ........................... : ShenZhen SigmaWit Technology Co.,Ltd Address.............................. : 11th floor,Lingyun Building, DingXin Industrial Area, Honglang North 2nd Road, Bao’an, ShenZhen,Guangdong Province,China Product Name ................... : SMART FINDER Test Model. ........................ : FD620 Standards .......................... : FCC Part 15.247 Date of Receipt sample .... : Nov.30, 2020 Date of Test........................ : Nov.30, 2020 to Dec.15, 2020 Date of Issue ..................... : Dec.15, 2020 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jack Huang / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTX20X11091628W-1 Page 2 of 38 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ...................................................................................................................................4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ...............................................................................4 1.2 TEST STANDARDS ...................................................................................................................................................5 1.3 TEST METHODOLOGY .............................................................................................................................................5 1.4 TEST FACILITY .......................................................................................................................................................5 1.5 EUT SETUP AND TEST MODE .................................................................................................................................6 1.6 MEASUREMENT UNCERTAINTY ..............................................................................................................................7 1.7 TEST EQUIPMENT LIST AND DETAILS .....................................................................................................................7 2. SUMMARY OF TEST RESULTS ...........................................................................................................................9 3. ANTENNA REQUIREMENT ................................................................................................................................ 10 3.1 STANDARD APPLICABLE ....................................................................................................................................... 10 3.2 EVALUATION INFORMATION................................................................................................................................. 10 4. POWER SPECTRAL DENSITY ........................................................................................................................... 11 4.1 STANDARD APPLICABLE ....................................................................................................................................... 11 4.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 11 4.3 TEST PROCEDURE ................................................................................................................................................. 11 4.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 11 5. DTS BANDWIDTH ................................................................................................................................................. 12 5.1 STANDARD APPLICABLE ....................................................................................................................................... 12 5.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 12 5.3 TEST PROCEDURE ................................................................................................................................................. 12 5.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 12 6. RF OUTPUT POWER ............................................................................................................................................ 13 6.1 STANDARD APPLICABLE ....................................................................................................................................... 13 6.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 13 6.3 TEST PROCEDURE ................................................................................................................................................. 13 6.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 13 7. FIELD STRENGTH OF SPURIOUS EMISSIONS ......................................................................…
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Reference No.: WTX20X11091628W -1 Page 8 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Radiation Emission Test Setup (Below 30MHz) Radiation Emission Test Setup (30MHz to 1GHz) Reference No.: WTX20X11091628W -1 Page 9 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Radiation Emission Test Setup (1GHz to 18GHz) Radiation Emission Test Setup (Above 18GHz) Reference No.: WTX20X11091628W -1 Page 10 of 10 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn ***** END OF REPORT *****
| # | Rule Parts | Frequency Range | Power Output |
|---|---|---|---|
| 1 | 15C | 2.40 GHz - 2.48 GHz | 2.30 mW |

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Equipment Class
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