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2AUI4-OS-M375K1Face recognition terminal

Universal Ubiquitous AI Co., Ltd.
Face recognition terminal - FCC ID 2AUI4-OS-M375K1 - Universal Ubiquitous AI Co., Ltd.
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Application Details

Equipment Class
JAB - Part 15 Class B Digital Device
Date of Grant
Sep 17, 2020
Application Purpose
Original Equipment
Date of Application
Sep 17, 2020
Equipment Note
Face recognition terminal
Company
Universal Ubiquitous AI Co., Ltd.
Country
China

Documents & Files

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Users Manual

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Cover Letter(s)

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External Photos

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ID Label/Location Info

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Internal Photos

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Test Report

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Test Setup Photos

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

Users Manual

PRODUCT BOOKLET Uface 7T Lite ( OS-M375K1-C-S23N ) Device introduction Parts list Dimensional drawing Platform/Software operating instruction Appearance description Illumination intensity Position Height Steps Wiring connection Features FA Q Installation Product description No. QuantityName 11Host 21Power adapter - 100-240V to 12V-2A 31Certificate 4 5 1 1 Warranty card Silicone top-plug, Silicone rear-plug 61Nut 74Round head screw Parts list Dimensional drawing Dear customer: Thank you for using our product. For better use, please carefully read this instruction. If you have any issues not mentioned here, please contact the provider. All parts of this booklet are reserved by our company, including words, pictures and graphics. Without written permission, no unit or individual shall extract, copy, translate or edit the content in this instruction. Unit: mm The software carried by the product divides into 2 versions: WO (WO platform, provides the secondary development) and LAN (LAN or offline version, provides the secondary development). Please mark the need for software version when place the order. Please contact the customer service for another version if required. For more detailed platform/software instruction manual, please login into the official website to download or contact the customer services. Operating instruction Appearance description Instruction 1 / 2 Digital port: NC normally close; NO normally on; COM public end Input port: ALARM_IN1, ALARM_IN2, GND 485 port: 485+, 485- GND Net mouth USB interface Power cable Reset232 serial port: TX_232, RX_232, GND Wiegand 26/34 signal output: WG_D0-OUT, WG_D1-OUT, GND WPS_KEYGNDRX_232GNDGNDWG_DO-OUTWG_D1-OUT TX_232 DOOR_COMDOOR_NODOOR_NCALARM_IN1ALARM_IN2485+485-GND White filling light RGB camera M30 267.5 210.68 225.68 292.5 30 55 126.68 111.68 227.16 414.45 482.84 The recognized face, of which, the illumination intensity ( “intensity” in short) shall not be lower than 30 Lux. The device has filling light itself, so when the device put in a totally dark environ- ment, the face illumination intensity, 0.5m distance to the device, is about 100 Lux. The nearer to the device, the higher the intensity is. If there is overexposure on the face, the face characteristics will be unable to be extracted and may lead to hard recognition. Light issues may lead to big differences between site image and registered image; backlight, side-light and strong light will influence the recognition experience. (Analysis: from the view of human eyes, the color changes on face skin may result in wrong recognition of identity; unclear exposure area, no matter large or small, may influence the identity judgement.) The test standard is as shown on the picture: the angle between dotted line A and dotted line B is 90 ° , the test adopts the common light meter with full spectrum, and applies U30 stan- dard light source; adjust the distance between source light and test object, subject to the illumination intensity of the object’ s face at this time. Back light Intensity test Illumination intensity in actual scenarios Strong light Side light Light source is near the object Device stands between the light source and object Object stands between the device and light source Side-light may lead to uneven light on the face Backlight may make the face too dark Direct strong light may cause overexposure 500Lux, overexposure 30 Lux, dim 100 Lux, bright 50 Lux, normal 300 Lux, slight exposure Reference to intensity Illumination intensity 1. Install the device in a place with little impact from light source. 2. Add a registered image according to the site condition, and it is suggested to use this product to enroll images. 3. Properly lower the threshold value according to usage. Improvements Device 0.5m~1m d 90° Test object Light source A B When the sunlight shines indoor through the window, the face recognition terminal device shall not be installed in shown black shadow area, instead, shall be installed in place with little sunlight impact, no side-light and no backlight. (Glass window can be deemed as no walls) Sunlight shines indoor If the room has glass wall, there is no shield for sunlight, then it is suggested to hang curtains over the window, and install the device in place with shield to avoid direct sunlight influencing the recognition. (Glass window can be deemed as no walls) Glass window Sunlight shines through the door, the device shall be installed at the place with shields and little light impact. Glass window can be deemed as no shields, the device shall be installed at the side without glass window or with curtain hung. Sunlight shines through the door, with glass window at one side Sunlight shines through the door, the device shall be installed at the place with shields and little light impact. Sunlight shines through the door Suggested installation height (the distance between the lens and the ground) is 1.4m, as the recognizable body height range, 0.5m distance away from the device, is 1.3m-1.7m; the recognizable body height range, 1m distance away from the device, is 1m-2m. (There are some deviations) Camera vertical wide-angleCamera horizontal wide-angle Position 3 / 4 Height Glass window (same as the semi-outdoor scene with no walls) Device Light DoorWall Person Curtain Device shall be installed in places avoiding backlight, side-light and strong light. This place, 3m away from the window, or does not influenced by sunlight, can be considered for installation. Backlight, side-light or direct strong light, not suitable for installation. Other areas, install in suitable places according to actual light impact. Indoor Door Light Wall/Shields Indoor Door Light Wall/Shields Indoor Light Door Door Wall/Shields Indoor Door Wall/Shields Light Glass wall FOV(H) FOV(H) User Recognition area Device Gate Steps 5 / 6 According to the site requirements, drill a 35mm-diameter hole in the gate (commonly in the middle or the front), as shown on the picture, is the sugg…

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External Photos

Reference Waltek Tes http://www EXHIBI EUT View 1 EUT View 2 e No.: WTX20 sting Group w.semtest.co T 2 - EUT 1 2 0X08059649 (Shenzhen) m.cn T EXTER 9W Co., Ltd. RNAL PH HOTOGR APHS Reference Waltek Tes http://www EUT View 3 EUT View 4 e No.: WTX20 sting Group w.semtest.co 3 4 0X08059649 (Shenzhen) m.cn 9W Co., Ltd. Reference Waltek Tes http://www EUT View 5 EUT View 6 e No.: WTX20 sting Group w.semtest.co 5 6 0X08059649 (Shenzhen) m.cn 9W Co., Ltd. Reference Waltek Tes http://www EUT View 7 e No.: WTX20 sting Group w.semtest.co 7 0X08059649 (Shenzhen) m.cn 9W Co., Ltd.

ID Label/Location Info

Reference Waltek Tes http://www EXHIBI Proposed Specificatio n it is visible durable to r expected lif e Proposed e No.: WTX20 sting Group w.semtest.co T 1 - PRO FCC ID La ns: The label or easily acc emain fully l etime. Label Loca 0X08059649 (Shenzhen) m.cn ODUCT L abel Forma FCC ID: This device Operation i (1) This de (2) this dev including i shall be secu cessible to th legible and in ation on EU 9W Co., Ltd. LABELIN at 2AUI4-OS e complies w is subject to t evice may not vice must acc nterference th urely affixed t he user, and ntact on the UT FCC NG S-M375K1 with Part 15 of the following t cause harmf cept any inter hat may caus to a permane shall not be device in al l ID Label Lo f the FCC Ru g two conditio ful interferenc ference receiv e undesired o ently attached readily detac l normal cond cation ules. ons: ce, and ved, operation. d part of the d chable. The l ditions of use device, in a lo label shall be e throughout ocation where e sufficiently t the device’s e y s

Internal Photos

Reference Waltek Tes http://www EXHIBI EUT Housi n EUT Housi n e No.: WTX20 sting Group w.semtest.co T 3 - EUT ng and Boar ng and Boar 0X08059649 (Shenzhen) m.cn T INTER rd View 1 rd View 2 9W Co., Ltd. NAL PHO OTOGRA APHS Reference Waltek Tes http://www Solder Boa r Solder Boar e No.: WTX20 sting Group w.semtest.co rd-Compone rd-Compone 0X08059649 (Shenzhen) m.cn ent View 1 ent View 2 9W Co., Ltd.

Internal Photos

Reference Waltek Tes http://www Solder Boa r Solder Boar e No.: WTX20 sting Group w.semtest.co rd-Compone rd-Compone 0X08059649 (Shenzhen) m.cn ent View 3 ent View 4 9W Co., Ltd. Reference Waltek Tes http://www Solder Boa r Solder Boar e No.: WTX20 sting Group w.semtest.co rd-Compone rd-Compone 0X08059649 (Shenzhen) m.cn ent View 5 ent View 6 9W Co., Ltd.

Test Report

Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 18 TEST REPORT Reference No. .................... : WTX20X08059649W FCC ID: ............................. 2AUI4-OS-M375K1 Applicant ........................... : Universal Ubiquitous Co., Ltd. Address ............................. : Room 658, Building 1, No.1, Lvting Road, Cangqian Street, Yuhang District, Hangzhou City Product Name ................... : Face recognition terminal Test Model. ........................ : OS-M375K1-C-S23N Standards .......................... : FCC PART15 SUBPART B Date of Receipt sample .... : Aug. 25, 2020 Date of Test........................ : Aug. 25, 2020 to Sep.01, 2020 Date of Issue ..................... : Sep.01, 2020 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Mike Shi / Project Engineer Evan Cai /EMC Manager Silin Chen / Manager Reference No.: WTX20X08059649W Page 2 of 18 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ................................................................................................................................... 3 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ............................................................................... 3 1.2 TEST STANDARDS ................................................................................................................................................... 4 1.3 TEST METHODOLOGY ............................................................................................................................................. 4 1.4 TEST FACILITY ....................................................................................................................................................... 4 1.5 EUT SETUP AND OPERATION MODE ...................................................................................................................... 5 1.6 MEASUREMENT UNCERTAINTY .............................................................................................................................. 5 1.7 TEST EQUIPMENT LIST AND DETAILS ..................................................................................................................... 7 2. SUMMARY OF TEST RESULTS ........................................................................................................................... 8 3. CONDUCTED EMISSIONS .................................................................................................................................... 9 3.1 TEST PROCEDURE ................................................................................................................................................... 9 3.2 BASIC TEST SETUP BLOCK DIAGRAM ..................................................................................................................... 9 3.3 ENVIRONMENTAL CONDITIONS .............................................................................................................................. 9 3.4 SUMMARY OF TEST RESULTS ................................................................................................................................. 9 3.5 CONDUCTED EMISSIONS TEST DATA .................................................................................................................... 10 4. RADIATED EMISSION ......................................................................................................................................... 12 4.1 TEST PROCEDURE ................................................................................................................................................. 12 4.2 BLOCK DIAGRAM OF TEST SETUP ........................................................................................................................ 12 4.3 TEST RECEIVER SETUP ......................................................................................................................................... 13 4.4 CORRECTED AMPLITUDE & MARGIN CALCULATION ............................................................................................ 13 4.5 ENVIRONMENTAL CONDITIONS ............................................................................................................................ 14 4.6 SUMMARY OF TEST RESULTS ............................................................................................................................... 14 Reference No.: WTX20X08059649W Page 3 of 18 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn 1. GENERAL INFORMATION 1.1 Product Description for Equipment Under Test (EUT) Client Information Applicant: Universal Ubiquitous Co., Ltd. Address of applicant: Room 658, Building 1, No.1, Lvting Road, Cangqian Street, Yuhang District, Hangzhou City Manufacturer: Universal Ubiquitous Co., Ltd. Address of manufacturer: Room 658, Building 1, No.1, Lvting Road, Cangqian Street, Yuhang District, Hangzhou City General Description of EUT Product Name: Face recognition terminal Trade Name: Model No.: OS-M375K1-C-S23N Adding Model(s): / Note: The test data is gathered from a production sample, provided by the manufacturer. Technical Characteristics of EUT Rated Voltage: DC 12V Rated Current: / Rated Power: / Power Adapter Model: MODEL:XED-UL120200CC INPUT: AC100-240V, 50/60Hz, 0.6A Output: DC12V, 2 A Lowest Internal Frequency: / H…

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Test Setup Photos

Reference Waltek Tes http://www EXHIBI Conducted Radiation E e No.: WTX20 sting Group w.semtest.co T 4 - TES Emission Te Emission Tes 0X08059649 (Shenzhen) m.cn ST SETUP est Setup st Setup (30M 9W Co., Ltd. P PHOTO MHz to 1GHz OGRAPH z) HS Reference Waltek Tes http://www Radiation E e No.: WTX20 sting Group w.semtest.co Emission Tes 0X08059649 (Shenzhen) m.cn st Setup (abo 9W Co., Ltd. ove 1GHz)

Contact Information

Applicant

Fangfang Liu(engineer)
[email protected](86) 15000804271Fax: (86)4000686857

Test Firm

Waltek Testing Group (Shenzhen) Co., Ltd.Jandy So
[email protected]86 755 33663308Fax: 86-755-33663309

Technical Specifications

#Rule PartsFrequency RangePower Output
115B--
Confidentiality
Long Term

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