2AWG8-ST-W102Social Distancing Smart Bracelet

Reference No.: WTX20X09063204W-1 Page 2 of 15 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTX20X09063204W-1 Page 3 of 15 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 3 EUT View 4 Reference No.: WTX20X09063204W-1 Page 4 of 15 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 5 EUT View 6 Reference No.: WTX20X09063204W-1 Page 5 of 15 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 7 EUT View 8 Reference No.: WTX20X09063204W-1 Page 6 of 15 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 9 EUT View 10 Reference No.: WTX20X09063204W-1 Page 7 of 15 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 11 EUT View 12 Reference No.: WTX20X09063204W-1 Page 8 of 15 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 13

Reference No.: WTX20X09063204W-1 Page 1 of 15 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format FCC ID: 2AWG8-ST-W102 Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

Reference N Waltek Tes http://www EXHIBI EUT Housi n Solder Boa r No.: WTX20X sting Group w.semtest.co T 3 - EUT ng and Boar rd-Compone X09063204W (Shenzhen) m.cn T INTER rd View 1 ent View 1 W-1 Co., Ltd. NAL PHO Page 9 of 1 OTOGRA 15 APHS Reference N Waltek Tes http://www Solder Boa r Solder Boa r No.: WTX20X sting Group w.semtest.co rd-Compone rd-Compone X09063204W (Shenzhen) m.cn ent View 2 ent View 3 W-1 Co., Ltd. Page 10 of 15 Reference N Waltek Tes http://www Solder Boa r Antenna V i BT Ant No.: WTX20X sting Group w.semtest.co rd-Compone iew tenna X09063204W (Shenzhen) m.cn ent View 4 W-1 Co., Ltd. Page 11 of 15

RF Exposure Requirements Product Description: Social Distancing Smart Bracelet Model No.: ST-W102, ST-W102 Pro FCC ID: 2AWG8-ST-W102 According to the KDB 447498 D01 v06 section 4.3.1, for 100 MHz to 6 GHz and test separation distances ≤ 50 mm, the 1-g and 10-g SAR test exclusion thresholds are determined by the following: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] ꞏ [√f(GHz)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where - f(GHz) is the RF channel transmit frequency in GHz - Power and distance are rounded to the nearest mW and mm before calculation - The result is rounded to one decimal place for comparison Calculation Result: Tx frequency range: 2402-2480MHz Min. test separation distance: 5mm Maximum Conducted Output Power: -3.24dBm Tune-Up output power: -3dBm RF channel transmit frequency: 2402MHz Result: 0.2 Limit: 3.0 The exclusion thresholds is 0.2 < 3, so the transmitter complies with the RF exposure requirements and the SAR is not required.

Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 38 TEST REPORT Reference No. .................... : WTX20X09063204W-1 FCC ID ................................ : 2AWG8-ST-W102 Applicant ........................... : Skyring Smart Technologies (Shenzhen) Co., Ltd. Address ............................. : 6F GDC Building, 9Gaoxin Centeral Avenue 3rd, Nanshan District, Shenzhen, P.R. China Product Name ................... : Social Distancing Smart Bracelet Test Model. ........................ : ST-W102 Standards .......................... : FCC Part 15.247 Date of Receipt sample .... : Sept.04, 2020 Date of Test........................ : Sept.04, 2020 to Sept.22, 2020 Date of Issue ..................... : Sept.22, 2020 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jack Huang / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTX20X09063204W-1 Page 2 of 38 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ................................................................................................................................... 4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ............................................................................... 4 1.2 TEST STANDARDS ................................................................................................................................................... 5 1.3 TEST METHODOLOGY ............................................................................................................................................. 5 1.4 TEST FACILITY ....................................................................................................................................................... 5 1.5 EUT SETUP AND TEST MODE ................................................................................................................................. 6 1.6 MEASUREMENT UNCERTAINTY .............................................................................................................................. 7 1.7 TEST EQUIPMENT LIST AND DETAILS ..................................................................................................................... 8 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 10 3. RF EXPOSURE ....................................................................................................................................................... 11 3.1 STANDARD APPLICABLE ....................................................................................................................................... 11 3.2 TEST RESULT........................................................................................................................................................ 11 4. ANTENNA REQUIREMENT ................................................................................................................................ 12 4.1 STANDARD APPLICABLE ....................................................................................................................................... 12 4.2 EVALUATION INFORMATION ................................................................................................................................ 12 5. POWER SPECTRAL DENSITY ........................................................................................................................... 13 5.1 STANDARD APPLICABLE ....................................................................................................................................... 13 5.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 13 5.3 TEST PROCEDURE ................................................................................................................................................. 13 5.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 13 6. DTS BANDWIDTH ................................................................................................................................................. 15 6.1 STANDARD APPLICABLE ....................................................................................................................................... 15 6.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 15 6.3 TEST PROCEDURE ................................................................................................................................................. 15 6.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 15 7. RF OUTPUT POWER ............................................................................................................................................ 17 7.1 STANDARD APPLICABLE ....................................................................................................................................... 17 7.2 TEST SETUP BLOCK DIAGRAM ..............................................…

Text truncated - open the document above for the full version.

Reference No.: WTX20X09063204W-1 Page 12 of 15 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Conducted Emission Test Setup Radiation Emission Test Setup (Below 30MHz) Reference No.: WTX20X09063204W-1 Page 13 of 15 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Radiation Emission Test Setup (30MHz to 1GHz) Radiation Emission Test Setup (1GHz to 18GHz) Reference No.: WTX20X09063204W-1 Page 14 of 15 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Radiation Emission Test Setup (Above 18GHz)