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2AZL3-STM226514KYDux guard keyboard trackpad BT (iPad Air 11 M4 & M3 & M2 & 5th & 4th gen) ANSI

Chun Lam Group (International) Limited
Dux guard keyboard trackpad BT (iPad Air 11 M4 & M3 & M2 & 5th & 4th gen) ANSI - FCC ID 2AZL3-STM226514KY - Chun Lam Group (International) Limited
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Application Details

Equipment Class
DTS - Digital Transmission System
Date of Grant
Jul 08, 2026
Application Purpose
Original Equipment
Equipment Note
Dux guard keyboard trackpad BT (iPad Air 11 M4 & M3 & M2 & 5th & 4th gen) ANSI
Frequency Range
2402.00000000 - 2480.00000000
Company
Chun Lam Group (International) Limited
Country
China

Documents & Files

Select a file to view

Users Manual

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Attestation Statements

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Cover Letter(s)

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External Photos

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ID Label/Location Info

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Internal Photos

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RF Exposure Info

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Test Report

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Test Setup Photos

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

Cover Letter(s)

Chun Lam Group (International) Limited FCC ID: 2AZL3-STM226514KY Date: 6/30/2026 Subject: authorization for adding family models To whom it May concern, Statement We confirm the product Dux guard keyboard trackpad BT with models stm-226-514KY-01, stm-226-546KY-01 are same in the Schematic, PCB layout, Operation description, BOM and Antenna. Only the model name is different. Yours sincerely, signature Sunny Wan Project assistant Chun Lam Group (International) Limited

External Photos

Appendix-stm-226-514KY-01-Photos Reference No.: WTF26D06157289W Page 3 of 11 2. Photographs –Constructional Details 2.1. EUT – External View Model stm-226-514KY-01 FCC ID: 2AZL3-STM226514KY Appendix-stm-226-514KY-01-Photos Reference No.: WTF26D06157289W Page 4 of 11 Appendix-stm-226-514KY-01-Photos Reference No.: WTF26D06157289W Page 5 of 11 Appendix-stm-226-514KY-01-Photos Reference No.: WTF26D06157289W Page 6 of 11

ID Label/Location Info

Label: Model: stm‐226‐514KY‐01 Input: 5V⎓200mA FCC ID: 2AZL3‐STM226514KY Label Location

Internal Photos

Appendix-stm-226-514KY-01-Photos Reference No.: WTF26D06157289W Page 7 of 11 2.2. EUT – Internal View Model stm-226-514KY-01 FCC ID: 2AZL3-STM226514KY Appendix-stm-226-514KY-01-Photos Reference No.: WTF26D06157289W Page 8 of 11 Appendix-stm-226-514KY-01-Photos Reference No.: WTF26D06157289W Page 9 of 11 Appendix-stm-226-514KY-01-Photos Reference No.: WTF26D06157289W Page 10 of 11 ANT Appendix-stm-226-514KY-01-Photos Reference No.: WTF26D06157289W Page 11 of 11 ======End======

RF Exposure Info

Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Page 1 of 7 TEST REPORT Referen ce No. .................... : WTF26D06157289W003 FCC ID ................................ : 2AZL3-STM226514KY Applicant ............................ : Chun Lam Group (International) Limited Address .............................. : 8 Zhen Yuan Road, Caiwu, Wusha, Chang An, Dongguan City, Guangdong, China. Manufacturer ..................... : Chun Lam Group (International) Limited Address .............................. : 8 Zhen Yuan Road, Caiwu, Wusha, Chang An, Dongguan City, Guangdong, China. Product ............................... : Dux guard keyboard trackpad BT (iPad Air 11 M4 & M3 & M2 & 5th & 4th gen) ANSI Model(s). ............................ : stm-226-514KY-01, stm-226-546KY-01 Standards........................... : 47CFR FCC Part 2 Subpart J Section 2.1093 Date of Receipt Sample .... : 2026-06-08 Date of Test ....................... : 2026-06-13 to 2026-06-24 Date of Issue ...................... : 2026-06-30 Test Result ......................... : Pass Remarks: The re sults shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group Co., Ltd. Address: No. 77, Houjie Section, Guantai Road, Houjie Town, Dongguan City, Guangdong, China Tel: +86-769-2267 6998 Fax: +86-769-2267 6828 Compiled by: Approved by: Estel Qian / Project Engineer Deval Qin / Designated Reviewer Reference No.: WTF26D06157289W003 Page 2 of 7 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 2. Contents Page 1 COVER PAGE ........................................................................................................................................... 1 2. CONTENTS ............................................................................................................................................... 2 3. REVISION HISTORY ................................................................................................................................. 3 4. GENERAL INFORMATION ....................................................................................................................... 4 4.1. GENERAL DESCRIPTION OF E.U.T.................................................................................................... 4 4.2. DETAILS OF E.U.T. ......................................................................................................................... 4 4.3. TEST FACILITY ................................................................................................................................ 5 4.4. SUBCONTRACTED ........................................................................................................................... 5 4.5. ABNORMALITIES FROM STANDARD CONDITIONS ................................................................................ 5 5. TEST SUMMARY ...................................................................................................................................... 6 6. RF EXPOSURE ......................................................................................................................................... 7 6.1. PROCEDURES AND REQUIREMENTS ................................................................................................. 7 6.2. CALCULATION METHOD ................................................................................................................... 7 6.3. TEST RESULT ................................................................................................................................. 7 Reference No.: WTF26D06157289W003 Page 3 of 7 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 3. Revision History Test Report No. Date of Receipt Sample Date of Test Date of Issue Purpose CommentApproved WTF26D06157289W003 2026-06-08 2026-06-13 to 2026-06-24 2026-06-30Original - Valid Reference No.: WTF26D06157289W003 Page 4 of 7 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 4. General Information 4.1. General Description of E.U.T. Product: Dux guard keyboard trackpad BT (iPad Air 11 M4 & M3 & M2 & 5th & 4th gen) ANSI Model(s): stm-226-514KY-01, stm-226-546KY-01 Model Description: Only the model name is different. The model stm-226-514KY-01 was tested in this report. Test Sample No.: 1-1/1 Bluetooth Version: V5.0 Hardware Version: V1.0 Software Version: V1.0 4.2. Details of E.U.T. Operation Frequency: 2402~2480MHz Max. RF output power: LE 1M: 1.27dBm, LE 2M: 1.24dBm Type of Modulation: GFSK Antenna installation: PCB Antenna Antenna Gain: 1.87dBi Note: #: The antenna gain is provided by the applicant, and the applicant should be responsible for its authenticity, WALTEK lab has not verified the authenticity of its information. Ratings: Input: 5V⎓200mA Battery: DC 3.7V, 210mAh Reference No.: WTF26D06157289W003 Page 5 of 7 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 4.3. Test Facility The test facility has a test site registered with the following organizations: ISED CAB identifier: CN0013. Test Firm Registration No.: 7760A. Waltek Testing Group Co., Ltd. Has been registered and fully described in a report filed with the Industry Canada. The acceptance letter from the Industry Canada is maintained in our files. Registration number 7760A, October 15, 2016. FCC Designation No.: CN1201. Test Firm Registration No.: 523476. Waltek Testing Group Co., Ltd. EMC Laboratory has been registered and fully described in a report filed with the (FCC) Federal Communications Commission. The acceptance letter from the FCC is maintained in our files. Registration number 523476, September 10, 2019. 4.4. Subcontracted Whether parts of tests for the product have been subcontracted to other labs: Yes No If Yes, list the related test items and lab information…

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Test Report

Waltek Testing Group Co., Ltd. http://www.waltek.com.cn Page 1 of 46 TEST REPORT Referen ce No. .................... : WTF26D06157289W002 FCC ID ................................ : 2AZL3-STM226514KY Applicant ............................ : Chun Lam Group (International) Limited Address .............................. : 8 Zhen Yuan Road, Caiwu, Wusha, Chang An, Dongguan City, Guangdong, China. Manufacturer ..................... : Chun Lam Group (International) Limited Address .............................. : 8 Zhen Yuan Road, Caiwu, Wusha, Chang An, Dongguan City, Guangdong, China. Product ............................... : Dux guard keyboard trackpad BT (iPad Air 11 M4 & M3 & M2 & 5th & 4th gen) ANSI Model(s). ............................ : stm-226-514KY-01, stm-226-546KY-01 Standards........................... : FCC 47CFR Part 15.247 Date of Receipt sample .... : 2026-06-08 Date of Test ....................... : 2026-06-13 to 2026-06-24 Date of Issue ...................... : 2026-06-30 Test Result ......................... : Pass Remarks: The re sults shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group Co., Ltd. Address: No. 77, Houjie Section, Guantai Road, Houjie Town, Dongguan City, Guangdong, China Tel: +86-769-2267 6998 Fax: +86-769-2267 6828 Compiled by: Approved by: Estel Qian / Project Engineer Deval Qin / Designated Reviewer Reference No.: WTF26D06157289W002 Page 2 of 46 Waltek Testing Group Co., Ltd. http://www.waltek.com.cn 2 Contents Page 1 COVER PAGE ........................................................................................................................................... 1 2 CONTENTS ............................................................................................................................................... 2 3 REVISION HISTORY ................................................................................................................................. 4 4 GENERAL INFORMATION ....................................................................................................................... 5 4.1 General Description of E.U.T. ....................................................................................................... 5 4.2 Details of E.U.T. ............................................................................................................................ 5 4.3 Channel List .................................................................................................................................. 6 4.4 Test Facility ................................................................................................................................... 7 4.5 Subcontracted ............................................................................................................................... 7 4.6 Abnormalities from Standard Conditions ...................................................................................... 7 4.7 Test Mode ..................................................................................................................................... 7 5 TEST SUMMARY ...................................................................................................................................... 8 6 EQUIPMENT USED DURING TEST ......................................................................................................... 9 6.1 Equipments List ............................................................................................................................ 9 6.2 Description of Support Units ....................................................................................................... 10 6.3 Measurement Uncertainty .......................................................................................................... 10 6.4 Test Equipment Calibration ........................................................................................................ 10 7 CONDUCTED EMISSION ....................................................................................................................... 11 7.1 E.U.T. Operation ......................................................................................................................... 11 7.2 EUT Setup .................................................................................................................................. 11 7.3 Measurement Description ........................................................................................................... 11 7.4 Conducted Emission Test Result ............................................................................................... 12 8 RADIATED EMISSIONS ......................................................................................................................... 14 8.1 EUT Operation ............................................................................................................................ 14 8.2 Test Setup .................................................................................................................................. 15 8.3 Spectrum Analyzer Setup ........................................................................................................... 16 8.4 Test Procedure ........................................................................................................................... 17 8.5 Corrected Amplitude & Margin Calculation ................................................................................ 17 8.6 Summary of Test Results ........................................................................................................... 18 9 CONDUCTED SPURIOUS EMISSIONS ................................................…

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Test Report

UCI CENTER FOR RF DESI GN AND CHARACTERIZATION ANT Specification UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Tested Products.• Antenna 1: integrated antenna. • Frequency = 2.402GHz.• Frequency = 2.441GHz.• Frequency = 2.480GHz. UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Coordinate System Reference: Antenna 1. Top view Side view Z Y X Front view Front viewRear vie w SM A connector X Z Y UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Radiation pattern: Antenna 1. XZ Plane at f = 2.402GHz Co-cross polarization field (dBi) Solid line: vertical polarizationDash line: horizontal polarization Total field (dBi) 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 -15 -20 -20 -25 -25 -30 -30 -35 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Radiation pattern: Antenna 1. YZ Plane at f = 2.402GHz Co-cross polarization field (dBi) Solid line: vertical polarizationDash line: horizontal polarization Total field (dBi) 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 -15 -20 -20 -25 -25 -30 -30 -35 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Radiation pattern: Antenna 1. XY Plane at f = 2.402GHz Co-cross polarization field (dBi) Solid line: vertical polarizationDash line: horizontal polarization Total field (dBi) 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 -15 -20 -20 -25 -25 -30 -30 -35 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Radiation pattern: Antenna 1. XZ Plane at f = 2.441GHz Co-cross polarization field (dBi) Solid line: vertical polarizationDash line: horizontal polarization Total field (dBi) 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 -15 -20 -20 -25 -25 -30 -30 -35 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Radiation pattern: Antenna 1. YZ Plane at f = 2.441GHz Co-cross polarization field (dBi) Solid line: vertical polarizationDash line: horizontal polarization Total field (dBi) 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 -15 -20 -20 -25 -25 -30 -30 -35 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Radiation pattern: Antenna 1. XY Plane at f = 2.441GHz Co-cross polarization field (dBi) Solid line: vertical polarizationDash line: horizontal polarization Total field (dBi) 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 -15 -20 -20 -25 -25 -30 -30 -35 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Radiation pattern: Antenna 1. XZ Plane at f = 2.480GHz Co-cross polarization field (dBi) Solid line: vertical polarizationDash line: horizontal polarization Total field (dBi) 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 -15 -20 -20 -25 -25 -30 -30 -35 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Radiation pattern: Antenna 1. YZ Plane at f = 2.480GHz Co-cross polarization field (dBi) Solid line: vertical polarizationDash line: horizontal polarization Total field (dBi) 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 -15 -20 -20 -25 -25 -30 -30 -35 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Radiation pattern: Antenna 1. XY Plane at f = 2.480GHz Co-cross polarization field (dBi) Solid line: vertical polarizationDash line: horizontal polarization Total field (dBi) 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 -15 -20 -20 -25 -25 -30 -30 -35 0 45 90 135 180 225 270 315 0 0 -5 -5 -10 -10 -15 UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Return Loss: Antenna 1 BW(-10dB) ¡ 13.48% 2 2.2 2.4 2.6 2.8 3 Frequency (GHz) -16-14-12-10 -8-6-4-2 R e t u r n L o s s ( d B ) UCI CENTER FOR RF DESI GN AND CHARACTERIZATION Measurements summary Frequency (GHz) Plane Return Loss (dB) Polarization Gain max. (dBi) θ for Gain max. φ for Gain max. Antenna 1 2.402 XZ -10.90 Vertical -7.8 290 2.402 XZ -10.90 Horizontal 0.786 182 2.402 YZ -10.90 Vertical 1.21 226 2.402 YZ -10.90 Horizontal -7.75 10 2.402 XY -10.90 Vertical -15.4 20 2.402 XY -10.90 Horizontal 0.93 180 2.441 XZ -12.20 Vertical -7.36 318 2.441 XZ -12.20 Horizontal 1.32 180 2.441 YZ -12.20 Vertical 0.981 204 2.441 YZ -12.20 Horizontal -8.23 24 2.441 XY -12.20 Vertical -14.1 -14 2.441 XY -12.20 Horizontal 1.74 180 2.48 XZ -13.80 Vertical -7.95 312 2.48 XZ -13.80 Horizontal 1.81 186 2.48 YZ -13.80 Vertical 0.204 214 2.48 YZ -13.80 Horizontal -8.38 8 2.48 XY -13.80 Vertical -15.8 12 2.48 XY -13.80 Horizontal 1.87 180

Test Setup Photos

Appendix-stm-226-514KY-01-Photos Reference No.: WTF26D06157289W Page 1 of 11 1. Test Setup photos Model stm-226-514KY-01 FCC ID: 2AZL3-STM226514KY 1.1 Photograph – Conducted Emission For Conducted Emission Test Site 1# 1.2 Photograph – Radiated Emissions For 9kHz-30MHz Test Site 2# Appendix-stm-226-514KY-01-Photos Reference No.: WTF26D06157289W Page 2 of 11 For 30MHz-1000MHz Test Site 2# For Above 1GHz Test Site 1#

Contact Information

Applicant

Sunny Wan(Project assistant)
[email protected]Fax: 0769 8624 8333

Technical Contact

FCC US Agent, LLCTim Payne
[email protected]

3722 Illinois Avenue, · Saint Charles, Illinois, 60174 · United States

Test Firm

WALTEK TESTING GROUP CO., LTD.Joy Zhou
[email protected]

Technical Specifications

#Rule PartsFrequency RangePower Output
115C2.40 GHz - 2.48 GHz1.30 mW
Confidentiality
Long Term
Grant Notes
Output power listed is conducted.

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