2BBL2-M16Recorders

shenzhen Berlin Electronic Co., Ltd (December 30, 2025) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: Attestation Statements Part 2.911(d)(5)(i) request for FCC ID: 2BBL2-M16 [shenzhen Berlin Electronic Co., Ltd] (“the applicant”) certifies that the equipment for which authorization is sought is not “covered” equipment prohibited from receiving an equipment authorization pursuant to section 2.903 of the FCC rules. We also certify that, as of the date of the filing of the application, the equipment does not utilize cyber-security or anti-virus software from Kaspersky Lab, Inc, or any of its successors and assignees, which is also on the “covered list”. Sincerely, (Applicant signature) (Applicant printed name) xinhui Nie shenzhen Berlin Electronic Co., Ltd (December 30, 2025) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: Attestation Statements Part 2.911(d)(5)(ii) request for FCC ID: 2BBL2-M16 [shenzhen Berlin Electronic Co., Ltd] (“the applicant”) certifies that, as of the date of the filing of the application, the applicant is not identified on the Covered List as an entity producing “covered” equipment. Sincerely, (Applicant signature) (Applicant printed name) xinhui Nie

shenzhen Berlin Electronic Co., Ltd Federal Communications Commission Authorization and Evaluation Division Equipment Authorization Branch 7435 Oakland Mills Road Columbia, MD 21046 [December 30, 2025] U.S. Agent Designation [shenzhen Berlin Electronic Co., Ltd] acknowledges their consent for the following contact located in the United States to act as their agent for service of process for the equipment for which authorization is sought FCC ID: 2BBL2-M16 Name and company of U.S. agent: [GLOCERTS TECHNOLOGY INC] Physical U.S. address of agent: [19784 SUNKISSED RIDGE DR, RIVERSIDE, CA 92507] FRN of U.S. agent: [0036339737] Email address of U.S. agent: [[email protected]] Telephone of U.S.agent: (626) 588-8039 [GLOCERTS TECHNOLOGY INC] acknowledges their obligation to accept service of process on behalf of [shenzhen Berlin Electronic Co., Ltd]. [shenzhen Berlin Electronic Co., Ltd] with the FRN [0033872052] accepts its obligation to maintain an agent for service of process in the United States for no less than 1 year after either the grantee has permanently terminated all marketing and importation of the applicable equipment within the U.S., or the conclusion of any Commission-related administrative or judicial proceeding involving the equipment, whichever is later. By signing this form, we confirm the above and that we are aware of the application requirements listed under § 2.911(d)(7). The information provided in this letter is based on the referenced rule parts of Title 47 of the CFR as well as KDB 986446 D01. Sincerely, Signature Signature [xinhui Nie] [Huiying Fan] [Quality manager] [Director] [shenzhen Berlin Electronic Co., Ltd] [GLOCERTS TECHNOLOGY INC]

shenzhen Berlin Electronic Co., Ltd (December 30, 2025) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: CONFIDENTIALITY REQUEST FOR (Recorders / M16 / FCC ID: 2BBL2-M16) To Whom It May Concern: This letter serves as an official request for confidentiality under sections 0.457 and 0.459 of CFR 47. We have requested that the Exhibits Long-Term Confidentiality Short-Term Confidentiality NOTE 2 ID Label/Location No No Attestation Statement No No External Photos No ☐ Block Diagram ☒ ☐ Schematics ☒ ☐ Test Report No No Test Setup Photos No ☐ User’s Manual ☐ NOTE 1 ☒ Internal Photos ☐ NOTE 1 ☒ Parts List / Tune Up ☐ ☐ RF Exposure Info No No Operational Description ☒ ☐ Cover Letter(s) No No SDR Software / Security Info ☐ No required to be submitted with this application be permanently withheld from public review. Above mentioned document contains detailed system and equipment description are considered as proprietary information in operation of the equipment. The public disclosure of above documents might be harmful to our company and would give competitor an unfair advantage in the market. Please contact me if there is any information you may need. Sincerely, Signature: Name: xinhui Nie Title: Quality manager

shenzhen Berlin Electronic Co., Ltd (December 30, 2025) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: LETTER OF AGENT AUTHORIZATION To Whom It May Concern: We, the undersigned, hereby authorize (Shenzhen CTB Testing Technology Co., Ltd.) to act on our behalf in all matters relating to application for equipment authorization, including the signing of all documents relating to these matters. We also hereby certify that no party to the application authorized hereunder is subject to the denial of benefits, including FCC benefits, pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C.853(a). This agreement expires one year from the current date. Sincerely, Signature: Name: xinhui Nie Title: Quality manager

Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 1 of 3 Model: M16 External Photos Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 2 of 3 Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 3 of 3

FCC ID LABEL: Label Location: FCC ID: 2BBL2-M16 Model No.: M16

Shenzhen CTB Testing Co., Ltd. FCC ID:2BBL2-M16 Portable device According to §15.247(e)(i) and §1.1307(b)(1), systems operating under the provisions of this section shall be operated in a manner that ensures that the public is not exposed to radio frequency energy level in excess of the Commission’s guidelines. According to KDB447498 D01 General RF Exposure Guidance V06 The 1-g SAR and 10-g SAR test exclusion thresholds for 100 MHz to 6 GHz at test separation distances ≤ 50 mm are determined by: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)]·[√f(GHZ)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where: • f(GHZ) is the RF channel transmit frequency in GHz • Power and distance are rounded to the nearest mW and mm before calculation • The result is rounded to one decimal place for comparison When the minimum test separation distance is < 5 mm, a distance of 5 mm is applied to determine SAR test exclusion. 2.4GWIFI: Modulation Channel Freq. (GHz) Conduct ed power (dBm) Conducte d power (mW) Tune-up power (dBm) Max tune-up power (dBm) Max tune-up power (mW) Distance (mm) Result calculatio n SAR Exclusion threshold SAR test exclusion 2.412 7.273 5.34 7±1 8.00 6.31 <5 1.95983 3.00 YES 2.437 7.597 5.75 7±1 8.00 6.31 <5 1.96996 3.00 YES 2.462 8.348 6.84 8±1 9.00 7.94 <5 2.49272 3.00 YES 2.412 7.564 5.71 7±1 8.00 6.31 <5 1.95983 3.00 YES 2.437 7.781 6.00 7±1 8.00 6.31 <5 1.96996 3.00 YES 2.462 7.268 5.33 7±1 8.00 6.31 <5 1.98004 3.00 YES 2.412 7.452 5.56 7±1 8.00 6.31 <5 1.95983 3.00 YES 2.437 7.724 5.92 7±1 8.00 6.31 <5 1.96996 3.00 YES 2.462 7.242 5.30 7±1 8.00 6.31 <5 1.98004 3.00 YES 2.422 7.813 6.04 7±1 8.00 6.31 <5 1.96389 3.00 YES 2.437 7.57 5.71 7±1 8.00 6.31 <5 1.96996 3.00 YES 2.452 8.038 6.37 8±1 9.00 7.94 <5 2.48766 3.00 YES 802.11b 802.11g 802.11n( HT20) 802.11n( HT40) Conclusion: For the max result : 2.49272≤ FCC Limit 3.0 for 1g SAR.

Approval sheet Page 1 of 9 ASC_RFANT3216120A5T_V05 Apr. 2010 MULTILAYER CERAMIC ANTENNA RFANT Series – RoHS Compliance 2.4 GHz ISM Band Working Frequency P/N: RFANT3216120A5T Series *Contents in this sheet are subject to change without prior notice. Approval sheet Page 2 of 9 ASC_RFANT3216120A5T_V05 Apr. 2010 FEATURES 1. Surface Mounted Devices with a small dimension of 3.2 X 1.6 X1.2 mm 3 meet future miniaturization trend. 2. LTCC process 3. High stability in Temperature / Humidity Change APPLICATIONS 1. 2.4GHz ISM band RF applications 2. Bluetooth, Wireless, HomeRF CONSTRUCTION DIMENSIONS Figure Symbol Dimension (mm) L 3.20 ± 0.20 W 1.60 ± 0.10 T 1.20 ± 0.10 a 0.25 ± 0.15 1. Feeding 2. Identification Mark 3. Soldering terminal W T E a a Approval sheet Page 3 of 9 ASC_RFANT3216120A5T_V05 Apr. 2010 Ground Soldering Pad 50 ΩTransmission Line Unit : mm 19.4 Empty Area 6x6 mm 50Ω ΩΩ ΩFeed line 45mm 20mm Series 1 Series 2 Ground Soldering Pad 50 ΩTransmission Line Unit : mm 19.4 Empty Area 6x6 mm 50Ω ΩΩ ΩFeed line 45mm 20mm Series 1 Series 2 ELECTRICAL CHARACTERISTICS RFANT3216120A5T Specification Working Frequency Range 2450 ± 50 MHz Fc (GHz) 2.9 Gain (dBi) 2 (Typical) VSWR 2 max. Series 1 6.8nH Matching component value Series 2 - Operation Temperature -40 ̊C ~ +85 ̊C * This frequency must be adjusted to 2.45GHz with matching circuit. SOLDER LAND PATTERN DESIGN Figure 1.66 0.8 2.3 1.63 6 3.43 1.6 6 1.36 0.36 0.88 0.34 1.88 1.83 0.8 0.54 1.66 0.8 2.3 1.63 6 3.43 1.6 6 1.36 0.36 0.88 0.34 1.88 1.83 0.8 0.54 Approval sheet Page 4 of 9 ASC_RFANT3216120A5T_V05 Apr. 2010 Antenna on Test Board ( Thickness 1.2mm) Antenna S11 on Test Board Antenna VSWR on Test Board E 0.8mm 1.6mm 19.4mm Empty Area 6x6 mm 50Ω ΩΩ ΩFeed line 1.66mm GROUND 0.8mm 1.6mm 19.4mm Empty Area 6x6 mm 50Ω ΩΩ ΩFeed line 1.66mm GROUND 0.8mm 1.6mm 19.4mm Empty Area 6x6 mm 50Ω ΩΩ ΩFeed line 1.66mm GROUND 0.8mm 1.6mm 19.4mm Empty Area 6x6 mm 50Ω ΩΩ ΩFeed line 1.66mm GROUND E Approval sheet Page 5 of 9 ASC_RFANT3216120A5T_V05 Apr. 2010 RADIATION PATTERN Radiation Pattern and Gain were dependent on measurement board design. The specification of RFANT3216120A5T antenna was measured based on the PCB size and installation position as shown in the below figure Test Board Vertical Horizontal Y - Z Plane Average Gain= 0.891 dBi Peak Gain = 2.12dBi Average Gain = 0.64 dBi Peak Gain= -6.07dBi Average Gain=-11.62dBi X - Z Plane Average Gain= -1.846 dBi Peak Gain= -7.78 dBi Average Gain= -11.97dBi Peak Gain= 0.96 dBi Average Gain= -2.29 dBi X - Y Plane Average Gain= -2.556 dBi Peak Gain= -9.41 dBi Average Gain= -15.54dBi Peak Gain= 1.40 dBi Average Gain= -2.78 dBi GROUND X Y Z GROUND X Y Z X Y Z Approval sheet Page 6 of 9 ASC_RFANT3216120A5T_V05 Apr. 2010 RELIABILITY TEST Test item Test condition / Test method Specification Solderability JIS C 0050-4.6 JESD22-B102D *Solder bath temperature：235 ± 5°C *Immersion time：2 ± 0.5 sec *Solder：Sn3Ag0.5Cu for lead-free At least 95% of a surface of each terminal electrode must be covered by fresh solder. Leaching (Resistance to dissolution of metallization) IEC 60068-2-58 *Solder bath temperature：260 ± 5°C *Leaching immersion time：30 ± 0.5 sec *Solder : SN63A Loss of metallization on the edges of each electrode shall not exceed 25%. Resistance to soldering heat JIS C 0050-5.4 *Preheating temperature：120~150°C, 1 minute. *Solder temperature：270±5°C *Immersion time：10±1 sec *Solder：Sn3Ag0.5Cu for lead-free Measurement to be made after keeping at room temperature for 24±2 hrs No mechanical damage. Samples shall satisfy electrical specification after test. Loss of metallization on the edges of each electrode shall not exceed 25%. Drop Test JIS C 0044 *Height：75 cm *Test Surface：Rigid surface of concrete or steel. *Times：6 surfaces for each units；2 times for each side. No mechanical damage. Samples shall satisfy electrical specification after test. Adhesive Strength of Termination JIS C 0051- 7.4.3 *Pressurizing force： 5N(≦0603)；10N(>0603) *Test time：10±1 sec No remarkable damage or removal of the termination. Bending test JIS C 0051- 7.4.1 The middle part of substrate shall be pressurized by means of the pressurizing rod at a rate of about 1 mm/s per second until the deflection becomes 1mm/s and then pressure shall be maintained for 5±1 sec. Measurement to be made after keeping at room temperature for 24±2 hours No mechanical damage. Samples shall satisfy electrical specification after test. Approval sheet Page 7 of 9 ASC_RFANT3216120A5T_V05 Apr. 2010 Temperature cycle JIS C 0025 1. 30±3 minutes at -40°C±3°C, 2. 10~15 minutes at room temperature, 3. 30±3 minutes at +85°C±3°C, 4. 10~15 minutes at room temperature, Total 100 continuous cycles Measurement to be made after keeping at room temperature for 24±2 hrs No mechanical damage. Samples shall satisfy electrical specification after test. Vibration JIS C 0040 *Frequency：10Hz~55Hz~10Hz(1min) *Total amplitude：1.5mm *Test times：6hrs.(Two hrs each in three mutually perpendicular directions) No mechanical damage. Samples shall satisfy electrical specification after test. High temperature JIS C 0021 *Temperature：85°C±2°C *Test duration：1000+24/-0 hours Measurement to be made after keeping at room temperature for 24±2 hrs No mechanical damage. Samples shall satisfy electrical specification after test. Humidity (steady conditions) JIS C 0022 *Humidity：90% to 95% R.H. *Temperature：40±2°C *Time：1000+24/-0 hrs. Measurement to be made after keeping at room temperature for 24±2 hrs ※ 500hrs measuring the first data then 1000hrs data No mechanical damage. Samples shall satisfy electrical specification after test. Low temperature JIS C 0020 *Temperature：-40°C±2°C *Test duration：1000+24/-0 hours Measurement to be made after keeping at room temperature for 24±2 hrs No mechanical damage. Samples shall satisfy electrical specification after test. Approval sheet Page 8 of 9 ASC_RFANT3216120A5T_V05 Apr. 2010 SOLDERING CONDITION Typical examples of soldering processes that provide …

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Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 1 of 64 TEST REPORT Compiled by: Reviewed by: Approved by: Kai Chen Martin Feng Bin Mei / Director Note: If there is any objection to the inspection results in this report, please submit a written report to the company within 15 days from the date of receiving the report. The test report is effective only with both signature and specialized stamp. This result(s) shown in this report refer only to the sample(s) tested. Without written approval of Shenzhen CTB Testing Technology Co., Ltd. this report can’t be reproduced except in full. The tested sample(s) and the sample information are provided by the client. “*” indicates the testing items were fulfilled by subcontracted lab. “#” indicates the items are not in CNAS accreditation scope. Test item description: Recorders FCC ID: 2BBL2-M16 Trademark(s): N/A Model/Type reference: M16 Applicant’s name: shenzhen Berlin Electronic Co., Ltd Address: 2nd Floor, Building B, No. 10, East District, Shangxue Technology Industrial City, Xinxue Community, Bantian Street, Longgang District, Shenzhen Manufacturer: shenzhen Berlin Electronic Co., Ltd Address: 2nd Floor, Building B, No. 10, East District, Shangxue Technology Industrial City, Xinxue Community, Bantian Street, Longgang District, Shenzhen Prepared By: Shenzhen CTB Testing Technology Co., Ltd. Address: 1&2/F., Building A, No.26, Xinhe Road, Xinqiao, Xinqiao Street, Bao'an District, Shenzhen, Guangdong, China Sample Received Date: Dec. 04, 2025 Sample tested Date: Dec. 04, 2025 to Dec. 24, 2025 Issue Date: Dec. 24, 2025 Report No.: CTB25120409701RF01 Test Standards FCC CFR Title 47 Part 15 Subpart C Section 15.247 ANSI C63.10:2020 Test Results PASS Remark: This is WIFI-2.4GHz band radio test report. Shenzhen CTB Testing Technology Co., Ltd. Report No.: CTB25120409701RF01 Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 2 of 64 TABLE OF CONTENT Test Report Declaration Page 1. VERSION ........................................................................................................................................................ 4 2. TEST SUMMARY .......................................................................................................................................... 5 3. MEASUREMENT UNCERTAINTY............................................................................................................. 6 4. PRODUCT INFORMATION AND TEST SETUP ..................................................................................... 7 4.1 Product Information .................................................................................................................................................... 7 4.2 Test Setup Configuration .......................................................................................................................................... 7 4.3 Support Equipment ..................................................................................................................................................... 7 4.4 Channel List .................................................................................................................................................................. 8 4.5 Test Mode ...................................................................................................................................................................... 8 4.6 Test Environment ........................................................................................................................................................ 8 5. TEST FACILITY AND TEST INSTRUMENT USED ................................................................................ 9 5.1 Test Facility ................................................................................................................................................................... 9 5.2 Test Instrument Used ................................................................................................................................................. 9 6. AC POWER LINE CONDUCTED EMISSION .......................................................................................... 12 6.1 Block Diagram Of Test Setup ................................................................................................................................ 12 6.2 Limit ............................................................................................................................................................................... 12 6.3 Test procedure ........................................................................................................................................................... 12 6.4 Test Result .................................................................................................................................................................. 14 7. RADIATED SPURIOUS EMISSION ........................................................................................................ 16 7.1 Block Diagram Of Test Setup ................................................................................................................................ 16 7.2 Limit ............................................................................................................................................................................... 16 7.3 Test procedure ........................................................................................................................................................... 17 7.4 Test Result .................................................................................................................................................................. 18 8. BAND EDGE AND RF COUNDUCTED SPURIOUS EMISSIONS..................................................... 40 8.1 Block Diagram Of Test Setup ...........................................................................…

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Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 1 of 2 Model: M16 Radiated Emission Below 1G Above 1G Shenzhen CTB Testing Technology Co., Ltd. Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 2 of 2 Conducted emissions