2BEDU-TOPV8V8 Bluetooth earphones

ShenzhenDiyageTechnologyCo.,Ltd 2.911(d)(5)(i)EquipmentTypeAttestationv1.2 Section2.911(d)(5)(i)Certification–EquipmentType Companyname:ShenzhenDiyageTechnologyCo.,Ltd Address:No.9HaoshiStreet,ShajingShangxingFourthIndustrialZone,Bao’anDistrict,Shenzhen China ProductName:V8Bluetoothearphones FCCID:2BEDU-TOPV8 Model(s):TOPV8 2.911(d)(5)(i)EquipmentType We,[ShenzhenDiyageTechnologyCo.,Ltd](“theapplicant”)certifythattheequipmentforwhich authorizationissoughtthroughcertificationisnot:  Prohibitedfromreceivinganequipmentauthorizationpursuantto§2.903;oftheFCCrules.  Identifiedasanequipmenttypeinthe“CoveredList” NOTE1 Yourssincerely, Name:ChangqingLuoDate:2024.1.5 TitleandCompanyname:Manager/ShenzhenDiyageTechnologyCo.,Ltd NOTE1 “CoveredList”;istheListofEquipmentandServicesCoveredBySection2ofTheSecureNetworksAct,availableat https://www.fcc.gov/supplychain/coveredlist References; 1)986446D01CoveredEquipmentv01 https://apps.fcc.gov/oetcf/kdb/forms/FTSSearchResultPage.cfm?switch=P&id=325672 2)FederalRegisterdocument2022-28263publishedon02/06/23 https://www.federalregister.gov/documents/2023/02/06/2022-28263/protecting-against-national-security-threats-to-the-com munications-supply-chain-through-the

ShenzhenDiyageTechnologyCo.,Ltd 2.911(d)(5)(ii)ApplicantAttestationv1.3 Section2.911(d)(5)(ii)Certification–Applicant(CoveredList) Companyname:ShenzhenDiyageTechnologyCo.,Ltd Address:No.9HaoshiStreet,ShajingShangxingFourthIndustrialZone,Bao’anDistrict,Shenzhen China ProductName:V8Bluetoothearphones FCCID:2BEDU-TOPV8 Model(s):TOPV8 2.911(d)(5)(ii)Applicantfiling We,[ShenzhenDiyageTechnologyCo.,Ltd](“theapplicant”)certifythat,asofthedateofthefilingof theapplication,theapplicantisnotidentified NOTE1 onthe“CoveredList” NOTE2 ,established pursuantto§1.50002ofthischapter,asanentityproducingcoveredcommunicationsequipment. Yourssincerely, Name:ChangqingLuoDate:2024.1.5 TitleandCompanyname:Manager/ShenzhenDiyageTechnologyCo.,Ltd NOTE1 Deleteoptionnotapplicabletothisapplication. NOTE2 “CoveredList”;istheListofEquipmentandServicesCoveredBySection2ofTheSecureNetworksAct,availableat https://www.fcc.gov/supplychain/coveredlist References; 1)986446D01CoveredEquipmentv01 https://apps.fcc.gov/oetcf/kdb/forms/FTSSearchResultPage.cfm?switch=P&id=325672 2)FederalRegisterdocument2022-28263publishedon02/06/23 https://www.federalregister.gov/documents/2023/02/06/2022-28263/protecting-against-national-security-threats-to-the-com munications-supply-chain-through-the

2.911 (d)(7)USA Agent v1.5 Shenzhen Diyage Technology Co., Ltd Section 2.9 11(d)(7) USA Agent for Service of Process Company name: Shenzhen Diyage Technology Co., Ltd Address: No. 9 Haoshi Street, Shajing Shangxing Fourth Industrial Zone, Bao’an District, Shenzhen, China. Product Name: V8 Bluetooth earphones FCC ID:2BEDU-TOPV8 Model(s): TOP V8 2.911(d)(7) USA Designated Agent for Service of Process We, [Shenzhen Diyage Technology Co., Ltd] (“the applicant”) designate [GSS SERVICE INC] NOTE1 for the purpose of accepting service of process on behalf of the applicant. Applicant consent: We acknowledge our consent to accept service of process in the United States for matters related to the applicable equipment, and at the physical U.S. address and email address of the designated agent and acknowledge our acceptance of our obligation to maintain an agent for service of process in the United States for no less than one year after either we the grantee have permanently terminated all marketing and importation of the applicable equipment within the U.S., or at the conclusion of any Commission-related administrative or judicial proceeding involving the equipment, whichever is later. Agent obligation: We acknowledge our obligation to accept service of process in the United States for matters related to the applicable equipment at our physical U.S. address and email address for no less than one year after either the grantee has permanently terminated all marketing and importation of the applicable equipment within the U.S., or at the conclusion of any Commission-related administrative or judicial proceeding involving the equipment, whichever is later. USA Agent Company name: GSS SERVICE INC USA Address: 6547 N Academy Blvd #2266 Colorado Springs Co 80918 USA FRN Number: 0033402082 Contact Name: Michoux Logan Telephone No: 001-949-2990192 or 001-515-7158284 Email: [email protected] Applicant Company name: Shenzhen Diyage Technology Co., Ltd Address: No. 9 Haoshi Street, Shajing Shangxing Fourth Industrial Zone, Bao’an District, Shenzhen, China. Grantee FRN Number: 0034698852 FCC Grantee Code: 2BEDU Contact Name: Changqing Luo Telephone No: 13428693948 Email: [email protected] ShenzhenDiyageTechnologyCo., Ltd 2.911(d)(7)USAAgentv1.5 Signature: Title: Signature: Title:Manager Date:Date: 2024-01-04 NOTE1: An applicantlocatedin the UnitedStatesmay designateitself as the agent for service of process. Reference;FederalRegisterdocument2022-28263publishedon 02/06/23 https://www.federalregister.gov/documents/2023/02/06/2022-28263/protecting-against-nation al-security-threats-to-the-communications-supply-chain-through-the

ShenzhenDiyageTechnologyCo.,Ltd AgentAuthorization Company:ShenzhenDiyageTechnologyCo.,Ltd Address:No.9HaoshiStreet,ShajingShangxingFourthIndustrialZone,Bao’anDistrict, ShenzhenChina ProductName:V8Bluetoothearphones ModelNumber(s):TOPV8 ProductDescription:V8Bluetoothearphones WeauthorizeMiCOMLabsInc.,575BoulderCourt,Pleasanton,California94566,USA, toactonourbehalfonallmattersconcerningthecertificationofabovenamed equipment. WedeclarethatMiCOMLabsInc.isallowedtoforwardallinformationrelatedtothe approvalandcertificationofequipmenttotheregulatoryagenciesasrequiredandto discussanyissuesconcerningtheapprovalapplication.Anyandallactscarriedoutby MiCOMLabsonourbehalfshallhavethesameeffectasactsofourown. Signature:Date:2024.1.5 Name:ChangqingLuo Title:Manager Company:ShenzhenDiyageTechnologyCo.,Ltd

ShenzhenDiyageTechnologyCo.,Ltd OfficeofEngineeringTechnology FederalCommunicationsCommission 7435OaklandMillsRoad Columbia,MD21046 USA Date:2024.1.5 Subject;RequestforConfidentiality FCCID:2BEDU-TOPV8 ToWhomItMayConcern, PursuanttotheprovisionsoftheCommission’srulesTitle47Sections§0.457and§0.459,we arerequestingtheCommissiontowithholdthefollowingattachment(s)asconfidential documentsfrompublicdisclosureindefinitely. Thesedocumentscontaindetailedsystemandequipmentdescriptionsandareconsideredas proprietaryinformationinoperationoftheequipment.Thepublicdisclosureofthesedocuments mightbeharmfultoourcompanyandwouldgivecompetitorsanunfairadvantageinthemarket. SchematicDiagram BlockDiagram PartsList OperationalDescription Tune-upProcedure Inadditionaltoabovementioneddocuments,inordertocomplywiththemarketingregulations inTitle47CFR§2.803andtheimportationrulesinTitle47CFR§2.1204,whileensuringthat businesssensitiveinformationremainsconfidentialuntiltheactualmarketingofnewly authorizeddevices,werequestShortTermConfidentialityofthefollowingattachment(s); ExternalPhotos TestSetupPhotos InternalPhotos UserManual For45days,pursuanttoPublicNoticeDA04-1705. OR For180dayspursuanttoKDB726920D01. Itisourunderstandingthatallmeasurementtestreports,FCCIDlabelformatand correspondenceduringthecertificationreviewprocesscannotbegrantedasconfidential documentsandthisinformationwillbeavailableforpublicreviewoncethegrantofequipment authorizationisissued. Sincerely, Signature: Name:ChangqingLuo Title:Manager

EUT PHOTO(External Photos)

Label & label location 10mm*5mm FCC ID:2BEDU-TOPV8 Label location Label location

EUT PHOTO(Internal Photos) ※※※※※ END OF REPORT ※※※※※ ANT ANT

RF EXPOSURE EVALUATION METHOD FCC ID:2BEDU-TOPV8 Applicable standard： In accordance with FCC 47 CFR part 2 (2.1093) this device has been defined as a portable device which is defined as a transmitting device designed to be used so that the radiating structure(s) of the device is/are within 20 centimeters of the body of the user. Portable devices must be evaluated using the specified in FCC 47 CFR part 2 (2.1093) and ANSI/IEEEC95.1-1992. and had been tested in accordance with the measurement methods and procedures specified in IEEE 1528-2003. Per FCC KDB 447498 D01 v06, the 1-g and 10-g SAR test exclusion thresholds for 100 MHz to 6 GHz at test separation distances s 50 mm are determined by: SAR Test Exclusion Thresholds for 100 MHz – 6 GHz and ≤ 50 mm Approximate SAR Test Exclusion Power Thresholds at Selected Frequencies and Test Separation Distances are illustrated in the following Table. The 1-g and 10-g SAR test exclusion thresholds for 100 MHz to 6 GHz at test separation distances ≤ 50 mm are determined by: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] · [√f(GHz)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR,where f(GHz) is the RF channel transmit frequency in GHz Power and distance are rounded to the nearest mW and mm before calculation The result is rounded to one decimal place for comparison The test exclusions are applicable only when the minimum test separation distance is ≤ 50 mm and for transmission frequencies between 100 MHz and 6 GHz. When the minimum test separation distance is < 5 mm, a distance of 5 mm is applied to determine SAR test exclusion. EDR Mode Max Power(dBm) Max Power(mW) Frequency(MHz) Min. distance(mm) Calc. thresholds limit GFSK -1.059 0.78 2402 5 0.24 3.0 π/4DQPSK -0.168 0.96 2402 5 0.30 3.0 Conclusion: 1. [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] * [√f(GHz)] < 3.0. 2. SAR Test Exclusion Thresholds is 3.0 for separation distance 5mm. Therefore, SAR test is not required.

RF EXPOSURE EVALUATION METHOD FCC ID:2BEDU-TOPV8 Applicable standard： In accordance with FCC 47 CFR part 2 (2.1093) this device has been defined as a portable device which is defined as a transmitting device designed to be used so that the radiating structure(s) of the device is/are within 20 centimeters of the body of the user. Portable devices must be evaluated using the specified in FCC 47 CFR part 2 (2.1093) and ANSI/IEEEC95.1-1992. and had been tested in accordance with the measurement methods and procedures specified in IEEE 1528-2003. Per FCC KDB 447498 D01 v06, the 1-g and 10-g SAR test exclusion thresholds for 100 MHz to 6 GHz at test separation distances s 50 mm are determined by: SAR Test Exclusion Thresholds for 100 MHz – 6 GHz and ≤ 50 mm Approximate SAR Test Exclusion Power Thresholds at Selected Frequencies and Test Separation Distances are illustrated in the following Table. The 1-g and 10-g SAR test exclusion thresholds for 100 MHz to 6 GHz at test separation distances ≤ 50 mm are determined by: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] · [√f(GHz)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR,where f(GHz) is the RF channel transmit frequency in GHz Power and distance are rounded to the nearest mW and mm before calculation The result is rounded to one decimal place for comparison The test exclusions are applicable only when the minimum test separation distance is ≤ 50 mm and for transmission frequencies between 100 MHz and 6 GHz. When the minimum test separation distance is < 5 mm, a distance of 5 mm is applied to determine SAR test exclusion. EDR Mode Max Power(dBm) Max Power(mW) Frequency(MHz) Min. distance(mm) Calc. thresholds limit GFSK -1.059 0.78 2402 5 0.24 3.0 π/4DQPSK -0.168 0.96 2402 5 0.30 3.0 Conclusion: 1. [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] * [√f(GHz)] < 3.0. 2. SAR Test Exclusion Thresholds is 3.0 for separation distance 5mm. Therefore, SAR test is not required.

SMD
CERAMIC
ANTENNA
Data
Sheet CS -2450-21-B For 2400-2483MH z 2.0x1.2mm [EIA2012] 典型特征 T y p i cal Characterist i cs ■重量轻，结构紧凑 Light weight, compact ■宽带大，低成本 Wide bandwidth, low cost ■高增益内置天线 Built-in antenna with high gain ■工作温度 Operating Temp. : -40°C~+85°C 电气特性 Electrical Characterist ics per line(TA=25°C) 2400~2483 MHz Lin ear dB i 68. 8% % 50 频带 Frequency Band 极 化 P o l a r iz a t i o n * 峰 值 增 益 P e ak Ga i n * 峰 值 效 率 P e a k Effi c i e n c y 阻 抗 Im p e n da n ce 参数Parameter 规格Specification 单位 Units 特征 Feature 应用 Application ■蓝牙,无线局域网,移动电视 Bluetooth, Wireless L AN, Mobile TV ■家用射频系统 Home RF system, etc TECHNOLOGY *测 试 条 件 ： 测 试 板 尺 寸 9 8 × 6 5 mm ； 匹 配 电 路 ： π 型 匹 配 电 路 。 T est co n d i t i o n : T e st boa r d s iz e 9 8 * 6 5 m m ; M a t c h in g c i r c u i t: P i m a t c hi n g c ir c u i t w i l l be re q u i r ed Fi g .1 驻 波 比 V S WR W Chip Antenna CS-2450-21-B -1.3 3D模式 3D Gain Pattern (2400 MHz) 2D模式 2D Gain Pattern (2400 MHz) 增益模式是在 暗 室 进 行 测 试 的 ， 被 测 件 放 在 桌 肩 位 置 ， 用 标 准 的 喇 叭 天 线 和 矢 量 网 络 分 析 仪 来 收 集 数 据 。 Th e Ga i n p a tt e rn i s measu r ed i n FAR - fi e l d c h a m be r . D U T i s p l aced o n e tab l e o f r o t a t o r , a s t a n da r d ho r n a n t e nn a a n d Vec t o r N e t w o rk t o co ll ect da t a . 辐射模式 Radiation Pattern Fig.2 暗室示意图 FAR-field Chamber TECHNOLOGY Chip Antenna t h An a l y z e r i s uesd 3D模式 3D Gain Pattern (2450 MHz) 2D模式 2D Gain Pattern (2450 MHz) 3D模式 3D Gain Pattern (2500 MHz) 2D模式 2D Gain Pattern (2500 MHz) TECHNOLOGY Chip Antenna 1. 30±3 minutes at -40°C±5°C, 2. Convert to +105°C (5 minutes) 3. 30±3 minutes at +105°C±5°C, 4. Convert to -40°C (5 minutes) 5. Total 100 continuous cycles 项目Item 环境Condition 规格Specification 热冲击 Thermal shock No apparent damage Fulfill the electrical spec. after test. 抗湿性 Humidity resistance No apparent damage Fulfill the electrical spec. after test. 1. Humidity: 85% R.H. 2. Temperature: 85±5°C 3. Time: 1000 hours. The dipped surface of the terminal shall be at least 95% covered with solder after dipped in solder bath of 245±5°C for 3±1 seconds. No apparent damage 焊锡性 Solderability 耐焊接热性 Soldering heat resistance No apparent damage 1. Solder bath temperature : 260±5°C 2. Bathing time: 10±1 seconds 低温电阻 Low temperature resistance No apparent damage Fulfill the electrical spec. after test. 1. Temperature: -40°C±5°C 2. Time: 1000 hours. No apparent damage Fulfill the electrical spec. after test. 1. Temperature: 150°C±5°C 2. Time: 1000 hours. 耐高温性 High temperature resistance 推荐回流焊接曲线Recommended Reflow Solder curve (2) 储存环境 Storage Condition (a)仓库：温度应在0～30°C之间，湿度应小于60%湿度，产品应在交货之日起1年内使用。 At warehouse: The temperature should be within 0 ~ 30°C and humidity should be less than 60% RH.The product should be used within 1 year from the time of elivery. (b)在板：温度应在40～85°C之间，湿度应小于85%湿度。On board: The temperature should be within -40~85°C and humidity should be less than 85% RH. (3) 工作环境温度 Operating Temperature Range 工作温度范围：-40°C to +85°C。 Operating temperature range : -40°C to +85°C. TECHNOLOGY Chip Antenna 推荐焊&Evaluation Board (1) 电烙铁的使用 Soldering Gun Procedure 以下注意事项仅针对使用电烙铁进行个别器件更换。 Note the follows, in case of using solder gun for replacement. (a) 使用小于30W的电烙铁，温度不高于350°C，焊接时间小于3秒。 The tip temperature must be less than 350°C for the period within 3 seconds by using soldering gun under 30 W. (b) 烙铁不可直接接触器件本体。 The soldering gun tip shall not touch this product directly. (2) 焊锡量 Soldering Volume 注意焊接过程中过多的焊锡量会损害器件本体。 Note that excess of soldering volume will easily get crack the body of this product. 产品尺寸 Product Dimension TECHNOLOGY Chip Antenna 1 应用环境Application Guide 包装信息Package Information A B C D E F L W 8.00±0.3 3.50± 0.051.75±0.1 2.00±0.054.00±0.1 1.50±0.1 2.30± 0.1 1.55± 0.1 编码规则 Par t Number System CS - 2450 - 21-B External DimensionsL*W(mm)2.0*1.2 Central Frequency2450MHz Product Series: Chip Antenna 丝印 Marking TECHNOLOGY Chip Antenna TECHNOLOGY 订货信息Order Information 设备 Device Package 净重 Net Weight 运送式 Carrier 量 Quantity 认证 HSF Status CS-2450 -21-B 2012 Tape & Reel 5000pcs RoHS compliant 版本信息 Revision history 日期/Date 本/Revision 本描述/Description of changes 0.0014g The contents of this data sheet are subject to change without notice. Please confirm the specifications and delivery conditions when placing your order. © Copyright 2015, Keweixin Electronics All rights reserved Chip Antenna 2021-4-2 2022-1-2 1.0 1.1 First Versio n Second Version

Project No.: ZKT-231129118E Page 1 of 59 FCC TEST REPORT FCC ID:2BEDU-TOPV8 Report Number. ................................ : ZKT-231129118E Date of Test ..................................................: Dec. 26, 2023 to Jan. 02, 2024 Date of issue ..................................... : Jan. 02, 2024 Total number of pages ....................... 59 Test Result ...................................... : PASS Testing Laboratory. ........................ : Shenzhen ZKT Technology Co., Ltd. Address ........................................... : 1/F, No. 101, Building B, No. 6, Tangwei Community Industrial Avenue, Fuhai Street, Bao'an District, Shenzhen, China Applicant's name ......................... : Shenzhen Diyage Technology Co., Ltd Address ........................................... : No. 9 Haoshi Street, Shajing Shangxing Fourth Industrial Zone, Bao’an District, Shenzhen, China. Manufacturer's name ................... : Shenzhen Diyage Technology Co., Ltd Address ........................................... : No. 9 Haoshi Street, Shajing Shangxing Fourth Industrial Zone, Bao’an District, Shenzhen, China. Test specification: Standard ........................................... : FCC CFR Title 47 Part 15 Subpart C Section 15.247 ANSI C63.10:2013 Test procedure ................................. : / Non-standard test method .............. : N/A Test Report Form No. .................... : / Test Report Form(s) Originator .... : ZKT Testing Master TRF ................................... : Dated: 2020-01-06 This device described above has been tested by ZKT, and the test results show that the equipment under test (EUT) is in compliance with the FCC requirements. And it is applicable only to the tested sample identified in the report. This report shall not be reproduced except in full, without the written approval of ZKT, this document may be altered or revised by ZKT, personal only, and shall be noted in the revision of the document. Product name ................................. : V8 Bluetooth earphones Trademark ....................................... : N/A Model/Type reference ....................... : TOP V8 Project No.: ZKT-231129118E Page 2 of 59 Testing procedure and testing location: Testing Laboratory ................................... : Shenzhen ZKT Technology Co., Ltd. Address ...................................................... : 1/F, No. 101, Building B, No. 6, Tangwei Community Industrial Avenue, Fuhai Street, Bao'an District, Shenzhen, China Jim Liu Tested by (name + signature) .................... : Jeff Fu Reviewer (name + signature) ..................... : Lake Xie Approved (name + signature) .................... : Project No.: ZKT-231129118E Page 3 of 59 Table of Contents Page 1. VERSION ..............................................................................................................................................................5 2. TEST SUMMARY ................................................................................................................................................6 2.1 TEST FACILITY ............................................................................................................................................................... 7 2.2 MEASUREMENT UNCERTAINTY ............................................................................................................................ 7 3.1 GENERAL DESCRIPTION OF EUT ......................................................................................................................... 8 3.2 Test Setup Configuration .............................................................................................................................................. 9 3.3 Support Equipment ......................................................................................................................................................... 9 4. EMC EMISSION TEST .................................................................................................................................... 13 4.1 Conducted emissions ................................................................................................................................................... 13 4.1.1 POWER LINE CONDUCTED EMISSION Limits ............................................................................................. 13 4.1.2 TEST PROCEDURE ................................................................................................................................................. 13 4.1.3 DEVIATION FROM TEST STANDARD .............................................................................................................. 13 4.1.4 TEST SETUP .............................................................................................................................................................. 13 4.1.5 EUT OPERATING CONDITIONS ......................................................................................................................... 14 4.1.6 Test Result ................................................................................................................................................................... 15 4.2 Radiated emissions....................................................................................................................................................... 17 4.2.1 Radiated Emission Limits ........................................................................................................................................ 17 4.2.2 TEST PROCEDURE ................................................................................................................................................. 17 4.2.3 DEVIATION FROM TEST STANDARD .............................................................................................................. 18 4.2.4 TEST SETUP ......................................................................................…

Text truncated - open the document above for the full version.

Project No.: ZKT-231129118E Page 1 of 59 FCC TEST REPORT FCC ID:2BEDU-TOPV8 Report Number. ................................ : ZKT-231129118E Date of Test ..................................................: Dec. 26, 2023 to Jan. 02, 2024 Date of issue ..................................... : Jan. 02, 2024 Total number of pages ....................... 59 Test Result ...................................... : PASS Testing Laboratory. ........................ : Shenzhen ZKT Technology Co., Ltd. Address ........................................... : 1/F, No. 101, Building B, No. 6, Tangwei Community Industrial Avenue, Fuhai Street, Bao'an District, Shenzhen, China Applicant's name ......................... : Shenzhen Diyage Technology Co., Ltd Address ........................................... : No. 9 Haoshi Street, Shajing Shangxing Fourth Industrial Zone, Bao’an District, Shenzhen, China. Manufacturer's name ................... : Shenzhen Diyage Technology Co., Ltd Address ........................................... : No. 9 Haoshi Street, Shajing Shangxing Fourth Industrial Zone, Bao’an District, Shenzhen, China. Test specification: Standard ........................................... : FCC CFR Title 47 Part 15 Subpart C Section 15.247 ANSI C63.10:2013 Test procedure ................................. : / Non-standard test method .............. : N/A Test Report Form No. .................... : / Test Report Form(s) Originator .... : ZKT Testing Master TRF ................................... : Dated: 2020-01-06 This device described above has been tested by ZKT, and the test results show that the equipment under test (EUT) is in compliance with the FCC requirements. And it is applicable only to the tested sample identified in the report. This report shall not be reproduced except in full, without the written approval of ZKT, this document may be altered or revised by ZKT, personal only, and shall be noted in the revision of the document. Product name ................................. : V8 Bluetooth earphones Trademark ....................................... : N/A Model/Type reference ....................... : TOP V8 Project No.: ZKT-231129118E Page 2 of 59 Testing procedure and testing location: Testing Laboratory ................................... : Shenzhen ZKT Technology Co., Ltd. Address ...................................................... : 1/F, No. 101, Building B, No. 6, Tangwei Community Industrial Avenue, Fuhai Street, Bao'an District, Shenzhen, China Jim Liu Tested by (name + signature) .................... : Jeff Fu Reviewer (name + signature) ..................... : Lake Xie Approved (name + signature) .................... : Project No.: ZKT-231129118E Page 3 of 59 Table of Contents Page 1. VERSION ..............................................................................................................................................................5 2. TEST SUMMARY ................................................................................................................................................6 2.1 TEST FACILITY ............................................................................................................................................................... 7 2.2 MEASUREMENT UNCERTAINTY ............................................................................................................................ 7 3.1 GENERAL DESCRIPTION OF EUT ......................................................................................................................... 8 3.2 Test Setup Configuration .............................................................................................................................................. 9 3.3 Support Equipment ......................................................................................................................................................... 9 4. EMC EMISSION TEST .................................................................................................................................... 13 4.1 Conducted emissions ................................................................................................................................................... 13 4.1.1 POWER LINE CONDUCTED EMISSION Limits ............................................................................................. 13 4.1.2 TEST PROCEDURE ................................................................................................................................................. 13 4.1.3 DEVIATION FROM TEST STANDARD .............................................................................................................. 13 4.1.4 TEST SETUP .............................................................................................................................................................. 13 4.1.5 EUT OPERATING CONDITIONS ......................................................................................................................... 14 4.1.6 Test Result ................................................................................................................................................................... 15 4.2 Radiated emissions....................................................................................................................................................... 17 4.2.1 Radiated Emission Limits ........................................................................................................................................ 17 4.2.2 TEST PROCEDURE ................................................................................................................................................. 17 4.2.3 DEVIATION FROM TEST STANDARD .............................................................................................................. 18 4.2.4 TEST SETUP ......................................................................................…

Text truncated - open the document above for the full version.

EUT TEST PHOTO