2BEDU-V20V20 Bluetooth earphones

(Shenzhen Diyage Technology Co., Ltd) (August 13, 2024) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: Attestation Statements Part 2.911(d)(5)(i) request for (FCC ID: 2BEDU‐V20) [ Shenzhen Diyage Technology Co., Ltd] (“the applicant”) certifies that the equipment for which authorization is sought is not “covered” equipment prohibited from receiving an equipment authorization pursuant to section 2.903 of the FCC rules. Sincerely, (Applicant signature) (Applicant printed name) Changqing Luo (Shenzhen Diyage Technology Co., Ltd) (August 13, 2024) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: Attestation Statements Part 2.911(d)(5)(ii) request for (FCC ID: 2BEDU‐V20) [ Shenzhen Diyage Technology Co., Ltd] (“the applicant”) certifies that, as of the date of the filing of the application, the applicant is not identified on the Covered List as an entity producing “covered” equipment. Sincerely, (Applicant signature) (Applicant printed name) Changqing Luo

Shenzhen Diyage Technology Co., Ltd (August 13, 2024) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: CONFIDENTIALITY REQUEST FOR (V20 Bluetooth earphones / V20 / FCC ID: 2BEDU-V20) To Whom It May Concern: This letter serves as an official request for confidentiality under sections 0.457 and 0.459 of CFR 47. We have requested that the Exhibits Long‐Term Confidentiality Short‐Term Confidentiality NOTE 2 ID Label/Location No No Attestation Statement No No External Photos No ☐ Block Diagram ☒ ☐ Schematics ☒ ☐ Test Report No No Test Setup Photos No ☐ User’s Manual ☐ NOTE 1 ☒ Internal Photos ☐ NOTE 1 ☒ Parts List / Tune Up ☐ ☐ RF Exposure Info No No Operational Description ☒ ☐ Cover Letter(s) No No SDR Software / Security Info ☐ No required to be submitted with this application be permanently withheld from public review. Above mentioned document contains detailed system and equipment description are considered as proprietary information in operation of the equipment. The public disclosure of above documents might be harmful to our company and would give competitor an unfair advantage in the market. Please contact me if there is any information you may need. Sincerely, Signature: Name: Changqing Luo Title: Manager

Shenzhen Diyage Technology Co., Ltd ( August 13, 2024) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: LETTER OF AGENT AUTHORIZATION To Whom It May Concern: We, the undersigned, hereby authorize (Shenzhen MinFan Electronic Commerce Co., LTD) to act on our behalf in all matters relating to application for equipment authorization, including the signing of all documents relating to these matters. We also hereby certify that no party to the application authorized hereunder is subject to the denial of benefits, including FCC benefits, pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C.853(a). This agreement expires one year from the current date. Sincerely, Signature: Name: Changqing Luo Title: Manager

Model: V20 External Photos Left ear: Right ear:

FCC ID LABEL: Label Location: FCC ID: 2BEDU-V20 Model No.: V20

Shenzhen Diyage Technology Co., Ltd FCC ID: 2BEDU-V20 Portable device According to §15.247(e)(i) and §1.1307(b)(1), systems operating under the provisions of this section shall be operated in a manner that ensures that the public is not exposed to radio frequency energy level in excess of the Commission’s guidelines. According to KDB447498 D01 General RF Exposure Guidance V06 The 1-g SAR and 10-g SAR test exclusion thresholds for 100 MHz to 6 GHz at test separation distances ≤ 50 mm are determined by: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)]·[√f(GHZ)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where: • f(GHZ) is the RF channel transmit frequency in GHz • Power and distance are rounded to the nearest mW and mm before calculation • The result is rounded to one decimal place for comparison When the minimum test separation distance is < 5 mm, a distance of 5 mm is applied to determine SAR test exclusion. EDR: Modulation Channel Freq. (GHz) Conduct ed power (dBm) Conducte d power (mW) Tune-up power (dBm) Max tune-up power (dBm) Max tune-up power (mW) Distance (mm) Result calculatio n SAR Exclusion threshold SAR test exclusion 2.402 3.415 2.204±15.003.16<50.980203.00YES 2.441 3.29 2.134±15.003.16<50.988133.00YES 2.480 2.39 1.733±14.002.51<50.791143.00YES 2.402 4.12 2.584±15.003.16<50.980203.00YES 2.441 3.951 2.484±15.003.16<50.988133.00YES 2.480 3.012 2.004±15.003.16<50.995993.00YES 2.402 4.323 2.715±16.003.98<51.234003.00YES 2.441 4.127 2.595±16.003.98<51.243983.00YES 2.480 3.368 2.174±15.003.16<50.995993.00YES GFSK π /4DQPSK 8DQPSK Conclusion: For the max result : 1.24398≤ FCC Limit 3.0 for 1g SAR.

2.4GHz2012ChipAntenna:RANT2012F245C07 Dimension(mm) L2.05+-0.15 W1.20+-0.15 T0.85+-0.10 No.TerminalName 1Feeding/GNG 2GND Application: WLAN,802.11b/g,Bluetooth,WLAN,etc... Features SMD,highreliability,ultraImpact,Omni-directional... PartnumberInformation RANT2012F245C07 (A)(B)(C)(D)(E)(F) (A)ProductTypeChipAntenna (B)SizeCode2.0x1.2mm(+-0.2mm) (C)MaterialHighKmaterial (D)Frequency2.4~2.5GHz (E)FeedingmodePIFA&SingleFeeding (F)AntennatypeType=07 ElectricalSpecification WorkingFrequencyRange2400~2484MHz Bandwidth84(Min.) PeakGain1.95dBi(Typ.) Impedance50Ohm Returnloss10dB(Min) PolarizationLinear AzimuthBeamwidthOmni-directional OperationTemperature( °C )-40~85 °C ResistancetoSolderingHeats 10sec.(@280°C) TerminationNi/Au(Leadless) ThespecificationisdefinedonEVB. DimensionandTerminalConfiguration RAINInternationalTechnologyCo.,Ltd.TEL:13530576606 2.4GHz2012ChipAntenna:RANT2012F245C07 EvaluationBoardReference PCBDimensionAntennaLayoutReference Unit:mm ElectricalCharacteristics ReturnLoss ReturnLoss&Radiation 1 Frequency(MHz) S11(dB) 2400-10.77 2450-24.81 2484-10.243 Radiation Z Y X 2400MHz2450MHz2500MHz Efficiency70.56%75.25%71.01% PeakGain1.72dBi1.95dBi1.69dBi 2.4GHz2012ChipAntenna:RANT2012F245C07 TapingSpecifications ReelandTapingSpecification ReelSpecification TYPESIZEABCD 20127”5K/Reel 9.0±0.5 60±213.5±0.5178±2 TappingSpecification PackagingTypeABWEFGHTDP PaperType2012 1.50±0.202.30±0.208.0±0.201.75±0.103.5±0.054.0±0.102.0±0.050.75±0.101.57±0.104.0±0.1 2.4GHz2012ChipAntenna:RANT2012F245C07 ReliabilityTable TestItemProcedure Requirements CeramicType Remark (Reference) Electrical Characterization Fulfilltheelectrical specification UserSpec. Thermal Shock 1.Preconditioning: 50±10°C/1hr,thenkeepfor24±1hrsatroomtemp. 2.Initialmeasure:Spec:referInitialspec. 3.Rapidchangeoftemperaturetest: -30°Cto+85°C;100cycles; 15minutesatLowercategorytemperature; 15minutesatUppercategorytemperature. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 107 Temperature Cycling 1.Initialmeasure:Spec:referInitialspec. 2.100Cycles(-30°Cto+85°C),SoakMode=1(2Cycle/hours). 3.Measurementat24±2Hoursaftertestcondition. NoVisibleDamage. Fulfilltheelectrical specification. JESD22 JA104 HighTemperature Exposure 1.Initialmeasure:Spec:referInitialspec. 2.Unpowered;500hours@T=+85°C. 3.Measurementat24±2hoursaftertest. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 108 LowTemperature Storage 1.Initialmeasure:Spec:referInitialspec. 2.Unpowered:500hours@T=-30°C. 3.Measurementat24±2hoursaftertest. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 108 Solderability (SMDBottomSide) Dippingmethod: a.Temperature:235±5°C b.Dippingtime:3±0.5s Thesoldershouldcover over95%ofthecritical areaofbottomside. IEC60384-21/22 4.10 SolderingHeat Resistance (RSH) Preheatingtemperature:150±10°C. Preheatingtime:1~2min. Soldertemperature:260±5°C. Dippingtime:5±0.5s NoVisibleDamage.IEC60384-21/22 4.10 Vibration5g'sfor20min.,12cycleseachof3orientations Note:Use8"X5"PCB.031"thick7securepointson,onelong sideand2securepointsatcornersofoppositesides.Parts mountedwithin2"fromanysecurepoint.Testfrom10-2000 Hz. NoVisibleDamage.MIL-STD-202 Method204 Mechanical Shock Threeshocksineachdirectionshallbeappliedalongthethree mutuallyperpendicularaxesofthetestspecimen(18shocks) Peakvalue:1,500g’s Duration:0.5ms Velocitychange:15.4ft/s Waveform:Half-sine NoVisibleDamage.MIL-STD-202 Method213 Humidity Bias 1.Humidity:85%R.H.,Temperature:85±2°C. 2.Time:500±24hours. 3.Measurementat24±2hrsaftertestcondition. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 Method106 2.4GHz2012ChipAntenna:RANT2012F245C07 2.4GHz2012ChipAntenna:RANT2012F245C07 _ Board Flex (SMD) 1.Mountingmethod: IR-Reflow.PCBSize(L:100×W:40×T:1.6mm) 2.Applytheloadindirectionofthearrowuntilbendingreaches 2mm. NoVisibleDamage.AEC-Q200 005 AdhesionForceof1.8Kgfor60seconds.NoVisibleDamage Magnificationof20Xor greatermaybeemployed forinspectionofthe mechanicalintegrityofthe devicebodyterminalsand body/terminaljunction. AEC-Q200 006 Physical Dimension Anyapplicablemethodusingx10magnification,micrometers, calipers,gauges,contourprojectors,orothermeasuring equipment,capableofdeterminingtheactualspecimen dimensions. Inaccordancewith specification. JESD22 JB100 RevisionHistory RevisionDateContent 12020/10/15NewDatasheet

TEST REPORT Compiled by: Reviewed by: Approved by: Zhou Kui Arron Liu Bin Mei / Director Note: If there is any objection to the inspection results in this report, please submit a written report to the company within 15 days from the date of receiving the report. The test report is effective only with both signature and specialized stamp. This result(s) shown in this report refer only to the sample(s) tested. Without written approval of Shenzhen CTB Testing Technology Co., Ltd. this report can’t be reproduced except in full. The tested sample(s) and the sample information are provided by the client. “*” indicates the testing items were fulfilled by subcontracted lab. “#” indicates the items are not in CNAS accreditation scope. Product Name: V20 Bluetooth earphones FCC ID: 2BEDU-V20 Trademark: N/A Model Number: V20 Prepared For: Shenzhen Diyage Technology Co., Ltd Address: No. 9 Haoshi Street, Shajing Shangxing Fourth Industrial Zone, Bao'an District, Shenzhen Manufacturer: Shenzhen Diyage Technology Co., Ltd Address: No. 9 Haoshi Street, Shajing Shangxing Fourth Industrial Zone, Bao'an District, Shenzhen Prepared By: Shenzhen CTB Testing Technology Co., Ltd. Address: 1&2/F., Building A, No.26, Xinhe Road, Xinqiao, Xinqiao Street, Bao'an District, Shenzhen, Guangdong, China Sample Received Date: Aug. 05, 2024 Sample tested Date: Aug. 05, 2024 to Aug. 07, 2024 Issue Date: Aug. 07, 2024 Report No.: CTB240807019RFX Test Standards FCC CFR Title 47 Part 15 Subpart C Section 15.247 ANSI C63.10:2013 Test Results PASS Remark: This is Bluetooth radio test report. Shenzhen CTB Testing Technology Co., Ltd. Report No.:CTB240807019RFX Report Tel: 4008-707-283 Web: http://www.ctb-lab.net Page 2 of 56 TABLE OF CONTENT Test Report Declaration Page 1. VERSION .......................................................................... 4 2. TEST SUMMARY ................................................................... 5 3. MEASUREMENT UNCERTAINTY ..................................................... 6 4. PRODUCT INFORMATION AND TEST SETUP .......................................... 7 4.1 Product Information .................................................................... 7 4.2 Test Setup Configuration ............................................................... 7 4.3 Support Equipment .................................................................... 7 4.4 Channel List .......................................................................... 8 4.5 Test Mode ............................................................................ 8 4.6 Test Environment ...................................................................... 8 5. TEST FACILITY AND TEST INSTRUMENT USED ....................................... 9 5.1 Test Facility ........................................................................... 9 5.2 Test Instrument Used .................................................................. 9 6. AC POWER LINE CONDUCTED EMISSION ............................................ 12 6.1 Block Diagram Of Test Setup .......................................................... 12 6.2 Limit ................................................................................ 12 6.3 Test procedure ....................................................................... 12 6.4 Test Result .......................................................................... 14 7. RADIATED SPURIOUS EMISSION ................................................... 16 7.1 Block Diagram Of Test Setup .......................................................... 16 7.2 Limit ................................................................................ 16 7.3 Test procedure ....................................................................... 17 7.4 Test Result .......................................................................... 18 8. BAND EDGE AND RF COUNDUCTED SPURIOUS EMISSIONS .......................... 27 8.1 Block Diagram Of Test Setup .......................................................... 27 8.2 Limit ................................................................................ 27 8.3 Test procedure ....................................................................... 27 8.4 Test Result .......................................................................... 28 9. COUDUCTED PEAK OUTPUT POWER ............................................... 35 9.1 Block Diagram Of Test Setup .......................................................... 35 9.2 Limit ................................................................................ 35 9.3 Test procedure ....................................................................... 35 9.4 Test Result .......................................................................... 35 10. 20DB OCCUPIED BANDWIDTH...................................................... 39 10.1 Block Diagram Of Test Setup ......................................................... 39 10.2 Limit ............................................................................... 39 10.3 Test procedure ...................................................................... 39 10.4 Test Result ......................................................................... 39 11. CARRIERFREQUENCIES SEPARATION .............................................. 43 11.1 Block Diagram Of Test Setup ......................................................... 43 11.2 Limit ............................................................................... 43 11.3 Test procedure ...................................................................... 43 11.4 Test Result ......................................................................... 43 12. HOPPING CHANNEL NUMBER ...................................................... 47 12.1 Block Diagram Of Test Setup ......................................................... 47 12.2 Limit ............................................................................... 47 12.3 Test procedure .............…

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Model: V20 Radiated Emission Below 1G Above 1G Conducted emissions