2BEH5-S2Bluetooth Communication System

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Reference No.: WTX24X07164220W001/002/003 Page 6 of 16 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Model: S1 EUT View 1 EUT View 2 Reference No.: WTX24X07164220W001/002/003 Page 7 of 16 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 3 EUT View 4 Reference No.: WTX24X07164220W001/002/003 Page 8 of 16 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 5 EUT View 6

Reference No.: WTX24X07164220W001/002/003 Page 2 of 16 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS Model: S2 EUT View 1 EUT View 2 Reference No.: WTX24X07164220W001/002/003 Page 3 of 16 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 3 EUT View 4 Reference No.: WTX24X07164220W001/002/003 Page 4 of 16 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 5 EUT View 6 Reference No.: WTX24X07164220W001/002/003 Page 5 of 16 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 7

Reference No.: WTX24X07164220W001/002/003 Page 1 of 16 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

Reference No.: WTX24X07164220W001/002/003 Page 11 of 16 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Model: S1 EUT Housing and Board View 1 Solder Board-Component View 1 Reference No.: WTX24X07164220W001/002/003 Page 12 of 16 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 2 Solder Board-Component View 3 9 Reference No.: WTX24X07164220W001/002/003 Page 13 of 16 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Antenna View 1 Antenna View 2 BT(BR/EDR/BLE)_A Ant. BT(BLE)_B Ant.

Reference No.: WTX24X07164220W001/002/003 Page 9 of 16 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS Model: S2 EUT Housing and Board View 1 Solder Board-Component View 1 Reference No.: WTX24X07164220W001/002/003 Page 10 of 16 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 2 Solder Board-Component View 3

1. RF Exposure Requirements 1.1 General Information Client Information Applicant: Shenzhen Asmax Infinite Technology Co., Ltd. Address of applicant: Room 908 Building 2, Aviation & Space Building, No. 53 Gaoxin South 9th Road, Gaoxin Community, Yuehai Street, Nanshan District, Shenzhen Manufacturer: Huizhou Newthinking Electronics Co.,Ltd Address of manufacturer: Building 1, 2, 3 floors, and 6 floors of the BeiDou Industrial Production Base for Connected Vehicles and Intelligent Terminals, No. 101 Jinfu Road, Xiaojinkou Street, Huicheng District, Huizhou City, Guangdong Province, China General Description of EUT: Product Name: Bluetooth Communication System Trade Name / Model No.: S2 Adding Model(s): S1, S3, S4, S5, S6, S7, S8, S9, S10, S20, S30, S1Plus, S1Pro, S2 Pro, S2 PLUS, S3 PLUS, S3 Pro, S4 PLUS, S4 Pro, S5 Pro, S6 Pro, S7 Pro, S8 Pro, S5 Plus, S6 Plus, S7 Plus, S8 Plus, S9 Pro, S9 Plus Rated Voltage: DC3.85V Battery Capacity: 980mAh Adapter Model: / FCC ID: 2BEH5-S2 Equipment Type: Portable device Technical Characteristics of EUT: Bluetooth(BR/EDR mode)-Ceramic Antenna Bluetooth Version: V5.4 (BR/EDR mode) Frequency Range: 2402-2480MHz RF Output Power: -1.27dBm (Conducted) Data Rate: 1Mbps, 2Mbps, 3Mbps Modulation: GFSK, π/4 DQPSK, 8DPSK Quantity of Channels: 79 Channel Separation: 1MHz Type of Antenna: Ceramic Antenna Antenna Gain: 5.19dBi Bluetooth(BLE mode)-Ceramic Antenna Bluetooth Version: V5.4 (BLE mode) Frequency Range: 2402-2480MHz RF Output Power: -2.23dBm (Conducted) Data Rate: 1Mbps Modulation: GFSK Quantity of Channels: 40 Channel Separation: 2MHz Type of Antenna: Ceramic Antenna Antenna Gain: 5.19dBi Bluetooth(BLE mode)-FPC Antenna Bluetooth Version: V5.4 (BLE mode) Frequency Range: 2402-2480MHz RF Output Power: -2.19dBm (Conducted) Data Rate: 1Mbps Modulation: GFSK Quantity of Channels: 40 Channel Separation: 2MHz Type of Antenna: FPC Antenna Antenna Gain: 2.84dBi 1.2 RF Exposure Exemption According to §1.1307(b)(3) and KDB 447498 D04 Interim General RF Exposure Guidance v01, system operating under the provisions of this section shall be operating in a manner that the public is not exposed to radio frequency energy level in excess limit for maximum permissible exposure. Option A: FCC Rule Part 1.1307 (b)(3)(i)(A):The available maximum time-averaged power is no more than 1mW, regardless of separation distance. Option B: FCC Rule Part 1.1307 (b)(3)(i)(B): The available maximum time-averaged power or effective radiated power (ERP), whichever is greater, is less than or equal to the threshold P th (mW) described in the following formula. P th is given by: Option C: FCC Rule Part 1.1307 (b)(3)(i)(C): The minimum separation distance (R in meters) from the body of a nearby person for the frequency (f in MHz) at which the source operates, the ERP (watts) is no more than the calculated value prescribed for that frequency. R must be at least λ/2π, where λ is the free-space operating wavelength in meters. Single RF Sources Subject to Routine Environmental Evaluation RF Source frequency (MHz) Threshold ERP (watts) 0.3-1.34 1,920 R 2 1.34-30 3,450 R 2 /f 2 30-300 3.83 R 2 300-1,500 0.0128 R 2 f 1,500-100,000 19.2R 2 For Multiple RF sources: FCC Rule Part 1.1307(b)(3)(ii): (A) The available maximum time-averaged power of each source is no more than 1 mW and there is a separation distance of two centimeters between any portion of a radiating structure operating and the nearest portion of any other radiating structure in the same device, except if the sum of multiple sources is less than 1 mW during the time-averaging period, in which case they may be treated as a single source (separation is not required). (B) In the case of fixed RF sources operating in the same time-averaging period, or of multiple mobile or portable RF sources within a device operating in the same time averaging period, if the sum of the fractional contributions to the applicable thresholds is less than or equal to 1 as indicated in the following equation. 1.3 Calculated Result Radio Access Technology Prediction Frequency Output Power Antenna Gain Duty Cycle Tune-Up Time-Averaged Power ERP (MHz) (dBm) (dBi) (%) (dBm) (dBm) Ceramic Antenna 2402 -1.27 5.19 100 -1.00 2.04 FPC Antenna 2402 -2.19 2.84 100 -2.00 -1.31 Frequency Option Min. Distance Max. Power Exposure Limit Ratio Result (MHz) (cm) (dBm) (mW) (mW) Pass/Fail 2402 B 0.5 2.04 1.60 2.788 0.57 Pass 2402 B 0.5 -1.31 0.74 2.788 0.27 Pass Note: 1. Time-Averaged Power=Output Power * Duty Cycle; ERP= Time-Averaged Power+ Antenna gain-2.15dB 2. Option A, B and C refers as clause 1.2. 3. For option B, Max (time-averaged power, effective radiated power (ERP)) converts to Max. Power. For option C, ERP converts to Max. Power; 4. For option B, P th (mW) converts to Exposure Limit (mW); For option C, ERP (W) converts to Exposure Limit (mW). 5. Ratio= Tune-Up ERP (mW)/ Exposure Limit (mW) Mode for Simultaneous Multi-band Transmission: Radio Access Technology Ratio 1 Ratio 2 Simultaneous Ratio Limit Result Pass/Fail - - - - - - Note: Ceramic Antenna and FPC Antenna can’t transmit at the same time. Result: Pass

Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 64 TEST REPORT Reference No. ....................: WTX24X07164220W001 FCC ID ............................... .: 2BEH5-S2 Applicant .......................... .: Shenzhen Asmax Infinite Technology Co., Ltd. Address ............................ .: Room 908 Building 2, Aviation & Space Building, No. 53 Gaoxin South 9th Road, Gaoxin Community, Yuehai Street, Nanshan District, Shenzhen Manufacturer .................... .: Huizhou Newthinking Electronics Co.,Ltd Address ............................ .: Building 1, 2, 3 floors, and 6 floors of the BeiDou Industrial Production Base for Connected Vehicles and Intelligent Terminals, No. 101 Jinfu Road, Xiaojinkou Street, Huicheng District, Huizhou City, Guangdong Province, China Product Name .................. .: Bluetooth Communication System Model No... ........................ .: S2 Standards ......................... .: FCC Part 15.247 Date of Receipt sample ... .: 2024-07-12 Date of Test....................... .: 2024-07-12 to 2024-08-05 Date of Issue .................... .: 2024-08-05 Test Report Form No. ...... . : WTX_Part 15_247W Test Result ........................ .: Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Dashan Chen Jason Su Reference No.: WTX24X07164220W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 64 TABLE OF CONTENTS 1. GENERAL INFORMATION .................................................................................................................................... 5 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ......................................................................... 5 1.2 TEST STANDARDS ................................................................................................................................................. 6 1.3 TEST METHODOLOGY ........................................................................................................................................... 6 1.4 TEST FACILITY ...................................................................................................................................................... 6 1.5 EUT SETUP AND TEST MODE .............................................................................................................................. 7 1.6 MEASUREMENT UNCERTAINTY ............................................................................................................................. 9 1.7 TEST EQUIPMENT LIST AND DETAILS ................................................................................................................. 10 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 13 3. ANTENNA REQUIREMENT ................................................................................................................................. 14 3.1 STANDARD APPLICABLE ..................................................................................................................................... 14 3.2 EVALUATION INFORMATION ................................................................................................................................ 14 4. FREQUENCY HOPPING SYSTEM REQUIREMENTS .................................................................................... 15 4.1 STANDARD APPLICABLE ..................................................................................................................................... 15 4.2 FREQUENCY HOPPING SYSTEM ......................................................................................................................... 15 4.3 EUT PSEUDORANDOM FREQUENCY HOPPING SEQUENCE ............................................................................... 16 5. QUANTITY OF HOPPING CHANNELS AND CHANNEL SEPARATION .................................................... 17 5.1 STANDARD APPLICABLE ..................................................................................................................................... 17 5.2 TEST SETUP BLOCK DIAGRAM ........................................................................................................................... 17 5.3 TEST PROCEDURE .............................................................................................................................................. 17 5.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 18 6. DWELL TIME OF HOPPING CHANNEL ........................................................................................................... 19 6.1 STANDARD APPLICABLE ..................................................................................................................................... 19 6.2 TEST SETUP BLOCK DIAGRAM ........................................................................................................................... 19 6.3 TEST PROCEDURE .............................................................................................................................................. 19 6.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 20 7. 20DB BANDWIDTH .............................................................…

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嘉兴佳利电子有限公司http://www.glead.com.cn阿里巴巴http://zydq.en.alibaba.com JIAXINGGLEADELECTRONICSCO.,LTD -1- 产品技术规格书 SPECIFICATION 中国浙江省嘉兴市经济开发区正原路66号 No.66ZhengyuanRoad,EconomicDevelopmentZone,Jiaxing,Zhejiang,China TEL：0086-573-83651818FAX：0086-573-83651858 拟制 Preparedby ：审核 Checkedby ：批准 Approvedby ： 送样日期 FormedOn 产品版本 DocumentVersion (V1.3) 产品型号PARTNO：LA31H2450-A35 客户料号CUSTOMERPARTNO： 客户确认CUSTOMERAPPROVEDBY： 确认日期APPROVEDDATE： 嘉兴佳利电子有限公司http://www.glead.com.cn阿里巴巴http://zydq.en.alibaba.com JIAXINGGLEADELECTRONICSCO.,LTD -2- 目录 Tableofcontents 规格书版本更改记录Versionrejiggertrackrecord..............................3 1.概述Introduction..................................................................4 2.型号PartNumber...............................................................4 3.外型尺寸及测试板焊盘尺寸Dimensions.....................4～5 4.测试电路和匹配电路EvaluationBoardandMatchingCircuits............5 5.电气性能ElectricalCharacteristics..........................................6 6.特性曲线Characteristiccurve...................................................6 7.方向图RadiationPattern...................................................7～8 8.可靠性试验后允许误差PostDependabilityTolerance...............9 9.可靠性试验DependabilityTest..........................................9～10 10.回流焊温度ReflowSolderingStandardCondition.....................10 11.包装尺寸PackagingandDimensions....................................11 嘉兴佳利电子有限公司http://www.glead.com.cn阿里巴巴http://zydq.en.alibaba.com JIAXING GLEAD ELECTRONICS CO., LTD - 3 - 产品尺寸/Size：3.2×1.6×1.2 1. 概述 INTRODUCTION " 佳利 " 微波多层陶瓷天线 LA 系列产品设计用于 WLAN 、 WiFi 、蓝牙、 PHS ，手机 多频天线 , FM 等小体积 SMD 片式设计。 "GLEAD" Microwave Multi-Layer Ceramic Antenna LA series are designed to be used in WLAN 、 WiFi 、 Bluetooth 、 PHS 、 Multiple-band Mobile phone antenna, FM, etc and compact size SMD chip design. 2. 型号 Part Number LA 31 H 2450 -A35 3. 外型尺寸 Dimensions （ Unit ： mm ） 天线频率/Antenna Frequency: 2450 MHz 产品设计结构H型/Via Design Series 多层结构天线/Multi-layerAntenna 产品名称，编号A35/Product Name:A35 嘉兴佳利电子有限公司http://www.glead.com.cn阿里巴巴http://zydq.en.alibaba.com JIAXING GLEAD ELECTRONICS CO., LTD - 4 - 4. 测试电路和匹配电路Evaluation Board and Matching Circuits 5. 电气性能Electrical Characteristics No. Item （项目） Specifications （特性） 5.1 Central Frequency中心频率(No matching)2875MHz (带匹配电路测试)After Matching2450 MHz 5.2Band Width通带宽度100MHz typ. 5.3Peak Gain峰值增益5.19 dBi 5.4V.S.W.R驻波比≤2.0 5.5 Polarization极化方式 Linear线性 5.6 Azimuth Beam width方位角 Omni-directional全向 5.7 Impedance阻抗 50 Ω 6.2n 1.8n 嘉兴佳利电子有限公司http://www.glead.com.cn阿里巴巴http://zydq.en.alibaba.com JIAXING GLEAD ELECTRONICS CO., LTD - 5 - 6. 特性曲线 Characteristic curve 7. 方向图 Radiation Pattern coordinates： 嘉兴佳利电子有限公司http://www.glead.com.cn阿里巴巴http://zydq.en.alibaba.com JIAXING GLEAD ELECTRONICS CO., LTD - 6 - X-Z Plane Y-Z Plane X-Y Plane 嘉兴佳利电子有限公司http://www.glead.com.cn阿里巴巴http://zydq.en.alibaba.com JIAXING GLEAD ELECTRONICS CO., LTD - 7 - 3DRadiation Pattern Frequency (MHz) 240024502500 Avg. Gain (dBi) -0.23-0.36-0.51 Peck Gain (dBi) 4.985.194.55 Efficiency (%) 7071.269 嘉兴佳利电子有限公司http://www.glead.com.cn阿里巴巴http://zydq.en.alibaba.com JIAXING GLEAD ELECTRONICS CO., LTD - 8 - 8可靠性试验后允许误差Post Dependability Tolerance 经可靠性试验后允许比起始读数偏差见下表 Post Dependability Tolerance ( Refer to the table ) 9可靠性试验Dependability Test 基准条件：温度范围Temperature range25±5°C 相对湿度范围Relative Humidity range55~75%RH 工作温度Operating Temperature range -40°C~+125°C 9.1 耐振动Vibration Resist 在振动频率为10~55Hz振幅为1.5mm沿X.Y.Z方向各振动2小时后测试符合表8.1~8.4规定。 The device should satisfy the electrical characteristics specified in paragraph 8.1~8.4 after applied to the vibration of 10 to 55Hz with amplitude of 1.5mm for 2 hours each in X , Yand Z directions. 9.2 耐跌落冲击Drop Shock 在100cm高度处按X，Y，Z三个面分别自由跌落在木制地板上共3次后测试符合表8.1~8.4规 定。 The device should satisfy the electrical characteristics specified in paragraph 8.1~8.4 after dropping onto the hard wooden board from the height of 100cm for 3 times each facet of the 3 dimensions of the device. 9.3 耐焊接热Solder Heat Proof 能承受经120~150°C的温度预热120秒后，在255°C+10°C的焊锡浸5±0.5秒，或300°C-10°C的 电烙铁焊接3±0.5秒，焊接面无损伤。 The device should be satisfied after preheating at 120°C~150°Cfor 120 seconds and dipping in soldering Sn at 255°C+10°Cfor 5±0.5 seconds，or electric iron 300°C-10°Cfor 3±0.5 seconds， without damnify. 9.4 推力试验Adhesive Strength of Termination 在产品电极端子上或表面上可承受5N(≦0603)；10N(>0603)水平推力10±1秒而无明显外观损坏 与电极移位。 The device have no remarkable damage or removal of the termination after horizontal force of 5N(≦0603)；10N(>0603)with 10±1 seconds. No.Item（项目） Post Dependability Tolerance (可靠性试验后允许附加误差) 8.1Central Frequency中心频率±5 MHz 8.2Band Width通带宽度±5 MHz 8.3Gain增益±0.1 dBi 8.4V.S.W.R (in BW)驻波比±0.1 嘉兴佳利电子有限公司http://www.glead.com.cn阿里巴巴http://zydq.en.alibaba.com JIAXING GLEAD ELECTRONICS CO., LTD - 9 - 9.5 耐弯曲试验Bending Resist Test 将产品按图焊在 1.6±0.2mm 的 PCB 板中间，由箭头方向施 力：1mm/S，弯曲距离：1.5mm，保持5±1S，产品金属层无脱落。 Weld the product to the center part of the PCB with the thickness 1.6±0.2mm as the illustration shows, and keep exerting force arrow-ward on it at speed of :1mm/S , and hold for 5±1S at the position of 1.5mm bending distance , so far , any peeling off of the product metal coating should not be detected . 9.6 耐湿热特性Moisture Proof 在温度为60±2°C，相对湿度90~95%的恒温湿箱中放置96小时，在常温中恢复1~2小时后测 试，符合表8.1~8.4规定。 The device should satisfy the electrical characteristics specified in paragraph 8.1~8.4 after exposed to the temperature 60±2°Cand the relative humidity 90~95% RH for 96 hours and 1~2 hours recovery time under normal condition. 9.7 高温特性High Temperature Endurance 在温度为125±5°C的恒温箱中放置96±2小时，在常温中恢复1~2小时后测试。符合表8.1~8.4 规定。 The device should satisfy the electrical characteristics specified in paragraph 8.1~8.4 after exposed to temperature 125±5°Cfor 96±2 hours and 1~2 hours recovery time under normal temperature. 9.8 低温特性Low Temperature Endurance 在温度为-40°C±5°C低温箱中放置96±2小时后恢复1~2小时测试符合表8.1~8.4规定。 The device should also satisfy the electrical characteristics specified in paragraph 8.1~8.4 after exposed to the temperature -40°C±5°Cfor 96±2 hours and to 2 hours recovery time under normal temperature…

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Reference No.: WTX24X07164220W001/002/003 Page 14 of 17 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Conducted Emission Test Setup Radiation Emission Test Setup (Below 30MHz) Reference No.: WTX24X07164220W001/002/003 Page 15 of 17 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (30MHz to 1GHz) Radiation Emission Test Setup (1GHz to 18GHz) Reference No.: WTX24X07164220W001/002/003 Page 16 of 17 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (Above 18GHz) Reference No.: WTX24X07164220W001/002/003 Page 17 of 17 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn ***** END OF REPORT *****