2BLU9-QL15R3HEQ-BooK+, Notebook

M&M Electronics, S.A. Section 2.911 (d)(5)(i) Certification - EquipmentType Company name: M&M Electronics, S.A. Address: Cocosolito, Colon Free Zone, Main Entrance Warehouse10O and 110, PanamA. Zip Code: 03050. Product Name: Notebook ,Q-BooK+ FCC ID: 2BLU9-QL 15R3HE Model(s): S15W1P-3200U, QL 15R3HE16256 2.911 ( d)( 5)(i) EquipmentType We, [M&M Electronics, S.A.] ("the applicant") certify that the equipment for which authorization is sought through certification is not: • Prohibited f r om receiving an equipment authorization pursuant to§ 2.903; of the FCC rules. o Identified as an equipment type in the "Covered List"NOTE 1 Yours sincerely, Narne: Redwan Daggak Date: 9/10/2025 Title and Company name: Manager I M&M Electronics, S.A. NOTE 1 "Covered List"; is the List of Equipment and Services Covered By Section 2 of The Secure Networks Act, available at b!!Q§.;f /wwv>'. f��: gov/s upplychain/coveredlist References; 1) 986446 001 Covered Equipment v01 httos://apps.fcc.qov/oetcf/kdb/forms/FTSSearchResultPaqe.cfm?switch;::P&id;::325672 2)' Federal Register document 2022-28263 published on 02/06/23 https:/lwww.federalregister.gov/documents/2023/02/06/2022-28263/prdtectinq-against-national-security-threats-to-the-com muni::ations-supply-chain-through-the 2.911 (d)(S)(i) Equipment Type Attestation vl.2

M& M Electronics, S.A. Section 2.911 (d)(5)(ii) Certification -Applicant (Covered List) Company name: M&M Electronics, S.A. A d d r e s s : C o c o s o l i t o , C o l o n F r e e Z o n e , M a i n E n t r a n c e W a r e h o u s e 1 O D a n d 1 1 D , P a n a m A . Z i p C o d e : 03050.Product Name: Notebook ,Q-BooK+ FCC ID: 2BLU9-QL 15R3HE Model(s): S15W1 P-3200U, QL 15R3HE16256 2.911(d)(5)(ii) Applicant filing We, (M&M Electronics, S.A.] ("the applicant") certify that, as of the date of the filing of the application, the applicant is not identified Nore 1 o n the "Covered List"Nore 2 ,established pursuant to §1.50002 o f this chapter.as an entity producing coveredcommunications equipment. Yours sincerely, Name: Redwan Daggak � Date: 9/10/2025 Title and Company name: Manager I M&M Electronics, S.A. NOTE 1 Delete option not applicable to this application. NOTE 2 "Covered List"; is the List of Equipment and Services Covered By Section 2 of The Secure Networks Act, available at httos:/ /www.fee.gov/su pplychai n/cove red list References; 1) 986446 01)1 Covered Equipment v01 https://ailllliJcc.gov/oetcf/kdb/forms/FTSSearchResultPaqe.cfm?switch=P&id=325672 2) Federal Register document 2022-28263 published on 02/06/23 https://www.federalregister.gov/documents/2023/02/06/2022-28263/protecting-against-national-security-threats-to-the-com munications-SUP-llli'.::Chain-throuqh-the 2.911 (d)(S)(ii) Applicant Attestation vl.3

M&M Electronics, S.A. U.S. Agent Letter of Attestation To: Federal Communications Commission 7435 Oakland Mills Road, Columbia, MD 21046, USA Date: 09-20-2025 Ref: Attestation Statement – Part 2.911(d)(7) filing FCC ID: 2BLU9-QL15R3HE M&M Electronics, S.A. (“the applicant”) certifies that, as of the date of the filing of the application, FCC US Agent, LLC (“the agent”) is our designated U.S. agent for service of process for the above reference FCC ID. The applicant accepts to maintain an agent for service of process in the United States for no less than one year after either the grantee has permanently terminated all marketing and importation of the applicable equipment within the U.S., or the conclusion of any Commission- related administrative or judicial proceeding involving the equipment, whichever is later. The applicant further acknowledges it is our responsibility to inform the FCC whenever the agent information changes. FCC US Agent, LLC ("the agent) understand it is the agent's obligation to accept service of process in the United States for matters related to the applicable equipment, and at the physical U.S. address and email address. Designated U.S. Agent Company Name: FCC US Agent, LLC FRN: 0033402884 Address: 3722 Illinois Avenue, Saint Charles, IL, 60174, USA Contact Person: Tim Pane Tel: 708-571-3148 Applicant Company Name: M&M Electronics, S.A. Address: Cocosolito, Colon Free Zone, Main Entrance Warehouse10D and 11D, PanamA. Zip Code: 03050. Signature: Contact Person: Redwan Daggak Tel: +17869305168 Email: [email protected] FRN: 0036174050

M&M Electronics , S.A. Letter of Authorization C o m p a n y : M & M E l e c t r o n i c s , S . A . A d d r e s s : C o c o s o l i t o , C o l o n F r e e Z o n e , M a i n E n t r a n c e W a r e h o u s e l O D a n d 1 1 D , PanamA. Zip Code: 03050. Pr oduct Name: Notebook ,Q-BooK+ Model N umber: S15WlP-3200U, Q L15R3HE16256 FCC Identifier: 2BLU9-QL15R3HE We authorize MiCOM Labs Inc, 575 Boulder Court, Pleasanton, California 94566, USA, to act on our behalf on all matters concerning the above named equipment. Any individual within Mi COM Labs is authorized to act on our behalf and take action on the application. We declare that MiCOM Labs Inc, 575 Boulder Court, Pleasanton, California 94566, U SA, is allowed to forward all information related to the approval project to the Federal Communication Commission and to discuss any issues concerning the approval a pplication. Any and all acts carried out by Mi COM Labs on our behalf shall have the same effect as acts of our own. Name: Redwan Daggak Date: 2025.06.12 Title: Manager Signature of applicant: �

M&MElectronics,S.A. Familymodelsdeclarationletter. 9/25/2025 We Company:M&MElectronics,S.A. Address:Cocosolito,ColonFreeZone,MainEntranceWarehouse10Dand11D,PanamA.Zip Code:03050. Product:Q-BooK+,Notebook ModelName:QL15R3HE16256 FamilyModel:S15W1P-3200U FCCID:2BLU9-QL15R3HE AllthemodelarethesamecircuitandRFmodule,exceptthemodelnames. We(M&MElectronics,S.A.)herebystatethatallthemodelsareelectricalidenticalincludingthe samesoftwareparameterandhardwaredesign(i.e.,circuitdesign,PCBLayout,RFmodule/circuit, antennatype(s)andantennalocation,componentsonPCB,etc.),samemechanicalstructureand design(includingproductenclosure,materials,etc.),theonlydifferenceisthemodelnames. Thanks Sincerely, Signature [Name]RedwanDaggak [Title]manager [email][email protected]

SN: LD004936072500000001 SN: LD004936072500000001 ~LD004936072500005630 Code 128 来料空白，内容产线打印 号段如下： 贴纸位置示意图见附图 底壳型号贴纸+SN Size= 40x25mm 铜版纸 哑胶 SN: LD004936072500000001 32 mm 33 mm 镍片logo 贴纸位置示意图 贴纸位置

Page 1 of 101 Report No.: N25073001303E FCC SAR EVALUATION REPORT In accordance with the requirements of FCC 47 CFR Part 2(2.1093) and IEEE Std 1528-2013 Product Name： Q-BooK+, Notebook Trademark： Compaq Model Name： QL15R3HE16256 Family Model： S15W1P-3200U Report No.： N25073001303E FCC ID： 2BLU9-QL15R3HE Prepared for M&M Electronics, S.A. Cocosolito, Colon Free Zone, Main Entrance Warehouse10D and 11D, PanamA. Zip Code: 03050. Prepared by Shenzhen NTEK Testing Technology Co., Ltd. No. 24 Xinfa East Road, Xiangshan Community, Xinqiao Street, Baoan District, Shenzhen, Guangdong, People's Republic of China Tel. 0755-23200050 Website: http://www.ntek.org.cn Page 2 of 101 Report No.: N25073001303E TEST RESULT CERTIFICATION Applicant’s name .................. : M&M Electronics, S.A. Address .................................. : Cocosolito, Colon Free Zone, Main Entrance Warehouse10D and 11D, PanamA. Zip Code: 03050. Manufacturer's Name ..................................... : Hena Digital Technology (Shenzhen) Co., Ltd. Address .................................. : 13F, Block B, Tairan Building Tairan 8th Road, Futian District, Shenzhen, China Product description Product name ......................... : Q-BooK+, Notebook Trademark ............................ : Compaq Model Name ......................... : QL15R3HE16256 Family Model .......................... : S15W1P-3200U Standards .............................. : FCC 47 CFR Part 2(2.1093) IEEE Std 1528-2013 Published RF exposure KDB procedures This device described above has been tested by Shenzhen NTEK. In accordance with the measurement methods and procedures specified in IEEE Std 1528-2013 and KDB 865664 D01. Testing has shown that this device is capable of compliance with localized specific absorption rate (SAR) specified in FCC 47 CFR Part 2(2.1093). The test results in this report apply only to the tested sample of the stated device/equipment. Other similar device/equipment will not necessarily produce the same results due to production tolerance and measurement uncertainties. This report shall not be reproduced except in full, without the written approval of Shenzhen NTEK, this document may be altered or revised by Shenzhen NTEK, personal only, and shall be noted in the revision of the document. Test Sample Number ............................ S2507310046-1# Date of Test Date (s) of performance of tests ................................................................. : Aug. 01, 2025~ Aug. 15, 2025 Date of Issue ........................................... : Aug. 20, 2025 Test Result .............................................. : Pass Prepared By : Reviewed By : Approved By : Owen Xiao (Project Engineer) Aaron Cheng (Supervisor) Alex Li (Manager) Page 3 of 101 Report No.: N25073001303E ※ ※ Revision History ※ ※ REV. DESCRIPTION ISSUED DATE REMARK Rev.1.0 Initial Test Report Release Aug. 20, 2025 Owen Xiao Page 4 of 101 Report No.: N25073001303E TABLE OF CONTENTS 1. General Information ............................................................................................ 6 1.1. RF exposure limits .................................................................................... 6 1.2. Statement of Compliance ........................................................................ 7 1.3. EUT Description ....................................................................................... 7 1.4. Test specification(s) .................................................................................. 8 1.5. Ambient Condition ................................................................................... 8 1.6. Facilities And Accreditations .................................................................... 8 1.6.1. Facilities ............................................................................................. 8 1.6.2. Laboratory Accreditations And Listings .............................................. 8 2. SAR Measurement System ................................................................................... 9 2.1. SATIMO SAR Measurement Set-up Diagram ............................................ 9 2.2. Robot ..................................................................................................... 10 2.3. E-Field Probe .......................................................................................... 11 2.3.1. E-Field Probe Calibration ................................................................. 11 2.4. SAM phantoms ...................................................................................... 12 2.4.1. Technical Data .................................................................................. 13 2.5. Device Holder ........................................................................................ 14 2.6. Test Equipment List ................................................................................ 15 3. SAR Measurement Procedures .......................................................................... 17 3.1. Power Reference ................................................................................... 17 3.2. Area scan & Zoom scan .......................................................................... 17 3.3. Description of interpolation/extrapolation scheme .............................. 19 3.4. Volumetric Scan ..................................................................................... 19 3.5. Power Drift ............................................................................................ 19 4. System Verification Procedure .......................................................................... 20 4.1. Tissue Verification ................................................................................. 20 4.1.1. Tissue Dielectric Parameter Check Results ...................................... 21 4.2. System Verification Procedure .............................................................. 22 4.2.1. System Verification Results ....…

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Page 76 of 101 Report No.: N25073001303E Page 77 of 101 Report No.: N25073001303E Page 78 of 101 Report No.: N25073001303E Page 79 of 101 Report No.: N25073001303E Page 80 of 101 Report No.: N25073001303E Page 81 of 101 Report No.: N25073001303E Page 82 of 101 Report No.: N25073001303E Page 83 of 101 Report No.: N25073001303E Page 84 of 101 Report No.: N25073001303E Page 85 of 101 Report No.: N25073001303E Page 86 of 101 Report No.: N25073001303E Page 87 of 101 Report No.: N25073001303E Page 88 of 101 Report No.: N25073001303E Page 89 of 101 Report No.: N25073001303E Page 90 of 101 Report No.: N25073001303E Page 91 of 101 Report No.: N25073001303E Page 92 of 101 Report No.: N25073001303E Page 93 of 101 Report No.: N25073001303E Page 94 of 101 Report No.: N25073001303E Page 95 of 101 Report No.: N25073001303E Page 96 of 101 Report No.: N25073001303E Page 97 of 101 Report No.: N25073001303E <Justification of the extended calibration> If dipoles are verified in return loss (<-20dB, within 20% of prior calibration for below 3GHz, and <-8dB, within 20% of prior calibration for 5GHz to 6GHz), and in impedance (within 5 ohm of prior calibration), the annual calibration is not necessary and the calibration interval can be extended. <Head 2450MHz> Return Loss (dB) Delta (%) Impedance Delta(ohm) Date of Measurement -29.27 - 53.6 - Feb. 21, 2024 -25.738 12.07 55.969 2.369 Feb. 13, 2025 The return loss is <-20dB, within 20% of prior calibration; the impedance is within 5 ohm of prior calibration. Therefore the verification result should support extended calibration. Dipole Verification Data Page 98 of 101 Report No.: N25073001303E <Head 5200MHz> Return Loss (dB) Delta (%) Impedance Delta(ohm) Date of Measurement -9.64 - 25.8 - Feb. 21, 2024 -9.494 1.51 26.574 0.774 Feb. 13, 2025 The return loss is <-8dB, within 20% of prior calibration; the impedance is within 5 ohm of prior calibration. Therefore the verification result should support extended calibration. Dipole Verification Data Page 99 of 101 Report No.: N25073001303E <Head 5400MHz> Return Loss (dB) Delta (%) Impedance Delta(ohm) Date of Measurement -14.01 - 51.53 - Feb. 21, 2024 -12.971 7.416 54.166 2.636 Feb. 13, 2025 The return loss is <-8dB, within 20% of prior calibration; the impedance is within 5 ohm of prior calibration. Therefore the verification result should support extended calibration. Dipole Verification Data Page 100 of 101 Report No.: N25073001303E <Head 5600Hz> Return Loss (dB) Delta (%) Impedance Delta(ohm) Date of Measurement -16.83 - 44.12 - Feb. 21, 2024 -16.427 2.395 46.677 2.557 Feb. 13, 2025 The return loss is <-8dB, within 20% of prior calibration; the impedance is within 5 ohm of prior calibration. Therefore the verification result should support extended calibration. Dipole Verification Data Page 101 of 101 Report No.: N25073001303E <Head 5800MHz> Return Loss (dB) Delta (%) Impedance Delta(ohm) Date of Measurement -14.91 - 38.53 - Feb. 21, 2024 -15.039 0.865 40.791 2.261 Feb. 13, 2025 The return loss is <-8dB, within 20% of prior calibration; the impedance is within 5 ohm of prior calibration. Therefore the verification result should support extended calibration. _____________________________________ END_______________________________________ Dipole Verification Data

Report No.: N25073001306E Version.1.3 Page 1 of 55 RADIO TEST REPORT FCC ID: 2BLU9-QL15R3HE Product: Q-BooK+, Notebook Trade Mark: Compaq Model No.: QL15R3HE16256 Family Model: S15W1P-3200U Report No.: N25073001306E Issue Date: Aug. 22, 2025 Prepared for M&M Electronics, S.A. Cocosolito, Colon Free Zone, Main Entrance Warehouse10D and 11D, PanamA. Zip Code: 03050. Prepared by Shenzhen NTEK Testing Technology Co., Ltd. No. 24 Xinfa East Road, Xiangshan Community, Xinqiao Street, Baoan District, Shenzhen, Guangdong, People's Republic of China Tel. 0755-23200050 Website: http://www.ntek.org.cn Report No.: N25073001306E Version.1.3 Page 2 of 55 TABLE OF CONTENTS 1 TEST RESULT CERTIFICATION ...................................................................................................................... 3 2 SUMMARY OF TEST RESULTS ......................................................................................................................... 4 3 FACILITIES AND ACCREDITATIONS ............................................................................................................. 5 3.1 FACILITIES..................................................................................................................................................... 5 3.2 LABORATORY ACCREDITATIONS AND LISTINGS ................................................................................. 5 3.3 MEASUREMENT UNCERTAINTY ............................................................................................................... 5 4 GENERAL DESCRIPTION OF EUT .................................................................................................................. 6 5 DESCRIPTION OF TEST MODES ..................................................................................................................... 8 6 SETUP OF EQUIPMENT UNDER TEST ........................................................................................................... 9 6.1 BLOCK DIAGRAM CONFIGURATION OF TEST SYSTEM ....................................................................... 9 6.2 SUPPORT EQUIPMENT ............................................................................................................................... 10 6.3 EQUIPMENTS LIST FOR ALL TEST ITEMS .............................................................................................. 11 7 TEST REQUIREMENTS .................................................................................................................................... 13 7.1 CONDUCTED EMISSIONS TEST ............................................................................................................... 13 7.2 RADIATED SPURIOUS EMISSION ............................................................................................................ 16 7.3 6DB BANDWIDTH ....................................................................................................................................... 25 7.4 DUTY CYCLE ............................................................................................................................................... 26 7.5 PEAK OUTPUT POWER .............................................................................................................................. 28 7.6 POWER SPECTRAL DENSITY ................................................................................................................... 29 7.7 CONDUCTED BAND EDGE MEASUREMENT......................................................................................... 31 7.8 SPURIOUS RF CONDUCTED EMISSIONS ................................................................................................ 32 7.9 ANTENNA APPLICATION .......................................................................................................................... 33 8 TEST RESULTS ................................................................................................................................................... 34 8.1 DUTY CYCLE .................................................................................................................................................. 34 8.2 MAXIMUM CONDUCTED OUTPUT POWER ....................................................................................................... 37 8.3 -6DB BANDWIDTH .......................................................................................................................................... 40 8.4 OCCUPIED CHANNEL BANDWIDTH .................................................................................................................. 43 8.5 MAXIMUM POWER SPECTRAL DENSITY LEVEL ............................................................................................... 46 8.6 BAND EDGE .................................................................................................................................................... 49 8.7 CONDUCTED RF SPURIOUS EMISSION ............................................................................................................. 52 Report No.: N25073001306E Version.1.3 Page 3 of 55 1 TEST RESULT CERTIFICATION Applicant’s name ......................... : M&M Electronics, S.A. Address ....................................... : Cocosolito, Colon Free Zone, Main Entrance Warehouse10D and 11D, PanamA. Zip Code: 03050. Manufacturer's Name .................. : Hena Digital Technology (Shenzhen) Co., Ltd. Address ....................................... : 13F, Block B, Tairan Building Tairan 8th Road, Futian District, Shenzhen, China Product description Product name .............................. : Q-BooK+, Notebook Trade Mark .................................. : Compaq Model and/or type reference ...... : QL15R3HE16256 Family Model ............................... : S15W1P-3200U Test Sample number ................... : S2507310045-1# Date (s) of performance of tests .................. : Jul. 30, 2025 ~ Aug. 22, 2025 Measu…

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Report No.: N25073001307E Version.1.3 Page 1 of 132 FCC RADIO TEST REPORT FCC ID: 2BLU9-QL15R3HE Product: Q-BooK+, Notebook Trade Mark: Compaq Model No.: QL15R3HE16256 Family Model: S15W1P-3200U Report No.: N25073001307E Issue Date: Aug. 22, 2025 Prepared for M&M Electronics, S.A. Cocosolito, Colon Free Zone, Main Entrance Warehouse10D and 11D, PanamA. Zip Code: 03050. Prepared by Shenzhen NTEK Testing Technology Co., Ltd. No. 24 Xinfa East Road, Xiangshan Community, Xinqiao Street, Baoan District, Shenzhen, Guangdong, People's Republic of China Tel. 0755-23200050 Website: http://www.ntek.org.cn Report No.: N25073001307E Version.1.3 Page 2 of 132 TABLE OF CONTENTS 1 TEST RESULT CERTIFICATION ...................................................................................................................... 3 2 SUMMARY OF TEST RESULTS ......................................................................................................................... 4 3 FACILITIES AND ACCREDITATIONS ............................................................................................................. 5 3.1 FACILITIES..................................................................................................................................................... 5 3.2 LABORATORY ACCREDITATIONS AND LISTINGS ................................................................................. 5 3.3 MEASUREMENT UNCERTAINTY ............................................................................................................... 5 4 GENERAL DESCRIPTION OF EUT .................................................................................................................. 6 5 DESCRIPTION OF TEST MODES ..................................................................................................................... 8 6 SETUP OF EQUIPMENT UNDER TEST ......................................................................................................... 10 6.1 BLOCK DIAGRAM CONFIGURATION OF TEST SYSTEM ..................................................................... 10 6.2 SUPPORT EQUIPMENT ............................................................................................................................... 11 6.3 EQUIPMENTS LIST FOR ALL TEST ITEMS .............................................................................................. 12 7 TEST REQUIREMENTS .................................................................................................................................... 14 7.1 CONDUCTED EMISSIONS TEST ............................................................................................................... 14 7.2 RADIATED SPURIOUS EMISSION ............................................................................................................ 17 7.3 6DB BANDWIDTH ....................................................................................................................................... 27 7.4 DUTY CYCLE ............................................................................................................................................... 29 7.5 MAXIMUM OUTPUT POWER .................................................................................................................... 30 7.6 POWER SPECTRAL DENSITY ................................................................................................................... 32 7.7 CONDUCTED BAND EDGE MEASUREMENT......................................................................................... 34 7.8 SPURIOUS RF CONDUCTED EMISSIONS ................................................................................................ 36 7.9 ANTENNA APPLICATION .......................................................................................................................... 37 8 TEST RESULTS ................................................................................................................................................... 38 8.1 DUTY CYCLE .................................................................................................................................................. 38 8.2 MAXIMUM CONDUCTED OUTPUT POWER ....................................................................................................... 51 8.3 -6DB BANDWIDTH .......................................................................................................................................... 52 8.4 OCCUPIED CHANNEL BANDWIDTH .................................................................................................................. 65 8.5 MAXIMUM POWER SPECTRAL DENSITY LEVEL ............................................................................................... 78 8.6 BAND EDGE .................................................................................................................................................... 91 8.7 CONDUCTED RF SPURIOUS EMISSION ........................................................................................................... 108 Report No.: N25073001307E Version.1.3 Page 3 of 132 1 TEST RESULT CERTIFICATION Applicant’s name ......................... : M&M Electronics, S.A. Address ....................................... : Cocosolito, Colon Free Zone, Main Entrance Warehouse10D and 11D, PanamA. Zip Code: 03050. Manufacturer's Name .................. : Hena Digital Technology (Shenzhen) Co., Ltd. Address ....................................... : 13F, Block B, Tairan Building Tairan 8th Road, Futian District, Shenzhen, China Product description Product name .............................. : Q-BooK+, Notebook Trade Mark .................................. : Compaq Model and/or type reference ...... : QL15R3HE16256 Family Model ............................... : S15W1P-3200U Test Sample number ................... : S2507310045-1# Date (s) of performance of tests .................. : Jul. 30, 2025 ~ Aug. 22, 2025 Measurem…

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Report No.: N25073001307E Version.1.3 Page 67 of 13 2 OBW NVNT b 2462MHz Ant1 OBW NVNT b 2412MHz Ant2 Report No.: N25073001307E Version.1.3 Page 68 of 13 2 OBW NVNT b 2437MHz Ant2 OBW NVNT b 2462MHz Ant2 Report No.: N25073001307E Version.1.3 Page 69 of 13 2 OBW NVNT g 2412MHz Ant1 OBW NVNT g 2437MHz Ant1 Report No.: N25073001307E Version.1.3 Page 70 of 13 2 OBW NVNT g 2462MHz Ant1 OBW NVNT g 2412MHz Ant2 Report No.: N25073001307E Version.1.3 Page 71 of 13 2 OBW NVNT g 2437MHz Ant2 OBW NVNT g 2462MHz Ant2 Report No.: N25073001307E Version.1.3 Page 72 of 13 2 OBW NVNT n20 2412MHz Ant1 OBW NVNT n20 2437MHz Ant1 Report No.: N25073001307E Version.1.3 Page 73 of 13 2 OBW NVNT n20 2462MHz Ant1 OBW NVNT n20 2412MHz Ant2 Report No.: N25073001307E Version.1.3 Page 74 of 13 2 OBW NVNT n20 2437MHz Ant2 OBW NVNT n20 2462MHz Ant2 Report No.: N25073001307E Version.1.3 Page 75 of 13 2 OBW NVNT n40 2422MHz Ant1 OBW NVNT n40 2437MHz Ant1 Report No.: N25073001307E Version.1.3 Page 76 of 13 2 OBW NVNT n40 2452MHz Ant1 OBW NVNT n40 2422MHz Ant2 Report No.: N25073001307E Version.1.3 Page 77 of 13 2 OBW NVNT n40 2437MHz Ant2 OBW NVNT n40 2452MHz Ant2 Report No.: N25073001307E Version.1.3 Page 78 of 13 2 8.5 MAXIMUM POWER SPECTRAL DENSITY LEVEL Condition Mode Frequency (MHz) Antenna Conducted PSD (dBm) Duty Factor (dB) Total PSD (dBm) Limit (dBm) Verdict NVNT b 2412 Ant1 -4.23 0 -4.23 8 Pass NVNT b 2437 Ant1 -4.2 0 -4.2 8 Pass NVNT b 2462 Ant1 -5.12 0 -5.12 8 Pass NVNT b 2412 Ant2 -6.46 0 -6.46 8 Pass NVNT b 2437 Ant2 -5.81 0 -5.81 8 Pass NVNT b 2462 Ant2 -5.9 0 -5.9 8 Pass NVNT g 2412 Ant1 -9.76 0 -9.76 8 Pass NVNT g 2437 Ant1 -12.67 0 -12.67 8 Pass NVNT g 2462 Ant1 -7.98 0 -7.98 8 Pass NVNT g 2412 Ant2 -8.03 0 -8.03 8 Pass NVNT g 2437 Ant2 -7.72 0 -7.72 8 Pass NVNT g 2462 Ant2 -7.57 0 -7.57 8 Pass NVNT n20 2412 Ant1 -14.71 0 -14.71 8 Pass NVNT n20 2437 Ant1 1.1 0 1.1 8 Pass NVNT n20 2462 Ant1 0.24 0 0.24 8 Pass NVNT n20 2412 Ant2 -10.31 0 -10.31 8 Pass NVNT n20 2437 Ant2 -9.26 0 -9.26 8 Pass NVNT n20 2462 Ant2 -8.99 0 -8.99 8 Pass NVNT n40 2422 Ant1 -11.63 0 -11.63 8 Pass NVNT n40 2437 Ant1 -11.53 0 -11.53 8 Pass NVNT n40 2452 Ant1 -11.8 0 -11.8 8 Pass NVNT n40 2422 Ant2 -12.91 0 -12.91 8 Pass NVNT n40 2437 Ant2 -12.37 0 -12.37 8 Pass NVNT n40 2452 Ant2 -12.71 0 -12.71 8 Pass Report No.: N25073001307E Version.1.3 …

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