2BTTE-V6PLUSBluetooth walkie-talkie

FCCStatement: Thisdevicecomplieswithpart15oftheFCCRules. Operationissubjecttothefollowingtwoconditions: (1)Thisdevicemaynotcauseharmfulinterference,and (2)thisdevicemustacceptanyinterferencereceived, includinginterferencethatmaycauseundesiredoperation. ThisequipmenthasbeentestedandfoundtocomplywiththelimitsforaClassB digitaldevice, pursuanttopart15oftheFCCRules. Theselimitsaredesignedtoprovidereasonableprotectionagainstharmful interferenceinaresidential installation. Thisequipmentgenerates,usesandcanradiateradiofrequencyenergyand,ifnot installedandusedin accordancewiththeinstructions, maycauseharmfulinterferencetoradiocommunications. However,thereisnoguaranteethatinterferencewillnotoccurinaparticular installation. Ifthisequipmentdoescauseharmfulinterferencetoradioortelevisionreception, whichcanbedeterminedbyturningtheequipmentoffandon, theuserisencouragedtotrytocorrecttheinterferencebyoneormoreofthe followingmeasures: —Reorientorrelocatethereceivingantenna. —Increasetheseparationbetweentheequipmentandreceiver. —Connecttheequipmentintoanoutletonacircuitdifferentfromthattowhichthe receiverisconnected. —Consultthedealeroranexperiencedradio/TVtechnicianforhelp.Caution:Any changesormodifications notexpresslyapprovedbytheparty

ShenzhenHoutonsenElectronicsCo.,Ltd. (2025.12.31) EurofinsElectricalandElectronicTestingNA,Inc. 914WestPatapscoAvenue Baltimore,MD21230 RE:AttestationStatementsPart2.911(d)(5)(i)requestfor(FCCID:2BTTE-V6PLUS) [ShenzhenHoutonsenElectronicsCo.,Ltd.](“theapplicant”)certifiesthatthe equipmentforwhichauthorizationissoughtisnot“covered”equipmentprohibited fromreceivinganequipmentauthorizationpursuanttosection2.903oftheFCCrules. Wealsocertifythat,asofthedateofthefilingoftheapplication,theequipmentdoes notutilizecyber-securityoranti-virussoftwarefromKasperskyLab,Inc,oranyofits successorsandassignees,whichisalsoonthe“coveredlist”. Sincerely, (Applicantsignature) (Applicantprintedname)MengXianfu ShenzhenHoutonsenElectronicsCo.,Ltd. (2025.12.31) EurofinsElectricalandElectronicTestingNA,Inc. 914WestPatapscoAvenue Baltimore,MD21230 RE:AttestationStatementsPart2.911(d)(5)(ii)requestfor(FCCID:2BTTE-V6PLUS) [ShenzhenHoutonsenElectronicsCo.,Ltd.](“theapplicant”)certifiesthat,asofthe dateofthefilingoftheapplication,theapplicantisnotidentifiedontheCoveredListas anentityproducing“covered”equipment. Sincerely, (Applicantsignature) (Applicantprintedname) MengXianfu

ShenzhenHoutonsenElectronicsCo.,Ltd. AgentAuthorizationLetter 2025-12-31 EurofinsElectricalandElectronicTestingNA,Inc. 914WestPatapscoAvenue Baltimore,MD21230 USA RE:LETTEROFAGENTAUTHORIZATION ToWhomItMayConcern: We,theundersigned,herebyauthorizeShenzhenMostTechnologyServiceCo.,Ltd.toact onourbehalfinallmattersrelatingtoapplicationforequipmentauthorization,includingthe signingofalldocumentsrelatingtothesematters. Wealsoherebycertifythatnopartytotheapplicationauthorizedhereunderissubjecttothe denialofbenefits,includingFCCbenefits,pursuanttoSection5301oftheAnti-DrugAbuse Actof1988,21U.S.C.853(a). Thisagreementexpiresoneyearfromthecurrentdate. Sincerely, Name:MengXianfu Position:MANAGER CompanyName:ShenzhenHoutonsenElectronicsCo.,Ltd. Address:Room302,BuildingBPlantShangliLangIndustrialZone,Shangli LangCommunityNanwanSubdistrict,LonggangDistrictShenzhen, GuangdongProvince,China Tel/Fax13632828338 E-Mail:[email protected]

ShenzhenHoutonsenElectronicsCo.,Ltd. LongTermConfidentialityRequestLetter 2025-12-31 EurofinsElectricalandElectronicTestingNA,Inc. 914WestPatapscoAvenue Baltimore,MD21230 USA RE:CONFIDENTIALITYREQUESTFOR(FCCID:2BTTE-V6PLUS) ToWhomItMayConcern: Thisletterservesasanofficialrequestforconfidentialityundersections0.457and0.459of CFR47.Wehaverequestedthatthe -e.g.Blockdiagram -e.g.SCH -e.g.OperationalDescription requiredtobesubmittedwiththisapplicationbepermanentlywithheldfrompublicreview. Theabovedocumentsarecompanyproprietaryinformationthatcouldnevergetinto thepossessionofyourcompetition. Pleasecontactmeifthereisanyinformationyoumayneed. Sincerely, Name:MengXianfu Position:MANAGER CompanyName:ShenzhenHoutonsenElectronicsCo.,Ltd. Address:Room302,BuildingBPlantShangliLangIndustrialZone,Shangli LangCommunityNanwanSubdistrict,LonggangDistrictShenzhen, GuangdongProvince,China Tel/Fax13632828338 E-Mail:[email protected]

ModelNo.:V6Plus FRONTVIEWOFSAMPLE BACKVIEWOFSAMPLE ModelNo.:V6Plus LEFTVIEWOFSAMPLE RIGHTVIEWOFSAMPLE ModelNo.:V6Plus TOPVIEWOFSAMPLE BOTTOMVIEWOFSAMPLE ModelNo.:V6Plus PHOTOOFTHEENTIRESAMPLE PHOTOOFTHEENTIRESAMPLE

ModelNo.:V6Plus Page1of3 INTERNALPHOTOOFSAMPLE INTERNALPHOTOOFSAMPLEPCB ModelNo.:V6Plus Page2of3 INTERNALPHOTOOFSAMPLEPCB INTERNALPHOTOOFSAMPLEPCB BTantenna ModelNo.:V6Plus Page3of3 INTERNALPHOTOOFSAMPLE

ShenzhenMostTechnologyServiceCo.,Ltd. No.5,2ndLangshanRoad,NorthDistrict,Hi-techIndustrialPark,Nanshan, Shenzhen,Guangdong,China. RFExposureEvaluationReport ReportReferenceNo........................: FCCID.................................................: MTEB25120258-H 2BTTE-V6PLUS Compiledby (position+printedname+signature) .. :FileadministratorsAlisaLuo Supervisedby (position+printedname+signature)..:TestEngineerSunnyDeng Approvedby (position+printedname+signature)..: ManagerYvetteZhou Dateofissue.........................................:Dec.23,2025 RepresentativeLaboratoryName.:ShenzhenMostTechnologyServiceCo.,Ltd. Address.................................................: No.5,2ndLangshanRoad,NorthDistrict,Hi-techIndustrialPark, Nanshan,Shenzhen,Guangdong,China. Applicant’sname ............................... :ShenzhenHoutonsenElectronicsCo.,Ltd. Address.................................................: Room302,BuildingBPlantShangliLangIndustrialZone,Shangli LangCommunityNanwanSubdistrict,LonggangDistrictShenzhen, GuangdongProvince,China Testspecification/Standard............: 47CFRPart1.1307 47CFRPart2.1093 TRFOriginator......................................:ShenzhenMostTechnologyServiceCo.,Ltd. ShenzhenMostTechnologyServiceCo.,Ltd.Allrightsreserved. Thispublicationmaybereproducedinwholeorinpartfornon-commercialpurposesaslongasthe ShenzhenMostTechnologyServiceCo.,Ltd.isacknowledgedascopyrightownerandsourceofthe material.ShenzhenMostTechnologyServiceCo.,Ltd.takesnoresponsibilityforandwillnotassume liabilityfordamagesresultingfromthereader'sinterpretationofthereproducedmaterialduetoits placementandcontext. Testitemdescription ........................ : Bluetoothwalkie-talkie TradeMark ............................................ : Houtonsen、Teleheer、SWAREY Model/Typereference ......................... : V6Plus ListedModels......................................: N/A ModulationType..................................: GFSK,π/4DQPSK,8DPSK OperationFrequency..........................: From2402MHzto2480MHz HardwareVersion................................. 1.0 SoftwareVersion ................................... 1.0 Rating ..................................................... : DC3.7VbyBattery DC5VbyUSBPort Result ..................................................... : PASS ReportNo.:MTEB25120258-HPage 2 of 5 TESTREPORT EquipmentunderTest:Bluetoothwalkie-talkie Model/Type:V6Plus ListedModels:N/A RemarkN/A Applicant: ShenzhenHoutonsenElectronicsCo.,Ltd. Address: Room302,BuildingBPlantShangliLangIndustrialZone,Shangli LangCommunityNanwanSubdistrict,LonggangDistrict Shenzhen,GuangdongProvince,China Manufacturer:ShenzhenHoutonsenElectronicsCo.,Ltd. Address : Room302,BuildingBPlantShangliLangIndustrialZone,Shangli LangCommunityNanwanSubdistrict,LonggangDistrict Shenzhen,GuangdongProvince,China TestResult:PASS Thetestreportmerelycorrespondstothetestsample. Itisnotpermittedtocopyextractsofthesetestresultwithoutthewrittenpermissionofthetest laboratory. ReportNo.:MTEB25120258-HPage 3 of 5 1.RevisionHistory RevisionIssueDateRevisionsRevisedBy 00 2025.12.23 InitialIssueAlisaLuo ReportNo.:MTEB25120258-HPage 4 of 5 2.SAREvaluation 2.1RFExposureComplianceRequirement 2.1.1StandardRequirement AccordingtoKDB447498D01GeneralRFExposureGuidancev06 4.3.1.StandaloneSARtestexclusionconsiderations UnlessspecificallyrequiredbythepublishedRFexposureKDBprocedures,standalone1-gheadorbodyand 10-gextremitySARevaluationforgeneralpopulationexposureconditions,bymeasurementornumerical simulation,isnotrequiredwhenthecorrespondingSARExclusionThresholdcondition,listedbelow,is satisfied. 2.1.2Limits The1-gand10-gSARtestexclusionthresholdsfor100MHzto6GHzattestseparationdistances≤50mm aredeterminedby: [(max.powerofchannel,includingtune-uptolerance,mW)/(min.testseparationdistance,mm)]·[√f(GHz)] ≤3.0for1-gSARand≤7.5for10-gextremitySAR,where Thetestexclusionsareapplicableonlywhentheminimumtestseparationdistanceis≤50mmand fortransmissionfrequenciesbetween100MHzand6GHz.Whentheminimumtestseparation distanceis<5mm,adistanceof5mmisappliedtodetermineSARtestexclusion ReportNo.:MTEB25120258-HPage 5 of 5 2.1.3EUTRFExposure MeasurementData EDR GFSK Testchannel PeakOutputPower (dBm) Tuneuptolerance (dBm) Maximumtune-upPower (dBm) Lowest(2402MHz)-1.78-1.78±1-0.78 Middle(2441MHz)-2.25-2.25±1-1.25 Highest(2480MHz)-1.90-1.90±1-0.9 π/4DQPSK Testchannel PeakOutputPower (dBm) Tuneuptolerance (dBm) Maximumtune-upPower (dBm) Lowest(2402MHz)-0.89-0.89±10.11 Middle(2441MHz)-1.41-1.41±1-0.41 Highest(2480MHz)-1.11-1.11±1-0.11 8DPSK Testchannel PeakOutputPower (dBm) Tuneuptolerance (dBm) Maximumtune-upPower (dBm) Lowest(2402MHz)-0.42-0.42±10.58 Middle(2441MHz)-0.94-0.94±10.06 Highest(2480MHz)-0.57-0.57±10.43 Worstcase:8DPSK Channel MaximumPeak ConductedOutput Power (dBm) Maximumtune-up Power Calculated value Exclusion threshold SARTest Exclusion (dBm)(mW) Lowest(2402MHz)-0.420.581.140.353.0Yes .......................THEENDOFREPORT.........................

ShenzhenMostTechnologyServiceCo.,Ltd. No.5,2ndLangshanRoad,NorthDistrict,Hi-techIndustrialPark,Nanshan, Shenzhen,Guangdong,China. TESTREPORT FCCRulesPart15.247 ReportReferenceNo........................: FCCID.................................................: MTEB25120258-R 2BTTE-V6PLUS Compiledby (position+printedname+signature)..:FileadministratorsAlisaLuo Supervisedby (position+printedname+signature)..:TestEngineerSunnyDeng Approvedby (position+printedname+signature) .. : ManagerYvetteZhou Dateofissue.........................................:Dec.23,2025 RepresentativeLaboratoryName.:ShenzhenMostTechnologyServiceCo.,Ltd. Address ................................................. : EastA,1/F.,NewAolinFactoryBuiding,LangshanErlu,North Area,Hi-TechIndustrialPark,NanshanDistrict,Shenzhen, Guangdong,China Applicant’sname...............................:ShenzhenHoutonsenElectronicsCo.,Ltd. Address.................................................: Room302,BuildingBPlantShangliLangIndustrialZone,Shangli LangCommunityNanwanSubdistrict,LonggangDistrictShenzhen, GuangdongProvince,China Testspecification/Standard ............ : FCCRulesPart15.247 TRFOriginator......................................:ShenzhenMostTechnologyServiceCo.,Ltd. ShenzhenMostTechnologyServiceCo.,Ltd.Allrightsreserved. Thispublicationmaybereproducedinwholeorinpartfornon-commercialpurposesaslongasthe ShenzhenMostTechnologyServiceCo.,Ltd.isacknowledgedascopyrightownerandsourceofthe material.ShenzhenMostTechnologyServiceCo.,Ltd.takesnoresponsibilityforandwillnotassume liabilityfordamagesresultingfromthereader'sinterpretationofthereproducedmaterialduetoits placementandcontext. Testitemdescription ........................ : Bluetoothwalkie-talkie TradeMark ............................................ : Houtonsen、Teleheer、SWAREY Model/Typereference ......................... : V6Plus ListedModels......................................: N/A ModulationType..................................: GFSK,π/4DQPSK,8DPSK OperationFrequency..........................: From2402MHzto2480MHz HardwareVersion................................. 1.0 SoftwareVersion ................................... 1.0 Rating ..................................................... : DC3.7VbyBattery DC5VbyUSBPort Result ..................................................... :PASS ReportNo.:MTEB25120258-RPage 2 of 50 TESTREPORT EquipmentunderTest:Bluetoothwalkie-talkie Model/Type:V6Plus ListedModels:N/A RemarkN/A Applicant: ShenzhenHoutonsenElectronicsCo.,Ltd. Address: Room302,BuildingBPlantShangliLangIndustrialZone,Shangli LangCommunityNanwanSubdistrict,LonggangDistrict Shenzhen,GuangdongProvince,China Manufacturer:ShenzhenHoutonsenElectronicsCo.,Ltd. Address : Room302,BuildingBPlantShangliLangIndustrialZone,Shangli LangCommunityNanwanSubdistrict,LonggangDistrict Shenzhen,GuangdongProvince,China TestResult : PASS Thetestreportmerelycorrespondstothetestsample. Itisnotpermittedtocopyextractsofthesetestresultwithoutthewrittenpermissionofthetest laboratory. ReportNo.:MTEB25120258-RPage 3 of 50 Contents 1REVISIONHISTORY...........................................................................................................................4 2TESTSTANDARDS..............................................................................................................................5 3SUMMARY.................................................................................................................................................6 3.1GeneralRemarks..........................................................................................................................................6 3.2ProductDescription.....................................................................................................................................6 3.3EquipmentUnderTest.................................................................................................................................6 3.4ShortdescriptionoftheEquipmentunderTest(EUT).............................................................................6 3.5EUToperationmode.....................................................................................................................................7 3.6BlockDiagramofTestSetup.......................................................................................................................7 3.7TestItem(EquipmentUnderTest)Description*........................................................................................7 3.8AuxiliaryEquipment(AE)Description........................................................................................................7 3.9AntennaInformation*...................................................................................................................................7 3.10RelatedSubmittal(s)/Grant(s).................................................................................................................8 3.11Modifications...............................................................................................................................................8 3.12EUTconfiguration.......................................................................................................................................8 4TESTENVIRONMENT........................................................................................................................9 4.1Addressofthetestlaboratory....................................................................................................................9 4.2Environmentalconditions............................................................................................................................9 4.3Summaryofmeasurementresults............................................................................................................10 4.4Statementofthemeasurementuncertainty............................................................................................10 …

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ReportNo.:MTEB25120258-RPage 36 of 50 8DPSK_3-DH5_Channel08DPSK_3-DH5_Channel39 8DPSK_3-DH5_Channel78 ReportNo.:MTEB25120258-RPage 37 of 50 APPENDIXIV.CarrierFrequenciesSeparation TestResult ModulationPacket LeftCenter frequency (MHz) RightCenter frequency (MHz) Hopping Frequency Separation (MHz) Limit(MHz)Result GFSKDH52439.98382441.04111.05730.697PASS GFSKDH52439.99192440.83470.84280.697PASS GFSKDH52440.00992441.00360.99370.697PASS π/4DQPSK2-DH52439.8682441.28741.41940.885PASS π/4DQPSK2-DH52440.03152441.0090.97750.885PASS π/4DQPSK2-DH52439.90522441.16711.26190.885PASS 8DPSK3-DH52439.85452440.89021.03570.868PASS 8DPSK3-DH52440.07382440.96520.89140.868PASS 8DPSK3-DH52439.96552441.16771.20220.868PASS TestGraphs GFSKGFSK GFSKπ/4DQPSK π/4DQPSKπ/4DQPSK ReportNo.:MTEB25120258-RPage 38 of 50 8DPSK8DPSK 8DPSK ReportNo.:MTEB25120258-RPage 39 of 50 APPENDIXV.ConductedSpurious&BandEdgeEmission TestResult Non-Hopping ModulationPacketChannel OOB Emission Frequency (MHz) OOB Emission Level (dBm) Limit (dBm) OverLimit (dB) Result GFSKDH5 0 2400.00-50.759-21.98-28.779PASS 4804.26-54.757-21.98-32.777PASS 7205.75-52.429-21.98-30.449PASS 9607.87-46.856-21.98-24.876PASS 24933.2-44.920-21.98-22.940PASS 39 4882.30-51.510-22.46-29.050PASS 7323.11-53.197-22.46-30.737PASS 9763.93-46.277-22.46-23.817PASS 24903.9-45.887-22.46-23.427PASS 78 2483.50-50.438-22.17-28.268PASS 4959.70-50.914-22.17-28.744PASS 7439.85-50.589-22.17-28.419PASS 9919.99-45.345-22.17-23.175PASS π/4DQPSK2-DH5 0 2398.73-50.818-21.87-28.948PASS 2400.00-51.128-21.87-29.258PASS 4804.30-58.988-21.87-37.118PASS 7205.80-52.076-21.87-30.206PASS 9607.90-46.741-21.87-24.871PASS 24941.9-45.714-21.87-23.844PASS 39 4882.30-55.480-22.48-33.000PASS 7323.11-54.910-22.48-32.430PASS 9763.93-44.825-22.48-22.345PASS 78 2483.50-52.133-22.19-29.943PASS 4959.70-53.455-22.19-31.265PASS 7439.85-53.619-22.19-31.429PASS 9919.99-45.102-22.19-22.912PASS 24928.8-44.867-22.19-22.677PASS 8DPSK3-DH5 0 2397.88-50.275-21.9-28.375PASS 2400.00-51.079-21.9-29.179PASS 4803.60-58.987-21.9-37.087PASS 7205.80-53.974-21.9-32.074PASS 9607.90-46.627-21.9-24.727PASS 24943.2-46.388-21.9-24.488PASS 39 4881.67-56.652-22.62-34.032PASS 7323.11-51.753-22.62-29.133PASS 9763.93-45.699-22.62-23.079PASS 24958.8-45.604-22.62-22.984PASS 78 2483.50-51.228-22.17-29.058PASS 4959.70-56.077-22.17-33.907PASS 7439.85-54.041-22.17-31.871PASS 9919.99-45.767-22.17-23.597PASS 24907.6-44.995-22.17-22.825PASS Note:inputcompensationcoeffcient(dB)=CableLoss(dB) Hopping ModulationPacketChannel OOB Emission Frequency (MHz) OOB Emission Level (dBm) Limit (dBm) OverLimit (dB) Result GFSKDH5 Hopping 2395.07-48.603-22.26-26.343PASS 2400.00-51.918-22.26-29.658PASS 2483.50-50.961-22.22-28.741PASS 2395.80-49.980-22.14-27.840PASS 2400.00-51.700-22.14-29.560PASS 2483.50-50.319-22.2-28.119PASS 2396.27-49.497-21.94-27.557PASS 2400.00-51.064-21.94-29.124PASS 2483.50-50.472-22.22-28.252PASS π/4DQPSK2-DH5 2398.35-48.997-22.11-26.887PASS 2400.00-51.712-22.11-29.602PASS ReportNo.:MTEB25120258-RPage 40 of 50 2483.50-49.909-22.24-27.669PASS 2397.59-49.983-22.03-27.953PASS 2400.00-51.450-22.03-29.420PASS 2483.50-51.423-22.36-29.063PASS 2398.13-49.786-22.34-27.446PASS 2400.00-51.771-22.34-29.431PASS 2483.50-49.934-22.32-27.614PASS 8DPSK3-DH5 2398.03-49.625-22.0-27.625PASS 2400.00-51.179-22.0-29.179PASS 2483.50-51.445-23.78-27.665PASS 2397.23-50.189-22.01-28.179PASS 2400.00-50.832-22.01-28.822PASS 2483.50-50.233-23.43-26.803PASS 2398.40-49.588-22.36-27.228PASS 2400.00-51.508-22.36-29.148PASS 2483.50-51.718-22.35-29.368PASS Note:inputcompensationcoeffcient(dB)=CableLoss(dB) TestGraphs OutOfBandEmission GFSK_DH5_Channel0 OutOfBandEmission π/4DQPSK_2-DH5_Channel0 30.0MHz-25000.0MHz GFSK_DH5_Channel0 30.0MHz-25000.0MHz π/4DQPSK_2-DH5_Channel0 OutOfBandEmission GFSK_DH5_Channel39 OutOfBandEmission π/4DQPSK_2-DH5_Channel39 ReportNo.:MTEB25120258-RPage 41 of 50 30.0MHz-25000.0MHz GFSK_DH5_Channel39 30.0MHz-25000.0MHz π/4DQPSK_2-DH5_Channel39 OutOfBandEmission GFSK_DH5_Channel78 OutOfBandEmission π/4DQPSK_2-DH5_Channel78 30.0MHz-25000.0MHz GFSK_DH5_Channel78 30.0MHz-25000.0MHz π/4DQPSK_2-DH5_Channel78 OutOfBandEmission 8DPSK_3-DH5_Channel0 30.0MHz-25000.0MHz 8DPSK_3-DH5_Channel0 ReportNo.:MTEB25120258-RPage 42 of 50 OutOfBandEmission 8DPSK_3-DH5_Channel39 30.0MHz-25000.0MHz 8DPSK_3-DH5_Channel39 OutOfBandEmission 8DPSK_3-DH5_Channel78 30.0MHz-25000.0MHz 8DPSK_3-DH5_Channel78 OutOfBandEmission(Left) GFSK_DH5_ChannelHopping OutOfBandEmission(Left) π/4DQPSK_2-DH5_ChannelHopping OutOfBandEmission(Right) GFSK_DH5_ChannelHopping OutOfBandEmission(Right) π/4DQPSK_2-DH5_ChannelHopping

ReportNo.:MTEB25120258-RPage 43 of 50 OutOfBandEmission(Left) GFSK_DH5_ChannelHopping OutOfBandEmission(Left) π/4DQPSK_2-DH5_ChannelHopping OutOfBandEmission(Right) GFSK_DH5_ChannelHopping OutOfBandEmission(Right) π/4DQPSK_2-DH5_ChannelHopping OutOfBandEmission(Left) GFSK_DH5_ChannelHopping OutOfBandEmission(Left) π/4DQPSK_2-DH5_ChannelHopping OutOfBandEmission(Right) GFSK_DH5_ChannelHopping OutOfBandEmission(Right) π/4DQPSK_2-DH5_ChannelHopping ReportNo.:MTEB25120258-RPage 44 of 50 OutOfBandEmission(Left) 8DPSK_3-DH5_ChannelHopping OutOfBandEmission(Right) 8DPSK_3-DH5_ChannelHopping OutOfBandEmission(Left) 8DPSK_3-DH5_ChannelHopping OutOfBandEmission(Right) 8DPSK_3-DH5_ChannelHopping OutOfBandEmission(Left) 8DPSK_3-DH5_ChannelHopping OutOfBandEmission(Right) 8DPSK_3-DH5_ChannelHopping ReportNo.:MTEB25120258-RPage 45 of 50 APPENDIXVI.DutyCycle TestResult ModulationPacketsChannel OnTime (ms) Period (ms) Duty Cycle(%) Duty Cycle (linear) Duty Cycle Factor (dB) 1/T GFSKDH5 02.8803.74876.840.76841.14410.3472 392.8803.74876.840.76841.14410.3472 782.8783.74876.790.76791.1470.3475 π/4DQPSK2-DH5 02.8863.74877.000.77001.13510.3465 392.8843.74876.950.76951.13790.3467 782.8863.74877.000.77001.13510.3465 8DPSK3-DH5 02.8863.74877.000.77001.13510.3465 392.8883.74877.050.77051.13230.3463 782.8863.74877.000.77001.13510.3465 TestGraphs GFSK(DH5)_Channel0GFSK(DH5)_Channel39 GFSK(DH5)_Channel78π/4DQPSK(2-DH5)_Channel0 π/4DQPSK(2-DH5)_Channel39π/4DQPSK(2-DH5)_Channel78 ReportNo.:MTEB25120258-RPage 46 of 50 8DPSK(3-DH5)_Channel08DPSK(3-DH5)_Channel39 8DPSK(3-DH5)_Channel78 ReportNo.:MTEB25120258-RPage 47 of 50 APPENDIXVII.DwellTime TestResult ModulationPacketChannel Pulse Width(ms) Numberof Pulsesin 31.6 seconds DwellTime (ms) Limit(ms)Result GFSK DH1 Hopping 0.3756315118.31 <400 PASS DH31.632166270.91PASS DH52.880113325.44PASS π/4DQPSK 2-DH10.3840312119.81PASS 2-DH31.632159259.49PASS 2-DH52.880103296.64PASS 8DPSK 3-DH10.3864317122.49PASS 3-DH31.632169275.81PASS 3-DH52.880100288.0PASS Note:Dwelltime=Pulsetime(ms)*NumberofPulsesin31.6seconds TestGraphs PulseWidth GFSK_DH1 NumberofPulsesin31.6seconds GFSK_DH1 PulseWidth GFSK_DH3 NumberofPulsesin31.6seconds GFSK_DH3 PulseWidth GFSK_DH5 NumberofPulsesin31.6seconds GFSK_DH5

ReportNo.:MTEB25120258-RPage 48 of 50 PulseWidth π/4DQPSK_2-DH1 NumberofPulsesin31.6seconds π/4DQPSK_2-DH1 PulseWidth π/4DQPSK_2-DH3 NumberofPulsesin31.6seconds π/4DQPSK_2-DH3 PulseWidth π/4DQPSK_2-DH5 NumberofPulsesin31.6seconds π/4DQPSK_2-DH5 PulseWidth 8DPSK_3-DH1 NumberofPulsesin31.6seconds 8DPSK_3-DH1 ReportNo.:MTEB25120258-RPage 49 of 50 PulseWidth 8DPSK_3-DH3 NumberofPulsesin31.6seconds 8DPSK_3-DH3 PulseWidth 8DPSK_3-DH5 NumberofPulsesin31.6seconds 8DPSK_3-DH5 ReportNo.:MTEB25120258-RPage 50 of 50 APPENDIXVIII.NumberOfHoppingChannel TestResult ModulationPacket NumberofHopping Channel LimitResult GFSKDH57915PASS π/4DQPSK2-DH57915PASS 8DPSK3-DH57915PASS TestGraphs HoppingPlot GFSK HoppingPlot π/4DQPSK HoppingPlot 8DPSK **********************EndofReport**********************

Approval sheet Page 1 of 9 ASC_RFANT5220110A0T_V13 Sep. 2012 MULTILAYER CERAMIC ANTENNA RFANT Pb free Series – RoHS Compliance Halogens Free Product 2.4 GHz ISM Band Working Frequency P/N: RFANT5220110A0T *Contents in this sheet are subject to change without prior notice. Approval sheet Page 2 of 9 ASC_RFANT5220110A0T_V13 Sep. 2012 FEATURES 1. Surface Mounted Devices with a small dimension of 5.2 x 2.0 x 1.1 mm 3 meet future miniaturization trend. 2. Embedded and LTCC (Low Temperature Co-fired Ceramic) technology is able to future integrate with system design as well as beautifying the housing of final product. 3. High Stability in Temperature / Humidity Change APPLICATIONS 1. Bluetooth 2. Wireless LAN 3. HormRF 4. ISM band 2.4GHz wireless applications DESCRIPTION Walsin Technology Corporation develops a new ceramic embedded antenna specified for 2.4 GHz ISM Band application, as shown in below “CONSTRUCTION”. Both of Wireless LAN IEEE 802.11b and Bluetooth TM typically located on this unlicensed frequency band which range covers from 2.4GHz to 2.4835GHz. To fulfil the friendly usage for antenna, this antenna has been designed to a typical 150MHz bandwidth through Walsin’s advanced LTCC (Low Temperature Co-fired Ceramic) technology and superior product design via 3D EM Simulation Skill. This antenna has a rectangular ceramic body with a tiny dimension of 5.2x 2.0 x 1.1 mm 3 meet the future SMT automation and miniaturization requirements on modern portable devices. CONSTRUCTION Identification mark Soldering terminal W T C W T C Feeding Identification mark Soldering terminal W T C W T C Feeding DIMENSIONS Figure Symbol Dimension L 5.20 ± 0.20 mm W 2.00 ± 0.20 mm T 1.15 ± 0.10 mm A 0.40 ± 0.25 mm Approval sheet P age 3 of 9 ASC_RFANT5220110A0T_V13 Sep. 2012 SOLDER LAND PATTERN DESIGN Figure ELECTRICAL CHARACTERISTICS RFANT5220110A0T Specification Working Frequency Range 2.4 GHz ～ 2.5GHz Gain 2.66 dBi (Typical) VSWR 2 max. Polarization Linear Azimuth Bandwidth Omni-directional Impedance 50Ω Rated Power (max.) 3 Watts Maximum Input Power 5 Watts for 5 minutes Operation Temperature -40 ̊C ~ +85 ̊C Remark: The specification is defined based on the test board dimension as in below Approval sheet Page 4 of 9 ASC_RFANT5220110A0T_V13 Sep. 2012 Antenna on Test Board ( FR4 Thickness 0.8mm) Antenna S11 on Test Board Bandwidth >150MHzBandwidth >150MHz Empty Area Empty Area 18x9 mm 50Ω ΩΩ ΩFeed line GROUND 30x18 mm 1mm 3.3mm 1.5mm WTC 2.5mm 18mm Empty Area Empty Area 18x9 mm 50Ω ΩΩ ΩFeed line GROUND 30x18 mm 1mm 3.3mm 1.5mm WTC 2.5mm 18mm Approval sheet Page 5 of 9 ASC_RFANT5220110A0T_V13 Sep. 2012 RADIATION PATTERN Radiation Pattern and Gain were dependent on measurement board design. The specification of RFANT5220110A0T antenna was measured based on the PCB size and installation position as shown in the below figure Test Board Vertical Horizontal Y - Z Plane Average Gai n= -0.82 dBi Peak Gain = 1.69 dBi Average Gain =-3.22 dBi Peak Gain= -5.42 dBi Average Gain=-8.98 dBi X - Z Plane Average Gain=-0.91 dBi Peak Gain= -5.97 dBi Average Gain=-3.24dBi Peak Gain= 2.66 dBi Average Gain= -8.61 dBi X - Y Plane Average Gain= -0.68 dBi Peak Gain= -5.97 dBi Average Gain=-3.12 dBi Peak Gain= 2.59 dBi Average Gain= -9.24 dBi Y Z WTC X Y Z WTC X Y Z WTC X Y Z WTC X Y Z WTC X Y Z WTC X z Y z Y z X z X X Y X Y Empty Area GROUND 30x18 mm WTC X Y Z Empty Area GROUND 30x18 mm WTC X Y Z X Y Z Approval sheet Page 6 of 9 ASC_RFANT5220110A0T_V13 Sep. 2012 RELIABILITY TEST Test item Test condition / Test method Specification Solderability JIS C 0050-4.6 JESD22-B102D *Solder bath temperature：235 ± 5°C *Immersion time：2 ± 0.5 sec *Solder：Sn3Ag0.5Cu for lead-free At least 95% of a surface of each terminal electrode must be covered by fresh solder. Leaching (Resistance to dissolution of metallization) IEC 60068-2-58 *Solder bath temperature：260 ± 5°C *Leaching immersion time：30 ± 0.5 sec *Solder : SN63A Loss of metallization on the edges of each electrode shall not exceed 25%. Resistance to soldering heat JIS C 0050-5.4 *Preheating temperature：120~150°C, 1 minute. *Solder temperature：270±5°C *Immersion time：10±1 sec *Solder：Sn3Ag0.5Cu for lead-free Measurement to be made after keeping at room temperature for 24±2 hrs No mechanical damage. Samples shall satisfy electrical specification after test. Loss of metallization on the edges of each electrode shall not exceed 25%. Drop Test JIS C 0044 *Height：75 cm *Test Surface： Rigid surface of concrete or steel. *Times：6 surfaces for each units；2 times for each side. No mechanical damage. Samples shall satisfy electrical specification after test. Adhesive Strength of Termination JIS C 0051- 7.4.3 *Pressurizing force： 5N(≦0603)；10N(>0603) *Test time：10±1 sec No remarkable damage or removal of the termination. Bending test JIS C 0051- 7.4.1 The middle part of substrate shall be pressurized by means of the pressurizing rod at a rate of about 1 mm/s per second until the deflection becomes 1mm/s and then pressure shall be maintained for 5±1 sec. Measurement to be made after keeping at room temperature for 24±2 hours No mechanical damage. Samples shall satisfy electrical specification after test. Approval sheet Page 7 of 9 ASC_RFANT5220110A0T_V13 Sep. 2012 Temperature cycle JIS C 0025 1. 30±3 minutes at -40°C±3°C, 2. 10~15 minutes at room temperature, 3. 30±3 minutes at +85°C±3°C, 4. 10~15 minutes at room temperature, Total 100 continuous cycles Measurement to be made after keeping at room temperature for 24±2 hrs No mechanical damage. Samples shall satisfy electrical specification after test. Vibration JIS C 0040 *Frequency：10Hz~55Hz~10Hz(1min) *Total amplitude：1.5mm *Test times：6hrs.(Two hrs each in three mutually perpendicular directions) No mechanical damage. Samples shall satisfy electrical specification after test. High temperature JIS C 0021 *Temperature：85°C±2°C *Test duration：1000+24/-0 hours Measurement to be made after keeping at room temperature for 24±2 hrs No mechanical damage. Sa…

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ModelNo.:V6Plus CETESTSETUP RETESTSETUP ModelNo.:V6Plus RETESTSETUP