A3LCLP510NLaser Beam Printer

18 of 19 Samsung EMC Testing Laboratory Project No: LBE041725 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Pic. 7 EUT (Label)

1 of 19 Samsung EMC Testing Laboratory Project No: LBE041725 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. EMC Test Report According to FCC Part 15 Subpart B Project No. LBE041725 Equipment under Test Applicant Samsung Electronics Co. Ltd; 416 Maetan-3 Dong, Young tong-Gu, Suwon City, Gyeonggi-Do, Korea, 442-742 FCC ID A3LCLP510N Product Name Laser Beam Printer Model Name CLP-510 Manufacturer Samsung Electronics Co. Ltd Date of Test Sep 24, 2004 – Sep 30, 2004 Issued Date Oct 04, 2004 Name/Position Signature Tested by Kyeong Dong, Kim Test Engineer Reviewed by No Cheon, Park Manager of EMC Lab. Authorized by Kyu Baek, Chung Chief of EMC Lab. 1. This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. 2. This test report is to certify that the tested device properly complies with the requirements of FCC Rules and Regulations Part 15 Subpart B Unintentional Radiators. All tests necessary to show compliance to the requirements were and these results met the specifications requirement. This laboratory is registered by the NIST/NVLAP, U.S.A. The test reported herein have been performed in accordance with its terms of registration. NVLAP LAB CODE 200623-0 2 of 19 Samsung EMC Testing Laboratory Project No: LBE041725 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Table of Contents 1. General Information 1.1 Basic Information related Product 1.2 Detail Information related Product 1.3 Operating mode and condition 1.4 Test System Details 1.5 Equipment Modifications 1.6 Test Procedure 1.7 Test Configuration 1.8 Applied Standard 1.9 Test Facility 2. Summary of Test Results 3. Description of individual tests 3.1 Conducted Emission 3.2 Radiated Emission 4. Appendix 4.1 Test Photography 4.2 EUT Photography 3 of 19 Samsung EMC Testing Laboratory Project No: LBE041725 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1. General Information 1.1 Basic Information related Product Applicant Samsung Electronics Co. Ltd; Model name CLP-510 Applicant Address 416 Maetan3- Dong, Young tong-Gu, Suwon City, Gyeonggi-Do, Korea, 442-742 Contact Person Kyeong Dong, Kim Kind of product Laser Beam Printer Valiant list CLP-510N Manufacturer Samsung Electronics Co.Ltd; New / Alternative / Permissive change Information This report is original report # 1.2 Detail Information related Product Specification Item Specification Remark QUALITY REAL 600 dpi, ADDRESSABLE 1200 dpi - RAM 64MB SDRAM (Max 192MB), MEMORY BUS 32-BIT 60MHz - ROM 8MB FLASH TYPE for CODE, ROM BUS 32-BIT - HOST INTERFACE IEEE1284(includingECP) B-TYPE USB2.O - OP PANEL 16 x 2 LCD Panel, LED 7 & Key 7 (Dual color LED in On-line key), Jam Indicator LED - OP PANEL I/F UART INTERFACE - FONT GDI - OPTIONI/F 1 SLOT for EXPANSION MEMORY 1 SLOT for EXPANSION ROM 1 SLOT for NETWORK/WLAN Second cassette Feeder - 4 of 19 Samsung EMC Testing Laboratory Project No: LBE041725 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Operating Frequency CLP-510 or CLP-510N is supporting the IEEE1284, USB, WireLess LAN and/or LAN Printing Mode. Both model have clock frequencies, Video(23.8807363MHz), CPU(60MHz), LPEC(23.8807363MHz), Main clock(12MHz), USB clock(30MHz), N/W clock(25MHz) and WLAN(2.4GHz). 1.3 Operating Mode and Condition EUT was tested all operating modes as below. Finally EUT was tested USB Printing (1200dpi, Color duplex) mode as maximum emission. - USB Printing Mode (worst emission) - IEEE1284 Printing Mode - LAN Printing Mode - WLAN Printing Mode - Standby Mode Test Voltage : AC 115V/60Hz 1.4 Test System Details Items Model name Manufacturer Remark Wireless LAN SWL-2250U Samsung Electro- Mechanics FCC ID : A3LSWL-2250U Second Cassette Feeder CLP-510S5 Samsung Electronics - 1.5 Equipment Modifications No equipment modifications were required. 5 of 19 Samsung EMC Testing Laboratory Project No: LBE041725 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.6 Test Procedure 1.6.1 Disturbance Voltage at Mains The EUT was placed on a platform nominal size, 1m by 1.5m, raised 80cm above the conducting ground plane. The rear of tabletop was located 40cm to the vertical conducting ground plane. The rear of EUT, including peripherals was aligned and flush with rear of tabletop. All other surfaces of tabletop was at least 80cm from any other grounded conducing surface. I/O cables and AC cables that were connected to the peripherals were bundled in center. They were folded back and forth forming a bindle 30cm to 40cm long and were handed at a 40cm height to the ground plane. Each EUT current-carrying power lead, except the ground(safety)lead, were individually connected through a LISN to the input power source. All unused 50 ohm connectors of the LISN were resistively terminated in 50 ohm when not connected to the measuring equipment. 1.6.2 Radiated disturbance EUT was placed on a platform of nominal size, 1m by 1.5m, raised 80cm above the conducting ground plane. The rear of EUT, including peripherals was aligned and flush with rear of tabletop. I/O cables that were connected to the peripherals were bundle in center. They were folded back and forth forming a bundle 30cm to 40cm long and were hanged 40cm height to the ground plane. Test was made with the antenna positioned in both the horizontal and vertical planes of polarization. The measurement antenna was varied in height above the conducting ground plane and the run table azimuth was varied to obtain the maximum signal strength The system configuration, clock speed, mode of operation or video resolution, turntable azimuth with respect to the antenna were noted for each frequency found. The spectrum was scanned from 30 to 1000 MHz using biconiLog antenna. 6 of 19 Samsung EMC Testing L…

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15 of 19 Samsung EMC Testing Laboratory Project No: LBE041725 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 4. Appendix 4.1 Test Photography Pic. 1 Conducted Emission (Front) Pic. 2 Conducted Emission (Rear) 16 of 19 Samsung EMC Testing Laboratory Project No: LBE041725 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Pic. 3 Radiated Emission (Front) Pic. 4 Radiated Emission (Rear)