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A3LHLP6163WDLP Projection TV

Samsung Electronics Co Ltd
DLP Projection TV - FCC ID A3LHLP6163W - Samsung Electronics Co Ltd
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Application Details

Equipment Class
JBP - Part 15 Class B Computing Device Peripheral
Date of Grant
Apr 29, 2004
Application Purpose
Original Equipment
Date of Application
Apr 29, 2004
Equipment Note
DLP Projection TV
Company
Samsung Electronics Co Ltd
Country
United States

Documents & Files

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Users Manual

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Block Diagram

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External Photos

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ID Label/Location Info

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Internal Photos

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Test Report

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Test Setup Photos

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

ID Label/Location Info

FCC ID SAMPLE LABEL & LOCATION LABELLING REQUIREMENTS PER §§ 2.925 & §§ 15.19 The Label shown shall be permanently affixed at a conspicuous location on the device and be readily visible to the user at the time of purchase. (SEE NEXT PAGE) Page : 19 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE040874 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. SAMSUNG ELECTRONICS AMERICA INC. 105 CHALLENGER ROAD, RIDGEFIELD PARK N.J. 07660-0511, U.S.A. DIST.BY SAMSUNG ELECTRONICS CANADA INC 7037 Financial Drive Mississauge, Ontario L5N 6R3 TYPE NO.: AT61L3 FCC ID.: A3LHLP6163W MODEL NO./MODELE NO. : HLP6163W AC120VOLTS 60HZ 200WATTS MFD./FABRIQUE: APRIL. 2004 FABRIQUE EN SUWON COREE MADE IN SUWON KOREA(SEC) CHASSIS/CHASSIS:L62B SERIAL NO.: U L R LISTED 77HN E215927 LR38329 Pic. 7 EUT (Label)

Test Report

Page : 1 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE040874 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. EMC Test Report According to FCC Part 15 Subpart B Project No. LBE040874 Equipment under Test Address 416 Maetan3-Dong,Yeongtong-Gu,Suwon-City,Gyeonggi-Do, Korea,443-742 Product Name DLP PROJECTION TV Model Name AT61L3 Manufacturer SAMSUNG Brand Name SAMSUNG FCC ID A3LHLP6163W Variant Model See Page 3 Date of Test April 22 ~ 23 , 2004 Issued Date April 26, 2004 Name/Position Signature Tested by Jang Tae Young Test Engineer Reviewed by No Cheon, Park Manager of EMC Lab. Authorized by Kyu Baek, Chung Chief of EMC Lab. 1. This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. 2. This test report is to certify that the tested device properly complies with the requirements of FCC Rules and Regulations Part 15 Subpart B Unintentional Radiators. All tests necessary to show compliance to the requirements were and these results met the specifications requirement. This laboratory is registered by the NIST/NVLAP, U.S.A. The test reported herein have been performed in accordance with its terms of registration. NVLAP LAB CODE 200623-0 Page : 2 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE040874 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Table of Contents 1. General Information 1.1 Basic Information related Product 1.2 Detail Information related Product 1.3 Test Configuration 1.4 EUT Operating Conditions 1.5 Applied Standard 1.6 Test Facility 2. Summary of Test Results 3. Description of individual tests 3. 1 Conducted Emission 3. 2 Radiated Emission 4. Appendix A 4.1 Test Photography 4.2 EUT Photography Page : 3 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE040874 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1. General Information 1.1 Basic Information related Product Applicant Samsung Electronics Co. Ltd; Model name AT61L3 Applicant Address Samsung Electronics Co. Ltd; 416 Maetan3- Dong, Yeongtong-Gu, Suwon-City, Gyeonggi-Do, Korea, 443-742 Contact Person SEUNGCHEOL LEE Kind of product DLP PROJECTION TV Valiant list None Manufacturer Samsung Electronics Co.Ltd; 1.2 Detail Information related Product Specification Resolution 1280 * 720 Horizontal Frequency 60kHz Vertical Frequency 75Hz Operating Frequency 1.3 Operating Mode and Condition The system was configured for testing in typical fashion use. The mode of operation utilized for testing was selected to best simulate typical EUT use. - PC Video Input - PC DVI Input 1.4 Equipment Modifications No equipment modifications were required. Page : 4 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE040874 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.5 Test Configuration Used EUT and Peripherals Seq Device Model Name Serial # Maker Note A DLP Projection TV AT61L3 - B PC M6320 625792GR301193 SAMSUNG C Printer LQ-580H CG2Y016889 EPSON D PS/2 Keyboard SEM-DT35 3T013080 SAMSUNG E PS/2 Mouse P801 01007585 KYE SYSTEMS Used Cable Description Connect Cable Length [m] Shielded [Y/N] Remark 1 Parallel (Printer) 1.7 Yes 2 Monitor 1.5 Yes 3 DVI 1.5 Yes 4 PS/2 1.5 Yes 5 Component Video Out 1.5 No 6 AV IN 1.5 No 7 Component Audio Out 1.5 No 8 S -Video Out 1.5 Yes 9 AV Out 1.5 No Page : 5 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE040874 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Block Diagram 1.6 Applied Standards List Product or Generic Standards Basic Standards FCC Part15 Subpart B ANSI 63.4 : 2000 Page : 6 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE040874 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.7 Test Facility General Information The sites are constructed in conformance with the requirements of ANSI C63.4 and CISPR 22, 16-1, 16-2, 11. This EMC Testing Lab. is accredited by Korea Laboratory Accreditation Scheme(KOLAS) which signed the International Laboratory Accreditation Cooperation (ILAC) Mutual Recognition Arrangement (MRA) for the above test item(s) and test method(s). This Lab. is operated as testing laboratory in accordance with the requirements of ISO/IEC 17025:1998. Accreditation and Listing Uncertainty Test Item Expanded Uncertainty Radiated Disturbance 5.09 Disturbance voltage at the mains terminals 1.64 Disturbance Power 2.46 (According to NAMAS Pub.NIS81) Page : 7 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE040874 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 2. Summary of Test Results Result : PASS The equipment under test(EUT) has been found to comply with the applied standards. Test Name Applied Standard Result Electromagnetic Emission Test 3.1 Conducted Emission FCC Part15 Subpart B Complied 3.2 Radiated Emission FCC Part15 Subpart B Complied Page : 8 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE040874 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 3. Description of Individual Tests 3.1 Conducted Emission Test Information Test Engineer Jang Tae Young Test Date April 22, 2004 Climate Condition Ambient Temperature : 23°C Relative Humidity : 37% Test Place Shield Room #5 Test Equipments Calibration Equipment Modal Name Manufacturer Serial No. Next Date Interval Spectrum Analyzer E7405A Agilent US4110272 2004-06-14 12 L.I.S.N ESH3-Z5 R&S 100261 2004-07-16 12 Field strength meter ESS R&S 844661 2004-05-31 12 RF Relais Matrix PSU R&S 861206/024 N/A 12 L.I.S.N ESH3-Z5 R&S 100260 2004-0…

Text truncated - open the document above for the full version.

Test Setup Photos

Page : 16 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE040874 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 4. Appendix A 4.1 Test Photography Picture 1. Conducted Emission (Front) Picture 2. Conducted Emission (Rear) Page : 17 of 19 Samsung EMC Testing and Certification Laboratory Project NO. :LBE040874 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Picture 3. Radiated Emission (Front) Picture 4. Radiated Emission (Rear)

Contact Information

Applicant

Jenni Chun(General Manager)
[email protected]973-808-6375Fax: 973-808-6361

Technical Contact

PCTEST Engineering Lab., Inc.Randy Ortanez
[email protected]410-290-6652

6660-B Dobbin Road · Columbia, Maryland · United States

Test Firm

SAMSUNG ELECTRONICS CO., LTD.No Cheon Park
[email protected]82-31-200-2185Fax: 82-31-200-2189

Technical Specifications

#Rule PartsFrequency RangePower Output
115B--
Grant Notes
Max. Resolution: 1280 x 720

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