A3LSMF721UPortable Handset

Quick Reference Guide (Terms an d Conditions) SM-F721U SM-F721U1 Read this document before operating the mobile device, accessories, or software (defined collectively and individually as the “Product”) and keep it for future reference. This document contains important Terms and Conditions. Electronic acceptance, opening the packaging, use, or retention of the Product constitutes acceptance of these Terms and Conditions. Visit www.samsung.com/us to view device information, the user manual, and more. You may incur additional charges for accessing the Internet. Device Layout To turn on the device, pr ess and hold th e Side key for a few seconds. The charger should remain close to the electric socket and easily accessible while charging. Installing a nano-SIM card Nano- SIM cards are sold separately. Contact us Questions? Visit us.community.samsung.com Get Support Call 1.800.SAMSUNG Service locations Find a service location near you at Samsung.com/us/support/service/locations Switching made simple Whether you are coming from an iOS or Android platform, you can easily transfer your data with Smart Switch. Back up your old phone Back up your old phone using your favorite back-up app. Samsung Smart Switch 1. From your new Galaxy device, tap Settings > Accounts and backup > Smart Switch. 2. Tap Receive data. 3. Select your old device type. 4. Tap Cable (Android) or Wireless (Android and iOS) and follow the prompts to connect your phones. Customize Tap Settings to personalize your phone. Flight mode This disables all wireless functions on your devic e. You can use only non- network services On the setting screen, tap Flight mode. NOTE: The use of mobile devices on an aircraft or a ship may be subject to federal and local guidelines and restrictions. Check with appropriate author and always follow crew instructions regarding when and how you may use your device. Important l egal information Arbitration Agreement - This Product is subject to a binding arbit ration agreement between you and SAMSUNG ELECTRONICS AMERICA, INC. (“Samsung”). You can opt out of t he agreement within 30 calendar days of the first consumer purchase by emailing [email protected] or calling 1-800-SAMSUNG (726-7864) and providing the applicable information. The full Arbitration Agreement, Standard One-year Limited Warranty, End User License Agreement (EU LA), and Health & Safety Information for your device are available online: •English: www.samsung.com/us/Legal/Phone-HSGuide •Spanish: www.samsung.com/us/Legal/Phone-HSGuide-SP This information can also be found on the device in the “About device” or “About phone” or “About tablet” section, for example: •Settings > About phone or About device or About tablet > Legal information > Samsung legal •Or,Search “Legal” If your device required Federal Communications Commission (FCC) approval, you can view the FCC certification by opening Settings > A bout phone or About device or About tablet> Status Information. Health and Safety WARNING! To avoid electri c shock and damage to your device, do not charge device while it is wet or in an area where it co uld get wet. Do not handle device, c harger or cords with wet hands while charging. Maint aining dust and water resistance The device is not impervious to dust and water damage in any situation. It is important that all c ompartments are closed tightly. Follow these tips carefully to prevent damage to the device and maintain dust and water resistance performance: •Water resistant based on IP68 rating, which tests submersion in fresh water deeper than 1.5 meters or keep it submerged for more than 30 minutes. If device is exposed to fresh water, dry it thoroughly with a clean, soft cloth; if exposed to liquid other than fresh water, rinse with fresh water and dry as directed. •Any device which uses accessible compar tments or por ts that can be opened should have these se aled or closed tightly to prevent liquid from entering th e system. •If the device has been immersed i n water or the microphone or speaker is wet, sound may not be heard clearly during a call. After wiping the device with a dry cloth, dry it thoroughly before using it. •Do not expose the device to water at high pressure. •If the device is dropped or receives an impact, the water and dust resistant features of the device may be damaged. Note: Liquid other than fresh water may enter the device fa ster. Failure to rinse the device in fresh water and dry it as instructed may cause the device to suffer from operability or cosmetic issues. Samsung Knox Samsung Knox is Samsung’s security platf orm. Additional licensing fees may be required for enterprise use. For more information about Knox, pl ease refer to: www.samsung.com/us/knox Specific Absorption Rate (SAR) certification information For information about SAR, visit : •https://www.fcc.gov/general/radio-frequency-safety-0 •www.fcc.gov/encyclopedia/ specifi c-absorption-rate-sar-cellular-telephones •www.samsung.com/sar Body-worn operations are restricted to belt-clips, ho lsters or similar accessories that have no metallic component in the assembly and must provide at least 1.5cm separation between the device and the user's body. Samsung Wireless Power Sharing feature allows device -to -device c harging without the need for a charger. If your device supports the wireless power sharing function, this equipment should be operated with a minimum distance of 20 cm between the device and your body. Note: Foldable devices can be stored in an environment with ambient temperatures of -10°C / 14.0°F to 50°C / 122°F safely; prolonged exposure to temperatures outside these recommended temperatures can pose a high risk of damage to the device. Samsung mobile products and recycling WARNING! Never dispose of batteries in a fire because they may explode. Do not disassemble, crush, puncture, heat, burn or reuse. F or battery and cell phone recycling, go to call2re cycle. org or call 1- 800-822-8837. F or more recycling information, go …

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Samsung Electronics America, Inc 19 Chapin Rd, Building D. Pine Brook, NJ 07058 Date: June 10, 2022 FCC ID: A3LSMF721U To whom it may concern: We, the undersigned, hereby authorize Element Washington DC LLC, to act on our behalf in all matters relating to applications for equipment authorization, including the signing of all documents relating to these matters. Any and all acts carried out by Element Washington DC LLC. on our behalf shall have the same effect as acts of our own. We also hereby certify that no party to any application is subject to a denial of benefits, including FCC benefits, pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S. C. 862. Sincerely, Jenni Chun / General Manager Samsung Electronics America, Inc. Address: 19 Chapin Rd., Building D Pine Brook, NJ 07058 Tel: 1-973-808-6375

SAMSUNG ELECTRONICS CO., LTD 129, Samsung-ro, Yeongtong-gu Suwon-si, Gyeonggi-do, 443-742 Korea June 8 th , 2022 Federal Communications Commission 7435 Oakland Mills Road Columbia, MD 21046 SUBJECT : Label Statement FCC ID : A3LSMF721U To whom it may concern We hereby provide the following attestations according to CFR 2.935 and FCC KDB 784748 D02: At the time of purchase, the FCC ID is readily and physically visible to the purchaser on the exterior package per CFR 2.935(f). The FCC ID will be readily legible without the aid of magnification according to CFR 2.935(d). The literature in the package describes how to access the electronic display to find the FCC ID per CRF 2.935(b) and FCC KDB 784748. Per CFR 2.935(c), the user will be able to access this information within a maximum of 3 steps. The user will be able to access this information without a SIM card, special accessories or supplemental plug-ins. Per CFR 2.935(e), We, Samsung have programmed the e-label and it is not able to be modified by any third party. Per CFR 2.935(f), the FCC ID will be able to survive normal shipping and handling so it is visible for inspection at the time of import. Should you have any questions or comments concerning the above, please contact the undersigned. Sincerely Yours, Jenni Chun / General Manager Samsung Electronics America, Inc. Address: 19 Chapin Rd., Building D Pine Brook, NJ 07058 Tel: 1-973-808-6375

SAMSUNG ELECTRONICS AMERICA, INC. American QA Lab 19 Chapin Rd, Building D. Pine Brook, NJ 07058 Date: June 10, 2022 Federal Communications Commission Authorization and Evaluation Div ision 7435 Oakland Mills Road, Columbia, MD 21046 RE:Request of Confidentiality for FCC ID: A3LSMF721U To Whom It May Concern: Pursuant to Sections 0.457 and 0.459 of the Commission’s Rules (CFR 47), and Section 552 (b) (4) of the Freedom of Information Act, SAMSUNG ELECTRONICS CO.,LTD. hereby requests confidentiality and treatment of certain information accompanying this application. The materials contain trade secrets and proprietary information not customarily re leased to th e public. The public disclosure of these matters might be harmful to the Applicant and provide unjustified benefits to its competitors. We are also hereby request Short-Term Confidentiality for 180 day s after the grant as outlined in Public Notice DA 04-1705. This provision will give SAMSUNG ELECTRONICS CO.,LTD. temporary confidentiality of commercially sensitive information pri or to product release. The requested Permanent and Short-Term Confidential exhibits are listed as follows: PERMANENT AND SHORT-TERM CONFIDENTIAL LIST ExhibitDescription PERMANENT 1 Block Diagram 2 Operational Description 3 Schematics 4 Parts List & Tune-Up Procedure SHORT-TERM 5 External Photos 6 Internal Photos 7 Test-Setup Photos 8 Users Manual The Applicant understands that pursuant to Rule 0.457, disclosure of this application and all accompanying documentations, where applicable, will not be made public before the date of the Grant for this application. Sincerely, Jenni Chun / General Manager Samsung Electronics America, Inc. Address: 19 Chapin Rd., Building D Pine Brook, NJ 07058 Tel: 1-973-808-6375

FCC ID : A3LSMF721U External Photos FCC ID : A3LSMF721U External Photos FCC ID : A3LSMF721U External Photos FCC ID : A3LSMF721U External Photos FCC ID : A3LSMF721U External Photos FCC ID : A3LSMF721U External Photos FCC ID : A3LSMF721U External Photos FCC ID : A3LSMF721U External Photos FCC ID : A3LSMF721U External Photos FCC ID : A3LSMF721U External Photos FCC ID : A3LSMF721U External Photos FCC ID : A3LSMF721U External Photos

FCC certification FCC ID: A3LSMF721U Description of E-label on the A3LSMF721U Date : June 8 th , 2022 FCC ID: A3LSMF721U This model is applied E-label, please find description of E-label below. 1.FCC ID (E-label): Settings > About Phone > Status Information <Device Display Screen> 2.FCC ID on the Quick Start Guide The FCC has granted an Equipment Authorization for this model device based on the compliance of all reported SAR levels with the FCC RF exposure guide lines. This device has a FCC ID number A3LSMF7 21U [Model Number: SM-F721U, SM-F721U1] and the specific SAR levels for this device c an be found at the following. FCC website: www.fcc.gov/oet/ea/ The SAR information for this device can be found on Samsung’s website: www.samsung.com/sar Samsung Electronics Co., LTD. 129, Samsung-ro, Yeongtong-gu Suwon-City, Gyeonggi-do, 16677, Korea

FCC ID : A3LSMF721U Internal Photos FCC ID : A3LSMF721U Internal Photos FCC ID : A3LSMF721U Internal Photos FCC ID : A3LSMF721U Internal Photos FCC ID : A3LSMF721U Internal Photos FCC ID : A3LSMF721U Internal Photos FCC ID : A3LSMF721U Internal Photos FCC ID : A3LSMF721U Internal Photos FCC ID : A3LSMF721U Internal Photos FCC ID : A3LSMF721U Internal Photos FCC ID : A3LSMF721U Internal Photos FCC ID : A3LSMF721U Internal Photos FCC ID : A3LSMF721U Internal Photos

FCC ID: A3LSMF721U NEAR-FIELD POWER DENSITY EVALUATION REPORT Approved by: Technical Manager Document S/N: 1M2204080051-25.A3L DUT Type: Portable Handset Page 1 of 22 REV 2.0 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. DUT Type: Portable Handset Application Type: Certification FCC Rule Part(s): CFR §2.1093 Model: Additional Model(s): SM-F721U SM-F721U1 I attest to the accuracy of data. All measurements reported herein were performed by me or were made under my supervision and are correct to the best of my knowledge and belief. I assume full responsibility for the completeness of these measurements and vouch for the qualifications of all persons taking them. Test results reported herein relate only to the item(s) tested. Tx FrequencyMeasured psPDReported psPD MHz mW /cm²mW /cm² n258 24250 - 24450; 24750 - 25250 0.3510.794 n26127500 - 283500.3010.794 n26037000 - 400000.3700.794 Band & Mode Total Exposure Ratio0.994 VerdictPASS ELEMENT MATERIALS TECHNOLOGY (Formerly PCTEST) 7185 Oakland Mills Road, Columbia, MD 21046 USA Tel. +1.410.290.6652 / Fax +1.410.290.6654 http://www.element.com NEAR-FIELD POWER DENSITY EVALUATION REPORT Applicant Name Date of Testing Samsung Electronics Co.‚ Ltd. 06/06/2022 – 06/10/2022 129, Samsung-ro, Maetan dong, Test Site/Location Yeongtong-gu, Suwon-si Element, Columbia, MD, USA Gyeonggi-do, 16677, Korea Document Serial No: 1M2204080051-25.A3L FCC ID: A3LSMF721U APPLICANT: SAMSUNG ELECTRONICS CO.‚ LTD. FCC ID: A3LSMF721U NEAR-FIELD POWER DENSITY EVALUATION REPORT Approved by: Technical Manager Document S/N: 1M2204080051-25.A3L DUT Type: Portable Handset Page 2 of 22 REV 2.0 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. TABLE OF CONTENTS 1 DEVICE UNDER TEST 3 1.1 NR FR2 Checklist 3 1.2 Time-Averaging Algorithm for RF Exposure Compliance 3 1.3 Power Density Design Target and Uncertainty 3 1.4 Input Power Specifications 4 1.5 DUT Antenna Locations 7 1.6 Simultaneous Transmission Capabilities 8 1.7 Guidance Applied 9 1.8 Bibliography 9 2 MEASUREMENT SYSTEM 10 2.1 Measurement Setup 10 2.2 SPEAG EUmmWVx Probe / E-Field 5G Probe 10 2.3 Peak Spatially Averaged Power Density Assessment Based on E-field Measurements 11 2.4 Reconstruction Algorithm 11 3 RF EXPOSURE LIMITS FOR POWER DENSITY 12 3.1 Uncontrolled Environment 12 3.2 Controlled Environment 12 3.3 RF Exposure Limits for Frequencies Above 6 GHz 12 4 SYSTEM VERIFICATION 13 4.1 Test System Verification 13 5 POWER DENSITY DATA @ INPUT.POWER.LIMIT 15 5.1 Power Density Results 15 5.2 Power Density Test Notes 18 6 EQUIPMENT LIST 19 7 MEASUREMENT UNCERTAINTIES 20 8 CONCLUSION 21 8.1 Measurement Conclusion 21 9 REFERENCES 22 APPENDIX A: POWER DENSITY TEST PLOTS APPENDIX B: SYSTEM VERIFICATION PLOTS APPENDIX C: TOTAL EXPOSURE RATIO APPENDIX D: PROBE AND VERIFICATION SOURCE CALIBRATION CERTIFICATES APPENDIX E: DUT ANTENNA DIAGRAM AND TEST SETUP PHOTOGRAPHS FCC ID: A3LSMF721U NEAR-FIELD POWER DENSITY EVALUATION REPORT Approved by: Technical Manager Document S/N: 1M2204080051-25.A3L DUT Type: Portable Handset Page 3 of 22 REV 2.0 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. 1 DEVICE UNDER TEST 1.1 NR FR2 Checklist 1.2 Time-Averaging Algorithm for RF Exposure Compliance The device is enabled with Qualcomm® Smart Transmit GEN1 feature. This feature performs time averaging algorithm in real time to control and manage transmitting power and ensure the time-averaged RF exposure is in compliance with FCC requirements all the time. Refer to Compliance Summary document for detailed description of Qualcomm ® Smart Transmit. Note that WLAN operations are not enabled with Smart Transmit. The Smart Transmit algorithm maintains the time-averaged transmit power, in turn, time-averaged RF exposure of SAR_design_target or PD_design_target, below the predefined time-averaged power limit (i.e., P limit for sub-6 radio, and input.power.limit for 5G mmW NR), for each characterized technology and band (see RF Exposure Part 0 Test Report). Smart Transmit allows the device to transmit at higher power instantaneously when needed, but manages power limiting to maintain time-averaged transmit power to input.power.limit. The purpose of this report (Part 1 test) is to demonstrate that the EUT meets FCC PD limits when transmitting in static transmission scenario at maximum allowable time-averaged power level given by input.power.limit. 1.3 Power Density Design Target and Uncertainty Form Factor Subcarrier Spacing (kHz) Total Number of Supported Uplink CCs (SISO) Total Number of Supported Uplink CCs (MIMO) Total Number of Supported DL CCs CP-OFDM Modulations Supported in UL DFT-s-OFDM Modulations Supported in UL LTE Anchor Bands NR FR1 Anchor Bands Duplex Type (mmWave) QPSK, 16QAM, 64QAM PI/2 BPSK, QPSK, 16QAM, 64QAM n258: 2/5/12/14/30/66, n261: 2/5/12/13/48/66, n260: 2/5/12/13/14/30/48/66 TDD NR FR2 Operations Information Portable Handset 120 2 2 8 n258: 2/5/12/25/30/41/66, n261: 2/5/25/41/48/66/77, n260: 2/5/12/25…

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APPENDIX A: POWER DENSITY TEST PLOTS A1 Element Date: 06/10/2022 Antenna K; Beam 147; H; High Ch.; CW; Closed Device Under Test Properties DUT Serial Number DUT Type A3LSMF721U VDP0652M Portable Handset Exposure Conditions Phantom Section Position Test Distance [mm] Band Frequency [MHz] 5G LEFT 2.00 n258 25200.00 Hardware Setup Probe, Calibration Date DAE, Calibration Date EUmmWV3 – SN9364, 06/21/2021 DAE4ip SN1638, 11/11/2021 Software Setup Software Software Version cDASY6 Module mmWave 3.0.0.841 Scans Setup Scan Type 5G Scan Grid Extents [mm] 80x80 Grid Steps [lambda] 0.25 x 0.25 Sensor Surface [mm] 2.0 Measurement Results Scan Type 5G Scan Avg. Area [cm 2 ] 4.00 pS tot avg [W/m 2 ] 3.29 pS n avg [W/m 2 ] 2.62 E peak [V/m] 56.9 Power Drift [dB] -0.04 A2 Element Date: 06/08/2022 Antenna K; Beam 148; H; Low Ch.; CW; Open Device Under Test Properties DUT Serial Number DUT Type A3LSMF721U VDP0653M Portable Handset Exposure Conditions Phantom Section Position Test Distance [mm] Band Frequency [MHz] 5G LEFT 2.00 n258 24350.00 Hardware Setup Probe, Calibration Date DAE, Calibration Date EUmmWV3 – SN9407, 12/13/2021 DAE4ip SN1639, 01/21/2022 Software Setup Software Software Version cDASY6 Module mmWave 3.0.0.841 Scans Setup Scan Type 5G Scan Grid Extents [mm] 80x80 Grid Steps [lambda] 0.25 x 0.25 Sensor Surface [mm] 2.0 Measurement Results Scan Type 5G Scan Avg. Area [cm 2 ] 4.00 pS tot avg [W/m 2 ] 3.51 pS n avg [W/m 2 ] 2.31 E peak [V/m] 66.3 Power Drift [dB] 0..11 A3 Element Date: 06/08/2022 Antenna K; Beam 147; H; Low Ch.; CW; Closed Device Under Test Properties DUT Serial Number DUT Type A3LSMF721U VDP0652M Portable Handset Exposure Conditions Phantom Section Position Test Distance [mm] Band Frequency [MHz] 5G FRONT 2.00 n261 27550.10 Hardware Setup Probe, Calibration Date DAE, Calibration Date EUmmWV3 – SN9364, 06/21/2021 DAE4ip SN1638, 11/11/2021 Software Setup Software Software Version cDASY6 Module mmWave 3.0.0.841 Scans Setup Scan Type 5G Scan Grid Extents [mm] 100x100 Grid Steps [lambda] 0.25 x 0.25 Sensor Surface [mm] 2.0 Measurement Results Scan Type 5G Scan Avg. Area [cm 2 ] 4.00 pS tot avg [W/m 2 ] 3.01 pS n avg [W/m 2 ] 2.44 E peak [V/m] 64.9 Power Drift [dB] -0.12 A4 Element Date: 06/08/2022 Antenna K; Beam 17; V; Low Ch.; CW; Open Device Under Test Properties DUT Serial Number DUT Type A3LSMF721U VDP0653M Portable Handset Exposure Conditions Phantom Section Position Test Distance [mm] Band Frequency [MHz] 5G LEFT 2.00 n261 27550.10 Hardware Setup Probe, Calibration Date DAE, Calibration Date EUmmWV3 – SN9407, 12/13/2021 DAE4ip SN1639, 01/21/2022 Software Setup Software Software Version cDASY6 Module mmWave 3.0.0.841 Scans Setup Scan Type 5G Scan Grid Extents [mm] 80x80 Grid Steps [lambda] 0.25 x 0.25 Sensor Surface [mm] 2.0 Measurement Results Scan Type 5G Scan Avg. Area [cm 2 ] 4.00 pS tot avg [W/m 2 ] 2.67 pS n avg [W/m 2 ] 2.00 E peak [V/m] 68.0 Power Drift [dB] 0..11 A5 Element Date: 06/08/2022 Antenna K; Beam 144; H; Low Ch.; CW; Closed Device Under Test Properties DUT Serial Number DUT Type A3LSMF721U VDP0652M Portable Handset Exposure Conditions Phantom Section Position Test Distance [mm] Band Frequency [MHz] 5G LEFT 2.00 n260 37050.00 Hardware Setup Probe, Calibration Date DAE, Calibration Date EUmmWV3 – SN9364, 06/21/2021 DAE4ip SN1638, 11/11/2021 Software Setup Software Software Version cDASY6 Module mmWave 3.0.0.841 Scans Setup Scan Type 5G Scan Grid Extents [mm] 120x120 Grid Steps [lambda] 0.25 x 0.25 Sensor Surface [mm] 2.0 Measurement Results Scan Type 5G Scan Avg. Area [cm 2 ] 4.00 pS tot avg [W/m 2 ] 3.70 pS n avg [W/m 2 ] 2.22 E peak [V/m] 89.6 Power Drift [dB] -0.16 A6 Element Date: 06/08/2022 Antenna K; Beam 144; H; Low Ch.; CW; Open Device Under Test Properties DUT Serial Number DUT Type A3LSMF721U VDP0653M Portable Handset Exposure Conditions Phantom Section Position Test Distance [mm] Band Frequency [MHz] 5G LEFT 2.00 n260 37050.00 Hardware Setup Probe, Calibration Date DAE, Calibration Date EUmmWV3 – SN9407, 12/13/2021 DAE4ip SN1639, 01/21/2022 Software Setup Software Software Version cDASY6 Module mmWave 3.0.0.841 Scans Setup Scan Type 5G Scan Grid Extents [mm] 120x120 Grid Steps [lambda] 0.25 x 0.25 Sensor Surface [mm] 2.0 Measurement Results Scan Type 5G Scan Avg. Area [cm 2 ] 4.00 pS tot avg [W/m 2 ] 3.04 pS n avg [W/m 2 ] 2.00 E peak [V/m] 90.3 Power Drift [dB] 0.03

APPENDIX B: POWER DENSITY SYSTEM VERIFICATION PLOTS B1 Element Date: 06/06/2022 30 GHz System Verification Device Under Test Properties DUT Serial Number 30 GHz Verification Source 1045 Exposure Conditions Phantom Section Position Test Distance [mm] Band Frequency [MHz] 5G FRONT 5.55 Validation band 30000.00 Hardware Setup Probe, Calibration Date DAE, Calibration Date EUmmWV3 – SN9364, 06/21/2021 DAE4ip SN1638, 11/11/2021 Software Setup Software Software Version cDASY6 Module mmWave 3.0.0.841 Scans Setup Scan Type 5G Scan Grid Extents [mm] 60.0 x 60.0 Grid Steps [lambda] 0.25 x 0.25 Sensor Surface [mm] 5.55 Measurement Results Scan Type 5G Scan Avg. Area [cm 2 ] 4.00 pS tot avg [W/m 2 ] 34.2 pS n avg [W/m 2 ] 33.8 E peak [V/m] 132.0 Deviation (dB) 0.19 30 GHz System Verification Calibration Certificate B2 Element Date: 06/10/2022 30 GHz System Verification Device Under Test Properties DUT Serial Number 30 GHz Verification Source 1035 Exposure Conditions Phantom Section Position Test Distance [mm] Band Frequency [MHz] 5G FRONT 5.55 Validation band 30000.00 Hardware Setup Probe, Calibration Date DAE, Calibration Date EUmmWV3 – SN9407, 12/13/2021 DAE4ip SN1639, 01/21/2022 Software Setup Software Software Version cDASY6 Module mmWave 3.0.0.841 Scans Setup Scan Type 5G Scan Grid Extents [mm] 60.0 x 60.0 Grid Steps [lambda] 0.25 x 0.25 Sensor Surface [mm] 5.55 Measurement Results Scan Type 5G Scan Avg. Area [cm 2 ] 4.00 pS tot avg [W/m 2 ] 30.3 pS n avg [W/m 2 ] 29.8 E peak [V/m] 123.0 Deviation (dB) -0.29 30 GHz System Verification Calibration Certificate

FCC ID: A3LSMF721U NEAR-FIELD POWER DENSITY EVALUATION REPORT Approved by: Technical Manager DUT Type: Portable Handset APPENDIX C: Page 1 of 9 REV 2.0 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. APPENDIX C: TOTAL EXPOSURE RATIO FCC ID: A3LSMF721U NEAR-FIELD POWER DENSITY EVALUATION REPORT Approved by: Technical Manager DUT Type: Portable Handset APPENDIX C: Page 2 of 9 REV 2.0 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. The Total Exposure Ratio (TER) is calculated by combining all SAR measurements and power density measurements after normalizing to their respective limits. The general expression is below. 푇푇푇푇푇푇=� 퐴퐴 푎푎=1 푆푆푆푆푇푇 푎푎 푆푆푆푆푇푇 푎푎 ,푙푙푙푙푙푙푙푙푙푙 +� 퐵퐵 푏푏=1 푝푝푝푝 푃푃푃푃 푏푏 푝푝푝푝푃푃푃푃 푏푏 ,푙푙푙푙푙푙푙푙푙푙 < 1 The TER shall be less than unity to ensure compliance with the limits. � 푁푁 푛푛=1 4퐺퐺 푆푆푆푆푇푇 푛푛 4퐺퐺 푆푆푆푆푇푇 푛푛 ,푙푙푙푙푙푙푙푙푙푙 +� 푀푀 푚푚=1 5퐺퐺 푙푙푙푙푚푚 푁푁푇푇 푝푝푝푝푃푃푃푃 푚푚 5퐺퐺 푙푙푙푙푚푚 푁푁푇푇 푝푝푝푝 푃푃푃푃 푚푚 ,푙푙푙푙푙푙푙푙푙푙 + � 푃푃 푝푝=1 푚푚푊푊푆푆푁푁 푆푆푆푆푇푇 푝푝 푚푚푊푊푆푆푁푁 푆푆푆푆푇푇 푝푝 ,푙푙푙푙푙푙푙푙푙푙 ˂1 Qualcomm ® Smart Transmit algorithm for WWAN adds directly the time-averaged RF exposure from 4G and time- averaged RFexposure from 5G mmW NR. Smart Transmit algorithm controls the total RF exposure from both 4G and 5G mmW NR to not exceed FCC limit. Therefore, per FCC guidance, TER does not need to be evaluated directly for the 4G and 5G simultaneous compliance via summation. The following equations are derived later in Appendix C. The validation of the time-averaging algorithm and compliance under the Tx varying transmission scenario for WWAN technologies are reported in Part 2 report. The report SN could be found in Bibliography section. � 푁푁 푛푛=1 4퐺퐺 푆푆푆푆푇푇 푛푛 4퐺퐺 푆푆푆푆푇푇 푛푛 ,푙푙푙푙푙푙푙푙푙푙 +� 푃푃 푝푝=1 푚푚푊푊푆푆푁푁 푆푆푆푆푇푇 푝푝 푚푚푊푊푆푆푁푁 푆푆푆푆푇푇 푝푝 ,푙푙푙푙푙푙푙푙푙푙 ˂ 1 � 푀푀 푚푚=1 5퐺퐺 푙푙푙푙푚푚 푁푁푇푇 푝푝푝푝 푃푃푃푃 푚푚 5퐺퐺 푙푙푙푙푚푚 푁푁푇푇 푝푝푝푝 푃푃푃푃 푚푚 ,푙푙푙푙푙푙푙푙푙푙 +� 푃푃 푝푝=1 푚푚푊푊푆푆푁푁 푆푆푆푆푇푇 푝푝 푚푚푊푊푆푆푁푁 푆푆푆푆푇푇 푝푝 ,푙푙푙푙푙푙푙푙푙푙 ˂ 1 For 5G mmW NR, since there is total design-related uncertainty arising from TxAGC and device-to-device variation, the worst-case RF exposure should be determined by accounting for device uncertainty. For this device, the manufacturer has added an additional permanent back-off (indicated below as WWAN backoff) for every beam in the calculations for input.power.limits used in the EFS file. The back-off levels can be found in the Part 0 Test report. Therefore, 5G mmW NR RF exposure for this DUT is evaluated by reported psPD calculated as: reported_psPD= (PD_design_target+PD_uncertainty) x 10 (-WWAN backoff in dB)/10 Note that since not all the beams supported by this EUT are measured, reported_psPD cannot be computed based on limited measured psPD data. Alternatively, since measured psPD for all the beams will be ≤ PD_design_target + PD_uncertainty uncertainty, reported_psPD is computed based on this worst-case psPD as shown above. FCC ID: A3LSMF721U NEAR-FIELD POWER DENSITY EVALUATION REPORT Approved by: Technical Manager DUT Type: Portable Handset APPENDIX C: Page 3 of 9 REV 2.0 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. The compliance analysis for simultaneous transmission scenarios of WWAN (4G LTE & 5G mmW NR) with Smart Transmit and 4G & WLAN can be found in two reports indicated in the table below. This appendix demonstrates compliance for the 5G + WLAN scenarios. The report SNs can be found in Bibliography section. Simultaneous Scenario Evaluation Report 1. 4G LTE WWAN + WLAN FCC SAR Evaluation Report (Part 1) 2. 4G LTE WWAN + 5G mmW NR WWAN RF Exposure Part 2 Test Report RF exposure compliance with 5G mmW NR WWAN+WLAN simultaneous transmission scenarios is demonstrated for various radio configurations below. Note that the above reported psPD applies to the worst-case surfaces of the DUT at 2mm evaluation distance. Worst-case PD on other surfaces of the DUT are calculated from simulated PD data (see Power Density Simulation Report), by multiplying reported psPD with the highest proportion out of all beams and out of all three channels in each band, where the adjustment for each beam/channel is computed as the proportion of “simulated PD on desired surface” to “simulated PD on worst-surface”. For example, to determine worst-case PD on front surface (needed for Head RF Exposure evaluation during simultaneous transmission), highest proportion of (simulated PD on front surface)/(simulated PD on worst surface) was determined out of all supported beams and out of all three channels by the DUT in each band. In some cases, the simulation vs measurement for some surfaces can exceed the device's total uncertainty. In those cases, if the measured psPD > simulated adjusted psPD (assuming a linear congruency of the psPD across surfaces), then measured psPD should be used towards the simultaneous TX analysis. Table C-1 lists the relevant worst-case reported psPD values based on the additional surfaces and evaluation distances needed to perform the TER analysis. The highest of the adjusted Reported_psPD…

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APPENDIX D: PROBE AND VERIFICATION SOURCE CALIBRATION CERTIFICATES

FCC ID: A3LSMF721U Part 0 Power Density Report Power Density Characterization Revision A June 27 th , 2022 SAMSUNG ELECTRONICS Power Density Characterization 1 Exposure Scenarios At frequencies > 6 GHz, the total …

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