APYHRO00160Cellular Phone

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Model Name:SH-02DPhoto(External) 2 nd /November/2011 1 / 21 / 2 Model Name:SH-02DPhoto(External) 2 nd /November/2011 2 / 22 / 2

2/November/2011 Model Name: SH-02D SpecLabel and Location Model Name: SH 02D FCC ID: APYHRO00160 ○Spec Label Spec Label and Location Vendor : NTT DoCoMo ① Color ② Approval Number of JATE ③ Certification Number of TELEC ④ Production Years & Months ⑤ Bar Code of IMEI ⑥() Spec Label and Location ⑥ IMEI (Production Serial Number) Caution : Turn off power in an aircraft. Don't remove this seal. Spec Label and Location Manufucturer/Applicant : SHARP Corporation ○Location Spec Label and Location FCC ID ○Location Spec Label and Location FCC ID Spec Label and Location FCC ID Note ; The drawing is rotated 90 degrees. Spec Label and Location FCC ID

Model Name:SH-02DPhoto(Internal) 2 nd /November/2011 1 / 41 / 4 Model Name:SH-02DPhoto(Internal) 2 nd /November/2011 2 / 42 / 4 Model Name:SH-02DPhoto(Internal) 2 nd /November/2011 3 / 43 / 4 Model Name:SH-02DPhoto(Internal) 2 nd /November/2011 4 / 44 / 4

Test report No. : 32BE0119-HO-B Page : 2 of 17 Issued date : October 31, 2011 UL Japan, Inc. Head Office EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 CONTENTS PAGE SECTION 1: Customer information ...................................................................................... 3 SECTION 2: Equipment under test (E.U.T.) ........................................................................ 3 SECTION 3: Test specification, procedures & results ......................................................... 4 SECTION 4: Operation of E.U.T. during testing ................................................................. 6 SECTION 5: Conducted Emission ......................................................................................... 7 SECTION 6: Radiated Emission ............................................................................................ 8 APPENDIX 1: Data of EMI test ............................................................................................. 9 Conducted Emission ...................................................................................................................... 9 Radiated Emission ....................................................................................................................... 11 Radiated Emission ....................................................................................................................... 13 APPENDIX 2: Test instruments ........................................................................................... 15 APPENDIX 3: Photographs of test setup............................................................................. 16 Conducted Emission .................................................................................................................... 16 Radiated Emission ....................................................................................................................... 17 Test report No. : 32BE0119-HO-B Page : 3 of 17 Issued date : October 31, 2011 UL Japan, Inc. Head Office EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 SECTION 1: Customer information Company Name : Sharp Corporation, Communication Systems Group. Address : 2-13-1 Hachihonmatsu-iida Higashihiroshima-shi Hiroshima, 739-0192 Japan Telephone Number : +81-82-420-1825 Facsimile Number : +81-82-420-1829 Contact Person : Kazuo Sugimoto SECTION 2: Equipment under test (E.U.T.) 2.1 Identification of E.U.T. Type of Equipment : Cellular Phone Model No. : SH-02D(JN-DC55) Serial No. : Refer to Section 4, Clause 4.2 Rating : AC 230/120V / 50Hz, DC4.0V Receipt Date of Sample : October 17, 2010 Country of Mass-production : China Condition of EUT : Production prototype (Not for Sale: This sample is equivalent to mass-produced items.) Modification of EUT : No Modification by the test lab 2.2 Product Description Feature of EUT: Tri Band WCDMA(FDD I,V,VI) and Tri-band GSM(900/1800/1900) Dual mod Cellular Phone with Bluetooth,W-LAN,FeliCa and GPS. - GSM (EU:900/1800M, 1900M) - WCDMA (EU:2000M, US:850M,JPN: 800/1700/2000) Clock frequency(ies) in the system: 48MHz (Oscillator), 1.0GHz (CPU clock). Test report No. : 32BE0119-HO-B Page : 4 of 17 Issued date : October 31, 2011 UL Japan, Inc. Head Office EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 SECTION 3: Test specification, procedures & results 3.1 Test specification Test Specification : FCC Part 15 Subpart B: 2011, final revised on July 8, 2011 and effective August 8, 2011 Title : FCC 47CFR Part15 Radio Frequency Device Subpart B Unintentional Radiators 3.2 Procedures and results Item Test Procedure Limits Deviation Worst margin Result Conducted emission ANSI C63.4: 2003 7. AC powerline conducted emission measurements Class B N/A [QP] 14.0dB 3.80436MHz, L [AV] 15.0dB 0.17629MHz, L Complied Radiated emission ANSI C63.4: 2003 8. Radiated emission measurements Class B N/A 2.3dB 797.076MHz, Horizontal, QP Complied *Note: UL Japan, Inc’s EMI Work Procedure 13-EM-W0420. 3.3 Addition to standard No addition, exclusion nor deviation has been made from the standard. 3.4 Uncertainty EMI The following uncertainties have been calculated to provide a confidence level of 95% using a coverage factor k=2. Test room (semi- anechoic chamber) Conducted emission (+dB) 150kHz-30MHz No.1 3.5dB No.2 3.6dB No.3 3.6dB No.4 3.6dB Test room (semi- anechoic chamber) Radiated emission (3m*)(+dB) (1m*)(+dB) (0.5m*)(+dB) 9kHz -30MHz 30MHz -300MHz 300MHz -1GHz 1GHz -10GHz 10GHz -18GHz 18GHz -26.5GHz 26.5GHz -40GHz No.1 4.2dB 5.0dB 5.1dB 5.6dB 5.9dB 4.4dB 4.3dB No.2 4.1dB 5.2dB 5.1dB 5.7dB 5.8dB 4.3dB 4.2dB No.3 4.5dB 5.0dB 5.2dB 5.7dB 5.8dB 4.5dB 4.2dB No.4 4.7dB 5.2dB 5.2dB 5.7dB 5.8dB 5.1dB 4.2dB *3m/1m/0.5m = Measurement distance Conducted Emission test The data listed in this test report has enough margin, more than the site margin. Radiated emission test(3m) The data listed in this report meets the limits unless the uncertainty is taken into consideration. Test report No. : 32BE0119-HO-B Page : 5 of 17 Issued date : October 31, 2011 UL Japan, Inc. Head Office EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 3.5 Test Location UL Japan, Inc. Head Office EMC Lab. *NVLAP Lab. code: 200572-0 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 FCC Registration Number IC Registration Number Width x Depth x Height (m) Size of reference ground plane (m) / horizontal conducting plane Other rooms No.1 semi-anechoic chambe r 313583 2973C-1 19.2 x 11.2 x 7.7m 7.0 x 6.0m No.1 Power source room No.2 semi-anechoic chamber 655103 2973C-2 7.5 x 5.8 x 5.2m 4.0 x 4.0m - No.3 semi-anechoic chamber 148738 2973C-3 12.0 x 8.5 x 5.9m 6.8 x 5.75m No.3 Preparation room No.3 sh…

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Test report No. : 32BE0119-HO-B Page : 16 of 17 Issued date : October 31, 2011 UL Japan, Inc. Head Office EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 APPENDIX 3: Photographs of test setup Conducted Emission Photo 1 Photo 2 Test report No. : 32BE0119-HO-B Page : 17 of 17 Issued date : October 31, 2011 UL Japan, Inc. Head Office EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 Radiated Emission Photo 1 Photo 2